CN208172217U - It is a kind of for testing the device of LED lamp bead on circuit board - Google Patents
It is a kind of for testing the device of LED lamp bead on circuit board Download PDFInfo
- Publication number
- CN208172217U CN208172217U CN201820571670.2U CN201820571670U CN208172217U CN 208172217 U CN208172217 U CN 208172217U CN 201820571670 U CN201820571670 U CN 201820571670U CN 208172217 U CN208172217 U CN 208172217U
- Authority
- CN
- China
- Prior art keywords
- circuit board
- plate
- led lamp
- pressing plate
- lamp bead
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 64
- 239000011324 bead Substances 0.000 title claims abstract description 31
- 239000000523 sample Substances 0.000 claims abstract description 30
- 239000000758 substrate Substances 0.000 claims abstract description 27
- 230000005484 gravity Effects 0.000 claims abstract description 19
- 239000013307 optical fiber Substances 0.000 claims abstract description 13
- 230000006835 compression Effects 0.000 claims description 5
- 238000007906 compression Methods 0.000 claims description 5
- 238000000034 method Methods 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 238000005056 compaction Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 238000013475 authorization Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 239000002360 explosive Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000005622 photoelectricity Effects 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model discloses one kind can be effectively protected test probe and automobile instrument panel circuit board, and the device that can be effectively reduced ambient interference, quickly accurately be tested LED lamp bead on circuit board.It includes substrate, circuit board hold-down mechanism and mechanism for testing circuit boards, and the circuit board hold-down mechanism includes the pressing plate for pushing down circuit board and the gravity pressure compact form mechanism for overturning pressing plate；Mechanism for testing circuit boards includes the loading plate being located on substrate and several test cells, pressing plate, loading plate and substrate are from top to bottom sequentially arranged, the upper surface of loading plate is equipped with several for accommodating the receiving hole of LED lamp bead on circuit board, the bottom surface of receiving hole is downwardly extending the loophole through loading plate lower surface, test cell includes optical fiber and the test probe that optical fiber one end is arranged in, it tests probe and loophole corresponds, test probe is protruded into loophole by the lower end of loophole.
Description
Technical field
The utility model relates to field of test instrument more particularly to a kind of for testing the device of LED lamp bead on circuit board.
Background technique
Automobile instrument panel circuit board requires to test the LED lamp bead on circuit board, confirms that it can before factory
It works normally.After usually circuit board is powered in factory, then operator sees the luminous situation of LED lamp bead one by one
It surveys.This traditional test mode more relies on manpower, and measuring accuracy is not high and efficiency is lower.
206945901 U of Chinese patent Authorization Notice No. CN, authorized announcement date 2018.01.30, a kind of entitled " LED
Lamp bead photoelectricity test mechanism " discloses a kind of test device that test probe can automatically reset, improves measuring accuracy.But
The test probe of this contact is easily during the test because the displacement of circuit board damages, and there is also certain damages for circuit board
Risk needs to improve；Simultaneously in open environment, it is easy the interference by ambient, measuring accuracy is not high.
Utility model content
The purpose of this utility model is to overcome deficiencies in the prior art, and test can be effectively protected by providing one kind
Probe and automobile instrument panel circuit board, and ambient interference can be effectively reduced, standard quickly is carried out to LED lamp bead on circuit board
The device really tested.
To achieve the goals above, the utility model uses following technical scheme：
It is a kind of for testing the device of LED lamp bead on circuit board, including
Substrate, circuit board hold-down mechanism and mechanism for testing circuit boards, the circuit board hold-down mechanism includes for pushing down electricity
The pressing plate of road plate and gravity pressure compact form mechanism for overturning pressing plate；
The mechanism for testing circuit boards includes the loading plate being located on substrate and several test cells, pressing plate, loading plate and
Substrate is from top to bottom sequentially arranged, and the upper surface of loading plate is equipped with several for accommodating the receiving hole of LED lamp bead on circuit board, appearance
Receiving the bottom surface in hole is downwardly extending the loophole through loading plate lower surface, and test cell includes optical fiber and is arranged in optical fiber one
The test probe at end, test probe and loophole correspond, and test probe is protruded into loophole by the lower end of loophole.Gravity
Compression type mechanism is for circuit board to be firmly pressed between pressing plate and loading plate, and circuit board is in and is compacted during the test
State, position will not change, and effective protection tests probe and circuit board.Circuit board equipped with LED lamp bead one facing towards carrying
Plate, LED lamp bead are located in receiving hole, and the light of sending is received through the directly tested probe of loophole and transferred out through optical fiber, subtract
Few ambient interference.
