CN211206704U - Jig and equipment for testing signals - Google Patents
Jig and equipment for testing signals Download PDFInfo
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- CN211206704U CN211206704U CN201921805776.5U CN201921805776U CN211206704U CN 211206704 U CN211206704 U CN 211206704U CN 201921805776 U CN201921805776 U CN 201921805776U CN 211206704 U CN211206704 U CN 211206704U
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Abstract
The utility model belongs to the technical field of signal test, a tool and equipment for test signal is disclosed, the tool includes PCB circuit board, PCB circuit board is equipped with a plurality of signal areas and a ground connection region, every signal area is equipped with signal probe connector, ground connection region is equipped with ground connection probe connector, one side of PCB circuit board is equipped with signal input interface, every signal area is through PCB wiring and signal input interface's pin intercommunication; the equipment comprises a signal generator, an oscilloscope and a jig, wherein the signal generator is used for generating signals, and the jig is used for conducting the signals to the oscilloscope. The utility model provides an among the prior art the inefficiency of signal test, the poor problem of signal uniformity, can improve efficiency of software testing, improve the rate of accuracy and the uniformity of test.
Description
Technical Field
The utility model relates to a signal test technical field especially relates to a tool and equipment for test signal.
Background
In signal testing, the testing of signal quality is particularly important, and the judgment of product performance is directly influenced. The traditional signal quality judgment is judged through a consistency test software result in an oscilloscope, and the judgment result is directly influenced by the quality of the signal. Under the condition that no test fixture is provided, the signal quality is tested by connecting three differential probes of an oscilloscope after welding a load, manually scraping a wire and manually welding a wire on a transmission line on a PCB, and the test flow is shown in figure 1. Under the condition of not using a test fixture, three signal wires and three ground wires need to be welded simultaneously for testing each channel, and if a plurality of channels exist, the operations of welding, scraping wires and welding wires need to be repeated. The manual wire scraping, manual wire welding and other processes are difficult to operate and poor in stability, so that the testing efficiency is low, the signal consistency is poor, the signal is judged, and difficulty and economic loss are brought to product design.
SUMMERY OF THE UTILITY MODEL
The embodiment of the application solves the problems of low efficiency and poor signal consistency of signal testing in the prior art by providing the jig and the equipment for testing the signals.
The embodiment of the application provides a tool for test signal, includes: a PCB circuit board; the PCB is provided with a plurality of signal areas and a grounding area; each of the signal areas is equipped with a signal probe connector, and the ground area is equipped with a ground probe connector; and one side of the PCB is provided with a signal input interface, and each signal area is communicated with a pin of the signal input interface through a PCB wiring.
Preferably, the signal input interface is a C-PHY input interface, each of the signal areas is equipped with three signal probe connectors, and the ground area is equipped with three ground probe connectors.
Preferably, the ground region is located in the middle of the PCB, and the two signal regions where the ground region is farthest away are equidistant.
Preferably, each of the signal regions includes: a first signal wire, a second signal wire and a third signal wire; the first signal trace, the second signal trace and the third signal trace are respectively connected with one signal probe connector; the first signal trace, the second signal trace and the third signal trace are differential in pairs.
Preferably, the first signal trace, the second signal trace, and the third signal trace satisfy: the single-ended impedance of each signal wire is 50 omega, and the error of the impedance is plus or minus 15 percent; the differential impedance of any two signal wires is 100 omega, and the error of the impedance is plus or minus 15%.
Preferably, the equal length error of the first signal trace, the second signal trace and the third signal trace is within 5 mils.
Preferably, the first signal trace, the second signal trace, and the third signal trace satisfy: the signal routing wiring mode is the same, and the number of the via holes is the same.
Preferably, the line ends of the first signal trace, the second signal trace and the third signal trace are respectively connected in series with a first resistor; the other ends of the three first resistors are connected together and connected with one end of a first capacitor, and the other end of the first capacitor is grounded.
Preferably, the three first resistors in each signal area are equidistant from the signal probe connector.
In another aspect, an embodiment of the present application provides an apparatus for testing a signal, including: the signal generator, the oscilloscope and the jig for testing the signal are arranged;
the signal generator is used for generating signals, and the jig is used for conducting the signals to the oscilloscope.
