CN210125566U - Double-station chip testing and sorting machine - Google Patents
Double-station chip testing and sorting machine Download PDFInfo
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- CN210125566U CN210125566U CN201920518897.5U CN201920518897U CN210125566U CN 210125566 U CN210125566 U CN 210125566U CN 201920518897 U CN201920518897 U CN 201920518897U CN 210125566 U CN210125566 U CN 210125566U
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- 238000012360 testing method Methods 0.000 title claims abstract description 88
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- 230000000712 assembly Effects 0.000 claims description 12
- 238000000429 assembly Methods 0.000 claims description 12
- 238000007599 discharging Methods 0.000 claims description 10
- 238000011084 recovery Methods 0.000 claims description 9
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- 238000004519 manufacturing process Methods 0.000 abstract description 4
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- 238000009434 installation Methods 0.000 description 1
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Abstract
The utility model discloses a double-station chip testing separator, which comprises a pair of feeding components, a pair of testing components, a turntable component, a pressing component and a pair of material separating boxes, wherein the feeding components, the testing components, the turntable component, the pressing component and the material separating boxes are arranged on a working platform; the feeding assembly is used for conveying the chip to be tested into the testing assembly; the test component is used for detecting a chip to be tested; the turntable assembly is used for taking out the chip to be tested in the feeding assembly, sending the chip to be tested into the testing assembly for testing, and finally sending the chip to the material distribution box for classification; the pressing component is used for controlling a suction nozzle on the turntable component to move up and down and sucking a chip to be tested; divide the magazine to be used for realizing that the chip after detecting carries out the categorised collection, the utility model provides a directly shake the pay-off track at vibrations in-process, the chip separation that the gas blow pipe will adhere together, the chip separation that awaits measuring that the tucking will superpose together guarantees the suction nozzle on the carousel subassembly can be accurate absorption chip that awaits measuring to improved production efficiency, can be used to in the chip testing.
Description
Technical Field
The utility model relates to a sorter, in particular to chip testing sorter.
Background
At present, the screening of qualified chips is mostly not completed by adopting a wafer test probe station. The wafer test probe consists of a microscope, a probe seat, a workbench, a wafer bearing table, an electrical engineering system and an interface display, and is matched with a tester to complete the electrical parameter test and the functional test of the wafer. Due to the limitation of the probe and the dotting mechanism, the electric parameters of the wafer test probe station can only be set to two grades (qualified products and unqualified products, and the unqualified products are dotted with red dots), the electric parameters lower than the set indexes can only be used as the unqualified products to be classified as waste, the actual part of the unqualified products can be classified as the next grade (good products or middle and upper products), and the unreasonable detection equipment causes the waste of products and the increase of cost. Secondly, the operation speed is limited by the need of manual wafer replacement and calibration, and the X, Y axes are required for planar movement of the wafer, so that the hourly operation efficiency is not high. And thirdly, the wafer needs to be cut into chips after being tested, the chips are possibly damaged in the cutting process, and the chips need to be screened for two times after being cut, so that the cost is increased and the efficiency is reduced.
Disclosed in the prior art is a chip testing and sorting robot, the publication number of which is: CN 106938255A, its shortcoming is that the phenomenon that the chip stack together can appear in its material loading to influence the carousel subassembly and absorb the chip, influence machining efficiency.
SUMMERY OF THE UTILITY MODEL
The utility model aims at providing a duplex position chip testing sorter shakes the pay-off track through the straight of designing new construction for the chip is when directly shaking pay-off track removal, guarantees the continuity that the chip carried, and improves detection efficiency.
