CN211603444U - Test board for integrated circuit - Google Patents
Test board for integrated circuit Download PDFInfo
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- CN211603444U CN211603444U CN201921685847.2U CN201921685847U CN211603444U CN 211603444 U CN211603444 U CN 211603444U CN 201921685847 U CN201921685847 U CN 201921685847U CN 211603444 U CN211603444 U CN 211603444U
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Abstract
The utility model discloses a survey test panel for integrated circuit. This test panel includes circuit board and the test component of setting on the circuit board, and the test component includes: an integrated circuit socket having a power pin, an input pin, and an output pin; the power supply wiring column group comprises a plurality of power supply wiring columns which are used for being connected with an external power supply, and the power supply wiring columns are connected with the power supply pins; the input voltage socket set comprises a first pin and a second pin, and the first pin is connected with the power supply wiring terminal; the second pin is connected with the input pin; the second type of pins are selectively connected with one of the plurality of first type of pins; the input signal wiring column group comprises a plurality of input signal wiring columns used for being connected with an external signal source, and the signal wiring columns are connected with the input pins; and the output signal wiring column group comprises a plurality of output signal wiring columns connected with the output pins. By adopting the test board, the test of the integrated circuit including the rotary digital converter can be more convenient.
Description
Technical Field
The utility model relates to a microelectronics technical field, concretely relates to survey test panel for integrated circuit especially relates to a survey test panel for revolving digital converter.
Background
A rotary to digital converter (RDC) is an integrated circuit that can integrate the advantages of CMOS logic and bipolar high-precision linear circuits, and is used to convert an ac signal output by a rotary transformer into a digital signal, thereby providing feedback information of motor shaft position and speed. At present, the rotary transformer digital converter is widely applied to the industrial fields of robots, hybrid power, full electric automobiles and the like.
With the rapid development of microelectronics, integrated circuits such as a rotary digital converter are required to have higher quality and reliability. Accordingly, functional and parametric testing of integrated circuits such as rotary digital converters is also of increasing importance. Development of a test apparatus that can be adapted to an integrated circuit such as a rotary digital converter is an important part of the development work of the integrated circuit.
However, considering the number of pins of the rotary digital converter and the complexity of peripheral circuits, when the rotary digital converter is tested at present, a plurality of test circuits are often required to be built according to different test requirements, so that the test process is complex and the test time is long.
SUMMERY OF THE UTILITY MODEL
The utility model provides a survey test panel for integrated circuit has solved the test consuming time, the power consumption problem of integrated circuit such as revolving digital converter.
The utility model provides a survey test panel for integrated circuit, including circuit board and the test component of setting on the circuit board, the test component includes at least: the integrated circuit socket is used for plugging an integrated circuit to be tested and is provided with a power pin, an input pin and an output pin; the power supply wiring column group comprises a plurality of power supply wiring columns which are used for being connected with an external power supply, and the power supply wiring columns are connected with the power supply pins; input voltage extension socket group, including a plurality of input voltage extension sockets, each input voltage extension socket includes a plurality of first type of base pins and at least one second type of base pin, wherein: the first pin is connected with the power supply wiring terminal; the second pin is connected with the input pin; the second pin type is selectively connected with one of the first pin types to provide required test voltage for the integrated circuit to be tested; the input signal wiring column group comprises a plurality of input signal wiring columns used for being connected with an external signal source, and the input signal wiring columns are connected with the input pins; and the output signal wiring column group comprises a plurality of output signal wiring columns, and the output signal wiring columns are connected with the output pins and used for outputting the output signals of the integrated circuit to be tested.
Further, each input voltage extension socket comprises a plurality of second-type pins, and the plurality of second-type pins are connected with each other.
Furthermore, in each input voltage extension socket, the first type pins and the second type pins are alternately arranged.
Furthermore, the voltage values of external power supplies connected with the first pins through the power supply binding posts are different.
Further, the second type pin is selectively connected with one of the first type pins through a jumper cap to provide a required test voltage for the integrated circuit to be tested.