One or more technical solutions provided in the embodiments of the present application have at least the following technical effects or advantages:
in the embodiment of the application, the provided fixture for testing the signals comprises a PCB, wherein the PCB is provided with a plurality of signal areas and a grounding area, each signal area is provided with a signal probe connector, the grounding area is provided with a grounding probe connector, one side of the PCB is provided with a signal input interface, and each signal area is communicated with the pins of the signal input interface through PCB wiring. In addition, utilize above-mentioned tool, this application still provides an equipment for test signal, still includes signal generator, oscilloscope, generates the signal through signal generator, transmits the signal to oscilloscope through the tool. Utilize the utility model provides a when tool tests, be connected to certain signal area's signal probe connector with oscilloscope's differential probe's positive pole on, be connected to ground connection probe connector with oscilloscope's differential probe's negative pole on, then open the electricity test can. When the test of one channel is completed, the anode of the differential probe of the oscilloscope is replaced to the signal probe connector of another signal area, and then another group of channels can be tested. For when not having test fixture, welding load, artifical line, the manual bonding wire of scraping lead to the condition that efficiency of software testing is low, the signal uniformity is poor on the transmission line on the PCB board, through the utility model provides a pair of a tool for test signal can be quick, stable test the signal, can effectively improve inefficiency, the uniformity subalternation problem that traditional approach brought.
Drawings
In order to more clearly illustrate the technical solution of the present embodiment, the drawings needed to be used in the description of the embodiment will be briefly introduced below, and it is obvious that the drawings in the following description are an embodiment of the present invention, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
FIG. 1 is a flow chart of signal testing used in the prior art;
fig. 2 is a schematic circuit diagram of a single signal area in a fixture for testing signals according to an embodiment of the present invention;
fig. 3 and 4 are schematic diagrams of a fixture for testing signals according to an embodiment of the present invention, which employs FPC board four-layer 6 channels L1 + L3 laminated routing;
fig. 5 and fig. 6 are schematic diagrams of a fixture for testing signals according to an embodiment of the present invention, which employs FR4 board four-layer 6 channels L1 + L4 stacked wires;
fig. 7 is a schematic view of a test connection of a fixture for testing signals according to an embodiment of the present invention.
Detailed Description
In order to better understand the technical solution, the technical solution will be described in detail with reference to the drawings and the specific embodiments.
The embodiment provides a tool for test signal, includes: a PCB circuit board; the PCB is provided with a plurality of signal areas and a grounding area; each of the signal areas is equipped with a signal probe connector, and the ground area is equipped with a ground probe connector; and one side of the PCB is provided with a signal input interface, and each signal area is communicated with a pin of the signal input interface through a PCB wiring.
The grounding area is positioned in the middle of the PCB circuit board, and the distances of the two signal areas at the farthest positions of the grounding area are equal. Namely, the grounding probe connector is preferably arranged at a position close to the middle of the PCB, so that the grounding probe connector is closer to each group of signal areas, and the connection of the differential probe of the oscilloscope is facilitated (when a jig is used for testing, the anode of the differential probe of the oscilloscope is connected to the signal probe connector of a certain signal area, and the cathode of the differential probe of the oscilloscope is connected to the grounding probe connector).
The utility model provides a signal type that is used for testable of test signal's tool includes but not limited to MIPI (Mobile Industry Processor Interface), and is specific also not limited to MIPIC-PHY.
Take the signal input interface is C-PHY input interface, every signal area is equipped with three signal probe connector, it is right that the ground connection area is equipped with three ground connection probe connector for the example the utility model discloses do further explanation.
Each of the signal regions includes: a first signal wire, a second signal wire and a third signal wire; the first signal trace, the second signal trace and the third signal trace are respectively connected with one signal probe connector; the first signal trace, the second signal trace and the third signal trace are differential in pairs.
The first signal trace, the second signal trace and the third signal trace satisfy: the single-ended impedance of each signal trace is 50 Ω (shown as Z in fig. 2)0) The error of the impedance is plus or minus 15 percent; the differential impedance of any two signal wires is 100 omega, and the error of the impedance is plus or minus 15%.
The tail ends of the first signal wire, the second signal wire and the third signal wire are respectively connected with a first resistor in series; the other ends of the three first resistors are connected together and connected with one end of a first capacitor, and the other end of the first capacitor is grounded.
Wherein the first capacitance is less than 90 picofarads. Preferably 22 picofarads, for higher bit rates, a 22pF capacitor can meet the common mode return loss specification.
