CN208172216U - LED lamp bead tests structure on a kind of circuit board - Google Patents
LED lamp bead tests structure on a kind of circuit board Download PDFInfo
- Publication number
- CN208172216U CN208172216U CN201820570773.7U CN201820570773U CN208172216U CN 208172216 U CN208172216 U CN 208172216U CN 201820570773 U CN201820570773 U CN 201820570773U CN 208172216 U CN208172216 U CN 208172216U
- Authority
- CN
- China
- Prior art keywords
- circuit board
- loading plate
- led lamp
- lamp bead
- loophole
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 80
- 239000011324 bead Substances 0.000 title claims abstract description 40
- 239000013307 optical fiber Substances 0.000 claims abstract description 39
- 239000000523 sample Substances 0.000 claims abstract description 34
- 239000000758 substrate Substances 0.000 claims abstract description 34
- 238000000034 method Methods 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 230000003139 buffering effect Effects 0.000 description 2
- 238000005056 compaction Methods 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 238000013475 authorization Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
The utility model relates to LED lamp beads in field of test instrument more particularly to a kind of circuit board to test structure.It includes substrate, loading plate and several test cells, the loading plate is located on substrate, the upper surface of loading plate is equipped with several for accommodating the receiving hole of LED lamp bead on circuit board, the lower section of receiving hole is equipped with the loophole being connected to receiving hole, loophole runs through the lower surface of loading plate, the test cell includes optical fiber and the test probe that optical fiber one end is arranged in, and test probe and loophole correspond, and test probe is protruded into loophole by the lower end of loophole.The benefit of the utility model is can be effectively protected test probe while reduce ambient interference.
Description
Technical field
The utility model relates to LED lamp beads in field of test instrument more particularly to a kind of circuit board to test structure.
Background technique
Circuit board can greatly reduce the mistake of wiring and assembly, improve the gentle productive labor rate of Automated water, main to use
It is electrically connected in electronic component, in every field using very extensive, such as LED lamp, automobile instrument panel etc..It is equipped with
The circuit board of LED lamp bead requires to test the LED lamp bead on circuit board before factory, confirms that it can be worked normally.
After usually circuit board is powered in factory, then operator is observed the luminous situation of LED lamp bead one by one.This tradition
Test mode precision it is not high and efficiency is lower.
205539412 U of Chinese patent Authorization Notice No. CN, authorized announcement date 2016.08.31, entitled " one kind is used for
The test device of LED lamp bead " discloses a kind of test probe and the test device that is in contact of LED lamp bead, significantly improves test
Precision and testing efficiency.But this test mode test probe is in open environment, and test result is easy by the external world
The interference of light, and LED lamp bead with test probe frequently contact cause test probe be easily damaged.
Utility model content
The purpose of this utility model is to overcome deficiencies in the prior art, and test can be effectively protected by providing one kind
Probe reduces LED lamp bead test structure on the circuit board of ambient interference.
To achieve the goals above, the utility model uses following technical scheme：
LED lamp bead tests structure on a kind of circuit board, including
Substrate, loading plate and several test cells, the loading plate are located on substrate, and the upper surface of loading plate is equipped with several
For accommodating the receiving hole of LED lamp bead on circuit board, the lower section of receiving hole is equipped with the loophole being connected to receiving hole, and loophole passes through
Wear the lower surface of loading plate；
The test cell includes optical fiber and the test probe that optical fiber one end is arranged in, and test probe and loophole one are a pair of
It answers, test probe is protruded into loophole by the lower end of loophole.Circuit board equipped with LED lamp bead one facing towards loading plate, LED light
Pearl is located in receiving hole, and the light of sending is received through the directly tested probe of loophole and transferred out through optical fiber, reduces ambient light
Line interference, and LED lamp bead is not required to contact with test probe, service life significantly improves.
Preferably, being equipped with several buffer structures between the loading plate and substrate, buffer structure includes being located on substrate
Guide post, the spring that is located at the limited block of guide post one end and is set on guide post, in a buffer structure：Loading plate sliding is set
It sets on guide post, limited block is located at the top of loading plate, and spring is between loading plate and substrate.Circuit board is placed on loading plate
It when test, usually also needs to be fixed, to prevent the dislocation of circuit board during the test, not only influences test result, Er Qie electricity
Road plate and test equipment are also easily damaged, and buffer structure can buffer the compaction process of circuit board, effective protection circuit
Plate and test equipment.
