CN210155176U - Fixing device for oscilloscope probe - Google Patents

Abstract

The utility model provides a fixing device for an oscilloscope probe. The probe includes an insulating body, a probe and a grounding part; and a circuit board, which is provided with an element to be measured, and the elements to be measured are arranged in sequence and electrically connected to the element to be measured. The test end, the first guide seat and the second guide seat; the first guide seat is provided with a metal layer and a first fixing structure for limiting the grounding part of the probe; the metal layer is electrically connected to the grounding end provided on the circuit board The second guide seat is higher than the first guide seat; the second guide seat is provided with an inclined surface inclined along the direction from the second guide seat to the first guide seat and a second fixing structure arranged on the inclined surface for limiting the insulating body of the probe; The insulating body is arranged along the inclined plane, so that the probe passes through the upper part of the first guide seat and contacts the test end. The utility model provides a fixing device for an oscilloscope probe, which solves the problem of interference to the oscilloscope test result due to the long cable of the probe grounding end.

Description

A fixture for oscilloscope probes

technical field

The utility model relates to the field of oscilloscopes, in particular to a fixing device for an oscilloscope probe.

Background technique

In the manufacturing and testing process of various electronic products (such as automatic electronic navigation products and infotainment products), the performance of the power supply system of the product is often tested, and the ripple noise of the power supply is a key indicator. Typically, power supply ripple noise is tested and analyzed with an oscilloscope. The probe of the oscilloscope includes a detection end and a ground end. The detection end is set at the tip of the probe and is a metal probe or metal hook. The ground end is generally a ground wire drawn from the main body of the probe and connected to the end of the ground wire. Metal clips. The detection of ripple noise is usually selected at both ends of the output capacitor of the power supply. The detection end of the probe is placed on the positive pin of the capacitor, and the ground end is placed on the ground pin of the capacitor. The physical structure of the probe itself of the oscilloscope will affect the test results, especially if the ground wire is too long, it will cause a circulating current and cause high-frequency noise interference. To reduce high frequency noise interference from the probe's long ground lead, keep the probe's ground lead as short as possible.

In the prior art, in order to reduce the test noise, a ring-shaped metal is adopted in which the ground wire is closely attached to the main body of the probe, thus making full use of the grounding path on the surface of the main body of the probe to shorten the length of the ground wire. However, most of the package sizes of output capacitors are 0402, 0603, and 0805. When testing these small-sized package components, the distance between the ground terminal and the detection terminal is too short, which is inconvenient to operate and easily causes short circuits. Therefore, it is necessary to consider designing a new probe fixing device for an oscilloscope, which can not only reduce noise interference, but also achieve a good fixation between the probe and the electronic components to be detected, and prevent short circuits.

Utility model content

In view of the deficiencies in the prior art, the utility model provides a fixing device for an oscilloscope probe, which aims to solve the problem of interference to the oscilloscope test result due to the long cable of the probe grounding end, and can ensure the probe detection time stability.

To achieve the above object, the utility model adopts the following technical scheme:

A fixing device for an oscilloscope probe, comprising a probe comprising an insulating body, a probe set at the front end of the insulating body, and a grounding part set at the rear of the probe; and a circuit board, which is provided with a A test element, and a test end, a first guide seat and a second guide seat which are arranged in sequence with the element to be tested; the first guide seat is provided with a metal layer and a first fixed part for limiting the grounding part of the probe structure; the metal layer is electrically connected to the ground terminal provided on the circuit board; the second guide seat is higher than the first guide seat; the second guide seat is provided on the second guide seat along the direction from the second guide seat to the first guide seat The inclined inclined surface and the second fixing structure arranged on the inclined surface are used to limit the insulating body of the probe; the insulating body is arranged along the inclined surface, so that the probe passes through the upper part of the first guide seat and contacts the test end.

Compared with the prior art, the utility model has the following beneficial effects: the grounding part of the probe is connected to the grounding terminal on the circuit board through the first guiding seat, so as to prevent the problem of circulating current interference caused by the length of the grounding wire of the probe; The seat is higher than the first guide seat, so that the rear end of the probe is inclined upward, so that the probe at the front end of the head points to the end to be tested of the component to be tested and abuts against the end to be tested, so as to ensure the stability of the probe test; through the first fixing structure and the second The fixed structure fixes the probe, further prevents the grounding part and the probe from being offset, and improves the detection accuracy.

Description of drawings

1 is a schematic diagram of a fixing device for an oscilloscope probe according to an embodiment of the present invention;

2 is a schematic diagram of the first fixed structure;

FIG. 3 is a schematic diagram of the second fixing structure.

Reference numerals include: component to be tested 1, pin 2, circuit board 3, insulating body 4, grounding portion 5, probe 6, second guide seat 7, first guide seat 8, vertical section 9, horizontal section 10 , metal layer 11 , inclined surface 12 , arc groove 13 .

Detailed ways

The technical solutions in the present utility model are further described below with reference to the accompanying drawings and embodiments.

As shown in FIG. 1 , the present invention proposes a fixing device for an oscilloscope probe, including a probe comprising an insulating body 4 , a probe 6 arranged at the front end of the insulating body 4 and a grounding device arranged at the rear of the probe 6 part 5; also includes a circuit board 3, the circuit board 3 is provided with a component to be tested, and a test end, a first guide seat 8 and a second guide seat 7 that are arranged in sequence with the component to be tested; the first guide seat 8 and the second guide seat 7; The seat 8 is provided with a metal layer 11 and a first fixing structure for limiting the grounding part 5 of the probe; the metal layer 11 is electrically connected to the ground terminal provided on the circuit board 3; the second guide seat 8 is higher than The first guide seat 7; the second guide seat 8 is provided with a slope inclined along the direction from the second guide seat 8 to the first guide seat 7 and a second fixing structure arranged on the slope for limiting the insulating body 4 of the probe ; The insulating body 4 is arranged along the inclined plane, so that the probe 6 passes through the upper part of the first guide seat 8 and contacts the test end.

