CN210155176U

CN210155176U - Fixing device for oscilloscope probe

Info

Publication number: CN210155176U
Application number: CN201920815381.7U
Authority: CN
Inventors: 朱黎丽; 杨泽龙; 崔普城
Original assignee: Chongqing Vocational Institute of Engineering
Current assignee: Chongqing Vocational Institute of Engineering
Priority date: 2019-05-31
Filing date: 2019-05-31
Publication date: 2020-03-17
Anticipated expiration: 2029-05-31

Abstract

The utility model provides a fixing device for an oscilloscope probe, wherein the probe comprises an insulation main body, a probe and a grounding part; the test device also comprises a circuit board, wherein the circuit board is provided with a to-be-tested element, a test end, a first guide seat and a second guide seat which are sequentially arranged and are electrically communicated with the to-be-tested element; the first guide seat is provided with a metal layer and a first fixing structure for limiting the probe grounding part; the metal layer is electrically communicated with a grounding end arranged on the circuit board; the second guide seat is higher than the first guide seat; the second guide seat is provided with an inclined plane which inclines along the direction from the second guide seat to the first guide seat and a second fixing structure which is arranged on the inclined plane and used for limiting the probe insulation main body; the insulating main body is arranged along the inclined plane, so that the probe passes through the upper part of the first guide seat and is contacted with the test end. The utility model provides a fixing device for oscilloprobe has solved because the problem of probe earthing terminal cable conductor overlength to oscilloscope test result interference.

Description

Fixing device for oscilloscope probe

Technical Field

The utility model relates to an oscilloscope field, concretely relates to a fixing device for oscilloprobe.

Background

In the manufacturing and testing process of various electronic products (such as automatic electronic navigation products and infotainment products), the performance of the power supply system of the products is often detected, wherein the ripple noise of the power supply is a key index. Typically, ripple noise of the power supply is tested and analyzed by an oscilloscope. The probe of the oscilloscope comprises a detection end and a ground end, wherein the detection end is arranged at the tip end of the probe and is a metal probe or a metal hook, and the ground end is generally used for leading a ground wire from the main body part of the probe and connecting a metal clip at the tail end of the ground wire. The detection of ripple noise is usually selected at two ends of an output capacitor of a power supply, a detection end of a probe is arranged on an anode pin of the capacitor, and a ground end is arranged on a ground pin of the capacitor. The physical structure of the probe of the oscilloscope influences the detection result, and particularly, if the ground wire is too long, circulation current is caused, and high-frequency noise interference is generated. In order to reduce the high frequency noise interference from the long ground of the probe, it is necessary to ensure that the ground of the probe is as short as possible.

In the prior art, a mode that a ground wire is closely attached to a main body part of a probe in a surrounding mode, namely, annular metal is adopted for reducing test noise, so that the length of the ground wire is shortened by fully utilizing a grounding path on the surface of the main body part of the probe. However, most of the package sizes of the output capacitors are 0402, 0603 and 0805, and when these small-sized package components are tested, the distance between the ground terminal and the test terminal is too short, the operation is inconvenient, and short circuit is easily caused. Therefore, a new probe fixing device for an oscilloscope needs to be designed, so that noise interference can be reduced, the probe and the detected electronic component can be well fixed, and short circuit can be prevented.

SUMMERY OF THE UTILITY MODEL

Not enough to exist among the prior art, the utility model provides a fixing device for oscilloscope probe, its aim at solve because the problem that probe earthing terminal cable conductor overlength disturbed oscilloscope test result to can guarantee the stability that the probe examined time measuring.

In order to achieve the above purpose, the utility model adopts the following technical scheme:

a fixing device for an oscilloscope probe comprises a probe, wherein the probe comprises an insulating main body, a probe arranged at the front end of the insulating main body and a grounding part arranged at the rear part of the probe; the test device also comprises a circuit board, wherein the circuit board is provided with a to-be-tested element, a test end, a first guide seat and a second guide seat which are sequentially arranged and are electrically communicated with the to-be-tested element; the first guide seat is provided with a metal layer and a first fixing structure for limiting the probe grounding part; the metal layer is electrically communicated with a grounding end arranged on the circuit board; the second guide seat is higher than the first guide seat; the second guide seat is provided with an inclined plane which inclines along the direction from the second guide seat to the first guide seat and a second fixing structure which is arranged on the inclined plane and used for limiting the probe insulation main body; the insulating main body is arranged along the inclined plane, so that the probe passes through the upper part of the first guide seat and is contacted with the test end.