Preferably, the number of the buffer structure is 4, buffer structure is distributed on four corners of loading plate.Both
Uniform cushion effect can be formed, and does not influence the test of circuit board.
Preferably, the receiving hole and loophole are coaxially arranged, the diameter of loophole is less than the diameter of receiving hole.Ensure
The light that probe collection is issued to LED lamp bead can be tested.
Preferably, the loading plate is equipped with several circuit board locating pins, circuit board locating pin protrudes from loading plate
Upper surface.Circuit board locating pin is used for position of the Primary Location circuit board on loading plate, guarantees the position of LED lamp bead and receiving hole
Set one-to-one correspondence.
Preferably, the upper surface of the substrate and loading plate is covered with black light shield layer.Black light shield layer, which is reduced, to be entered
The extraneous light of receiving hole and loophole improves the accuracy of test probe.
Preferably, the lower section of the substrate is equipped with optical fiber containing box, test probe is fixed on substrate, and optical fiber is located at light
In fine containing box.Optical fiber is placed in optical fiber containing box, avoids optical fiber and external contact, and exterior light is reduced while shielding
The interference of line.
Preferably, the upper end opening of the optical fiber containing box, substrate is covered on the upper end of optical fiber containing box, the one of substrate
It holds hinged with optical fiber containing box.Substrate opposed optical fibers containing box is openable, more convenient when test cell overhauls.
The utility model has the beneficial effects that：（1）For LED lamp bead with test probe without contacting, that tests probe uses the longevity
Life is obviously improved；（2）The directly tested probe collection of the light that LED lamp bead issues simultaneously is transferred out by optical fiber, at light acquisition
It is small by extraneous interference in the environment of relative closure；（3）The test result of all LED lamp beads can be disposably obtained, is surveyed
Examination precision and testing efficiency are substantially improved.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of the utility model；
Fig. 2 is the top view of Fig. 1；
Fig. 3 is the enlarged drawing in Fig. 1 at A.
In figure：Substrate 1, optical fiber containing box 11, loading plate 2, circuit board locating pin 21, test cell 3, receiving hole 22, thoroughly
Unthreaded hole 23, optical fiber 31, test probe 32, guide post 41, limited block 42, spring 43.
Specific embodiment
The utility model is further described in the following with reference to the drawings and specific embodiments.
As shown in Figure 1 to Figure 3, LED lamp bead tests structure on a kind of circuit board, including
Substrate 1, loading plate 2 and several test cells 3, the loading plate are located on substrate, and loading plate is equipped with several electricity
Road plate positioning pin 21, circuit board locating pin protrude from the upper surface of loading plate, and circuit board locating pin is used for Primary Location circuit board
Position on loading plate.The upper surface of loading plate is equipped with several for accommodating the receiving hole 22 of LED lamp bead on circuit board, receiving
The lower section in hole is equipped with the loophole 23 being connected to receiving hole, and loophole runs through the lower surface of loading plate, and receiving hole is same with loophole
Axis arrangement, the diameter of loophole are less than the diameter of receiving hole, it is ensured that can collect the light of LED lamp bead sending.Substrate and carrying
The upper surface of plate is covered with black light shield layer, and black light shield layer reduces the extraneous light for entering receiving hole and loophole, reduces outer
The interference of portion's light.
Test cell includes optical fiber 31 and the test probe 32 that optical fiber one end is arranged in, and test probe and loophole one are a pair of
It answers, test probe is protruded into loophole by the lower end of loophole, and the directly tested probe collection of the light that LED lamp bead issues simultaneously passes through
Optical fiber transfers out, and light acquisition is small by extraneous interference in the environment of relative closure.
Several buffer structures are equipped between loading plate and substrate, buffer structure includes the guide post 41 being located on substrate, is located at
The limited block 42 of guide post one end and the spring 43 being set on guide post, in a buffer structure：Loading plate, which is slidably arranged in, leads
On column, limited block is located at the top of loading plate, and spring is between loading plate and substrate.The number of buffer structure is 4, buffering
Structure distribution is on four corners of loading plate.Circuit board is placed on when testing on loading plate, usually also needs to be fixed, to prevent
Circuit board misplaces during the test, not only influences test result, but also circuit board and test equipment are also easily damaged, buffering knot
Structure can buffer the compaction process of circuit board, effective protection circuit board and test equipment.
