CN109909180A - A kind of double-station chip testing sorting machine - Google Patents

A kind of double-station chip testing sorting machine Download PDF

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Publication number
CN109909180A
CN109909180A CN201910307263.XA CN201910307263A CN109909180A CN 109909180 A CN109909180 A CN 109909180A CN 201910307263 A CN201910307263 A CN 201910307263A CN 109909180 A CN109909180 A CN 109909180A
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CN
China
Prior art keywords
chip
measured
rotary disc
disc assembly
suction nozzle
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Pending
Application number
CN201910307263.XA
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Chinese (zh)
Inventor
莫健
陆军
陈尔军
郭文
吉俊
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Yangzhou Eddie Show Automation Technology Co Ltd
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Yangzhou Eddie Show Automation Technology Co Ltd
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Application filed by Yangzhou Eddie Show Automation Technology Co Ltd filed Critical Yangzhou Eddie Show Automation Technology Co Ltd
Priority to CN201910307263.XA priority Critical patent/CN109909180A/en
Publication of CN109909180A publication Critical patent/CN109909180A/en
Pending legal-status Critical Current

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Abstract

The invention discloses a kind of double-station chip testing sorting machines, including a pair of of loading assemblies, a pair of of test suite, rotary disc assembly, pushing component and a pair of of the Riving Box being mounted on workbench;Loading assemblies are chip to be measured to be delivered in test suite;Test suite is to detect chip to be measured;Rotary disc assembly is finally sent into Riving Box and classifies to take out and send by the chip to be measured in loading assemblies to testing in test suite;Component is pushed to move up and down to control the suction nozzle on rotary disc assembly, draw chip to be measured;Riving Box carries out categorised collection to the chip after realizing detection, straight shake feeding track in the present invention is during vibration, gas blow pipe separates the chip being sticked together, pressing separates the chip to be measured being superimposed, guarantee that the suction nozzle on rotary disc assembly can accurately draw chip to be measured, to improve production efficiency, can be used in chip testing.

