CN106292001B - A test device and test method - Google Patents

Abstract

The present invention relates to field of display technology, a kind of test device and test method are disclosed, test device is for testing liquid crystal module to be tested, comprising: base station；At least one test module on base station is set; test module is equipped with tests probe with the test point in the array substrate of liquid crystal module correspondingly, and in test, test probe is protruded between the array substrate of liquid crystal module and cover sheet is in contact with corresponding test point；The display module being connected with test probe; the test signal sent for receiving and showing test probe; in test, test probe is protruded between array substrate and cover sheet and is in contact with corresponding test point to be tested test point and be sent test signal, and the test signal received is shown at it and shown on screen by display module；It therefore, there is no need to remove cover sheet with regard to the achievable test to test point, reduce the damage to liquid crystal module, can completely retain the bad sample of client, improve analyzing efficiency.

Description

A test device and test method

technical field

The present invention relates to the field of display technology, and in particular, to a testing device and a testing method.

Background technique

In the field of display technology, a protective cover plate is disposed on the liquid crystal module to protect the display panel, and has been widely used in display products, especially display products with touch function.

As shown in FIG. 1, the liquid crystal module includes a protective cover 01, an OCA adhesive (a special double-sided adhesive with optical transparency) 02 for fixing the protective cover 01 and the color filter 03, and a protective cover 02. 01 is opposite to the array substrate 04, the flexible circuit board 06 disposed on the side of the protective cover 01 facing the array substrate 04, and the ET Pad (test point) 05 disposed on the side of the array substrate 04 facing the protective cover 01. The ET Pad 05 is located on the side of the color filter 03 close to the flexible circuit board 06. After the protective cover 01 is attached, the ET traces (test traces) on the TFT (thin film transistor) side of the display panel are protected by a protective cover. The ET Pad 05 and the ET traces on the array substrate 04 cannot be directly tested with probes when the product is defective in subsequent analysis. In the prior art, the protective cover 01 needs to be removed for testing, but This test method can only be carried out under the authorization of the customer. The tester cannot make a preliminary judgment on the failure cause of the product before removing the protective cover 01, and the liquid crystal is likely to be damaged during the removal of the protective cover 01. module, and cannot retain bad samples, and the analysis efficiency is low.

SUMMARY OF THE INVENTION

The present invention provides a test device and a test method. The test device can complete the test of the liquid crystal module to be tested without removing the protective cover, thereby avoiding damage to the liquid crystal module during the removal process, and can completely Retain bad samples from customers and improve analysis efficiency.

For achieving the above object, the present invention provides the following technical solutions:

A testing device for testing a liquid crystal module to be tested, comprising:

abutment;

At least one test module arranged on the base, the test module includes test probes corresponding to the test points on the array substrate of the liquid crystal module, and the test probes extend into the liquid crystal during testing The array substrate and the protective cover plate of the module are in contact with the corresponding test points;

A display module, which is connected to the test probe and used for receiving and displaying the test signal sent by the test probe.

When the above-mentioned testing device tests the liquid crystal module to be tested, the test probe extends between the array substrate of the liquid crystal module and the protective cover plate and contacts the corresponding test point to test the test point, and the test probe Send the test signal of the test point to the display module, and the display module will display the received test signal on its display screen, so that the tester can analyze the test signal. The above-mentioned test device does not test the LCD module to be tested. It is necessary to remove the protective cover from the liquid crystal module to complete the test of the test point, thereby avoiding the damage to the liquid crystal module during the removal process, reducing the damage to the liquid crystal module, and completely retaining the customer's bad samples. Improve parsing efficiency.

Preferably, the test module further comprises a protruding plate, a test light source and a test rod, the protruding plate is fixed on the base, and the part of the protruding plate protruding from the edge of the base is provided with a The test light source, the test rod is movably installed on the base, and the test rod is located on the side of the extending plate away from the base, and the extension direction of the test rod is parallel to the It extends into the plane where the board is located, and the end of the test rod is provided with the test probe.

Preferably, a slide rail is provided on the base, and the test rod is slidably mounted on the slide rail.

Preferably, the test light source is a light bar.

Preferably, a mounting hole is provided on the protruding plate, and the light bar is mounted in the mounting hole.

Preferably, the display module is an oscilloscope, and the oscilloscope is connected to the test probe through a signal connection line.

A test method that includes:

Remove the backlight of the LCD module;

It is determined that the protective cover plate of the liquid crystal module is located below the array substrate, and the side of the protective cover plate facing away from the array substrate is parallel to the bottom surface of the base;

Extend the test probe between the array substrate of the liquid crystal module and the protective cover to test the corresponding test points;

The display module receives and displays the test signal sent by the test probe.

Preferably, the test probes are inserted between the array substrate of the liquid crystal module and the protective cover to test the corresponding test points, which specifically includes:

moving the base, so that the extending plate is inserted between the array substrate of the liquid crystal module and the protective cover;

Light up the test light source;

The test rod extends into the side of the test point away from the array substrate;

The test probes are in contact with the test points.

Preferably, the test rod extends into the side of the test point away from the array substrate, which specifically includes: the test rod slides along a slide rail installed on the base.

Description of drawings

1 is a schematic structural diagram of a liquid crystal module provided in the background of the present invention;

2 is a schematic structural diagram of a testing device provided by the present invention;

3 is a schematic structural diagram of a module formed by a test device and a liquid crystal module to be tested during testing by a test device provided by the present invention;

FIG. 4 is a flow chart of a testing method provided by the present invention.

Detailed ways

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

As shown in Figure 2 and Figure 3, a test device for testing the liquid crystal module 5 to be tested includes:

Abutment 1;

At least one test module 2 disposed on the base 1, the test module 2 includes the test probes 23 corresponding to the test points 53 on the array substrate 51 of the liquid crystal module 5 one-to-one, and the test probes 23 extend into the liquid crystal during testing. The array substrate 51 of the module 5 and the protective cover plate 52 are in contact with the corresponding test points 53;

The display module 3 is connected to the test probe 23 for receiving and displaying the test signal sent by the test probe 23 .

When the above-mentioned testing device tests the liquid crystal module 5 to be tested, the test probes 23 extend between the array substrate 51 of the liquid crystal module 5 and the protective cover 52 and contact the corresponding test points 53 to test the test points 53 For testing, the test probe 23 sends the test signal of the test point 53 to the display module 3, and the display module 3 displays the received test signal on its display screen, so that the tester can analyze the test signal. When the liquid crystal module 5 to be tested is tested, it is not necessary to remove the protective cover 52 from the liquid crystal module 5 to complete the test of the test point 53, thereby avoiding damage to the liquid crystal module 5 during the removal process, reducing the need for The damage to the liquid crystal module 5 can completely retain the customer's defective samples and improve the analysis efficiency.

In a preferred embodiment, as shown in FIG. 2 and FIG. 3 , the test module 2 further includes a penetration board 21 , a test light source 22 and a test rod 24 . The penetration board 21 is fixed on the base 1 and extends into the board 21 . The part protruding from the edge of the base 1 is provided with a test light source 22, the test rod 24 is movably installed on the base 1, and the test rod 24 is located on the side of the protruding plate 21 away from the base 1, and the extension direction of the test rod 24 It is parallel to the plane where the protruding plate 21 is located, and the end of the test rod 24 is provided with a test probe 23 .

When the liquid crystal module 5 to be tested is tested by the above-mentioned testing device, the backlight of the liquid crystal module 5 is removed, the protective cover 52 is placed downward, and the base 1 is moved so that the part of the protruding plate 21 protruding from the edge of the base 1 is inserted Between the array substrate 51 and the protective cover 52, the test light source 22 disposed on the edge portion of the protruding board 21 protruding from the base 1 is illuminated to facilitate the positioning of the test point 53, and then the test rod 24 is moved relative to the base 1 to make The test probe 23 at the end of the test rod 24 extends between the array substrate 51 of the liquid crystal module 5 and the protective cover 52, and the test probe 23 contacts the corresponding test point 53 to test the test point 53. The above test When the device tests the liquid crystal module 5 to be tested, the test point 53 can be tested without removing the protective cover 52 from the liquid crystal module 5, thereby avoiding damage to the liquid crystal module 5 during the removal process. Moreover, the liquid crystal module 5 to be tested can be tested conveniently and reliably by means of mechanical connection and transmission.

On the basis of the above test device, in order to better realize the movement of the test rod 24 relative to the base 1 , specifically, as shown in FIG. 2 and FIG. 3 , the base 1 is provided with a slide rail 25 , and the test rod 24 It is slidably installed on the slide rail 25, and the test rod 24 slides along the slide rail 25, so that the test probe 23 at the end of the test rod 24 extends between the array substrate 51 of the liquid crystal module 5 and the protective cover 52, and the test probe 23 is in contact with the corresponding test point 53 to test the test point 53. The slide rail 25 ensures that the test probe 23 can move along the set trajectory, so that the movement of the test rod 24 and the test probe 23 is relatively stable.

Specifically, the test light source 22 can be a light bar. As a cold light source, the light bar has low heat generation, little impact on the liquid crystal module 5, and is environmentally friendly and has low loss. According to the test device and the liquid crystal module to be tested 5, the test light source 22 may also be in other suitable light source forms.

Specifically, the insertion plate 21 is provided with an installation hole, and the light bar is installed in the installation hole. The installation of the light bar in the installation hole of the insertion plate 21 makes the size of the test module 2 more compact, thereby ensuring the penetration into the plate 21. And the test probes 23 can smoothly enter between the array substrate 51 of the liquid crystal module 5 and the protective cover plate 52 .

In a preferred embodiment, the display module 3 is an oscilloscope, the oscilloscope is connected to the test probe 23 through a signal connection line 4, the test probe 23 is in contact with the corresponding test point 53 to obtain a test signal, and the test signal is passed through the signal. The connecting line 4 is sent to the oscilloscope, and the oscilloscope converts the test signal into an image, which is convenient for testers to analyze and study. As a very widely used electronic measuring instrument, the oscilloscope can more easily convert the invisible test signal into one that can be analyzed and studied. For images, the display module 3 can also be other suitable display devices according to the specific conditions of the test device and the test environment.