The purpose of the utility model is realized like this: a double-station chip testing separator comprises a pair of feeding assemblies, a pair of testing assemblies, a turntable assembly, a pressing assembly and a pair of material distributing boxes, wherein the feeding assemblies, the testing assemblies, the turntable assembly, the pressing assembly and the material distributing boxes are arranged on a working platform;
the feeding assembly is used for conveying chips to be tested into the testing assembly, the feeding assembly comprises a circular vibration tray for receiving the chips to be tested from a storage bin, a discharge port of the circular vibration tray is butted with a straight vibration feeding rail, a straight vibration recovery rail is arranged below the straight vibration feeding rail, a discharge port of the straight vibration recovery rail is butted with the circular vibration tray, the tail end of the straight vibration feeding rail is butted with the rotary disc assembly and is used for a suction nozzle on the rotary disc assembly to suck the chips to be tested away, the straight vibration feeding rail comprises a feeding plate, a first flange is processed at the edge of the front end of the feeding plate, an unloading inclined plane is processed at the same side of the rear end of the feeding plate and the first flange, a discharging hole is processed at the other side of the feeding plate, a feeding channel is formed between the two sides, a second flange connected with the first flange is processed at one side of the feeding channel close to the unloading inclined plane, and a notch, an air blowing pipe used for blowing air towards the transition position of the front end and the rear end of the feeding plate is arranged beside the feeding plate, and a pressing pin capable of adjusting the vertical height and used for limiting the height of the chip is also arranged beside the feeding plate;
the test component is used for detecting a chip to be tested;
the turntable assembly is used for taking out the chip to be tested in the feeding assembly, sending the chip to be tested into the testing assembly for testing, and finally sending the chip to the material distribution box for classification;
the downward pressing component is used for controlling a suction nozzle on the turntable component to move up and down and sucking a chip to be tested;
the material distributing box is used for realizing classified collection of the detected chips.
The utility model discloses during operation, the chip that awaits measuring in the storage silo sends into circular shake charging tray, will await measuring the chip under the effect of circular shake charging tray and send to directly shaking the pay-off track, the chip that awaits measuring shakes under the orbital effect of pay-off track along the pay-off passageway forward motion under the effect of first flange directly, the chip that awaits measuring begins to arrange from first flange, the chip that awaits measuring outside the pay-off passageway region falls into from the discharge opening and directly shakes and retrieves the track, the effect of second flange has guaranteed that the chip that awaits measuring of lower floor can not blown away under the effect of gas blow pipe, the inclined plane landing of unloading can be blown down from to overlapping chip partly, partly that blows off can be blocked by the tucking, and directly shake and retrieve the track to the landing, the chip that awaits measuring moves and is siphoned away when directly shaking pay-off track afterbody, get into next station, supply test assembly to test it. Compared with the prior art, the utility model has the advantages that in the vibration process of the direct vibration feeding track, the redundant chips at the two sides of the feeding channel are recovered from the discharging inclined plane and the discharging hole respectively, meanwhile, the air blowing pipe separates the adhered chips, the pressing pin separates the overlapped chips to be detected, and the suction nozzle on the turntable component can accurately suck the chips to be detected, thereby improving the production efficiency; the utility model discloses a set up duplex bit architecture, further improve raw tea efficiency. The utility model discloses can be used to in the chip test.
As a further limitation of the utility model, the test assembly includes the adjustable seat of high regulation about fixed mounting is on work platform, adjust and install the test box on the seat, the test box is installed a pair of test probe as positive, negative binding post, the test probe distributes about being to with the suction nozzle cooperation, and top test probe is L shape strip structure, and the below probe comprises the needle structure that sets up at rectangular form structure tip, the processing of suction nozzle tip is into the toper structure. During testing, the suction nozzle which sucks the chip to be tested at the previous station is rotated to the current station and moves downwards under the action of the pressing component, so that the bottom of the chip to be tested is in contact with the lower test probe, the upper test probe is in contact with the suction nozzle to form a loop, the chip to be tested is tested, the suction nozzle with a conical structure is in contact with the upper test probe in the descending process, slides upwards along the conical surface and keeps in contact with the side wall of the suction nozzle, and therefore the contact reliability in the testing process is guaranteed; meanwhile, by the test mode, the chip can be accurately tested, so that the type of the performance of the chip to be tested can be accurately judged, and the chip can be accurately delivered into the corresponding distribution box.