Description

A kind of double-station chip testing sorting machine
Technical field
The present invention relates to a kind of sorting machine, in particular to a kind of chip testing sorting machine.
Background technique
It to the screening of qualified chip is not completed using Wafer Probe platform at present.Smooth Wafer Probe is by showing What micro mirror, probe base, workbench, wafer-supporting platform, electrician's system and interface display formed, it completes after its collocation tester to wafer Electric parameters testing and functional test.For this Wafer Probe platform because of the limitation of its probe and striking mechanism, electrical parameter can only It is set as two grades (qualified product and rejected product, rejected product beat red dot), electrical parameter does not conform to lower than can only being used as setting target Lattice product are classified as waste material, and substantial portion rejected product can be classified as next shelves (non-defective unit or middle top grade), and the unreasonable of detection device is made At the waste and increased costs of product.Secondly, since it is desired that changing wafer manually and calibrating and wafer is flat in operating rate Face is mobile to need X, Y-axis with dynamic etc. limitation, and leading to it, working efficiency is not high per hour.Again, it is needed after wafer test is complete It is cut into chip, is possible to will cause the damage of chip in cutting process, needs to screen again two times after cutting, leads to increased costs It is reduced with efficiency.
A kind of chip testing classifier device people is disclosed in the prior art, Publication No.: 106938255 A of CN, no Foot place is that feeding will appear the phenomenon that chip is superimposed, to influence rotary disc assembly absorption chip, influence to process Efficiency.
Summary of the invention
The object of the present invention is to provide a kind of double-station chip testing sorting machines, by the straight shake feeding rail for designing new construction Road so that chip guarantees the continuity of chip conveying when directly shake feeding track is mobile, and improves detection efficiency.
The object of the present invention is achieved like this: a kind of double-station chip testing sorting machine, including is mounted on workbench On a pair of of loading assemblies, a pair of of test suite, rotary disc assembly, push component and a pair of of Riving Box;
For the loading assemblies chip to be measured to be delivered in test suite, the loading assemblies include receiving to come from storage bin The round shake charging tray of interior chip to be measured, the round straight shake feeding track of discharge port docking for shaking charging tray, straight shake feeding track Lower section is provided with straight shake recycling track, the round shake charging tray of straight shake recycling track discharge port docking, the straight end for shaking feeding track with Rotary disc assembly docking, siphons away chip to be measured for the suction nozzle on rotary disc assembly, the straight shake feeding track includes delivery sheet, described Be machined with the first rib at the front edge of delivery sheet, the delivery sheet rear end with the first rib is ipsilateral is machined with discharging inclined-plane, The other side is machined with dumping pit, and feeding passage is formed between two sides, and feeding passage is machined with connection close to the side on discharging inclined-plane Second rib of the first rib is provided with notch corresponding with the dumping pit on the second rib, is provided with by the delivery sheet To the gas blow pipe blown towards delivery sheet front and rear end transition position, adjustable upper-lower height is additionally provided with by the delivery sheet The pressing to limit chip height;
The test suite is to detect chip to be measured;
The rotary disc assembly is finally sent to take out and send by the chip to be measured in loading assemblies to testing in test suite Enter Riving Box to classify;
The pushing component moves up and down to control the suction nozzle on rotary disc assembly, draws chip to be measured;
The Riving Box carries out categorised collection to the chip after realizing detection.
When the invention works, the chip to be measured in storage bin is sent into round shake charging tray, will under the action of circle shakes charging tray Chip to be measured is sent to straight shake feeding track, and chip to be measured is made along feeding passage in the first rib under the action of directly shake feeding track It travels forward under, chip to be measured is arranged since the first rib, and the chip to be measured other than feeding passage region is fallen from dumping pit Entering straight shake recycling track, the effect of the second rib ensure that the chip to be measured of lower layer will not be blown away under the action of gas blow pipe, Chip a part of overlapping, which can be blown off from discharging inclined-plane, to be slid, and blowing a part that do not fall can be blocked by pressing, and slide into straight Shake recycling track, chip motion to be measured is siphoned away to when directly shaking feeding track tail portion by suction nozzle, into next station, for test Component tests it.Compared with prior art, the beneficial effects of the present invention are the straight shake feeding track in the present invention exists During vibration, the extra chip positioned at feeding passage two sides is recovered from discharging inclined-plane and dumping pit whereabouts respectively, meanwhile, it blows Tracheae separates the chip being sticked together, and pressing separates the chip to be measured being superimposed, and guarantees the suction on rotary disc assembly Mouth can accurately draw chip to be measured, to improve production efficiency;The present invention is further increased by the way that duplexing bit architecture is arranged Raw tea efficiency.The present invention can be used in chip testing.
