CN208224437U - A kind of automatic IC T test fixture adapting to a variety of PCBA - Google Patents
A kind of automatic IC T test fixture adapting to a variety of PCBA Download PDFInfo
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- CN208224437U CN208224437U CN201820730289.6U CN201820730289U CN208224437U CN 208224437 U CN208224437 U CN 208224437U CN 201820730289 U CN201820730289 U CN 201820730289U CN 208224437 U CN208224437 U CN 208224437U
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- 238000012360 testing method Methods 0.000 title claims abstract description 82
- RVCKCEDKBVEEHL-UHFFFAOYSA-N 2,3,4,5,6-pentachlorobenzyl alcohol Chemical compound OCC1=C(Cl)C(Cl)=C(Cl)C(Cl)=C1Cl RVCKCEDKBVEEHL-UHFFFAOYSA-N 0.000 title claims abstract description 38
- 239000000523 sample Substances 0.000 claims abstract description 56
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims abstract description 10
- 238000004519 manufacturing process Methods 0.000 abstract description 6
- 239000011159 matrix material Substances 0.000 abstract description 4
- -1 pedestal Chemical compound 0.000 abstract 1
- 238000005516 engineering process Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 238000011990 functional testing Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000013102 re-test Methods 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
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Abstract
A kind of automatic IC T test fixture adapting to a variety of PCBA, including pedestal, bracket, cylinder, connecting rod, test board, probe, elastomeric element and support frame, pedestal is equipped with bracket and support frame, PCBA is placed on the support frame, holder part above face support frame installs cylinder, and cylinder connect with test board by connecting rod and test board can be driven to move up and down, and the probe of lattice arrangement is installed on test board bottom surface, elastomeric element is equipped between probe and test board, test fixture is connect with computer.The lifting of matrix form probe is controlled by intelligent automation, to realize versatility and reusable property to all PCBA test, does not have to be directed to corresponding PCBA custom fabricated jig again.The time for reducing test fixture manufacture, test period is shortened, the input cost of test fixture is further reduced, saves monetary cost and time cost.
Description
Technical field
The utility model relates to printed circuit board test technical field, in particular to a kind of automation for adapting to a variety of PCBA
ICT test fixture.
Background technique
With advances in technology and develop, the type of electronic product is more and more, and the core of electronic product is PCBA board.
One good product must have a good PCBA board, thus need to each piece of PCBA will strict inspection, guarantee it is each
Block PCBA board is all good.
In order to detect the quality of PCBA board, many new technologies are invented, ICT (automatic on-line detector) is exactly wherein
One kind.ICT, that is, automatic on-line tester is PCBA (the Printed-Circuit Board of hyundai electronics enterprise indispensability
Assembly, printed circuit-board assembly) production test equipment, ICT use scope is wide, and measurement accuracy is high, to what is detected
Problem instruction is clear, is very easy to the general worker of electronic technology level handles problematic PCBA.
ICT Test be mainly test probe contact PCB layout come out test point come detect PCBA open lines,
The welding situation of short-circuit, all parts, can be divided into open test, short-circuit test, resistance test, capacity measurement, Test Diode,
Other general and specific components neglected loading, misloading, the parameter values such as triode test, field-effect tube test, the test of IC pin are inclined
Even weldering, wiring board open the failures such as short circuit for difference, solder joint, and are which components by failure or open that short circuit is located at which point accurately tells use
There is higher recognition capability at family to the welding test of component.
ICT test is divided into flying needle ICT and needle bed ICT.Flying needle ICT advantage is to be not required to production jig, and the program development time is short,
The disadvantage is that single-board testing speed is slow, is not suitable for high-volume and tests.Needle bed-type ICT can carry out analog device function and digital device is patrolled
Functional test is collected, fault coverage is high, but need to make dedicated needle bed fixture, jig production and program development week to every kind of veneer
Phase is long.
Utility model content
To overcome problems of the prior art, the utility model provides a kind of automation for adapting to a variety of PCBA
ICT test fixture.
The technical solution adopted by the utility model to solve its technical problems is that: this kind adapts to the automation of a variety of PCBA
ICT test fixture, including pedestal, bracket, cylinder, connecting rod, test board, probe, elastomeric element and support frame, pedestal are equipped with
Bracket and support frame, PCBA are placed on the support frame, and the holder part above face support frame installs cylinder, and cylinder passes through connection
Bar connect with test board and test board can be driven to move up and down, and the probe of lattice arrangement is installed on test board bottom surface, probe and survey
Elastomeric element is equipped between test plate (panel), test fixture is connect with computer.