In order to make the motion of suction nozzle convenient and fast more, the carousel subassembly is including rotating the carousel of installing on work platform, a plurality of suction nozzles that can reciprocate have evenly been arranged on the carousel, the suction nozzle is fixed on the slider, the slider is connected at the tip that runs through the slide bar that the carousel set up, and slide bar periphery cover is equipped with reset spring, and be fixed with on the slide bar with reset spring complex round platform, reset spring one end is contradicted on the carousel, and the other end is contradicted on the round platform. During operation, the slide bar is pressed down through the pressing component, the suction nozzle is driven to move downwards, the chip to be tested is sucked, meanwhile, the chip to be tested is sent to the testing component to be tested for detection, and after the detection is completed, the slide bar rises under the action of the reset spring.
As a further limitation of the utility model, the pressing component comprises a bracket fixed on the working platform, a lifting cylinder is arranged on the bracket, a piston rod of the lifting cylinder penetrates through the bracket and is connected with a support, two ends of the support are respectively connected with a lower pressure head capable of moving up and down, the lower pressure head comprises a servo motor fixed on the support, a lower pressing block is sleeved on a rotating shaft of the servo motor, an inclined sliding groove is arranged on the periphery of the lower pressing block, pulleys are correspondingly arranged in the sliding grooves, the pulleys are arranged on the lower sliding block, a pair of pressure heads is arranged at the bottom of the lower sliding block, an L-shaped mounting plate is fixed at the bottom of the support, a slide rail is fixed on the vertical part of the mounting plate, a slide seat is arranged on the slide rail in a sliding way, the lower slider is fixed on the slide, be provided with the pressure spring on the mounting panel horizontal part, the other end of pressure spring is contradicted in lower briquetting bottom. During operation, the position of the lower pressure head is adjusted through the lifting air cylinder, the servo motor is controlled to move periodically, the sliding block moves downwards under the driving of the sliding groove matched with the pulley, the reciprocating motion is realized through the matched pressure spring, the two pressure heads can simultaneously realize material suction and test, and the production efficiency is further improved.
Drawings
Fig. 1 is a schematic structural diagram of the present invention.
Fig. 2 is a perspective view of the middle feeding assembly of the present invention.
Fig. 3 is a front view of the middle feeding assembly of the present invention.
Fig. 4 is a top view of the middle feeding assembly of the present invention.
Fig. 5 is the structural schematic diagram of the feeding track for middle and direct vibration of the utility model.
Fig. 6 is an enlarged view of a portion a in fig. 5.
Fig. 7 is a schematic structural view of the middle test assembly of the present invention.
Fig. 8 is a schematic view of the working states of the middle positive and negative connection terminals of the present invention.
Fig. 9 is a schematic view of the structure of the transfer tray assembly of the present invention.
Fig. 10 is an enlarged view at B in fig. 9.
Fig. 11 is a schematic structural view of the middle pressing assembly of the present invention.
Fig. 12 is a schematic view of the structure of the middle and lower pressing head and the support of the present invention.
Fig. 13 is a schematic view of the connection between the middle lower press head and the lower press block of the present invention.
The device comprises a working platform 1, a feeding assembly 2, a storage bin 201, a circular vibrating tray 202, a 203 straight vibrating feeding track, a 203a first flange, a 203b second flange, a 203c discharging hole, a 203d discharging inclined plane, a 203e notch, a 203f feeding plate, a 204 straight vibrating recovery track, an 205 gas blow pipe, a 206 press pin, a 3 testing assembly, a 301 adjusting seat, a 302 testing box, a 303 testing probe, a 4 turntable assembly, a 401 turntable, a 402 suction nozzle, a 403 slider, a 404 reset spring, a 405 circular truncated cone, a 406 sliding rod, a 5 pressing assembly, a 501 support, a 502 lifting cylinder, a 502a piston rod, a 503 support, a 504 pressing head, a 504a servo motor, a 504b pressing block, a 504c pulley, a 504d pressing block, a 504e sliding rail, a 504f mounting plate vertical part, a 504g sliding seat, a 504h pressing spring, a 504i mounting plate horizontal part, 504j, 6 part material box and 7 pressing head chips to be tested.
Detailed Description
The double-station chip testing sorter shown in fig. 1-13 comprises a pair of feeding assemblies 2, a pair of testing assemblies 3, a turntable assembly 4, a pressing assembly 5 and a pair of material distributing boxes 6 which are arranged on a working platform 1;
the feeding assembly 2 is used for conveying a chip 7 to be tested into the testing assembly 3, the feeding assembly 2 comprises a circular vibration tray 202 for receiving the chip 7 to be tested from the storage bin 201, a discharge port of the circular vibration tray 202 is butted with a straight vibration feeding track 203, a straight vibration recovery track 204 is arranged below the straight vibration feeding track 203, a discharge port of the straight vibration recovery track 204 is butted with the circular vibration tray 202, the tail end of the straight vibration feeding track 203 is butted with the turntable assembly 4, a suction nozzle 402 on the turntable assembly 4 sucks the chip 7 to be tested away, the straight vibration feeding track 203 comprises a feeding plate 203f, a first flange 203a is processed at the edge of the front end of the feeding plate 203f, a discharging inclined surface 203d is processed at the same side of the rear end of the feeding plate 203f and the first flange 203a, a discharging hole 203c is processed at the other side, a feeding channel is formed between the two sides, a second flange 203b connected with the first flange 203a is processed at one side of the feeding channel close to the, a notch 203e corresponding to the discharge hole 203c is formed in the second baffle 203b, an air blowing pipe 205 for blowing air towards the transition position of the front end and the rear end of the feeding plate 203f is arranged beside the feeding plate 203f, and a pressing pin 206 capable of adjusting the vertical height and limiting the height of the chip is arranged beside the feeding plate 203 f;
the testing component 3 is used for detecting a chip 7 to be tested, the testing component 3 comprises an adjusting seat 301 which is fixedly arranged on the working platform 1 and can adjust the vertical height, a testing box 302 is arranged on the adjusting seat 301, the testing box 302 is provided with a pair of testing probes 303 which are used as a positive wiring terminal and a negative wiring terminal, the testing probes 303 are distributed up and down and matched with a suction nozzle 402, an upper testing probe 303a is in an L-shaped strip structure, a lower testing probe 303b is composed of a needle-shaped structure arranged at the end part of the strip structure, and the end part of the suction nozzle 402 is processed into a conical structure;
the rotary table assembly 4 is used for taking out a chip 7 to be tested in the feeding assembly 2 and sending the chip to be tested into the testing assembly 3 for testing, and finally sending the chip to the material distribution box 6 for classification, the rotary table assembly 4 comprises a rotary table 401 rotatably installed on the working platform 1, a plurality of suction nozzles 402 capable of moving up and down are uniformly arranged on the rotary table 401, the suction nozzles 402 are fixed on a sliding block 403, the sliding block 403 is connected to the end part of a sliding rod 406 penetrating through the rotary table 401, a return spring 404 is sleeved on the periphery of the sliding rod 406, a circular table 405 matched with the return spring 404 is fixed on the sliding rod 406, one end of the return spring 404 is abutted against the rotary table 401;
the downward-pressing component 5 is used for controlling the suction nozzle 402 on the turntable component 4 to move up and down and sucking the chip 7 to be tested, the downward-pressing component 5 comprises a bracket 501 fixed on the working platform 1, a lifting cylinder 502 is installed on the bracket 501, a piston rod 503a of the lifting cylinder 502 passes through the bracket 501 and is connected with a support 503, two ends of the support 503 are respectively connected with a downward-pressing head 504 capable of moving up and down, the downward-pressing head 504 comprises a servo motor 504a fixed on the support 503, a lower pressing block 504b is sleeved on a rotating shaft of the servo motor 504a, an inclined sliding groove is formed in the periphery of the lower pressing block 504b, a pulley 504c is correspondingly arranged in the sliding groove, the pulley 504c is installed on a lower sliding block 504d, a pair of pressing heads 504j is installed at the bottom of the lower sliding block 504d, an L-shaped installation plate is fixed at the bottom of the support 503, a sliding, the lower sliding block 504d is fixed on the sliding base 504g, a pressure spring 504h is arranged on the horizontal part 504i of the mounting plate, and the other end of the pressure spring 504h abuts against the bottom of the lower pressing block 504 b;
the material distributing box 6 is used for realizing the classified collection of the detected chips.