As shown in Figure 4, a test method includes:

Step S401, removing the backlight of the liquid crystal module 5;

Step S402, it is determined that the protective cover 52 of the liquid crystal module 5 is located below the array substrate 51, and the side of the protective cover 52 facing away from the array substrate 51 is parallel to the bottom surface of the base 1;

Step S403, extending the test probe 23 between the array substrate 51 of the liquid crystal module 5 and the protective cover 52 to test the corresponding test point 53;

Step S404 , the display module 3 receives and displays the test signal sent by the test probe 23 .

In the above test method, step S401 is used to ensure that the test device has a unique illumination light source during the test, and step S402 is used to place the protective cover plate 52 downward to facilitate the test device to test the liquid crystal module 5, and the test is performed in step S403 The probe 23 tests the corresponding test point 53 and displays the test signal through step S404. The above test method is simple and easy to implement, and the protective cover plate 52 does not need to be removed during the test, which reduces the damage to the liquid crystal module 5 and improves the performance. the analytical efficiency.

On the basis of the above test method, in a preferred embodiment, the test probe 23 is inserted between the array substrate 51 and the protective cover plate 52 of the liquid crystal module 5 to test the corresponding test point 53, which specifically includes:

Move the base 1 so that the extending plate 21 is inserted between the array substrate 51 of the liquid crystal module 5 and the protective cover plate 52;

Turn on the test light source 22;

The test rod 24 extends into the side of the test point 53 away from the array substrate 51;

The test probes 23 are in contact with the test points 53 .

When the liquid crystal module 5 to be tested is tested, the base 1 is moved so that the insertion board 21 is inserted between the array substrate 51 and the protective cover 52, and the test set on the edge portion of the insertion board 21 protruding from the base 1 is illuminated. The light source 22 is convenient to locate the position of the test point 53, the test rod 24 extends into the side of the test point 53 away from the array substrate 51 to make the test probe 23 contact the corresponding test point 53 to test the test point 53, the above-mentioned test method It is simple and easy to implement, and the liquid crystal module 5 to be tested can be tested conveniently and reliably.

Specifically, the test rod 24 extends into the side of the test point 53 away from the array substrate 51, which specifically includes: the test rod 24 slides along the slide rail 25 installed on the base 1, and the slide rail 25 ensures that the test probe 23 can move along the The set trajectory movement makes the movement of the test rod 24 and the test probe 23 relatively stable.

Obviously, those skilled in the art can make various changes and modifications to the embodiments of the present invention without departing from the spirit and scope of the present invention. Thus, provided that these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include these modifications and variations.

Claims (8)

1. a kind of test device, for testing liquid crystal module to be tested characterized by comprising

Base station；

At least one test module on base station is set, the test module include in the array substrate of the liquid crystal module Test point test probe correspondingly, in test, the test probe protrudes into array substrate and the guarantor of the liquid crystal module It is in contact between protecting cover plate with the corresponding test point；

Display module, the display module are connected with the test probe, the survey sent for receiving and showing test probe Trial signal；

The test module further includes protruding into plate, testing light source and reference test bar, and the plate that protrudes into is fixed on the base station, and It is described protrude into plate and protrude the part at the base station edge be equipped with the testing light source, the reference test bar is movably mounted at described On base station, and the reference test bar protrudes into side of the backboard from the base station positioned at described, and the extending direction of the reference test bar is parallel In the plane where protruding into plate, and the end of the reference test bar is equipped with the test probe.

2. test device according to claim 1, which is characterized in that the base station is equipped with sliding rail, and the reference test bar is sliding It is dynamic to be mounted on the sliding rail.

3. test device according to claim 1, which is characterized in that the testing light source is lamp bar.

4. test device according to claim 3, which is characterized in that the plate that protrudes into is equipped with mounting hole, the lamp bar Installation is in the mounting hole.

5. test device according to claim 1, which is characterized in that the display module is oscillograph, the oscillograph It is connected with the test probe by signal connecting line.

6. a kind of test method of test device as described in any one in claim 1-5 characterized by comprising

Remove the backlight of liquid crystal module；

Determine that the cover sheet of liquid crystal module is located at the lower section of array substrate, and the cover sheet is away from the array substrate It is parallel with the bottom surface of base station on one side；

Test probe is protruded between the array substrate of liquid crystal module and cover sheet, corresponding test point is tested；

Display module receives and shows test signal transmitted by test probe.

7. test method according to claim 6, which is characterized in that the array that test probe is protruded into liquid crystal module Corresponding test point is tested between substrate and cover sheet, is specifically included:

Movable drill base is inserted between the array substrate and cover sheet of the liquid crystal module so as to protrude into plate；

Light testing light source；

Reference test bar protrudes into the side that test point deviates from array substrate；

Test probe is in contact with test point.

8. test method according to claim 7, which is characterized in that the reference test bar protrudes into test point away from array substrate Side, specifically include: reference test bar along be mounted on base station sliding rail sliding.