Preferably, the three first resistors in each signal area are equidistant from the signal probe connector. I.e., three resistors and one capacitor per channel, are preferably located close to the probe connector, with the three resistors being placed side by side and kept equidistant from the probe connector to minimize signal loss due to end mismatch.
For example, at the ends of the first signal trace, the second signal trace, and the third signal trace, a 50-ohm resistor is connected in parallel, the other ends of the three resistors are connected together, and then a 22 picofarad capacitor is connected in series to the ground. The three signal wires are respectively connected with a signal probe connector of a proper type, and three grounding probe connectors of the same type are arranged nearby at the same time, so that 6 probe connectors are arranged to be matched and connected with three corresponding differential probes. If there are N PHY channels, then it is sufficient to correspondingly match 3N signal connection lines and 3 ground probe connectors, which may be shared.
As shown in fig. 2, a schematic diagram of a C-PHY circuit with only one channel, i.e., a schematic diagram of a circuit of one signal region. The input ends of the A, B, C three signal connecting circuits are the signal input ends of the C-PHY jig, and are matched with corresponding input interfaces according to different C-PHY output signal interfaces of products, and the types are not limited. Commonly used are gold finger connectors, substrate-to-FPC connectors, and the like. Commonly used probe connectors are: SMA, 2.92mm connectors or other devices to facilitate connection to the probe, packaging, etc.
When the PCB is arranged, the equal length error of the first signal routing, the second signal routing and the third signal routing is within 5 mil. Specifically, all signal wires are arranged on the same layer as much as possible, if the layers are forced to be changed, the length of the signal wires is equal according to the layers, and the total equal length error is within +/-5 mils, so that the lengths of the signal wires can be kept consistent as much as possible, and the time delay among signals is reduced.
The first signal trace, the second signal trace and the third signal trace satisfy: the signal routing wiring mode is the same, and the number of the via holes is the same. Specifically, the signal routing does not punch through holes as much as possible, and even if the signal routing punches through holes, fewer than two through holes on one line need to be kept, and the number of the through holes on all the differential pairs is as large; paving the left and right sides of the signal routing; the signal routing needs to be bent less, if the signal routing needs to be bent, the number of the left turn and the number of the right turn are kept equal, and the angle is larger than 135 degrees; therefore, the signal routing can be kept the same, and the loss of signal transmission is close to the loss of signal transmission as much as possible.
In addition, the probe connector is packaged in a chemical immersion gold electroplating mode, so that better contact between a signal and a probe can be ensured, and the probe connector is ensured to be better contacted with a test fixture, so that the signal can be better tested.
Adjacent layers have a reference ground plane so that the signal has a better return path. In order to ensure that adjacent layers have reference ground planes and to facilitate better impedance control, a four-layer board stacking mode is preferably adopted for the PCB, and different stacking modes can be designed according to product requirements in practical situations.
For example, fig. 3 and 4 show four-layer 6-channel stacked wiring manners of an FPC board, where fig. 3 shows L1 layers of four layers of FPC boards, fig. 4 shows L3 layers of four layers of FPC boards, and other layers are ground layers.
Fig. 5 and 6 show four-layer 6-channel laminated routing manners of FR4 plates, where fig. 5 shows four layers of FR4 plates L1 layers of routing diagrams, fig. 6 shows four layers of FR4 plates L4 layers of routing diagrams, and the other layers are ground layers.
As shown in fig. 7, during the test, the anodes of the three differential probes of the oscilloscope are connected to the three signal probe connectors (i.e., A, B, C of a certain channel in fig. 7) in a certain signal area on the fixture, and the cathodes of the three differential probes of the oscilloscope are connected to the three grounding probe connectors, so that the power-on test can be performed. When one channel is tested, the anode of the probe of the oscilloscope is replaced to the three signal probe connectors (namely the other three A, B, C) in the other signal area, so that another group of C-PHY channels can be tested until all the channels are tested.
Utilize above-mentioned tool, the utility model discloses still provide an equipment for test signal, equipment specifically includes: the device comprises a signal generator, an oscilloscope and a jig, wherein the signal generator is used for generating signals, and the jig is used for conducting the signals to the oscilloscope.
To sum up, through the utility model provides a pair of a tool and equipment for test signal can be fast, stable test the signal, can effectively improve inefficiency, the poor scheduling problem of uniformity that traditional approach brought. The manual cost is reduced, and meanwhile, the signal quality of the product can be tested more stably, so that the product performance misjudgment, the design change of the board and the like caused by manual welding are reduced.
The embodiment of the utility model provides a tool and equipment for test signal includes following technological effect at least:
1) based on test fixture, can improve efficiency of software testing, reduce the cost of labor.
2) Based on the test fixture, the stability of the test can be improved, and the accuracy and the consistency of the test are improved.
Finally, it should be noted that the above embodiments are only used for illustrating the technical solutions of the present invention and not for limiting, and although the present invention has been described in detail with reference to the examples, those skilled in the art should understand that the technical solutions of the present invention can be modified or replaced by equivalents without departing from the spirit and scope of the technical solutions of the present invention, which should be covered by the scope of the claims of the present invention.
Claims (10)
1. A fixture for testing a signal, comprising: a PCB circuit board; the PCB is provided with a plurality of signal areas and a grounding area; each of the signal areas is equipped with a signal probe connector, and the ground area is equipped with a ground probe connector; and one side of the PCB is provided with a signal input interface, and each signal area is communicated with a pin of the signal input interface through a PCB wiring.
2. The fixture of claim 1, wherein the signal input interface is a C-PHY input interface, each of the signal areas is equipped with three signal probe connectors, and the ground area is equipped with three ground probe connectors.
3. The fixture of claim 1, wherein the grounding area is located in the middle of the PCB circuit board, and the distance between the two signal areas where the grounding area is farthest away is equal.
4. The fixture of claim 2, wherein each of the signal areas comprises: a first signal wire, a second signal wire and a third signal wire; the first signal trace, the second signal trace and the third signal trace are respectively connected with one signal probe connector; the first signal trace, the second signal trace and the third signal trace are differential in pairs.
5. The fixture for testing signals according to claim 4, wherein the first signal trace, the second signal trace, and the third signal trace satisfy: the single-ended impedance of each signal wire is 50 omega, and the error of the impedance is plus or minus 15 percent; the differential impedance of any two signal wires is 100 omega, and the error of the impedance is plus or minus 15%.
6. The apparatus according to claim 4, wherein the first signal trace, the second signal trace, and the third signal trace have equal length errors within 5 mils.
7. The fixture for testing signals according to claim 4, wherein the first signal trace, the second signal trace, and the third signal trace satisfy: the signal routing wiring mode is the same, and the number of the via holes is the same.
8. The apparatus according to claim 4, wherein the ends of the first signal trace, the second signal trace, and the third signal trace are respectively connected in series to a first resistor; the other ends of the three first resistors are connected together and connected with one end of a first capacitor, and the other end of the first capacitor is grounded.
9. The fixture of claim 8, wherein the three first resistors in each signal area are equidistant from the signal probe connector.
10. An apparatus for testing a signal, comprising: a signal generator, an oscilloscope, a tool for testing signals according to any one of claims 1 to 9;
the signal generator is used for generating signals, and the jig is used for conducting the signals to the oscilloscope.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921805776.5U CN211206704U (en) | 2019-10-25 | 2019-10-25 | Jig and equipment for testing signals |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921805776.5U CN211206704U (en) | 2019-10-25 | 2019-10-25 | Jig and equipment for testing signals |
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| CN211206704U true CN211206704U (en) | 2020-08-07 |
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| CN201921805776.5U Active CN211206704U (en) | 2019-10-25 | 2019-10-25 | Jig and equipment for testing signals |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112433074A (en) * | 2020-11-20 | 2021-03-02 | 苏州浪潮智能科技有限公司 | Multifunctional connecting device of oscilloscope and connecting method thereof |
| CN115993501A (en) * | 2023-02-15 | 2023-04-21 | 宁畅信息产业(北京)有限公司 | PCIe signal test fixture of U.2 connector |
-
2019
- 2019-10-25 CN CN201921805776.5U patent/CN211206704U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112433074A (en) * | 2020-11-20 | 2021-03-02 | 苏州浪潮智能科技有限公司 | Multifunctional connecting device of oscilloscope and connecting method thereof |
| CN112433074B (en) * | 2020-11-20 | 2022-11-29 | 苏州浪潮智能科技有限公司 | Multifunctional connecting device of oscilloscope and connecting method thereof |
| CN115993501A (en) * | 2023-02-15 | 2023-04-21 | 宁畅信息产业(北京)有限公司 | PCIe signal test fixture of U.2 connector |
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