When the utility model works, the chip 7 to be tested in the storage bin 201 is sent into the circular vibration material tray 202, the chip 7 to be tested is sent to the straight vibration material feeding track 203 under the action of the circular vibration material tray 202, the chip 7 to be tested moves forwards under the action of the first baffle edge 203a along the material feeding channel under the action of the straight vibration material feeding track 203, the chip 7 to be tested is arranged from the first baffle edge 203a, the chip 7 to be tested outside the material feeding channel area falls into the straight vibration material recovery track 204 from the discharging hole 203c, the chip 7 to be tested at the lower layer is ensured not to be blown away under the action of the air blowing pipe 205 under the action of the second baffle edge 203b, one part of the overlapped chips can be blown off and slide down from the discharging inclined plane 203d, one part which can not be blown off can be blocked by the pressing pin 206 and slide down into the straight vibration material recovery track 204, the chip 7 to be tested is sucked away by the suction nozzle 402 when moving to the tail part of the straight, for the testing component 3 to test it; the movement mode of the suction nozzle 402 is specifically as follows: the servo motor 504a controls the lower pressing block 504b to rotate, the lower sliding block 504d is driven by the pulley 504c to move downwards, the pressure head 505 is pushed to press the sliding rod 406 downwards, so that the suction nozzle 402 on the sliding block 403 is controlled to move downwards to suck the chip 7 to be tested, after the chip 7 to be tested is sucked, the servo motor 504a rotates reversely to reset the lower sliding block 504d, meanwhile, the sliding rod 406 also rises under the action of the reset spring 404 to drive the chip 7 to be tested to rise and enter a testing station, and the suction nozzle 402 is controlled to fall in the same way, because the pair of pressure heads 505 are matched on each lower sliding block 504d, the suction nozzle 402 on the station of the feeding assembly 2 and the suction nozzle 402 on the station of the testing assembly 3 can be controlled to act simultaneously, and therefore the; after entering the test assembly 3, the upper test probe 303 contacts the side wall of the suction nozzle 402, the lower test probe 303 contacts the chip 7 to be tested, so that a loop is formed, the test on the chip 7 to be tested is completed, after the test is completed, the turntable 401 is controlled to rotate to the specific material distribution box 6 according to the specific conditions of the chip, the suction nozzle 402 is controlled to discharge materials, and accurate material distribution is realized; the two feeding assemblies 2, the two testing assemblies 3 and the two material distributing boxes 6 can be produced simultaneously, so that the production efficiency is improved.
The present invention is not limited to the above embodiments, and based on the technical solutions disclosed in the present invention, those skilled in the art can make some replacements and transformations for some technical features without creative labor according to the disclosed technical contents, and these replacements and transformations are all within the protection scope of the present invention.
Claims (7)
1. A double-station chip testing separator is characterized by comprising a pair of feeding assemblies, a pair of testing assemblies, a turntable assembly, a pressing assembly and a pair of material distributing boxes, wherein the feeding assemblies, the testing assemblies, the turntable assembly, the pressing assembly and the material distributing boxes are arranged on a working platform;
the feeding assembly is used for conveying chips to be tested into the testing assembly, the feeding assembly comprises a circular vibration tray for receiving the chips to be tested from a storage bin, a discharge port of the circular vibration tray is butted with a straight vibration feeding rail, a straight vibration recovery rail is arranged below the straight vibration feeding rail, a discharge port of the straight vibration recovery rail is butted with the circular vibration tray, the tail end of the straight vibration feeding rail is butted with the rotary disc assembly and is used for a suction nozzle on the rotary disc assembly to suck the chips to be tested away, the straight vibration feeding rail comprises a feeding plate, a first flange is processed at the edge of the front end of the feeding plate, an unloading inclined plane is processed at the same side of the rear end of the feeding plate and the first flange, a discharging hole is processed at the other side of the feeding plate, a feeding channel is formed between the two sides, a second flange connected with the first flange is processed at one side of the feeding channel close to the unloading inclined plane, and a notch, an air blowing pipe used for blowing air towards the transition position of the front end and the rear end of the feeding plate is arranged beside the feeding plate, and a pressing pin capable of adjusting the vertical height and used for limiting the height of the chip is also arranged beside the feeding plate;
the test component is used for detecting a chip to be tested;
the turntable assembly is used for taking out the chip to be tested in the feeding assembly, sending the chip to be tested into the testing assembly for testing, and finally sending the chip to the material distribution box for classification;
the downward pressing component is used for controlling a suction nozzle on the turntable component to move up and down and sucking a chip to be tested;
the material distributing box is used for realizing classified collection of the detected chips.
2. The double-station chip testing and sorting machine according to claim 1, wherein the testing assembly comprises an adjusting seat which is fixedly installed on the working platform and can adjust the vertical height, a testing box is installed on the adjusting seat, and a pair of testing probes which are used as a positive wiring terminal and a negative wiring terminal are installed on the testing box.
3. The double-station chip testing and sorting machine according to claim 2, wherein the testing probes are distributed up and down and are matched with the suction nozzle, the upper testing probe is of an L-shaped strip structure, the lower testing probe is of a needle structure arranged at the end of the strip structure, and the end of the suction nozzle is processed into a conical structure.
4. The double-station chip testing and sorting machine according to claim 1, wherein the turntable assembly comprises a turntable rotatably mounted on the working platform, and a plurality of suction nozzles capable of moving up and down are uniformly arranged on the turntable.
5. The double-station chip testing and sorting machine according to claim 4, wherein the suction nozzle is fixed on a sliding block, the sliding block is connected to the end portion of a sliding rod penetrating through the turntable, a return spring is sleeved on the periphery of the sliding rod, a circular truncated cone matched with the return spring is fixed on the sliding rod, one end of the return spring abuts against the turntable, and the other end of the return spring abuts against the circular truncated cone.
6. The double-station chip testing and sorting machine according to claim 1, wherein the pressing assembly comprises a support fixed on the working platform, a lifting cylinder is mounted on the support, a piston rod of the lifting cylinder penetrates through the support and is connected with a support, and two ends of the support are respectively connected with a pressing head capable of moving up and down.
7. The double-station chip testing and sorting machine according to claim 6, wherein the lower pressing head comprises a servo motor fixed on a support, a lower pressing block is sleeved on a rotating shaft of the servo motor, an inclined sliding groove is formed in the periphery of the lower pressing block, a pulley is correspondingly arranged in the sliding groove and mounted on the lower sliding block, a pair of pressing heads is mounted at the bottom of the lower sliding block, an L-shaped mounting plate is fixed at the bottom of the support, a sliding rail is fixed on the vertical portion of the mounting plate, a sliding seat is slidably arranged on the sliding rail, the lower sliding block is fixed on the sliding seat, a pressure spring is arranged on the horizontal portion of the mounting plate, and the other end of the pressure spring abuts.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201920518897.5U CN210125566U (en) | 2019-04-17 | 2019-04-17 | Double-station chip testing and sorting machine |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201920518897.5U CN210125566U (en) | 2019-04-17 | 2019-04-17 | Double-station chip testing and sorting machine |
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| CN201920518897.5U Expired - Fee Related CN210125566U (en) | 2019-04-17 | 2019-04-17 | Double-station chip testing and sorting machine |
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Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109909180A (en) * | 2019-04-17 | 2019-06-21 | 扬州爱迪秀自动化科技有限公司 | A kind of double-station chip testing sorting machine |
| CN111948513A (en) * | 2020-07-24 | 2020-11-17 | 武汉锐科光纤激光技术股份有限公司 | Chip temperature control equipment |
| CN112002647A (en) * | 2020-10-28 | 2020-11-27 | 四川立泰电子有限公司 | Automatic pin cutting and testing integrated machine for semiconductor electronic device and application thereof |
| CN112058713A (en) * | 2020-11-12 | 2020-12-11 | 南京派格测控科技有限公司 | Chip testing method and device |
| CN114082663A (en) * | 2022-01-18 | 2022-02-25 | 四川明泰电子科技有限公司 | Integrated chip tube body and pin detection system |
| CN114603265A (en) * | 2022-05-10 | 2022-06-10 | 常州市金锤隆锻造有限公司 | Silicon wafer cutting equipment and method for accurately cutting wafer |
| CN114779051A (en) * | 2022-04-29 | 2022-07-22 | 深圳格芯集成电路装备有限公司 | Chip pressure equipment |
| CN115892589A (en) * | 2022-05-11 | 2023-04-04 | 深圳市三一联光智能设备股份有限公司 | Screening apparatus |
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| CN116213304A (en) * | 2023-03-22 | 2023-06-06 | 深圳市立能威微电子有限公司 | Sorting method and system for power supply chips |
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Cited By (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109909180A (en) * | 2019-04-17 | 2019-06-21 | 扬州爱迪秀自动化科技有限公司 | A kind of double-station chip testing sorting machine |
| CN111948513A (en) * | 2020-07-24 | 2020-11-17 | 武汉锐科光纤激光技术股份有限公司 | Chip temperature control equipment |
| CN112002647A (en) * | 2020-10-28 | 2020-11-27 | 四川立泰电子有限公司 | Automatic pin cutting and testing integrated machine for semiconductor electronic device and application thereof |
| CN112058713A (en) * | 2020-11-12 | 2020-12-11 | 南京派格测控科技有限公司 | Chip testing method and device |
| CN114082663A (en) * | 2022-01-18 | 2022-02-25 | 四川明泰电子科技有限公司 | Integrated chip tube body and pin detection system |
| CN114779051A (en) * | 2022-04-29 | 2022-07-22 | 深圳格芯集成电路装备有限公司 | Chip pressure equipment |
| CN114779051B (en) * | 2022-04-29 | 2023-06-20 | 深圳格芯集成电路装备有限公司 | Chip press-testing device |
| CN114603265A (en) * | 2022-05-10 | 2022-06-10 | 常州市金锤隆锻造有限公司 | Silicon wafer cutting equipment and method for accurately cutting wafer |
| CN115892589A (en) * | 2022-05-11 | 2023-04-04 | 深圳市三一联光智能设备股份有限公司 | Screening apparatus |
| CN115892589B (en) * | 2022-05-11 | 2023-09-22 | 深圳市三一联光智能设备股份有限公司 | Screening apparatus |
| CN116142746A (en) * | 2023-03-21 | 2023-05-23 | 佛山市通宝华龙控制器有限公司 | Automatic overturning and conveying device for bimetal discs |
| CN116142746B (en) * | 2023-03-21 | 2023-08-25 | 佛山市通宝华龙控制器有限公司 | Automatic overturning and conveying device for bimetal discs |
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