CN113933547B - Detection fixture convenient to module quick replacement is surveyed - Google Patents

Detection fixture convenient to module quick replacement is surveyed Download PDF

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Publication number
CN113933547B
CN113933547B CN202111203456.4A CN202111203456A CN113933547B CN 113933547 B CN113933547 B CN 113933547B CN 202111203456 A CN202111203456 A CN 202111203456A CN 113933547 B CN113933547 B CN 113933547B
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China
Prior art keywords
upper cover
lower cover
rotating shaft
test
module
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CN202111203456.4A
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Chinese (zh)
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CN113933547A (en
Inventor
李炜
周晓亮
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Wuhan Haitai Zhongce Electronic Co ltd
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Wuhan Haitai Zhongce Electronic Co ltd
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Publication of CN113933547A publication Critical patent/CN113933547A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

The invention discloses a detection clamp convenient for quick replacement of a tested module, which comprises: the device comprises a lower cover and an upper cover, wherein one end of the upper cover is hinged with the lower cover through a first rotating shaft, and the upper cover is arranged above the lower cover in a turnover way around the first rotating shaft; the lower cover is internally provided with a tested module placing cavity, and the upper cover is overturned and pressed on the tested module placing cavity; the test probe is welded on the back plate, and the thimble head of the test probe sequentially penetrates through the positioning holes of the clamp bottom box and the lower cover, and the thimble head of the test probe is arranged at the bottom of the cavity for placing the tested module in a protruding mode. The test fixture has the advantages of simple structure, convenient and reliable use, and capability of rapidly completing a series of clamping actions such as replacement, compaction, connection of test signals and the like of the tested module. The testing fixture has expandability, and a plurality of testing fixtures can be installed by changing the size of the fixture box and the switch matrix of the backboard, so that batch testing of the tested modules is realized.

Description

Detection fixture convenient to module quick replacement is surveyed
Technical Field
The invention relates to the technical field of circuit module production, in particular to a detection clamp convenient for quick replacement of a tested module.
Background
The test fixture for rapidly replacing the tested module is mainly used for completing a series of clamping actions such as replacement, compaction, connection of test signals and the like of the tested module, ensuring rapid clamping of the tested module and reliable connection of the test signals, and completing testing of various performance indexes of the tested module. The existing solution is two scattered devices, so that the problems of fixed compression of the tested module and connection of test signals are respectively solved, the operation time is long, the failure rate is high, batch operation is difficult to perform, the product cost is increased, meanwhile, more restriction is put on technicians, and the difficulty and time for clamping the tested module by the technicians are increased.
Disclosure of Invention
The invention aims to provide a detection clamp which is convenient for quick replacement of a tested module, so as to solve the problems in the background technology.
In order to achieve the above purpose, the present invention provides the following technical solutions: detection fixture convenient to module quick replacement is surveyed: comprises the following steps of
The upper cover is hinged with the lower cover through a first rotating shaft, and the upper cover is arranged above the lower cover in a turnover way around the first rotating shaft; the lower cover is internally provided with a tested module placing cavity, and the upper cover is overturned and pressed on the tested module placing cavity;
The pressing plate is arranged in the pressing plate cavity; the two side ends of the pressing plate are respectively and rotatably hinged through a second rotating shaft; a first compression spring is arranged between the back surface of the pressing plate and the pressing plate cavity, and the first compression spring is arranged above the second rotating shaft; the pressing plate is elastically extruded by the first compression spring, rotates around the second rotating shaft and is obliquely arranged with the upper cover;
The clamp bottom box is fixedly arranged at the outer lower end of the lower cover; a back plate is horizontally and fixedly arranged in the inner cavity of the clamp bottom box;
The test probe is welded on the back plate, and the thimble head of the test probe sequentially penetrates through the positioning holes of the clamp bottom box and the lower cover, and the thimble head of the test probe is arranged at the bottom of the cavity for placing the tested module in a protruding mode.
Still further, be provided with a plurality of compression columns on the clamp plate front, be provided with the fixed orifices to the inboard indent on the compression column, the stiff end of compression column is provided with the screw thread, through compression column stiff end screw thread detachable setting is in the fixed orifices.
Furthermore, the upper cover is connected with the lower cover through a first rotating shaft, three torsion springs with an opening angle of 90 degrees are sleeved on the first rotating shaft, one elastic end of each torsion spring is elastically extruded at the upper side end of the upper cover, the other elastic end of each torsion spring is elastically extruded at the inner side end of the lower cover, and the torsion springs drive the upper cover to be far away from the lower cover.
Further, the test probe comprises a sleeve and a top needle, a copper wire spring is arranged in the sleeve, and the elastic direction of the copper wire spring is consistent with the length direction of the sleeve; one end of the thimble head is inserted into the sleeve and fixedly arranged on the copper wire spring; the copper wire spring drives the thimble head to move in a telescopic way.
Furthermore, a plurality of mounting holes are formed in the back plate, and the sleeves are fixedly arranged in the mounting holes in a one-to-one correspondence mode.
Furthermore, a locking handle is arranged at the end part of the upper cover, which is far away from the hinge joint of the upper cover and the lower cover, the locking handle is arranged at the front end of the upper cover through a third rotating shaft, a locking rod is arranged at the position, corresponding to the locking handle, of the lower cover, the locking handle is hooked on the locking rod, and the upper cover and the lower cover are locked and closed.
Further, a notch groove is formed in the locking handle side of the upper cover, the locking handle rotates around the third rotation axial notch groove, and the locking handle releases the locking rod; the notch groove is internally provided with a second compression spring, one end of the second compression spring is fixedly arranged in the notch groove, and the other end of the second compression spring is fixedly arranged on the locking handle.
Furthermore, the upper cover, the lower cover, the pressing plate, the pressing column and the locking handle are all made of PC materials; the first rotating shaft, the second rotating shaft, the third rotating shaft and the locking rod are all made of stainless steel materials.
Further, the shape and the size of the module to be tested placing cavity are correspondingly arranged with those of the module to be tested; and the left side and the right side of the measured module placing cavity are respectively provided with a material taking groove.
Further, the backboard is provided with a test signal output interface and a test signal input interface.
Compared with the prior art, the invention has the beneficial effects that: the test fixture has the advantages of simple structure, convenient and reliable use, and capability of rapidly completing a series of clamping actions such as replacement, compaction, connection of test signals and the like of the tested module.
When the locking handle is pressed down, the upper cover is easily sprung, the test probe jacks up the tested module, and the tested module is quickly taken out and replaced.
The test fixture is suitable for tested modules of different models by replacing pressing plates of different specifications, and reduces cost.
The testing fixture has expandability, and a plurality of testing fixtures can be installed by changing the size of the fixture box and the switch matrix of the backboard, so that batch testing of the tested modules is realized.
Drawings
FIG. 1 is a schematic perspective view of a detection fixture according to the present invention;
FIG. 2 is a side view of the inspection jig of the present invention;
FIG. 3 is a schematic cross-sectional view of FIG. 2 in accordance with the present invention;
FIG. 4 is a schematic perspective view of a detecting clamp according to the present invention;
FIG. 5 is a top view of the present invention shown in FIG. 4;
FIG. 6 is a schematic perspective view of a test probe of the test fixture of the present invention;
Fig. 7 is a schematic cross-sectional view of fig. 6 according to the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Referring to the drawings, the present invention provides a technical scheme: detection fixture convenient to module quick replacement is surveyed: comprises the following steps of
The upper cover 2 is hinged with the lower cover 1 through a first rotating shaft 21, and the upper cover 2 is arranged above the lower cover 1 in a turnover manner around the first rotating shaft 21; a tested module placing cavity 10 is arranged in the lower cover 1, and the upper cover 2 is overturned and pressed on the tested module placing cavity 10; the outer shape and the size of the tested module placing cavity 10 are correspondingly arranged with those of the tested module, and the inner cavity of the lower cover plays a role in limiting the tested module, so that the test probe can be accurately aligned with a test point of the tested module after the tested module is placed in the cavity. The left side and the right side in the module to be tested placing cavity 10 are respectively provided with a material taking groove 101, so that the module to be tested can be conveniently taken out.
The pressing plate 3 is arranged on the inner side of the upper cover 2, and a pressing plate cavity 20 is formed in the pressing plate 3; the two side ends of the pressing plate 3 are respectively and rotatably hinged through a second rotating shaft 22; a first compression spring 30 is arranged between the back surface of the pressing plate 3 and the pressing plate cavity 20, and the first compression spring 30 is arranged above the second rotating shaft 22; the pressing plate 3 is elastically pressed by the first pressing spring 30, and the pressing plate 3 rotates around the second rotating shaft 22 and is obliquely arranged with the upper cover 2; the pressing plate 3 and the upper cover 2 have a certain inclination angle. The front end of the pressing plate 3 is provided with a plurality of pressing columns 31, the pressing columns 31 are provided with fixing holes concave inwards towards the plate, the fixing ends of the pressing columns 31 are provided with threads, and the fixing ends of the pressing columns 31 are detachably arranged in the fixing holes through threads. The pressing column 31 has different sizes and lengths for different tested modules, and the fixed end of the pressing column is provided with threads, so that the pressing column can be conveniently detached from the pressing plate 3 and replaced. In the process of compacting the module to be tested, when the upper cover 2 rotates, the pressing column 31 on the pressing plate 3 always keeps the pressing surface parallel to the contact surface of the module to be tested, so that the pressing column 31 can vertically press the module to be tested, and the stress of the module to be tested is uniform.
The pressing plate 3 is installed in the pressing plate cavity 20, so that the pressing plate 3 can have a certain rotation angle, the rotation range is limited, the pressing column 31 can be ensured to vertically press on the tested module, and the pressing plate 3 can be protected from external interference during rotation.
The clamp bottom box 4 is fixedly arranged at the outer lower end of the lower cover 1; a back plate 5 is horizontally and fixedly arranged in the inner cavity of the clamp bottom box 4;
The test probe 6, the test probe 6 welding sets up on backplate 5, the top needle head 62 of test probe 6 passes anchor clamps end box 4 and the locating hole of lower cover 1 in proper order to the protruding bottom of setting up in the module of being tested and placing chamber 10 of the thimble head 62 of test probe 6.
The end of the upper cover 2, which is far away from the hinge joint of the upper cover 2 and the lower cover 1, is provided with a locking handle 7, the locking handle 7 is connected with the front end of the upper cover 2 through a third rotating shaft 23, the part of the lower cover 1 corresponding to the locking handle 7 is provided with a locking rod 8, the locking handle 7 is hooked on the locking rod 8, and the upper cover 2 and the lower cover 1 are locked and closed.
A notch 24 is arranged on the locking handle 7 side of the upper cover 2, the locking handle 7 rotates around a third rotation shaft 23 towards the notch 24, and the locking handle 7 releases the locking rod 8; a second compression spring 70 is arranged in the notch groove 24, one end of the second compression spring 70 is fixedly arranged in the notch groove 24, and the other end of the second compression spring is fixedly arranged on the locking handle 7.
The upper cover 2 and the lower cover 1 are connected through a first rotating shaft 21, three torsion springs 210 with an opening angle of 90 degrees are sleeved on the first rotating shaft 21, one elastic end of each torsion spring 210 is elastically extruded at the upper side end of the upper cover 2, the other elastic end of each torsion spring is elastically extruded at the inner side end of the lower cover 1, and the torsion springs 210 drive the upper cover 2 to be far away from the lower cover 1. After the locking handle 7 is pressed down, the upper cover 2 can be easily sprung, and the efficiency of replacing the tested module is improved.
The test probe 6 comprises a sleeve 61 and a thimble head 62, a plurality of mounting holes are formed in the back plate 5, and the sleeve 61 is fixedly arranged in the mounting holes in a one-to-one correspondence manner to play a role in fixing and limiting. A copper wire spring 60 is arranged in the sleeve 61, and the elastic direction of the copper wire spring 60 is consistent with the length direction of the sleeve 61; one end of the thimble head 62 is inserted into the sleeve 61 and fixedly arranged on the copper wire spring 60; the copper wire spring 60 drives the top needle 62 to move in a telescopic way. In this way, the top needle 62 protrudes to a certain height from the corresponding position of the module to be tested placing cavity 10, and can accurately align and firmly press the test point of the module to be tested when the module to be tested is placed in the cavity, thereby ensuring the signal communication during the test. When the upper cover 2 is opened, the thimble head 62 of the test probe 6 can jack up the tested module, so that the tested module can be conveniently removed and replaced.
The upper cover 2, the lower cover 1, the pressing plate 3, the pressing column 31 and the locking handle 7 are all made of PC materials; the strength and toughness of the test fixture can be ensured, the insulation effect can be achieved, and the tested module is not interfered. The first rotating shaft 21, the second rotating shaft 22, the third rotating shaft 23 and the locking rod 8 are made of stainless steel materials, so that the installation precision can be ensured, and the functions of rust prevention and corrosion prevention can be achieved.
Each test signal output interface and each test signal input interface are arranged on the backboard 5, the clamp box 4 provides an external interface, and the whole set of test clamp is ensured to meet various test requirements. .
In the description of the present invention, it should be understood that the terms "coaxial," "bottom," "one end," "top," "middle," "another end," "upper," "one side," "top," "inner," "front," "center," "two ends," etc. indicate orientations or positional relationships based on the orientation or positional relationships shown in the drawings, are merely for convenience in describing the present invention and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present invention.
Furthermore, the terms "first," "second," "third," "fourth," and the like are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated, whereby features defining "first," "second," "third," "fourth" may explicitly or implicitly include at least one such feature.
In the present invention, unless explicitly specified and limited otherwise, the terms "mounted," "configured," "connected," "secured," "screwed," and the like are to be construed broadly and may be, for example, fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; either directly or indirectly through intermediaries, or in communication with each other or in interaction with each other, unless explicitly defined otherwise, the meaning of the terms described above in this application will be understood by those of ordinary skill in the art in view of the specific circumstances.
Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims (9)

1. Detection anchor clamps convenient to by survey module quick replacement, its characterized in that: the novel anti-theft device comprises a lower cover (1) and an upper cover (2), wherein one end of the upper cover (2) is hinged with the lower cover (1) through a first rotating shaft (21), and the upper cover (2) is arranged above the lower cover (1) in a turnover manner around the first rotating shaft (21); a tested module placing cavity (10) is arranged in the lower cover (1), and the upper cover (2) is arranged on the tested module placing cavity (10) in a turnover pressing mode;
The pressing plate (3) is arranged on the inner side of the upper cover (2), a pressing plate cavity (20) is formed in the inner side of the upper cover, and the pressing plate (3) is arranged in the pressing plate cavity (20); the two side ends of the pressing plate (3) are respectively hinged through a second rotating shaft (22); a first compression spring (30) is arranged between the back surface of the pressing plate (3) and the pressing plate cavity (20), and the first compression spring (30) is arranged above the second rotating shaft (22); the pressing plate (3) is elastically extruded by the first compression spring (30), and the pressing plate (3) rotates around the second rotating shaft (22) and is obliquely arranged with the upper cover (2);
the clamp bottom box (4) is fixedly arranged at the outer lower end of the lower cover (1); a back plate (5) is horizontally and fixedly arranged in the inner cavity of the clamp bottom box (4);
The test probe (6), the welding of the said test probe (6) is set up on the back plate (5), the thimble head (62) of the said test probe (6) is passed the locating hole of the bottom box (4) of clamp and lower cover (1) sequentially, and the thimble head (62) of the test probe (6) is set up in the module to be tested and placed the bottom in the cavity (10) prominently;
The upper cover (2) is connected with the lower cover (1) through a first rotating shaft (21), three torsion springs (210) with opening angles of 90 degrees are sleeved on the first rotating shaft (21), one elastic end of each torsion spring (210) is elastically extruded at the upper side end of the upper cover (2), the other elastic end of each torsion spring is elastically extruded at the inner side end of the lower cover (1), and the torsion springs (210) drive the upper cover (2) to be far away from the lower cover (1).
2. The test fixture for facilitating rapid replacement of a module under test of claim 1, wherein: the front end of the pressing plate (3) is provided with a plurality of pressing columns (31), fixing holes inwards concave in the plate are formed in the pressing columns (31), threads are arranged on the fixing ends of the pressing columns (31), and the fixing ends of the pressing columns (31) are detachably arranged in the fixing holes through threads.
3. The test fixture for facilitating rapid replacement of a module under test of claim 1, wherein: the test probe (6) comprises a sleeve (61) and a thimble head (62), wherein a copper wire spring (60) is arranged in the sleeve (61), and the elastic direction of the copper wire spring (60) is consistent with the length direction of the sleeve (61); one end of the thimble head (62) is inserted into the sleeve (61) and fixedly arranged on the copper wire spring (60); the copper wire spring (60) drives the ejector pin head (62) to move in a telescopic mode.
4. A test fixture for facilitating quick replacement of a module under test as recited in claim 3, wherein: and a plurality of mounting holes are formed in the back plate (5), and the sleeves (61) are fixedly arranged in the mounting holes in a one-to-one correspondence manner.
5. The test fixture for facilitating rapid replacement of a module under test of claim 1, wherein: the end part of the upper cover (2) far away from the hinge joint of the upper cover and the lower cover (1) is provided with a locking handle (7), the locking handle (7) is connected with the front end of the upper cover (2) through a third rotating shaft (23), a locking rod (8) is arranged at the position, corresponding to the locking handle (7), of the lower cover (1), the locking handle (7) is hooked on the locking rod (8), and the upper cover (2) and the lower cover (1) are locked and closed.
6. The test fixture for facilitating rapid replacement of a module under test of claim 5, wherein: a notch groove (24) is formed in the side of the locking handle (7) of the upper cover (2), the locking handle (7) rotates around a third rotating shaft (23) into the notch groove (24), and the locking handle (7) releases the locking rod (8); a second compression spring (70) is arranged in the notch groove (24), one end of the second compression spring (70) is fixedly arranged in the notch groove (24), and the other end of the second compression spring is fixedly arranged on the locking handle (7).
7. The test fixture for facilitating quick replacement of a module under test of claim 6, wherein: the upper cover (2), the lower cover (1), the pressing plate (3), the pressing column (31) and the locking handle (7) are all made of PC materials; the first rotating shaft (21), the second rotating shaft (22), the third rotating shaft (23) and the locking rod (8) are all made of stainless steel materials.
8. The test fixture for facilitating rapid replacement of a module under test of claim 1, wherein: the appearance size of the module to be tested placing cavity (10) is arranged corresponding to the module to be tested; the left side and the right side in the tested module placing cavity (10) are respectively provided with a material taking groove (101).
9. The test fixture for facilitating rapid replacement of a module under test of claim 1, wherein: the backboard (5) is provided with a test signal output interface and a test signal input interface.
CN202111203456.4A 2021-10-15 2021-10-15 Detection fixture convenient to module quick replacement is surveyed Active CN113933547B (en)

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Application Number Priority Date Filing Date Title
CN202111203456.4A CN113933547B (en) 2021-10-15 2021-10-15 Detection fixture convenient to module quick replacement is surveyed

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Application Number Priority Date Filing Date Title
CN202111203456.4A CN113933547B (en) 2021-10-15 2021-10-15 Detection fixture convenient to module quick replacement is surveyed

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CN113933547B true CN113933547B (en) 2024-05-28

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Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113865823B (en) * 2021-09-27 2022-05-13 中国人民解放军国防科技大学 Quickly-replaceable pneumatic probe supporting and clamping device and method
CN116381282A (en) * 2023-03-07 2023-07-04 浙江东瓷科技有限公司 Aging test socket for small-intercept multi-lead packaging shell

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CN208172217U (en) * 2018-04-20 2018-11-30 浙江雷云科技有限公司 It is a kind of for testing the device of LED lamp bead on circuit board
CN111308323A (en) * 2020-03-31 2020-06-19 上海捷策创电子科技有限公司 Aging test seat and aging test device
CN113189375A (en) * 2021-05-06 2021-07-30 杭州中安电子有限公司 Microwave device test fixture

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CN204731001U (en) * 2015-05-25 2015-10-28 深圳市邦乐达科技有限公司 A kind of connector probe test fixture
CN105093105A (en) * 2015-08-25 2015-11-25 贵州航天计量测试技术研究所 Encapsulation microwave switch test device
CN105158524A (en) * 2015-08-25 2015-12-16 贵州航天计量测试技术研究所 Universal test fixture for surface mounted technology (SMT)-based diode components
CN208172217U (en) * 2018-04-20 2018-11-30 浙江雷云科技有限公司 It is a kind of for testing the device of LED lamp bead on circuit board
CN111308323A (en) * 2020-03-31 2020-06-19 上海捷策创电子科技有限公司 Aging test seat and aging test device
CN113189375A (en) * 2021-05-06 2021-07-30 杭州中安电子有限公司 Microwave device test fixture

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