Further, the power supply terminal set comprises a positive power supply terminal, a ground terminal and a negative power supply terminal, wherein the positive power supply terminal is used for being connected with an external power supply with a positive voltage value, the ground terminal is grounded, and the negative power supply terminal is used for being connected with an external power supply with a negative voltage value.
Further, the test component also comprises a resistor array, wherein the resistor array comprises a plurality of resistors with different resistance values; one end of the resistor is connected with the input signal wiring terminal or the output signal wiring terminal, and the other end of the resistor is grounded or connected with the power supply wiring terminal.
Furthermore, the test component also comprises a capacitor array, the capacitor array comprises a plurality of capacitors with different capacitance values, one end of each capacitor is connected with the input signal wiring terminal or the output signal wiring terminal, and the other end of each capacitor is grounded.
Further, the test component also comprises an indicator light group; the indicating lamp group comprises a plurality of indicating lamps; one end of the indicator light is connected with the output signal wiring terminal, and the other end of the indicator light is grounded.
Further, the output signal binding post is used for being connected with an oscilloscope.
The utility model provides a survey test panel for integrated circuit, through inserting integrated circuit possesses, power terminal group, input voltage row and insert group, input signal terminal group and output signal terminal group integration on the circuit board, improved the specificity and the integration that survey test panel, simplified integrated circuit's such as rotary digital converter testing step, shortened test time, make integrated circuit's test more accurate and high-efficient.
Drawings
The above and other objects, features and advantages of the embodiments of the present invention will become more readily understood by referring to the following drawings. For purposes of clarity, the various features in the drawings are not necessarily drawn to scale.
Fig. 1 is a schematic structural diagram of a test board for an integrated circuit according to an embodiment of the present invention.
List of reference numerals:
100-a circuit board; 110-an integrated circuit package;
120-input voltage bank; 121-input voltage extension;
122-first type pins; 123-pins of the second type;
130-input signal lug set; 140-output signal lug set;
150-power supply lug group; 160-indicator light set;
170-a resistor array; 180-capacitor array.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the drawings in the embodiments of the present invention are combined below to clearly and completely describe the technical solutions in the embodiments of the present invention. The features in the embodiments described below may be combined with each other without conflict.
Fig. 1 shows a schematic structural diagram of a test board for an integrated circuit according to an embodiment of the present invention. As shown in fig. 1, the test board for integrated circuits provided in this embodiment includes a circuit board 100 and a test component disposed on the circuit board 100; the test part includes at least:
the integrated circuit socket 110 is used for plugging an integrated circuit to be tested, and the integrated circuit socket 110 is provided with a power pin, an input pin and an output pin;
the power supply wiring column group 150 comprises a plurality of power supply wiring columns used for being connected with an external power supply, and the power supply wiring columns are connected with the power supply pins;
the input voltage socket set 120 includes a plurality of input voltage sockets 121, each input voltage socket 121 includes a plurality of first type pins 122 and at least one second type pin 123, wherein: the first type pins 122 are connected with power supply wiring terminals; the second type pin 123 is connected with the input pin; the second-type pins 123 are selectively connected with one of the first-type pins 122 to provide a required test voltage to the integrated circuit to be tested;
an input signal terminal set 130 including a plurality of input signal terminals for connecting with an external signal source, the input signal terminals being connected with the input pins;
the output signal terminal set 140 includes a plurality of output signal terminals, and the output signal terminals are connected to the output pins for outputting the output signals of the ic to be tested.
Specifically, the wiring board 100 is used to carry a plurality of test components required for integrated circuit testing. The wiring Board 100 may be specifically a Printed Circuit Board (PCB).
The ic socket 110 is used for plugging an ic to be tested. Connections between other test components and the integrated circuit under test are made through the integrated circuit interposer 110.
The ic socket 110 has a plurality of pins corresponding to the ic pins to be tested. It is understood that the number and arrangement of the pins of the ic socket 110 may be determined according to the model and specification of the ic to be tested, and it is preferable to ensure that the total number of the pins of the ic socket 110 matches the number of the pins of the ic to be tested, each pin corresponding to one pin. For example, the ic to be tested is a digital converter with dual in-line package (DIP) package, the digital converter has a rectangular shape, two parallel rows of metal pins are disposed on two sides of the digital converter, and the number of the pins is forty, so that the ic socket 110 is a dual in-line type and has forty pins.
The pins of the integrated circuit socket 110 may be divided into an input pin, an output pin, and a power pin according to functional differentiation, wherein: supplying power to the integrated circuit to be tested through the power pins; providing a test voltage and a test signal to the integrated circuit to be tested through the input pins; and outputting the output signal of the integrated circuit to be tested through the output pins. The number and the arrangement position of the input pins, the output pins and the power supply pins can be determined according to the specification and the test requirement of the integrated circuit to be tested, and the embodiment is not particularly limited herein.
The power terminal set 150 includes a plurality of power terminals for connecting an external power source to the power pins of the ic socket 110 to supply power to the ic to be tested. The number of power terminals is preferably not less than the number of power pins in the integrated circuit package 110. In actual production, the number of the power supply terminals is consistent with the number of the power supply pins in the integrated circuit socket 110, so that the power supply terminals and the power supply pins are in one-to-one correspondence.
According to the test requirement, the power supply wiring terminal can be used for being connected with external power supplies with different voltage values. For the convenience of testing, the power supply terminals of the power supply terminal group 150 are manually specified or divided into positive power supply terminals, ground terminals and negative power supply terminals according to the voltage value of the external power supply. The positive power supply wiring terminal is used for being connected with an external power supply with a positive voltage value, the ground wiring terminal is grounded, and the negative power supply wiring terminal is used for being connected with an external power supply with a negative voltage value.
The positive power supply terminals may further be defined as power supply terminals of different voltage values. For example, the power supply terminal set 150 includes two positive power supply terminals, one of which is used for connecting +12V external power supply, and the other of which is used for connecting +5V external power supply. Of course, the negative power supply terminal can be further divided according to the voltage value of the external voltage.
When the testing board provided in this embodiment is specifically used for testing a rotary digital converter, the power post set 150 includes four power posts, which are: two positive power supply terminals, one ground terminal, and one negative power supply terminal. The two positive power supply binding posts are respectively used for connecting a +12V external power supply and a +5V external power supply, the ground binding post is grounded, and the negative power supply binding post is used for connecting a-12V external power supply.
The input voltage socket set 120 is used to connect an external power source with the input pins of the ic socket 110, so as to provide the ic to be tested with the voltage required by the test. Specifically, each input voltage extension socket 121 in the input voltage extension socket set 120 includes a plurality of pins, and is further divided into a first pin 122 and a second pin 123 according to the functions of the pins, wherein the first pin 122 is connected to an external power source by being connected to a power terminal, the second pin 123 is connected to an input pin of the ic socket 110, and the first pin 122 and the second pin 123 are selectively connected to provide a required test voltage to the ic to be tested.
In a specific implementation process, the voltage values of the external power supplies connected to the first pins 122 through the power supply binding posts are different, that is, the voltage values of the external power supplies connected to the first pins 122 are different; or, in the plurality of first pins 122, the voltage values of the external power supplies connected to any two first pins 122 are different, so that test voltages with more voltage values can be provided for the integrated circuit to be tested, and the test requirements of the integrated circuit can be better met.
For example, each input voltage socket 121 in the input voltage socket set 120 includes three first type pins 122, which are respectively connected to +12V external power, +5V external power and ground through corresponding power terminals. When the required test voltage is +12V, the first pin 122 and the second pin 123 for connecting the +12V external power source can be connected. Similarly, when the required test voltage is +5V, the first pin 122 and the second pin 123 connected to the +5V external power source may be connected.
It is understood that the number of the first-type pins 122 is determined according to the required test voltage, for example, the required test voltages are +12V, +5V and 0V (ground), the number of the first-type pins 122 is three, and the three first-type pins 122 are respectively used for connecting the external voltage of +12V, +5V and ground through the power supply terminal.
In this embodiment, how to realize the connection between the first type of pins and the second type of pins is not particularly limited, and a conventional electrical connection manner in the field may be adopted, and particularly, a jumper cap may be adopted to perform the connection, so as to ensure that various test voltages can be flexibly obtained during the test of the integrated circuit.
Preferably, each of the input voltage extension sockets 121 in the input voltage extension socket set 120 includes a plurality of second-type pins 123, and the plurality of second-type pins 123 are connected to each other. Thus, when testing the integrated circuit, the second-type pins 123 can be connected to any one of the first-type pins 122 nearby, or one of the first-type pins 122 can be connected to one of the second-type pins 123 nearby, according to the principle of proximity.
Further, in each input voltage socket 121, the first type pins 122 and the second type pins 123 are alternately arranged, for example, each input voltage socket 121 in the input voltage socket set 120 has five pins, and the five pins are arranged in a row (as shown in fig. 1) or in a column (not shown) on the circuit board 100, wherein the odd number pins are the first type pins 122 and the even number pins are the second type pins 123. This facilitates the connection between the first type pins 122 and the second type pins 123, and particularly facilitates the connection of the first type pins 122 with the adjacent second type pins 123 using jumper caps.
Referring to fig. 1, the number of the input voltage sockets 121 in the input voltage socket set 120 is not particularly limited in this embodiment. Of course, the number of the input voltage extension sockets 121 is preferably the same as the number of the input pins in the ic socket 110, so that the input voltage extension sockets 121 and the input pins are in one-to-one correspondence, thereby facilitating the test of the ic. For example, the ic socket 110 has six input pins, and the input voltage extension socket set 120 also has six input voltage extension sockets 121, where each input voltage extension socket 121 corresponds to one input pin.
The input signal terminal set 130 includes a plurality of input signal terminals for connecting an external signal source (not shown) and input pins of the ic socket 110, so as to transmit input signals from the external signal source to the ic to be tested through the input pins of the ic socket 110.
It is understood that the number of input signal terminals is preferably the same as the number of input pins of the ic socket 110, so that there is a one-to-one correspondence between the input signal terminals and the input pins.
The output signal terminal set 140 includes a plurality of output signal terminals, and the output signal terminals are connected to the output pins of the ic socket 110 for outputting output signals of the ic to be tested.
The number of output signal terminals is preferably consistent with the number of output pins of the ic socket 110, so that the output signal terminals and the output pins are in one-to-one correspondence.
Specifically, the output signal terminal can be connected with an oscilloscope to display the waveform of the output signal of the integrated circuit to be tested, so that whether the function of the integrated circuit to be tested is normal can be judged according to waveform analysis.
When the test board provided by this embodiment is used to test an integrated circuit, the power supply terminal set 150 may be connected to an external power supply, the input signal terminal set 130 may be connected to an external signal source, the first type pin 122 and the second type pin 123 of the input voltage socket 121 in the input voltage socket set 120 may be selectively connected, the output signal terminal set 140 may be connected to a signal detection device such as an oscilloscope, the integrated circuit to be tested may be placed on the integrated circuit socket 110 and may be well plugged, and the oscilloscope, the external signal source and the external power supply may be turned on to test the integrated circuit.
Therefore, the test board for the integrated circuit according to the present embodiment can perform the test operation on the integrated circuit by integrating the integrated circuit socket 110, the input voltage extension socket set 120, the input signal post set 130, the output signal post set 140, and the power post set 150 on the same circuit board 100, and then cooperating with the oscilloscope, the external signal source, and the external power source. Therefore, by adopting the technical scheme of the embodiment, the accuracy and the convenience of the integrated circuit test are improved, the test problem of the integrated circuits such as the rotary digital converter is effectively solved, and the capital cost and the time cost required by the test are reduced.
Referring to fig. 1, the test board for integrated circuits may further include an indicator light set 160, where the indicator light set 160 is a test component and is disposed on the circuit board 100. Specifically, the indicator light group 160 includes a plurality of indicator lights; one end of the indicator light is connected with the output signal terminal of the output signal terminal group 140, and the other end is grounded.
The indicator light set 160 is used for determining the state of the output signal of the ic to be tested. For example, when the indicator light is on, it indicates that the output signal of the integrated circuit under test is at a high level; when the indicator light is not on, the output signal of the integrated circuit to be tested is represented as low level. Through the indicator light set 160, whether the function of the integrated circuit to be tested is normal can be judged more intuitively.