Preferably, gravity pressure compact form mechanism includes plate bracket, flip-arm and the peace being vertically fixed on substrate
The upper end of loading board, pressing plate is fixed on plate bracket, and mounting plate is equipped with the first guide groove, and one end of the first guide groove is to downward
It stretches to form the first vertical slot, the lower section of the first guide groove is equipped with the second vertical slot, and plate bracket passes through first rotating shaft and second turn
Axis is rotatably arranged on mounting plate, and first rotating shaft passes through the first guide groove, and the second shaft passes through the second vertical slot, sets on flip-arm
There is the second guide groove, flip-arm is rotatably arranged on mounting plate by first rotating shaft and third shaft, and first rotating shaft passes through second
Guide groove.When flip-arm rotates, first rotating shaft is slided in the first guide groove, the first vertical slot and the second guide groove, and second turn
Axis slides in the second vertical slot, and when pressing plate is ported to circuit board contacts, pressing plate is in pressing plate and the weight of plate bracket at this time
Continue to move down compression circuit board under power effect, the first vertical slot and the second vertical slot ensure that the pressure direction of pressing plate is vertical, will not
Damage test probe or circuit board by pressure.The existing inverting action of gravity pressure compact form mechanism, when opening, facilitate the placement of circuit board and take,
Pressing plate has lift action that can compress circuit board again simultaneously.
Preferably, being equipped with several buffer structures between the loading plate and substrate, buffer structure includes being located on substrate
Guide post, the spring that is located at the limited block of guide post one end and is set on guide post, in a buffer structure：Loading plate sliding is set
It sets on guide post, limited block is located at the top of loading plate, and spring is between loading plate and substrate.In circuit board compaction process
It works as a buffer, while circuit board reaches self-balancing under the supporting role of pressing plate and the gravity and loading plate of plate bracket
State, further protection test probe and circuit board.
Preferably, the lower surface of the pressing plate is equipped with elastic thimble, elastic thimble is vertical with pressing plate.Elastic thimble prevents
Pressing plate damages the component on circuit board by pressure.
Preferably, the loading plate is equipped with several circuit board locating pins, circuit board locating pin, which is located on loading plate, to be leaned on
One end of nearly pressing plate.Circuit board locating pin is used for position of the Primary Location circuit board on loading plate, guarantees LED lamp bead and accommodates
The position in hole corresponds.
Preferably, the upper surface of the substrate and loading plate is covered with black light shield layer.Black light shield layer, which is reduced, to be entered
The extraneous light of receiving hole and loophole improves the accuracy of test probe.
The utility model has the beneficial effects that：（1）First vertical slot and the second vertical slot ensure that pressing plate is pressed along the vertical direction
Tight circuit board, while loading plate is equipped with buffer structure, gravity and loading plate of the circuit board in pressing plate and plate bracket
Reach the state of self-balancing under supporting role, effective protection tests probe and circuit board；（2）The light directly quilt that LED lamp bead issues
Test probe collection is simultaneously transferred out by optical fiber, small by extraneous interference, and can disposably obtain all LED lamp beads
Test result, measuring accuracy and testing efficiency are substantially improved.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of the utility model；
Fig. 2 is the structural schematic diagram at another visual angle of the utility model；
Fig. 3 is the enlarged drawing in Fig. 2 at A；
Fig. 4 is the explosive view of gravity pressure compact form mechanism in the utility model.
In figure：Substrate 1, pressing plate 2, elastic thimble 21, gravity pressure compact form mechanism 3, plate bracket 31, flip-arm 32, installation
Plate 33, the first guide groove 331, the first vertical slot 332, the second vertical slot 333, the second guide groove 334, loading plate 41, circuit board
Positioning pin 411, receiving hole 412, loophole 413, optical fiber 421, test probe 422, guide post 43, limited block 44, spring 45.
Specific embodiment
The utility model is further described in the following with reference to the drawings and specific embodiments.
It is a kind of for testing the device of LED lamp bead on circuit board shown in as shown in Figure 1 to Figure 4, including
Substrate 1, circuit board hold-down mechanism and mechanism for testing circuit boards, the circuit board hold-down mechanism includes for pushing down electricity
The pressing plate 2 of road plate and gravity pressure compact form mechanism 3 for overturning pressing plate, the lower surface of pressing plate are equipped with elastic thimble 21, elastic top
Needle is vertical with pressing plate, and elastic thimble prevents pressing plate from damaging the component on circuit board by pressure.Gravity pressure compact form mechanism includes plate bracket
31, flip-arm 32 and the mounting plate 33 being vertically fixed on substrate, the upper end of pressing plate is fixed on plate bracket, sets on mounting plate
There is the first guide groove 331, one end of the first guide groove is downwardly extending the first vertical slot 332, sets below the first guide groove
There is the second vertical slot 333, plate bracket is rotatably arranged on mounting plate by first rotating shaft and the second shaft, and first rotating shaft passes through
First guide groove, the second shaft pass through the second vertical slot, and flip-arm is equipped with the second guide groove 334, and flip-arm passes through first turn
Axis and third shaft are rotatably arranged on mounting plate, and first rotating shaft passes through the second guide groove.When flip-arm rotates, first rotating shaft exists
It is slided in first guide groove, the first vertical slot and the second guide groove, the second shaft is slided in the second vertical slot, when pressing plate is turned
When to circuit board contacts, pressing plate continues to move down under the gravity of pressing plate and plate bracket compression circuit board at this time, and first
Vertical slot and the second vertical slot ensure that the pressure direction of pressing plate is vertical, will not damage test probe or circuit board by pressure.Gravity pressure compact form
The existing inverting action of mechanism, when opening, facilitate the placement of circuit board and take, and are not take up space, while pressing plate has lift action again
Circuit board can be compressed.
The mechanism for testing circuit boards includes the loading plate 41 and several test cells being located on substrate, pressing plate, loading plate
And substrate is from top to bottom sequentially arranged.Several buffer structures are equipped between loading plate and substrate, buffer structure includes being located at substrate
On guide post 43, the spring 45 that is located at the limited block 44 of guide post one end and is set on guide post, in a buffer structure：Carrying
Plate is slidably arranged on guide post, and limited block is located at the top of loading plate, and between loading plate and substrate, buffer structure exists spring
It is worked as a buffer in circuit board compaction process, while circuit board is in the support of pressing plate and the gravity and loading plate of plate bracket
Reach the state of self-balancing under effect, further protection test probe and circuit board.Loading plate is positioned equipped with several circuit boards
Pin 411, circuit board locating pin are located at one end on loading plate close to pressing plate, and circuit board locating pin exists for Primary Location circuit board
Position on loading plate guarantees that the position of LED lamp bead and receiving hole corresponds.The upper surface of loading plate is equipped with several for holding
The receiving hole 412 of nano circuit onboard led lamp bead, the bottom surface of receiving hole are downwardly extending the loophole through loading plate lower surface
413, test cell includes optical fiber 421 and the test probe 422 that optical fiber one end is arranged in, and test probe and loophole one are a pair of
It answers, test probe is protruded into loophole by the lower end of loophole.The upper surface of substrate and loading plate is covered with black light shield layer, black
Color light shield layer reduces the extraneous light for entering receiving hole and loophole, improves the accuracy of test probe.
When the utility model is used, pressing plate is in the state of opening at the beginning, facilitates placement circuit board, circuit board is placed in
On loading plate, Primary Location is carried out by circuit board locating pin, on circuit board equipped with LED lamp bead one facing towards loading plate, respectively
LED lamp bead is located in corresponding receiving hole, rotates flip-arm, pressing plate is gone to and circuit board contacts, pressing plate is in pressing plate and pressing plate
Continue to move down compression circuit board under the gravity of bracket, parallel the first vertical slot and the second vertical slot ensure the pressure of pressing plate
Direction is vertical, and circuit board reaches self-balancing, LED under the supporting role of pressing plate and the gravity and loading plate of plate bracket
Probe receives and is transferred out and tested by optical fiber the light that lamp bead issues after tested, and flip-arm is rotated further by after being completed, is pressed
Plate is routed up, and the taking-up of circuit board is facilitated.
The utility model has the beneficial effects that：First vertical slot and the second vertical slot ensure movement when pressing plate pushes down circuit board
Direction is vertical, while loading plate is equipped with buffer structure, gravity and loading plate of the circuit board in pressing plate and plate bracket
Reach the state of self-balancing under supporting role, effective protection tests probe and circuit board；The light that LED lamp bead issues is directly tested
Examination probe collection is simultaneously transferred out by optical fiber, small by extraneous interference, and can disposably obtain the survey of all LED lamp beads
Test result, measuring accuracy and testing efficiency are substantially improved.
Claims (6)
1. a kind of for testing the device of LED lamp bead on circuit board, characterized in that including
Substrate, circuit board hold-down mechanism and mechanism for testing circuit boards, the circuit board hold-down mechanism includes for pushing down circuit board
Pressing plate and gravity pressure compact form mechanism for overturning pressing plate；
The mechanism for testing circuit boards includes the loading plate being located on substrate and several test cells, pressing plate, loading plate and substrate
It is from top to bottom sequentially arranged, the upper surface of loading plate is equipped with several for accommodating the receiving hole of LED lamp bead on circuit board, receiving hole
Bottom surface be downwardly extending the loophole through loading plate lower surface, test cell includes optical fiber and is arranged in optical fiber one end
Probe is tested, test probe and loophole correspond, and test probe is protruded into loophole by the lower end of loophole.