Specifically, taking the component 1 to be measured as a capacitor as an example, the terminal to be measured of the capacitor is pin 2 . The pins 2 , the first guide base 8 and the second guide base 7 of the component to be tested 1 are respectively fixed on the circuit board 3 by welding. Preferably, the height of the first guide seat 8 is substantially the same as the height of the component to be tested 1 . When in use, the cable at the back of the probe is connected to the oscilloscope.

As shown in FIG. 2 , the first fixing structure is two L-shaped plates arranged upside down and symmetrical; an accommodation space for placing the probe grounding part 5 is formed between the two L-shaped plates; the metal layer 11 is fixed On the upper surface of the first guide seat 8 and between the two L-shaped plates.

Wherein, the two L-shaped plates include a vertical section 9 and a horizontal section 10. The vertical section 9 is vertically arranged on the first guide seat 8, and the vertical section 9 of the two L-shaped plates is close to one side and is respectively connected with the horizontal section 10. One end is connected, and the other end of the horizontal section 10 of the two L-shaped plates extends inward.

Preferably, the height of the two horizontal sections 10 of the L-shaped plate is between 1/4 and 1/2 of the height of the grounding portion 5, and the distance between the two horizontal sections 10 is slightly larger than the width of the grounding portion 5, so that the grounding The lower half of the part 5 is placed between the horizontal sections 10 of the two L-shaped plates, and the bottom surface of the grounding part 5 is in contact with the metal layer 11 on the upper surface of the first guide seat 8, which meets the requirements of grounding to prevent circulating current interference and enhances the Stability of probe detection.

As shown in FIG. 3 , the second fixing structure is an arc-shaped groove 13 arranged along the extending direction of the inclined surface 12 , and the arc-shaped groove 13 is matched with the joint. The arc-shaped groove 13 guides the probe along the inclined surface 12 of the second guide seat 7 , further preventing the probe 6 at the front end of the probe from deviating, and facilitating the placement of the probe insulating body 4 .

The diameter of the grounding portion 5 is smaller than the diameter of the insulating body 4 of the probe;

Specifically, the grounding portion 5 is a metal ring surrounding the front portion of the probe insulating body 4 ; the outer diameter of the metal ring is larger than the portion of the probe 6 at the front thereof. Preferably, according to the heights of the two horizontal sections 10 located in the vertical section 9, the width of the metal ring placed on the first guide base 8 between the two horizontal sections 10 is different, and the different distances between the two horizontal sections 10 are adjusted so that The stability of the probe between the two horizontal sections 10 is better, so as to ensure that the probe 6 is always in contact with the end to be tested of the component to be tested 1 .

The depth of the arc groove 13 is the same as the radius of the probe, which makes the probe more stable.

The test end includes a test seat fixed on the circuit board 3 and a metal bracket set on the test seat and electrically connected to the element to be tested 1; the metal bracket includes a number of metal branches evenly distributed around the circumference; the metal branches The spacing between them matches the diameter of the end of the probe 6 .

When in use, by arranging the probes 6 between the metal branches, the contact of the probes 6 during testing is more stable compared with the direct contact with the pins 2 of the component to be tested 1 .

Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and not to limit them. Although the present invention has been described in detail with reference to the preferred embodiments, those of ordinary skill in the art should The technical solutions are modified or equivalently replaced without departing from the purpose and scope of the technical solutions of the present invention, and all of them should be included in the scope of the claims of the present invention.

Claims (6)

1. a fixing device for an oscilloscope probe, comprising a probe, the probe comprising an insulating body, a probe arranged at the front end of the insulating body and a grounding portion arranged at the rear of the probe; it is characterized in that: also include a circuit board, The circuit board is provided with an element to be tested, a test end electrically connected to the element to be tested, a first guide seat and a second guide seat arranged in sequence; the first guide seat is provided with a metal layer and a probe for limiting The first fixing structure of the grounding part; the metal layer is electrically connected to the grounding terminal provided on the circuit board; the second guide seat is higher than the first guide seat; The inclined surface inclined to the direction of the first guide seat and the second fixing structure provided on the inclined surface are used to limit the insulating body of the probe; the insulating body is arranged along the inclined surface, so that the probe passes through the upper part of the first guide seat and contacts the test end. 2. A fixing device for an oscilloscope probe according to claim 1, wherein the first fixing structure is two L-shaped plates arranged upside down and symmetrical; An accommodation space for placing the grounding part of the probe; the metal layer is fixed on the upper surface of the first guide seat and is located between the two L-shaped plates. 3 . The fixing device for an oscilloscope probe according to claim 1 , wherein the second fixing structure is an arc-shaped groove arranged along the extending direction of the inclined plane, and the arc-shaped groove is matched with the joint. 4 . 4. A fixing device for an oscilloscope probe according to claim 2, characterized in that: the diameter of the grounding portion is smaller than the diameter of the insulating body of the probe; the distance between the horizontal sections of the two L-shaped plates is greater than the width of the grounding portion and smaller than the diameter of the insulating body of the probe. 5 . The fixing device for an oscilloscope probe according to claim 3 , wherein the depth of the arc-shaped groove is the same as the radius of the insulating body of the probe. 6 . 6. A fixing device for an oscilloscope probe as claimed in claim 1, wherein the test end comprises a test seat fixed on the circuit board and a Metal bracket; the metal bracket includes several metal branches evenly distributed around the circumference; the spacing between the metal branches matches the diameter of the probe tip.

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