The present embodiment is not particularly limited to the specific type of the indicator light, and includes but is not limited to an LED light. The specific number of the indicator lights is not particularly limited in this embodiment; as a preferred embodiment, the number of the indicator lights is adapted to the number of the output signal terminals in the output signal terminal group 140, and in particular, can correspond to one another.
Referring to fig. 1, the test board may further include a resistor array 170, where the resistor array 170 includes a plurality of resistors, and particularly, a plurality of resistors with different resistance values. The number and resistance of the resistors can be set according to the requirements of the test line.
One end of the resistor is connected with the output signal terminal or the input signal terminal, and the other end of the resistor can be connected with the power terminal of the power terminal group 150 or directly grounded according to actual needs.
For example, one end of the resistor is connected to the output signal terminal, and the other end is grounded to pull down the output voltage. In addition, the output voltage can be further adjusted by connecting resistors with different resistance values. Therefore, by providing the resistor array 170, a test under a multi-load condition can be realized.
Referring to fig. 1, the test board may further include a capacitor array 180, where the capacitor array 180 includes a plurality of capacitors, and particularly, may include a plurality of capacitors with different capacitance values. The number and value of the capacitors can be set according to the requirements of the test line.
Specifically, one end of the capacitor is connected with the output signal wiring terminal or the input signal wiring terminal, and the other end of the capacitor is grounded. For example, one end of the capacitor is connected to the input signal terminal, and the other end is grounded to block the dc signal, thereby achieving the filtering effect. In addition, alternating current signals with different frequencies can be further blocked by connecting capacitors with different capacitance values. Therefore, by arranging the capacitor array 180, multi-band filtering can be realized, and the stability of the test signal is improved.
By integrating the integrated circuit socket 110, the input voltage extension socket set 120, the input signal terminal set 130, the output signal terminal set 140, the power terminal set 150, the indicator light set 160, the resistor array 170 and the capacitor array 180 on one circuit board 100, the specificity and the integration of the test board for the integrated circuit are further improved, the accuracy and the convenience of the integrated circuit test are improved, the problem of time and labor consumption during the test of the integrated circuits such as a rotary digital converter is effectively solved, and the capital cost and the time cost required by the test are reduced.
The present embodiment is not particularly limited to the position where the test member is disposed on the wiring board 100. It will be appreciated that the test components are arranged on the circuit board 100 in a manner that ensures convenient testing and reasonable wiring. As shown in fig. 1, in one embodiment, the circuit board 100 has a rectangular shape, wherein the ic socket 110 is disposed in a middle region of the circuit board 100, and the input voltage row socket set 120 and the input signal post set 130 can be disposed on one side of the ic socket 110, such as the right side in fig. 1, and along the long side of the circuit board 100; the resistor array 170 and the capacitor array 180 may be disposed on the other side of the ic socket 110, such as the left side in fig. 1, and along the long side of the circuit board 100; the output signal post set 140 and the indicator light set 160 may be disposed below the integrated circuit package 110, and the power post set 150 may be disposed above the integrated circuit package 110. Of course, the test components may be arranged in other ways to facilitate wiring and reduce line loss.
In the present invention, the terms "connected" and "connected" refer to electrical connection unless otherwise specified. In this embodiment, the connection manner between the test components is not particularly limited, and metal wiring or electrical connection using a terminal cap, a jumper cap, or the like may be used. Of course, the rough wiring principle can refer to the wiring principle of the PCB, such as adopting double-layer wiring and nearby wiring to reduce the wiring consumption, avoid the interference between leads and the reduction of signals, and ensure the accuracy and reliability of the test result.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; such modifications and substitutions do not substantially depart from the scope of the embodiments of the present invention, and are intended to be covered by the claims and the specification.