Further limited as of the invention, the test suite include be fixedly mounted on it is adjustable on workbench The adjustment seat of upper-lower height is saved, testing cassete is installed in the adjustment seat, testing cassete is equipped with a pair of as positive and negative connecting terminal Test probe, the test probe goes to upper and lower distribution, and cooperates with suction nozzle, and it is L shape strip structure that probe is tested in top, under Square probe is made of the acicular texture that strip structure end is arranged in, and pyramidal structure is processed into the suction nozzle end.When test, The suction nozzle that a upper station has drawn chip to be measured goes to current station, moves downward under the action of pushing component, so as to be measured The bottom of chip is contacted with lower section test probe, and top test probe is contacted with suction nozzle, is formed into a loop, is realized to chip to be measured Test, the suction nozzle of pyramidal structure contacts during decline with top test probe, along tapered surface upward sliding, holding and suction nozzle The contact of side wall, to guarantee the reliability contacted in test process;Simultaneously by this test mode, it can be achieved that the essence of chip Really test, so as to be accurately judged to classification locating for chip performance to be measured, so that it can be accurately delivered to corresponding sub-material In box.
In order to enable the movement of suction nozzle is more convenient, the rotary disc assembly includes being rotatably installed on workbench Turntable has been evenly arranged several suction nozzles moving up and down on the turntable, and the suction nozzle is fixed on sliding block, and the sliding block connects It connects in the end of the slide bar through turntable setting, slide bar periphery is arranged with reset spring, and is fixed on slide bar and reset spring The rotary table of cooperation, described reset spring one end contradict on turntable, and the other end contradicts on rotary table.When work, pass through pushing group Part pushes slide bar, drives suction nozzle to move downward, draws chip to be measured while chip to be measured being sent to be detected into test suite, completes Afterwards, slide bar rises under the action of reset spring.
It is further limited as of the invention, the pushing component includes the bracket being fixed on workbench, the branch Lifting cylinder is installed, the piston rod of the lifting cylinder passes through bracket and connecting support, and the both ends of support are separately connected on frame There is the push-down head that can be moved up and down, the push-down head includes fixed servo motor on the support, is covered in the shaft of servo motor Equipped with lower lock block, the periphery of lower lock block offers inclined sliding slot, and pulley is correspondingly arranged in the sliding slot, and pulley is mounted on down On sliding block, the bottom of sliding block is equipped with a pair of of pressure head, and the bottom of the support is fixed with L-shaped installing plate, and the mounting plate is perpendicular Sliding rail is fixed in straight portion, sliding is provided with slide on sliding rail, and the sliding block is fixed on slide, the mounting plate horizontal part On be provided with pressure spring, the other end of pressure spring is contradicted in lower lock block bottom.When work, the position of push-down head is regulated by lifting cylinder It sets, in periodically control servo motor movement, cooperates pulley driving sliding block to move downward by sliding slot, cooperation pressure spring is realized It moves back and forth, two pressure heads can be achieved at the same time suction and test, further increase production efficiency.
Detailed description of the invention
Fig. 1 is schematic structural view of the invention.
Fig. 2 is loading assemblies perspective view in the present invention.
Fig. 3 is loading assemblies front view in the present invention.
Fig. 4 is loading assemblies top view in the present invention.
Fig. 5 is directly to shake feeding track structural schematic diagram in the present invention.
Fig. 6 is enlarged drawing at A in Fig. 5.
Fig. 7 is test suite structural schematic diagram in the present invention.
Fig. 8 is positive and negative connecting terminal working state schematic representation in the present invention.
Fig. 9 is turntable component structure diagram of the present invention.
Enlarged drawing at B in Figure 10 Fig. 9.
Figure 11 is to push component structure diagram in the present invention.
Figure 12 is push-down head and bearing structure illustration in the present invention.
Figure 13 is push-down head and lower lock block connection schematic diagram in the present invention.
Wherein, 1 workbench, 2 loading assemblies, 201 storage bins, 202 round shake charging trays, 203 straight shake feeding tracks, 203a First rib, the second rib of 203b, 203c dumping pit, 203d discharging inclined-plane, 203e notch, 203f delivery sheet, 204 straight shake recycling Track, 205 gas blow pipes, 206 pressings, 3 test suites, 301 adjustment seats, 302 testing cassetes, 303 test probes, 4 rotary disc assemblies, 401 turntables, 402 suction nozzles, 403 sliding blocks, 404 reset springs, 405 rotary tables, 406 slide bars, 5 push component, 501 brackets, 502 liftings Cylinder, 502a piston rod, 503 supports, 504 push-down heads, 504a servo motor, 504b lower lock block, 504c pulley, 504d glide Block, 504e sliding rail, 504f mounting plate vertical portion, 504g slide, 504h pressure spring, 504i mounting plate horizontal part, 504j pressure head, 6 points Magazine, 7 chips to be measured.
Specific embodiment
A kind of double-station chip testing sorting machine as shown in figures 1-13, including in a pair for being mounted on workbench 1 Expect component 2, a pair of of test suite 3, rotary disc assembly 4, push component 5 and a pair of of Riving Box 6;
For loading assemblies 2 chip 7 to be measured to be delivered in test suite 3, loading assemblies 2 include receiving to come from storage bin 201 The round shake charging tray 202 of interior chip to be measured 7, the straight shake feeding track 203 of discharge port docking of circle shake charging tray 202, directly shakes feeding The lower section of track 203 is provided with straight shake recycling track 204, straight to shake the round shake charging tray 202 of recycling 204 discharge port of track docking, directly The end of shake feeding track 203 is docked with rotary disc assembly 4, siphons away chip 7 to be measured for the suction nozzle 402 on rotary disc assembly 4, straight to shake Feeding track 203 includes delivery sheet 203f, is machined with the first rib 203a, delivery sheet 203f at the front edge of delivery sheet 203f Rear end with the first rib 203a is ipsilateral is machined with discharging inclined-plane 203d, the other side is machined with dumping pit 203c, is formed between two sides Feeding passage, feeding passage are machined with the second rib 203b of the first rib 203a of connection close to the side of discharging inclined-plane 203d, It is provided with notch 203e corresponding with dumping pit 203c on second rib 203b, is provided with by delivery sheet 203f to towards feeding The gas blow pipe 205 that plate 203f front and rear end transition position is blown is additionally provided with the use of adjustable upper-lower height by delivery sheet 203f To limit the pressing 206 of chip height;
For test suite 3 to detect to chip 7 to be measured, test suite 3 is adjustable on workbench 1 including being fixedly mounted on The adjustment seat 301 of upper-lower height is saved, testing cassete 302 is installed in adjustment seat 301, testing cassete 302 is equipped with a pair of as positive and negative The test probe 303 of connecting terminal, test probe 303 goes to upper and lower distribution, and cooperates with suction nozzle 402, and probe 303a is tested in top For L shape strip structure, lower section test probe 303b is made of the acicular texture that strip structure end is arranged in, 402 end of suction nozzle It is processed into pyramidal structure in portion;
Rotary disc assembly 4 is finally sent to take out and be sent to testing in test suite 3 by the chip to be measured 7 in loading assemblies 2 Enter Riving Box 6 to classify, rotary disc assembly 4 includes the turntable 401 being rotatably installed on workbench 1, uniform cloth on turntable 401 Several suction nozzles moving up and down 402 are equipped with, suction nozzle 402 is fixed on sliding block 403, and sliding block 403 is connected to be set through turntable 401 The end for the slide bar 406 set, 406 periphery of slide bar are arranged with reset spring 404, and are fixed on slide bar 406 and reset spring 404 The rotary table 405 of cooperation, 404 one end of reset spring contradict on turntable 401, and the other end contradicts on rotary table 405;
It pushes component 5 to move up and down to control the suction nozzle 402 on rotary disc assembly 4, draw chip 7 to be measured, pushing component 5 includes The bracket 501 being fixed on workbench 1 is equipped with lifting cylinder 502, the piston rod 503a of lifting cylinder 502 on bracket 501 Across bracket 501 and connecting support 503, the both ends of support 503 are connected separately with the push-down head 504 that can be moved up and down, push-down head 504 include the servo motor 504a being fixed on support 503, is set with lower lock block 504b in the shaft of servo motor 504a, under The periphery of briquetting 504b offers inclined sliding slot, and pulley 504c is correspondingly arranged in sliding slot, and pulley 504c is mounted on sliding block On 504d, the bottom of sliding block 504d is equipped with a pair of of pressure head 504j, and the bottom of support 503 is fixed with L-shaped installing plate, mounting plate Sliding rail 504e is fixed on the 504f of vertical portion, sliding is provided with slide 504g on sliding rail 504e, and sliding block 504d is fixed on slide On 504g, pressure spring 504h is provided on mounting plate horizontal part 504i, the other end of pressure spring 504h is contradicted in the bottom lower lock block 504b;
Riving Box 6 carries out categorised collection to the chip after realizing detection.
When the invention works, the chip to be measured 7 in storage bin 201 is sent into round shake charging tray 202, shakes charging tray 202 in circle Under the action of chip 7 to be measured is sent to straight shake feeding track 203, chip 7 to be measured is under the action of directly shake feeding track 203 along sending Material channel travels forward under the first rib 203a effect, and chip 7 to be measured is arranged since the first rib 203a, feeding passage area Chip to be measured 7 other than domain falls into straight shake recycling track 204 from dumping pit 203c, and the effect of the second rib 203b, which ensure that, is blowing The chip to be measured 7 of lower layer will not be blown away under the action of tracheae 205, and chip a part of overlapping can be blown off from discharging inclined-plane 203d slides, and blowing a part that do not fall can be blocked by pressing 206, and slides into straight shake recycling track 204, and chip 7 to be measured moves It is siphoned away to when directly shaking 203 tail portion of feeding track by suction nozzle 402, into next station, it is surveyed for test suite 3 Examination;The motion mode of suction nozzle 402 specifically: lower lock block 504b rotation is controlled by servo motor 504a, cooperates pulley 504c band Dynamic sliding block 504d is moved downward, and pressure head 505 is pushed to push slide bar 406, so that the suction nozzle 402 controlled on sliding block 403 is transported downwards Dynamic that chip 7 to be measured is sucked, after chip 7 to be measured is sucked, servo motor 504a is inverted so that sliding block 504d resets, meanwhile, slide bar 406 also rise under the action of reset spring 404, drive chip 7 to be measured to rise, into test station, pass through same mode It controls suction nozzle 402 to decline, due to being equipped with a pair of of pressure head 505 on each sliding block 504d, loading assemblies 2 can be controlled simultaneously Suction nozzle 402 on 3 station of suction nozzle 402 and test suite on station moves at the same time, to substantially increase production efficiency;Into After test suite 3, top tests probe 303 and contacts 402 side wall of suction nozzle, and 303 contact measured chip 7 of probe is tested in lower section, thus Forming circuit completes the test to chip 7 to be measured, after the completion of test, controls turntable 401 according to the concrete condition of chip and goes to tool After body Riving Box 6,402 blanking of suction nozzle is controlled, realizes accurate sub-material;Two loading assemblies 2, two test suites 3, two Riving Boxes 6 can It is produced simultaneously, improves production efficiency.
The present invention is not limited to the above embodiments, on the basis of technical solution disclosed by the invention, the skill of this field For art personnel according to disclosed technology contents, one can be made to some of which technical characteristic by not needing creative labor A little replacements and deformation, these replacements and deformation are within the scope of the invention.

Claims (7)

1. a kind of double-station chip testing sorting machine, which is characterized in that including be mounted on workbench a pair of of loading assemblies, A pair of of test suite, rotary disc assembly push component and a pair of of Riving Box;
For the loading assemblies chip to be measured to be delivered in test suite, the loading assemblies include receiving to come from storage bin The round shake charging tray of interior chip to be measured, the round straight shake feeding track of discharge port docking for shaking charging tray, straight shake feeding track Lower section is provided with straight shake recycling track, the round shake charging tray of straight shake recycling track discharge port docking, the straight end for shaking feeding track with Rotary disc assembly docking, siphons away chip to be measured for the suction nozzle on rotary disc assembly, the straight shake feeding track includes delivery sheet, described Be machined with the first rib at the front edge of delivery sheet, the delivery sheet rear end with the first rib is ipsilateral is machined with discharging inclined-plane, The other side is machined with dumping pit, and feeding passage is formed between two sides, and feeding passage is machined with connection close to the side on discharging inclined-plane Second rib of the first rib is provided with notch corresponding with the dumping pit on the second rib, is provided with by the delivery sheet To the gas blow pipe blown towards delivery sheet front and rear end transition position, adjustable upper-lower height is additionally provided with by the delivery sheet The pressing to limit chip height;
The test suite is to detect chip to be measured;
The rotary disc assembly is finally sent to take out and send by the chip to be measured in loading assemblies to testing in test suite Enter Riving Box to classify;
The pushing component moves up and down to control the suction nozzle on rotary disc assembly, draws chip to be measured;
The Riving Box carries out categorised collection to the chip after realizing detection.
2. a kind of double-station chip testing sorting machine according to claim 1, which is characterized in that the test suite Adjustment seat including the adjustable upper-lower height being fixedly mounted on workbench is equipped with testing cassete in the adjustment seat, surveys Examination box is equipped with a pair of test probe as positive and negative connecting terminal.
3. a kind of double-station chip testing sorting machine according to claim 2, which is characterized in that the test probe is in Upper and lower distribution, and cooperate with suction nozzle, it is L shape strip structure that probe is tested in top, and lower section probe is by being arranged in strip structure end The acicular texture in portion forms, and pyramidal structure is processed into the suction nozzle end.
4. a kind of double-station chip testing sorting machine according to claim 1, which is characterized in that the rotary disc assembly includes The turntable being rotatably installed on workbench has been evenly arranged several suction nozzles moving up and down on the turntable.
5. a kind of double-station chip testing sorting machine according to claim 4, which is characterized in that the suction nozzle is fixed on cunning On block, the sliding block is connected to the end of the slide bar through turntable setting, and slide bar periphery is arranged with reset spring, and solid on slide bar Surely there is the rotary table with reset spring cooperation, described reset spring one end contradicts on turntable, and the other end contradicts on rotary table.
6. a kind of double-station chip testing sorting machine according to claim 1, which is characterized in that the pushing component includes The bracket being fixed on workbench, lifting cylinder is equipped on the bracket, and the piston rod of the lifting cylinder passes through bracket And connecting support, the both ends of support are connected separately with the push-down head that can be moved up and down.
7. a kind of double-station chip testing sorting machine according to claim 6, which is characterized in that the push-down head includes solid Determine servo motor on the support, is set with lower lock block in the shaft of servo motor, the periphery of lower lock block offers inclined cunning Slot is correspondingly arranged on pulley in the sliding slot, and pulley is mounted on sliding block, and the bottom of sliding block is equipped with a pair of of pressure head, institute The bottom for stating support is fixed with L-shaped installing plate, and sliding rail is fixed on the mounting plate vertical portion, and sliding is provided with cunning on sliding rail Seat, the sliding block are fixed on slide, and pressure spring is provided on the mounting plate horizontal part, and the other end conflict of pressure spring is pushing Block bottom.
CN201910307263.XA 2019-04-17 2019-04-17 A kind of double-station chip testing sorting machine Pending CN109909180A (en)

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CN111346831A (en) * 2019-07-04 2020-06-30 苏州埃尔森自动化设备有限公司 Semiconductor detection device
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CN208135372U (en) * 2018-03-28 2018-11-23 上海安稷实业有限公司 Vibrating disk air blowing material all in one piece mechanism
CN208199591U (en) * 2018-05-18 2018-12-07 昆山市高士达自动化技术有限公司 A kind of general vibrating disk of feeding track outlet with angle
CN109174701A (en) * 2018-10-12 2019-01-11 江苏信息职业技术学院 A kind of IC chip test sorting unit and its working method
CN109502074A (en) * 2018-12-19 2019-03-22 华兆鼎泰科技(天津)有限公司 Rotary type tower detects radium-shine braid all-in-one machine
CN210125566U (en) * 2019-04-17 2020-03-06 扬州爱迪秀自动化科技有限公司 Double-station chip testing and sorting machine

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CN111346831A (en) * 2019-07-04 2020-06-30 苏州埃尔森自动化设备有限公司 Semiconductor detection device
CN111352017A (en) * 2020-03-08 2020-06-30 邱贤春 Semiconductor chip detection device
CN111570303A (en) * 2020-05-22 2020-08-25 李秀碧 Chip screening equipment
CN111842180A (en) * 2020-07-16 2020-10-30 四川中光防雷科技股份有限公司 Circulator bag-measuring integrated machine
CN113634516A (en) * 2021-10-13 2021-11-12 江苏煜晶光电科技有限公司 Semiconductor intellectual detection system structure
CN113634516B (en) * 2021-10-13 2021-12-10 江苏煜晶光电科技有限公司 Semiconductor intellectual detection system structure
CN114950996A (en) * 2022-06-10 2022-08-30 晶太集成电路(台州)有限公司 Device and method for screening industrial-grade memory chips
CN114950996B (en) * 2022-06-10 2024-02-23 晶太集成电路(台州)有限公司 Device and method for screening industrial-grade memory chips
CN115327350A (en) * 2022-09-13 2022-11-11 江苏芯安集成电路设计有限公司 Chip testing sorter
CN115327350B (en) * 2022-09-13 2023-08-25 江苏芯安集成电路设计有限公司 Chip test classifier
CN116605639A (en) * 2023-07-19 2023-08-18 江苏海纳电子科技有限公司 Material receiving equipment for chip test
CN116605639B (en) * 2023-07-19 2023-09-12 江苏海纳电子科技有限公司 Material receiving equipment for chip test

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