Further, the elastomeric element is spring.
Further, the bottom surface of the test board corresponds to probe and is equipped with the lattice arrangement blind hole that Open Side Down, spring
Blind hole top is fixed in one end, and the upper part of the other end linking probe of spring, probe is located in blind hole.
Further, the bottom surface of the test board corresponds to probe equipped with the lattice arrangement blind hole that Open Side Down, in blind hole
The sleeve of protrusion test board bottom surface is installed, blind hole top is fixed in one end of spring, the other end linking probe of spring,
The upper part of probe is located in sleeve.
Further, the probe is arranged into a rectangular array.
Further, the probe is arranged at circular array.
Further, the spacing of adjacent two probe is 1.27 millimeters.
To sum up, the above-mentioned technical proposal of the utility model has the beneficial effect that:
Because every kind of PCBA veneer requires to make dedicated needle bed fixture, the production needs of these jigs disappear needle bed-type ICT
The investment of time-consuming and financial resources, the utility model realize the versatility of jig, and may be reused, and do not have to again be every kind of PCBA
Jig is all customized, jig input cost is saved, shortens the development cycle.
Probe is made into close matrix, the elastic construction of spring-like is connected behind probe, jig slowly pushes, slowly
Contact PCBA, wait probes completely attach to PCBA after, which probe of Auto-Sensing touches test point, which is not exposed to
Test point, the connected computer control of jig, no matter which type of the size shape of PCBA is in this way, and how are measure-point amount and position
Variation, can carry out ICT test using same set of jig.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of the utility model；
Fig. 2 is the partial enlarged view for testing board blind hole position embodiment one；
Fig. 3 is the partial enlarged view for testing board blind hole position embodiment two；
Fig. 4 is the first embodiment view of probe arrangement on test board；
Fig. 5 is the second embodiment view of probe arrangement on test board；
Fig. 6 is jig work flow diagram.
In figure:
1 pedestal, 2 brackets, 3 cylinders, 4 connecting rods, 5 test boards, 6 probes, 7 springs, 8 support frames, 9 computers, 10 blind holes, 11
Sleeve.
Specific embodiment
It is described in detail below in conjunction with feature and principle of the attached drawing 1- Fig. 5 to the utility model, illustrated embodiment is only used
In explaining the utility model, the protection scope of the utility model is not limited with this.
As shown in Figure 1, the utility model mainly include pedestal 1, bracket 2, cylinder 3, connecting rod 4, test board 5, probe 6,
8 several major of elastomeric element and support frame.Wherein, pedestal 1 is equipped with bracket 2 and support frame 8, and support frame 8 is used to support placement
PCBA.The bottom end of bracket 2 is fixed on pedestal 1, and top is higher than support frame 8,2 part of the bracket installation of 8 top of face support frame
It is fixed with cylinder 3.
Cylinder 3 connect with test board 5 by connecting rod 4 and test board 5 can be driven to move up and down, and tests when cylinder 3 drives
When plate 5 moves down, probe 6 is also moved down and gradually close to test board 5.The probe 6 of lattice arrangement is installed on test board 5
Bottom surface is equipped with elastomeric element between probe 6 and test board 5, elastomeric element can also be pushed for protecting probe 6 in probe 6
When prevent from damaging the part on PCBA or PCBA by pressure.Test fixture is connect with computer 9, and jig measurement data can be transmitted to computer
9.Control module can control the pushing of probe 6 and lift, and judge whether probe 6 touches the test on PCBA by computer 9
Point, and control the pushing of probe 6 and lift.
As shown in Fig. 2, 5 blind hole of test board, 10 position embodiment one, the bottom surface of test board 5 corresponds to probe 6 and arranges equipped with dot matrix
The column blind hole 10 that Open Side Down, interior blind hole 10 is elastomeric element, specifically optional spring 7.One end of spring 7 is fixed on blind
The upper part on 10 top of hole, the other end linking probe 6 of spring 7, probe 6 is located in blind hole 10.
As shown in figure 3,5 blind hole of test board, 10 position embodiment two, the bottom surface of the test board 5 corresponds to probe 6 equipped with point
Battle array arrangement the blind hole 10 that Open Side Down, is equipped with the sleeve 11 of protrusion 5 bottom surface of test board in blind hole 10, and the one of spring 7
10 top of blind hole is fixed at end, and the upper part of the other end linking probe 6 of spring 7, probe 6 is located in sleeve 11.