Claims (10)
1. A test board for integrated circuits, comprising a wiring board and test means arranged on said wiring board, said test means comprising at least:
the integrated circuit socket is used for plugging an integrated circuit to be tested and is provided with a power pin, an input pin and an output pin;
the power supply wiring column group comprises a plurality of power supply wiring columns which are used for being connected with an external power supply, and the power supply wiring columns are connected with the power supply pins;
input voltage extension socket group, including a plurality of input voltage extension sockets, each the input voltage extension socket includes a plurality of first type of plug pins and at least one second type of plug pin, wherein: the first pin is connected with the power supply wiring terminal; the second pin is connected with the input pin; the second pin type is selectively connected with one of the first pin types to provide required test voltage for the integrated circuit to be tested;
the input signal wiring column group comprises a plurality of input signal wiring columns used for being connected with an external signal source, and the input signal wiring columns are connected with the input pins;
and the output signal wiring column group comprises a plurality of output signal wiring columns, and the output signal wiring columns are connected with the output pins and used for outputting the output signals of the integrated circuit to be tested.
2. The test board for integrated circuits of claim 1, wherein each of the input voltage sockets comprises a plurality of the second type pins, and a plurality of the second type pins are connected to each other.
3. The test board for integrated circuits of claim 2, wherein the first type of pins and the second type of pins alternate in each of the input voltage sockets.
4. The test board for integrated circuits according to any one of claims 1 to 3, wherein the plurality of pins of the first type are different in voltage value from an external power source connected thereto through the power terminals.
5. The test board for integrated circuits of any of claims 1-3, wherein the second type of pin is selectively connected to one of the plurality of first type of pins by a jumper cap to provide a desired test voltage to the integrated circuit under test.
6. The test board for integrated circuits according to any one of claims 1 to 3, wherein the set of power supply posts includes a positive power supply post for connection to an external power supply having a positive voltage value, a ground post for connection to ground, and a negative power supply post for connection to an external power supply having a negative voltage value.
7. The test board for integrated circuits according to any one of claims 1 to 3, wherein the test member further comprises a resistor array including a plurality of resistors having different resistance values;
one end of the resistor is connected with the input signal wiring terminal or the output signal wiring terminal, and the other end of the resistor is grounded or connected with the power supply wiring terminal.
8. The test board for integrated circuits according to any one of claims 1 to 3, wherein the test part further comprises a capacitor array including a plurality of capacitors having different capacitance values, one end of the capacitor being connected to the input signal terminal or the output signal terminal, and the other end of the capacitor being grounded.
9. The test board for integrated circuits according to any one of claims 1 to 3, wherein the test member further comprises a group of indicator lights; the indicating lamp group comprises a plurality of indicating lamps; one end of the indicator light is connected with the output signal wiring terminal, and the other end of the indicator light is grounded.
10. The test board for integrated circuits according to any one of claims 1 to 3, wherein the output signal terminals are for connection to an oscilloscope.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921685847.2U CN211603444U (en) | 2019-10-09 | 2019-10-09 | Test board for integrated circuit |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201921685847.2U CN211603444U (en) | 2019-10-09 | 2019-10-09 | Test board for integrated circuit |
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| CN211603444U true CN211603444U (en) | 2020-09-29 |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114137266A (en) * | 2021-10-11 | 2022-03-04 | 昆山丘钛微电子科技股份有限公司 | Separable power supply circuit board, test tool and adapter plate |
| CN114325542A (en) * | 2021-11-23 | 2022-04-12 | 中国船舶重工集团公司第七0九研究所 | Direct current signal calibration board, calibration device and calibration method for integrated circuit test system |
-
2019
- 2019-10-09 CN CN201921685847.2U patent/CN211603444U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114137266A (en) * | 2021-10-11 | 2022-03-04 | 昆山丘钛微电子科技股份有限公司 | Separable power supply circuit board, test tool and adapter plate |
| CN114325542A (en) * | 2021-11-23 | 2022-04-12 | 中国船舶重工集团公司第七0九研究所 | Direct current signal calibration board, calibration device and calibration method for integrated circuit test system |
| CN114325542B (en) * | 2021-11-23 | 2023-08-22 | 中国船舶重工集团公司第七0九研究所 | Direct current signal calibration plate, calibration device and calibration method of integrated circuit test system |
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