2. according to claim 1 a kind of for testing the device of LED lamp bead on circuit board, characterized in that the gravity
Compression type mechanism includes plate bracket, flip-arm and the mounting plate being vertically fixed on substrate, and the upper end of pressing plate is fixed on pressing plate
On bracket, mounting plate is equipped with the first guide groove, and one end of the first guide groove is downwardly extending the first vertical slot, the first guiding
The lower section of slot is equipped with the second vertical slot, and plate bracket is rotatably arranged on mounting plate by first rotating shaft and the second shaft, and first
Shaft passes through the first guide groove, and the second shaft passes through the second vertical slot, and flip-arm is equipped with the second guide groove, and flip-arm passes through the
One shaft and third shaft are rotatably arranged on mounting plate, and first rotating shaft passes through the second guide groove.
3. according to claim 1 or 2 a kind of for testing the device of LED lamp bead on circuit board, characterized in that described to hold
Several buffer structures are equipped between support plate and substrate, buffer structure includes the guide post being located on substrate, the limit for being located at guide post one end
Position block and the spring being set on guide post, in a buffer structure：Loading plate is slidably arranged on guide post, and limited block, which is located at, to be held
The top of support plate, spring is between loading plate and substrate.
4. according to claim 1 or 2 a kind of for testing the device of LED lamp bead on circuit board, characterized in that the pressure
The lower surface of plate is equipped with elastic thimble, and elastic thimble is vertical with pressing plate.
5. according to claim 1 or 2 a kind of for testing the device of LED lamp bead on circuit board, characterized in that described to hold
Support plate is equipped with several circuit board locating pins, and circuit board locating pin is located at one end on loading plate close to pressing plate.
6. according to claim 1 or 2 a kind of for testing the device of LED lamp bead on circuit board, characterized in that the base
The upper surface of plate and loading plate is covered with black light shield layer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820571670.2U CN208172217U (en) | 2018-04-20 | 2018-04-20 | It is a kind of for testing the device of LED lamp bead on circuit board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820571670.2U CN208172217U (en) | 2018-04-20 | 2018-04-20 | It is a kind of for testing the device of LED lamp bead on circuit board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208172217U true CN208172217U (en) | 2018-11-30 |
Family
ID=64370075
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201820571670.2U Expired - Fee Related CN208172217U (en) | 2018-04-20 | 2018-04-20 | It is a kind of for testing the device of LED lamp bead on circuit board |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN208172217U (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108693485A (en) * | 2018-04-20 | 2018-10-23 | 浙江雷云科技有限公司 | A kind of automobile instrument panel circuit board testing device |
| CN112505521A (en) * | 2020-09-25 | 2021-03-16 | 华东光电集成器件研究所 | Three-dimensional assembled circuit testing device |
| CN113058883A (en) * | 2021-03-25 | 2021-07-02 | 中国电子科技集团公司第三十八研究所 | Multi-station integrated linkage type automatic detection mechanism |
| CN113933547A (en) * | 2021-10-15 | 2022-01-14 | 武汉海泰中测电子有限责任公司 | Detection clamp convenient for rapid replacement of tested module |
-
2018
- 2018-04-20 CN CN201820571670.2U patent/CN208172217U/en not_active Expired - Fee Related
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108693485A (en) * | 2018-04-20 | 2018-10-23 | 浙江雷云科技有限公司 | A kind of automobile instrument panel circuit board testing device |
| CN112505521A (en) * | 2020-09-25 | 2021-03-16 | 华东光电集成器件研究所 | Three-dimensional assembled circuit testing device |
| CN112505521B (en) * | 2020-09-25 | 2024-04-19 | 华东光电集成器件研究所 | Three-dimensional assembled circuit testing device |
| CN113058883A (en) * | 2021-03-25 | 2021-07-02 | 中国电子科技集团公司第三十八研究所 | Multi-station integrated linkage type automatic detection mechanism |
| CN113058883B (en) * | 2021-03-25 | 2023-09-12 | 中国电子科技集团公司第三十八研究所 | Multi-station integrated linkage type automatic detection mechanism |
| CN113933547A (en) * | 2021-10-15 | 2022-01-14 | 武汉海泰中测电子有限责任公司 | Detection clamp convenient for rapid replacement of tested module |
| CN113933547B (en) * | 2021-10-15 | 2024-05-28 | 武汉海泰中测电子有限责任公司 | Detection fixture convenient to module quick replacement is surveyed |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20181130 |