As shown in figure 4, probe 6 is arranged into a rectangular array.Or as shown in figure 5, probe 6 is arranged at circular array.Regardless of what
Kind distribution guarantees that the covering surface of probe 6 is greater than the area of tested PCB A.The spacing of adjacent two probe 6 is 1.27 millimeters.
As shown in fig. 6, specific work process is exactly the retest process to multiple PCBA to be measured.
By intelligent automation control matrix form probe 6 lifting, come realize to all PCBA test versatility and can
Reusing does not have to be directed to corresponding PCBA custom fabricated jig again.The time for reducing test fixture manufacture, shorten survey
The period is tried, the input cost of test fixture is further reduced, saves monetary cost and time cost.
Above-described embodiment is only the description carried out to preferred embodiments of the present invention, not to model of the invention
It encloses and is defined, under the premise of not departing from the spirit of the design of the utility model, relevant technical staff in the field is to the utility model
Various changes and improvements, should all expand in protection scope determined by the utility model claims book.
Claims (7)
1. a kind of automatic IC T test fixture for adapting to a variety of PCBA, which is characterized in that including pedestal, bracket, cylinder, connection
Bar, test board, probe, elastomeric element and support frame, pedestal are equipped with bracket and support frame, and PCBA is placed on the support frame, just
Cylinder is installed to the holder part above support frame, cylinder is connect with test board and can be driven on test board by connecting rod and moved down
Dynamic, the probe of lattice arrangement is installed on test board bottom surface, and elastomeric element, test fixture and computer are equipped between probe and test board
Connection.
2. a kind of automatic IC T test fixture for adapting to a variety of PCBA according to claim 1, which is characterized in that described
Elastomeric element is spring.
3. a kind of automatic IC T test fixture for adapting to a variety of PCBA according to claim 1, which is characterized in that described
The bottom surface of test board corresponds to probe equipped with the lattice arrangement blind hole that Open Side Down, and blind hole top, bullet are fixed in one end of spring
The upper part of the other end linking probe of spring, probe is located in blind hole.
4. a kind of automatic IC T test fixture for adapting to a variety of PCBA according to claim 1, which is characterized in that described
The bottom surface of test board corresponds to probe and is equipped with the lattice arrangement blind hole that Open Side Down, and protrusion test board bottom surface table is equipped in blind hole
Blind hole top is fixed in the sleeve in face, one end of spring, and the upper part of the other end linking probe of spring, probe is located at sleeve
It is interior.
5. a kind of automatic IC T test fixture for adapting to a variety of PCBA according to claim 1, which is characterized in that described
Probe is arranged into a rectangular array.
6. a kind of automatic IC T test fixture for adapting to a variety of PCBA according to claim 1, which is characterized in that described
Probe is arranged at circular array.
7. a kind of automatic IC T test fixture for adapting to a variety of PCBA according to claim 5 or 6, which is characterized in that institute
The spacing for stating adjacent two probe is 1.27 millimeters.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820730289.6U CN208224437U (en) | 2018-05-16 | 2018-05-16 | A kind of automatic IC T test fixture adapting to a variety of PCBA |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820730289.6U CN208224437U (en) | 2018-05-16 | 2018-05-16 | A kind of automatic IC T test fixture adapting to a variety of PCBA |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208224437U true CN208224437U (en) | 2018-12-11 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201820730289.6U Active CN208224437U (en) | 2018-05-16 | 2018-05-16 | A kind of automatic IC T test fixture adapting to a variety of PCBA |
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| Country | Link |
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| CN (1) | CN208224437U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111551841A (en) * | 2020-05-11 | 2020-08-18 | 西安精雕软件科技有限公司 | Automatic ICT testing arrangement |
| CN112269119A (en) * | 2020-10-25 | 2021-01-26 | 苏州市方普电子科技有限公司 | Switching test fixture and switching method for high-density measuring points |
-
2018
- 2018-05-16 CN CN201820730289.6U patent/CN208224437U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111551841A (en) * | 2020-05-11 | 2020-08-18 | 西安精雕软件科技有限公司 | Automatic ICT testing arrangement |
| CN112269119A (en) * | 2020-10-25 | 2021-01-26 | 苏州市方普电子科技有限公司 | Switching test fixture and switching method for high-density measuring points |
| CN112269119B (en) * | 2020-10-25 | 2023-05-23 | 苏州方普智能装备有限公司 | High-density measuring point switching test fixture and switching method |
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