Compared with the prior art, the utility model discloses following beneficial effect has: the grounding part of the probe is connected to the grounding end on the circuit board through the first guide seat, so that the problem of circulating current interference generated by the length of the ground wire of the probe is prevented; the second guide seat is higher than the first guide seat to enable the rear end of the probe to be inclined upwards, so that the probe at the front end of the probe points to the end to be tested of the element to be tested and abuts against the end to be tested, and the stability of the probe test is ensured; the probe is fixed through the first fixing structure and the second fixing structure, so that the grounding part and the probe are further prevented from deviating, and the detection accuracy is improved.

Drawings

Fig. 1 is a schematic view of a fixing device for an oscilloscope probe according to an embodiment of the present invention;

FIG. 2 is a schematic view of the first fastening structure;

fig. 3 is a schematic view of the second fixing structure.

The reference numerals include: the device comprises a component to be tested 1, a pin 2, a circuit board 3, an insulating main body 4, a grounding part 5, a probe 6, a second guide seat 7, a first guide seat 8, a vertical section 9, a horizontal section 10, a metal layer 11, an inclined plane 12 and an arc-shaped groove 13.

Detailed Description

The technical solution of the present invention will be further explained with reference to the accompanying drawings and embodiments.

As shown in fig. 1, the utility model provides a fixing device for oscilloscope probe, which comprises a probe, wherein the probe comprises an insulating main body 4, a probe 6 arranged at the front end of the insulating main body 4 and a grounding part 5 arranged at the rear part of the probe 6; the test device also comprises a circuit board 3, wherein the circuit board 3 is provided with a to-be-tested element, a test end, a first guide seat 8 and a second guide seat 7 which are sequentially arranged and are electrically communicated with the to-be-tested element; the first guide seat 8 is provided with a metal layer 11 and a first fixing structure for limiting the probe grounding part 5; the metal layer 11 is electrically connected with a grounding end arranged on the circuit board 3; the second guide seat 8 is higher than the first guide seat 7; the second guide seat 8 is provided with an inclined plane which inclines along the direction from the second guide seat 8 to the first guide seat 7 and a second fixing structure which is arranged on the inclined plane and used for limiting the probe insulation main body 4; the insulating body 4 is disposed along an inclined plane such that the probe 6 passes through the upper portion of the first guide 8 and contacts the test terminal.

Specifically, taking the device 1 to be tested as a capacitor as an example, the terminal to be tested of the capacitor is the pin 2. The pin 2, the first guide seat 8 and the second guide seat 7 of the element to be tested 1 are fixed on the circuit board 3 through welding respectively. Preferably, the height of the first guide 8 is substantially the same as the height of the element to be measured 1. When the device is used, the cable at the rear end of the probe is connected to an oscilloscope.

As shown in fig. 2, the first fixing structure is two L-shaped plates which are arranged in an inverted manner and are symmetrical; an accommodating space for placing the probe grounding part 5 is formed between the two L-shaped plates; the metal layer 11 is fixed on the upper surface of the first guide seat 8 and is located between the two L-shaped plates.

Wherein, two L shaped plates all contain vertical section 9 and horizontal segment 10, and vertical section 9 is established perpendicularly on first guide holder 8, and the vertical section 9 of two L shaped plates is close to one side and meets with horizontal segment 10 one end respectively, and the horizontal segment 10 other end of two L shaped plates inwards extends.

Preferably, the height of the two horizontal sections 10 of the L-shaped plate is between 1/4 and 1/2 of the height of the grounding part 5, and the distance between the two horizontal sections 10 is slightly larger than the width of the grounding part 5, so that the lower half part of the grounding part 5 is placed between the horizontal sections 10 of the two L-shaped plates, and the bottom surface of the grounding part 5 contacts with the metal layer 11 on the upper surface of the first guide seat 8, thereby satisfying the requirement of preventing the circular current interference during grounding and enhancing the stability of the probe detection.

As shown in fig. 3, the second fixing structure is an arc-shaped slot 13 arranged along the extending direction of the inclined plane 12, and the arc-shaped slot 13 is matched with the joint. The arc-shaped groove 13 guides the probe along the inclined surface 12 of the second guide seat 7, so that the probe 6 at the front end of the probe is further prevented from deviating, and the probe insulation main body 4 is convenient to place.

The diameter of the grounding part 5 is smaller than that of the probe insulation main body 4; the distance between the two L-shaped plate horizontal sections 10 is larger than the width of the grounding part 5 and smaller than the diameter of the probe insulation body 4.

Specifically, the grounding part 5 is a metal ring surrounding the front part of the probe insulation body 4; the outer diameter of the metal ring is larger than the part of the probe 6 in front of it. Preferably, according to the height that two horizontal segments 10 are located vertical section 9, the width that metal ring placed at first guide holder 8 and is located between two horizontal segments 10 is different, adjusts the different interval of two horizontal segments 10 for probe stability is better between two horizontal segments 10, thereby guarantees that probe 6 and the end that awaits measuring of awaiting measuring component 1 contact all the time.

The depth of the arc-shaped groove 13 is the same as the radius of the probe, so that the stability of the probe is better.

The testing end comprises a testing seat fixed on the circuit board 3 and a metal bracket which is arranged on the testing seat and is electrically communicated with the element to be tested 1; the metal bracket comprises a plurality of metal branches which are uniformly distributed on the circumference; the spacing between the metal branches matches the diameter of the end of the probe 6.

In use, by placing the probe 6 between the metal branches, the probe 6 is more stable in contact during testing than when in direct contact with the pin 2 of the device 1 to be tested.

Finally, although the present invention has been described in detail with reference to the preferred embodiments, it should be understood by those skilled in the art that the present invention can be modified or replaced by other means without departing from the spirit and scope of the present invention, which should be construed as limited only by the appended claims.

Claims

1. A fixing device for an oscilloscope probe comprises a probe, wherein the probe comprises an insulating main body, a probe arranged at the front end of the insulating main body and a grounding part arranged at the rear part of the probe; the method is characterized in that: the test device also comprises a circuit board, wherein the circuit board is provided with a to-be-tested element, a test end, a first guide seat and a second guide seat which are sequentially arranged and are electrically communicated with the to-be-tested element; the first guide seat is provided with a metal layer and a first fixing structure for limiting the probe grounding part; the metal layer is electrically communicated with a grounding end arranged on the circuit board; the second guide seat is higher than the first guide seat; the second guide seat is provided with an inclined plane which inclines along the direction from the second guide seat to the first guide seat and a second fixing structure which is arranged on the inclined plane and used for limiting the probe insulation main body; the insulating main body is arranged along the inclined plane, so that the probe passes through the upper part of the first guide seat and is contacted with the test end.

2. A fixture for an oscilloscope probe according to claim 1, wherein: the first fixing structure is two L-shaped plates which are arranged in an inverted manner and are symmetrical; an accommodating space for placing the probe grounding part is formed between the two L-shaped plates; the metal layer is fixed on the upper surface of the first guide seat and is positioned between the two L-shaped plates.

3. A fixture for an oscilloscope probe according to claim 1, wherein: the second fixing structure is an arc-shaped groove arranged along the extension direction of the inclined plane, and the arc-shaped groove is matched with the joint.

4. A fixture for an oscilloscope probe according to claim 2, wherein: the diameter of the grounding part is smaller than that of the probe insulation main body; the distance between the horizontal sections of the two L-shaped plates is larger than the width of the grounding part and smaller than the diameter of the probe insulation main body.

5. A fixture for an oscilloscope probe according to claim 3, wherein: the depth of the arc-shaped groove is the same as the radius of the probe insulation main body.

6. A fixture for an oscilloscope probe according to claim 1, wherein: the test end comprises a test seat fixed on the circuit board and a metal bracket which is arranged on the test seat and is electrically communicated with the element to be tested; the metal bracket comprises a plurality of metal branches which are uniformly distributed on the circumference; the spacing between the metal branches matches the diameter of the probe tip.