CN220323378U - Profiling test fixture for high-voltage conductive block - Google Patents
Profiling test fixture for high-voltage conductive block Download PDFInfo
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- CN220323378U CN220323378U CN202321600944.3U CN202321600944U CN220323378U CN 220323378 U CN220323378 U CN 220323378U CN 202321600944 U CN202321600944 U CN 202321600944U CN 220323378 U CN220323378 U CN 220323378U
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- conductive block
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- block
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- 238000012360 testing method Methods 0.000 title claims abstract description 65
- 239000000523 sample Substances 0.000 claims abstract description 19
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 8
- 229910052802 copper Inorganic materials 0.000 claims description 8
- 239000010949 copper Substances 0.000 claims description 8
- 230000000903 blocking effect Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- 229910001369 Brass Inorganic materials 0.000 description 2
- 239000010951 brass Substances 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 239000007769 metal material Substances 0.000 description 2
- 230000000149 penetrating effect Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005485 electric heating Methods 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
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- Measuring Leads Or Probes (AREA)
Abstract
The utility model belongs to the technical field of testing devices, and particularly relates to a high-voltage conductive block profiling testing jig which comprises a base, a first conductive block and a second conductive block, wherein a containing groove for containing a product is formed in the base, and a through hole for a testing probe to pass through and contact with the product is formed in the bottom of the base; the first conductive block is arranged between the product and the base, one end of the first conductive block is contacted with the bottom of the product, the other end of the first conductive block is contacted with the side end of the product, and the bottom of the first conductive block is free of the through hole; the second conductive block is arranged on the base and is contacted with the product, and a round hole contacted with the test probe is formed in one side of the second conductive block, which is away from the product; the shape of the first conductive block and the second conductive block is adapted to the shape of the product. Therefore, quality problems caused by breakage of the rubber shell and the wire rod of the product, overlong peeling and the like are effectively detected, and the test fixture is low in cost.
Description
Technical Field
The utility model belongs to the technical field of testing devices, and particularly relates to a profiling testing jig for a high-voltage conductive block.
Background
The jig is a large class of tools for woodworking, ironwork, and other handicraft articles, and is mainly used as a tool for assisting in controlling position or motion (or both). The test fixture belongs to a category below the fixture, and is a fixture which is specially used for testing and testing functions, power calibration, service life, performance and the like of products. The test fixture is mainly used for testing various indexes of products on a production line. Tools have been widely used in the industry, including mechanical tools, woodworking tools, welding tools, jewelry tools, and other fields. Some types of jigs are also referred to as "dies" or "aids", the primary purpose of which is to repeat and accurately repeat the remanufacturing of a part.
In some products, breakage of the rubber shell, wire, etc. of the product needs to be identified by naked eyes or by using a magnifying glass, which easily causes quality problems of the product flowing out.
Disclosure of Invention
The utility model aims to provide a profiling test fixture for a high-voltage conductive block, and aims to solve the technical problem that damages of rubber shells, wires and the like of products in the prior art need to be identified by naked eyes or by using a magnifying glass.
In order to achieve the above purpose, the high-voltage conductive block profiling test fixture provided by the embodiment of the utility model comprises a base, a first conductive block and a second conductive block, wherein a containing groove for containing a product is formed in the base, and a through hole for a test probe to pass through and contact with the product is formed in the bottom of the base; the first conductive block is arranged between the product and the base, one end of the first conductive block is contacted with the bottom of the product, the other end of the first conductive block is contacted with the side end of the product, and the bottom of the first conductive block is free of the through hole; the second conductive block is arranged on the base and is contacted with the product, and a round hole contacted with the test probe is formed in one side of the second conductive block, which is away from the product; the shape of the first conductive block and the second conductive block is adapted to the shape of the product.
Optionally, a step for limiting the product is arranged in the accommodating groove.
Optionally, a limiting groove for limiting the first conductive block is arranged at the bottom of the accommodating groove.
Optionally, a contact surface attached to the side surface of the product is arranged on one side surface of the first conductive block.
Optionally, the bottom of base is provided with the mounting hole and is located the fixed orifices of the relative both sides of mounting hole, two the fixed orifices all with the mounting hole intercommunication runs through the side of base.
Optionally, two opposite sides of the base are provided with blocking arms, a gap is formed between the two blocking arms, and the second conductive block is located at the gap.
Optionally, the first conductive block is a copper block.
Optionally, the second conductive block is a copper block.
The technical scheme of the high-voltage conductive block profiling test fixture provided by the embodiment of the utility model has at least one of the following technical effects: when the electric heating device is used, a product is placed in the accommodating groove, and at the moment, the product is in contact with the first conductive block and the second conductive block. Then the test fixture is pressed down through the driving element, the test probes at the bottom of the test fixture are contacted with the product by penetrating through the base, the other group of test probes are contacted with the second copper block by driving, and finally voltage is applied to the copper block and the tested product, so that the quality problems caused by the breakage of the rubber shell and the wire rod of the product, overlong peeling and the like are effectively detected, and the test fixture is low in cost. The first conductive block and the second conductive block can be designed into proper shapes according to the size of a product to be tested; the test fixture can be flexibly assembled to other fixtures or can be assembled to test equipment.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present utility model, the drawings that are needed in the embodiments or the description of the prior art will be briefly described below, it being obvious that the drawings in the following description are only some embodiments of the present utility model, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
Fig. 1 is a schematic structural diagram of a high-voltage conductive block profiling test fixture according to an embodiment of the present utility model.
Fig. 2 is a schematic structural exploded view of a high-voltage conductive block profiling test fixture according to an embodiment of the present utility model.
Fig. 3 is a cross-sectional view of a high-voltage conductive block profiling test fixture provided by an embodiment of the utility model.
Fig. 4 is a schematic structural diagram of a base of a high-voltage conductive block profiling test fixture according to an embodiment of the present utility model.
Fig. 5 is a schematic structural diagram of a high-voltage conductive block profiling test fixture according to another embodiment of the present utility model under another view angle.
Wherein, each reference sign in the figure:
1-product 10-base 11-containing groove
12-through hole 13-step 14-limit groove
15-mounting hole 16-fixing hole 17-blocking arm
18-notch 20-first conductive block 21-contact surface
30-second conductive block 31-circular hole.
Detailed Description
Embodiments of the present utility model are described in detail below, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to like or similar elements or elements having like or similar functions throughout. The embodiments described below by referring to fig. 1 to 5 are exemplary and intended to illustrate embodiments of the present utility model and should not be construed as limiting the utility model.
In the description of the embodiments of the present utility model, it should be understood that the terms "length," "width," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like indicate orientations or positional relationships based on the orientation or positional relationships shown in the drawings, merely to facilitate description of the embodiments of the present utility model and simplify description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present utility model.
Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more such feature. In the description of the embodiments of the present utility model, the meaning of "plurality" is two or more, unless explicitly defined otherwise.
In the embodiments of the present utility model, unless explicitly specified and limited otherwise, the terms "mounted," "connected," "secured" and the like are to be construed broadly and include, for example, either permanently connected, removably connected, or integrally formed; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communicated with the inside of two elements or the interaction relationship of the two elements. The specific meaning of the above terms in the embodiments of the present utility model will be understood by those of ordinary skill in the art according to specific circumstances.
In one embodiment of the present utility model, as shown in fig. 1 to 5, a high voltage conductive block profiling test fixture is provided, which includes a base 10, a first conductive block 20 and a second conductive block 30, wherein the first conductive block 20 and the second conductive block 30 are respectively located at two adjacent sides of a product 1. The base 10 is provided with a containing groove 11 for containing the product 1, and the product 1 is not easy to move after being placed in the containing groove 11. The bottom of the base 10 is provided with a plurality of through holes 12 for the test probes to pass through and contact with the product 1, the positions of the through holes 12 are set according to the structure of the product 1, and the test probes pass through the corresponding through holes 12 and contact with the product 1 to supply power to the product 1; the first conductive block 20 is arranged between the product 1 and the base 10, one end of the first conductive block 20 is in contact with the bottom of the product 1, the other end of the first conductive block 20 is in contact with the side end of the product 1, the bottom of the first conductive block 20 is free of the through hole 12, the whole first conductive block 20 is in an L-shaped arrangement, when the first conductive block 20 is assembled, the first conductive block 20 is firstly arranged on the base 10, then the bottom of the first conductive block 20 of the product 1 is placed, a slot for avoiding the empty test probe is formed according to the position of the through hole 12, and the test probe is prevented from being blocked from contacting the product 1 after the test probe passes through the through hole 12; the second conductive block 30 is disposed on the base 10, and the second conductive block 30 contacts the product 1, a circular hole 31 contacting with a test probe is disposed on a side of the second conductive block 30 facing away from the product 1, and the test probe is driven to be inserted into the second conductive block 30; the shape of the first conductive block 20 and the second conductive block 30 is adapted to the shape of the product 1. The test probe is a spring probe.
In use, the product 1 is placed in the receiving space 11, at which time the product 1 is in contact with the first conductive block 20 and the second conductive block 30. Then the test fixture is pressed down by the driving element, the test probes at the bottom of the test fixture are contacted with the product 1 by penetrating through the base 10, the other group of test probes are contacted with the second conductive block 30 by driving, and finally voltage is applied to the first conductive block 20, the second conductive block 30 and the tested product 1, so that the quality problems caused by the breakage of the rubber shell and the wire rod of the product 1, overlong peeling and the like are effectively detected, and the test fixture is low in cost. Wherein, the first conductive block 20 and the second conductive block 30 can be designed into proper shapes according to the size of the tested product 1; the test fixture can be flexibly assembled to other fixtures or can be assembled to test equipment. One accommodating groove 11 of the test fixture corresponds to one product 1, and the number of the accommodating grooves can be increased according to the productivity and the actual needs, so that the test fixture can be flexibly matched.
Wherein, base 10 is the rectangle setting, and four bights of base 10 all are convex fillet setting.
In this embodiment, as shown in fig. 1 to 5, a step 13 for limiting the product 1 is disposed in the accommodating groove 11. Specifically, due to the arrangement of the step 13, after the product 1 is placed conveniently, the product 1 is limited, and the product 1 is prevented from moving.
In this embodiment, as shown in fig. 1 to 5, a limiting groove 14 for limiting the first conductive block 20 is disposed at the bottom of the accommodating groove 11. Specifically, the shape of the limiting groove 14 is adapted to the bottom shape of the first conductive block 20, so as to prevent the first conductive block 20 from moving after the first conductive block 20 is mounted, which results in closing the through hole 12 and affecting the test.
In this embodiment, as shown in fig. 1 to 2, a contact surface 21 that is attached to a side of the product 1 is provided on a side of the first conductive block 20. Specifically, the first contact surface 21 contacts with the side end of the product 1 to realize detection of whether the rubber shell and the wire of the product 1 are damaged after power is applied.
In this embodiment, as shown in fig. 1 to 5, the bottom of the base 10 is provided with a mounting hole 15 and fixing holes 16 located on opposite sides of the mounting hole 15, and both of the fixing holes 16 are communicated with the mounting hole 15 and penetrate through the side ends of the base 10. Specifically, the fixture or the testing device can be connected with other fixtures or testing devices through the mounting holes 15 and the fixing holes 16, one end of the fixture or the testing device is inserted into the mounting holes 15, then the fixture or the testing device is locked through the fixing holes 16 by locking pieces, the locking pieces can be bolts, bolts or screws, and the like, and correspondingly, threads are arranged in the fixing holes 16.
In this embodiment, as shown in fig. 1 to 5, two opposite sides of the base 10 are provided with blocking arms 17, a gap 18 is formed between the two blocking arms 17, and the second conductive block 30 is located at one gap 18. In particular, the blocking arm 17 extends vertically upwards, on the one hand protecting the product 1, and the other conveniently formed notch 18 facilitates the placement of the second conductive block 30. The second conductive block 30 is in contact with the wire of the product 1.
In this embodiment, as shown in fig. 1 to 2, the first conductive block 20 is a copper block. Specifically, the first conductive block 20 is made of a metal material, preferably brass.
In this embodiment, as shown in fig. 1 to 2, the second conductive block 30 is a copper block. Specifically, the second conductive block 30 is made of a metal material, preferably brass.
The foregoing description of the preferred embodiments of the utility model is not intended to be limiting, but rather is intended to cover all modifications, equivalents, and alternatives falling within the spirit and principles of the utility model.
Claims (8)
1. A high-voltage conductive block profiling test fixture is characterized in that: the testing device comprises a base, a first conductive block and a second conductive block, wherein a containing groove for containing a product is formed in the base, and a through hole for a testing probe to pass through and contact with the product is formed in the bottom of the base; the first conductive block is arranged between the product and the base, one end of the first conductive block is contacted with the bottom of the product, the other end of the first conductive block is contacted with the side end of the product, and the bottom of the first conductive block is free of the through hole; the second conductive block is arranged on the base and is contacted with the product, and a round hole contacted with the test probe is formed in one side of the second conductive block, which is away from the product; the shape of the first conductive block and the second conductive block is adapted to the shape of the product.
2. The high voltage conductive block profiling test jig of claim 1, wherein: the accommodating groove is internally provided with a step for limiting products.
3. The high voltage conductive block profiling test jig of claim 1, wherein: and a limiting groove for limiting the first conductive block is formed in the bottom of the accommodating groove.
4. The high voltage conductive block profiling test jig according to any one of claims 1 to 3, wherein: and a contact surface attached to the side surface of the product is arranged on one side surface of the first conductive block.
5. The high voltage conductive block profiling test jig according to any one of claims 1 to 3, wherein: the bottom of base is provided with the mounting hole and is located the fixed orifices of the relative both sides of mounting hole, two the fixed orifices all with the mounting hole intercommunication runs through the side of base.
6. The high voltage conductive block profiling test jig according to any one of claims 1 to 3, wherein: the two opposite sides of the base are provided with baffle arms, a gap is formed between the two baffle arms, and the second conductive block is positioned at one gap.
7. The high voltage conductive block profiling test jig according to any one of claims 1 to 3, wherein: the first conductive block is a copper block.
8. The high voltage conductive block profiling test jig according to any one of claims 1 to 3, wherein: the second conductive block is a copper block.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321600944.3U CN220323378U (en) | 2023-06-20 | 2023-06-20 | Profiling test fixture for high-voltage conductive block |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321600944.3U CN220323378U (en) | 2023-06-20 | 2023-06-20 | Profiling test fixture for high-voltage conductive block |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220323378U true CN220323378U (en) | 2024-01-09 |
Family
ID=89424713
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202321600944.3U Active CN220323378U (en) | 2023-06-20 | 2023-06-20 | Profiling test fixture for high-voltage conductive block |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220323378U (en) |
-
2023
- 2023-06-20 CN CN202321600944.3U patent/CN220323378U/en active Active
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