The lower section of substrate is equipped with optical fiber containing box 11, and test probe is fixed on substrate, and optical fiber is located in optical fiber containing box.
The upper end opening of optical fiber containing box, substrate are covered on the upper end of optical fiber containing box, and one end of substrate and optical fiber containing box are hinged.Light
Fibre is placed in optical fiber containing box, avoids optical fiber and external contact, and the interference of extraneous light, substrate are reduced while shielding
Opposed optical fibers containing box is openable, more convenient when test cell overhauls.
When the utility model is used, Primary Location is carried out to circuit board by circuit board locating pin, LED is housed on circuit board
The one of lamp bead is located in corresponding receiving hole facing towards loading plate, each LED lamp bead, compresses circuit board, work of the PCB in buffer structure
Reach equilibrium state under, probe receives and transfers out test by optical fiber the light that LED lamp bead issues after tested.
The utility model has the beneficial effects that：（1）For LED lamp bead with test probe without contacting, that tests probe uses the longevity
Life is obviously improved；（2）The directly tested probe collection of the light that LED lamp bead issues simultaneously is transferred out by optical fiber, at light acquisition
It is small by extraneous interference in the environment of relative closure；（3）The test result of all LED lamp beads can be disposably obtained, is surveyed
Examination precision and testing efficiency are substantially improved.
Claims (8)
1. LED lamp bead tests structure on a kind of circuit board, characterized in that including
Substrate, loading plate and several test cells, the loading plate are located on substrate, and the upper surface of loading plate is equipped with several be used for
The receiving hole of LED lamp bead on circuit board is accommodated, the lower section of receiving hole is equipped with the loophole being connected to receiving hole, and loophole, which runs through, to be held
The lower surface of support plate；
The test cell includes optical fiber and the test probe that optical fiber one end is arranged in, and test probe and loophole correspond,
Test probe is protruded into loophole by the lower end of loophole.
2. LED lamp bead tests structure on a kind of circuit board according to claim 1, characterized in that the loading plate and base
Several buffer structures are equipped between plate, buffer structure includes the guide post being located on substrate, the limited block and set for being located at guide post one end
The spring being located on guide post, in a buffer structure：Loading plate is slidably arranged on guide post, and limited block is located at the upper of loading plate
Side, spring is between loading plate and substrate.
3. LED lamp bead tests structure on a kind of circuit board according to claim 2, characterized in that the buffer structure
Number is 4, and buffer structure is distributed on four corners of loading plate.
4. on a kind of circuit board according to claim 1 or 2 LED lamp bead test structure, characterized in that the receiving hole with
Loophole is coaxially arranged, and the diameter of loophole is less than the diameter of receiving hole.
5. LED lamp bead tests structure on a kind of circuit board according to claim 1 or 2, characterized in that on the loading plate
Equipped with several circuit board locating pins, circuit board locating pin protrudes from the upper surface of loading plate.
6. LED lamp bead tests structure on a kind of circuit board according to claim 1 or 2, characterized in that the substrate and hold
The upper surface of support plate is covered with black light shield layer.
7. LED lamp bead tests structure on a kind of circuit board according to claim 1 or 2, characterized in that under the substrate
Side is equipped with optical fiber containing box, and test probe is fixed on substrate, and optical fiber is located in optical fiber containing box.
8. LED lamp bead tests structure on a kind of circuit board according to claim 7, characterized in that the optical fiber containing box
Upper end opening, substrate is covered on the upper end of optical fiber containing box, and one end of substrate and optical fiber containing box are hinged.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820570773.7U CN208172216U (en) | 2018-04-20 | 2018-04-20 | LED lamp bead tests structure on a kind of circuit board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820570773.7U CN208172216U (en) | 2018-04-20 | 2018-04-20 | LED lamp bead tests structure on a kind of circuit board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208172216U true CN208172216U (en) | 2018-11-30 |
Family
ID=64370042
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201820570773.7U Expired - Fee Related CN208172216U (en) | 2018-04-20 | 2018-04-20 | LED lamp bead tests structure on a kind of circuit board |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN208172216U (en) |
-
2018
- 2018-04-20 CN CN201820570773.7U patent/CN208172216U/en not_active Expired - Fee Related
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20181130 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |