CN206470367U - A kind of test equipment for relay - Google Patents

A kind of test equipment for relay Download PDF

Info

Publication number
CN206470367U
CN206470367U CN201620877368.0U CN201620877368U CN206470367U CN 206470367 U CN206470367 U CN 206470367U CN 201620877368 U CN201620877368 U CN 201620877368U CN 206470367 U CN206470367 U CN 206470367U
Authority
CN
China
Prior art keywords
relay
control system
analog control
test
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201620877368.0U
Other languages
Chinese (zh)
Inventor
施元军
郭靖
刘凯
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TWINSOLUTION TECHNOLOGY Ltd
Original Assignee
TWINSOLUTION TECHNOLOGY Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TWINSOLUTION TECHNOLOGY Ltd filed Critical TWINSOLUTION TECHNOLOGY Ltd
Priority to CN201620877368.0U priority Critical patent/CN206470367U/en
Application granted granted Critical
Publication of CN206470367U publication Critical patent/CN206470367U/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

The utility model is related to a kind of test equipment for relay, including relay contact analog control system motherboard circuit and MCU units, the input of the relay contact analog control system motherboard circuit is connected with the output end of power subsystem, the output end of the relay contact analog control system motherboard circuit is connected with the input of extension/drive circuit, the input of the relay contact analog control system motherboard circuit is connected with the output end of the compatible tool of test, the output end of the relay contact analog control system motherboard circuit is connected with the input of MCU units, the input of the MCU units also with power subsystem, the output end of extension/drive circuit and the compatible tool of test is connected, the output end of the MCU units is connected with the input of host computer.The utility model can effectively reduce application cost by detection, help to shorten test period, reduce testing cost.

Description

A kind of test equipment for relay
Technical field
The utility model is related to a kind of test equipment, more particularly to a kind of test equipment for relay, belongs to and partly leads Body field.
Background technology
Generally in semiconductor applications, the cost of a chips has focused largely on the pressure that semiconductor test is brought.
In semiconductor test, have on the interface card that substantial amounts of relay application is tested to FT and CP.For cutting Change TCH test channel, the various functions such as adjustment circuit.And the quality of relay, the quality of test and the effect of test can be directly affected Rate.So, required basic detection during in order to test, it is essential to develop a relay test set, is used for The defective products of relay needed for excluding.Reduce caused testing cost therefrom.
In view of above-mentioned defect, the design people is actively subject to research and innovation, to found a kind of being used for for new structure The test equipment of relay, makes it with more the value in industry.
Utility model content
In order to solve the above technical problems, the purpose of this utility model is to provide a kind of test equipment for relay.
To achieve the above object, the utility model is adopted the following technical scheme that:
A kind of test equipment for relay, including relay contact analog control system motherboard circuit and MCU units, the relay are surveyed The input of examination motherboard circuit is connected with the output end of power subsystem, the output end of the relay contact analog control system motherboard circuit and expansion The input of exhibition/drive circuit is connected, the input of the relay contact analog control system motherboard circuit and the output end of the compatible tool of test It is connected, the output end of the relay contact analog control system motherboard circuit is connected with the input of MCU units, the input of the MCU units Also be connected with the output end of power subsystem, extension/drive circuit and the compatible tool of test, the output end of the MCU units with it is upper The input of position machine is connected.
Further, the described test equipment for relay, wherein, the extension/drive circuit is 74HC373 drive circuits, or be 74HC238IO expanded circuits.
Again further, the described test equipment for relay, wherein, the compatible tool of test is compatibility The tool of PCB interfaces/insertion slot type.
Again further, the described test equipment for relay, wherein, the relay contact analog control system motherboard circuit with Transmission line is connected between test product.
Again further, the described test equipment for relay, wherein, the transmission line is provided with delay time T, Its formula is as follows:
Wherein, L:The overall length of transmission line;
C:The light velocity 3 × 108m/s;
ε:The dielectric constant of PCB media.
Again further, the described test equipment for relay, wherein, in addition to over-current protecting unit, it is described Over-current protecting unit is connected with relay contact analog control system motherboard circuit.
By such scheme, the utility model at least has advantages below:
1) storage relay is detected, excludes unqualified relay, it is to avoid unqualified relay is to subsequent product Function and malfunction elimination cause direct or indirect influence, reduce application cost.
2) when help tester solves test, to the malfunction elimination of relay, the workload of tester is alleviated, Help to shorten test period, reduce testing cost.
Described above is only the general introduction of technical solutions of the utility model, in order to better understand skill of the present utility model Art means, and being practiced according to the content of specification, with preferred embodiment of the present utility model and coordinate accompanying drawing detailed below Describe in detail bright as after.
Brief description of the drawings
In order to illustrate more clearly of the technical scheme of the utility model embodiment, it will use below required in embodiment Accompanying drawing be briefly described, it will be appreciated that the following drawings illustrate only some embodiments of the present utility model, therefore should not be by Regard the restriction to scope as, for those of ordinary skill in the art, on the premise of not paying creative work, may be used also To obtain other related accompanying drawings according to these accompanying drawings.
Fig. 1 is structural representation of the present utility model;
Fig. 2 is the structural representation of relay contact analog control system motherboard circuit.
Embodiment
With reference to the accompanying drawings and examples, embodiment of the present utility model is described in further detail.Below Embodiment is used to illustrate the utility model, but is not limited to scope of the present utility model.
In order that those skilled in the art more fully understand the utility model scheme, it is real below in conjunction with the utility model Accompanying drawing in example is applied, the technical scheme in the utility model embodiment is clearly and completely described, it is clear that described reality It is only a part of embodiment of the utility model to apply example, rather than whole embodiments.Generally described in accompanying drawing and show here The component of the utility model embodiment gone out can be arranged and designed with a variety of configurations.Therefore, below in accompanying drawing The detailed description of the embodiment of the present utility model of middle offer is not intended to limit claimed scope of the present utility model, and It is to be merely representative of selected embodiment of the present utility model.Based on embodiment of the present utility model, those skilled in the art are not having The every other embodiment obtained on the premise of making creative work, belongs to the scope of the utility model protection.
Embodiment
As shown in figure 1, a kind of test equipment for relay, including relay contact analog control system motherboard circuit 1 and MCU units 2, the input of the relay contact analog control system motherboard circuit 1 is connected with the output end of power subsystem 3, the relay contact analog control system mainboard electricity The output end on road 1 is connected with the input of extension/drive circuit 4, the input of the relay contact analog control system motherboard circuit 1 and test The output end of compatible tool 5 is connected, and the output end of the relay contact analog control system motherboard circuit 1 is connected with the input of MCU units 2, The output end of the input of the MCU units 2 tool 5 also compatible with power subsystem 3, extension/drive circuit 4 and test is connected, The output end of the MCU units 2 is connected with the input of upper 6 machine.Pass through MCU units and relay contact analog control system motherboard circuit The detection of the automation to relay can be realized by coordinating, it is ensured that the yield of the relay used, so as to reduce application cost and survey Try cost.
As shown in Fig. 2 relay contact analog control system motherboard circuit described in the utility model includes relay chip, the relay First pin of chip is connected with DC5V, and the negative electrode also with diode D33 is connected, diode D33 anode and relay 8th pin of chip is connected, external first signal terminal of the 8th pin of relay chip, and the of the relay chip Two pins are connected with diode D32 anode, and the D32 of diode negative electrode is grounded by resistance R41, and the second of relay chip The external secondary signal terminals of pin, external 3rd signal terminal of the 3rd pin of the relay chip, the relay 4th pin of chip is connected with diode D34 anode, and the negative electrode of the diode D34 is grounded by resistance R42, and relay External 4th signal terminal of the 4th pin of device chip, the 5th pin of the relay chip and diode D36 anode It is connected, diode D36 negative electrode is grounded by resistance R44, external 5th signal terminal of the 5th pin of relay chip, institute State external 6th signal terminal of the 6th pin of relay chip, the 7th pin of the relay and diode D35 sun Extremely it is connected, diode D35 negative electrode is grounded by resistance 43, and the external 7th signal wiring of the 7th pin of relay chip End.The quality of relay can be detected by the device, so that it is guaranteed that being used using the normal of relay.
Diode D32 described in the utility model, diode D34, diode D35, diode D36 are light-emitting diodes Which in relay pipe, can effectively watch go wrong, facilitate the maintenance in later stage using light emitting diode, make it weight Multiple to utilize, making up to reduces the purpose of cost.
Extension/drive circuit 4 described in the utility model is 74HC373 drive circuits, or extends electricity for 74HC238IO Road, extension/drive circuit can be passed through using extension/drive circuit 4 when not enough connecing occurs in relay contact analog control system motherboard circuit 4 pairs of its I/O ports expand, and make up to reasonable demand.
The tool that compatible tool 5 is compatibility PCB interfaces/insertion slot type is tested described in the utility model in addition, due to not Incompatible possibility is deposited in the pin position of same relay and encapsulation, in order to the relay of compatible producers as many as possible, design The tool of one compatibility PCB interfaces/insertion slot type, come the tool of the pin position that reaches compatible different relay, reduce its use it is different Test device, so as to reduce use cost.
For above-mentioned tool, for the relay using paster, it is possible to use only the tool of insertion slot type, pass through insertion slot type Tool be connected with relay contact analog control system motherboard circuit, so as to meet the convenience of test.But also it is easy to disassemble, easy to operate, it is most main What is wanted is the precision that can be controlled on delay test.
And for the relay of PCB interfaces, there is interface daughter board, measured relay is arranged on interface daughter board, daughter board tool Standby corresponding signaling transfer point, allow measured relay pin position and the pin non-colinear position of mainboard, to realize testing requirement.
Transmission line is connected between relay contact analog control system motherboard circuit and test product described in above-mentioned wiring, and it is described Transmission line is provided with delay time T, and its formula is as follows:
Wherein, L:The overall length of transmission line;
C:The light velocity 3 × 108m/s;
ε:The dielectric constant of PCB media.
In actual test, due to test the delay of relay, due to relay contact analog control system, it is necessary to use Transmission line, and can produce certain delay time T using transmission line, general delay time delay is or even the meeting in nanosecond rank Smaller, the relay delay accuracy in order to ensure detecting can just obtain accurate, it is necessary to the delay to transmission line is controlled by Result.
Operation principle of the present utility model is as follows:
Power subsystem passes through test as the electric supply installation of relay contact analog control system motherboard circuit in relay contact analog control system motherboard circuit Relay is connected with relay contact analog control system motherboard circuit in the presence of compatible tool, the instruction transmitted by MCU units is to relay The circuit carried in device test flap circuit carries out automatic detection, the break-make of circuitry self test relay and delay to relay, and The data hair tested out by relay contact analog control system motherboard circuit feeds back to MCU units again, the data finally fed back to by MCU units Send the good or bad situation for allowing tester to be apparent from the relay into host computer.
For the personal safety of tester in the utility model, over-current protecting unit with the addition of.When electric current is more than 2A General supply can disconnect, and the software being equipped with also has equipment self-inspection function, and after the power-up, equipment can carry out self-inspection first, really Whether normal recognize state, then can just operate.Intuitively LED, which is had, in test, on device panel carrys out display device State.
The utility model at least has advantages below:
1) storage relay is detected, excludes unqualified relay, it is to avoid unqualified relay is to subsequent product Function and malfunction elimination cause direct or indirect influence, reduce application cost.
2) when help tester solves test, to the malfunction elimination of relay, the workload of tester is alleviated, Help to shorten test period, reduce testing cost.
Described above is only preferred embodiment of the present utility model, is not limited to the utility model, it is noted that For those skilled in the art, on the premise of the utility model technical principle is not departed from, it can also do Go out some improvement and modification, these improvement and modification also should be regarded as protection domain of the present utility model.

Claims (6)

1. a kind of test equipment for relay, it is characterised in that:Including relay contact analog control system motherboard circuit and MCU units, institute The input of relay contact analog control system motherboard circuit is stated with the output end of power subsystem to be connected, the relay contact analog control system motherboard circuit it is defeated Go out end with the input of extension/drive circuit to be connected, input and the compatible tool of test of the relay contact analog control system motherboard circuit Output end be connected, the output end of the relay contact analog control system motherboard circuit is connected with the input of MCU units, the MCU units Input be also connected with the output end of power subsystem, extension/drive circuit and the compatible tool of test, the MCU units it is defeated Go out end with the input of host computer to be connected.
2. the test equipment according to claim 1 for relay, it is characterised in that:Extension/the drive circuit is 74HC373 drive circuits, or be 74HC238IO expanded circuits.
3. the test equipment according to claim 1 for relay, it is characterised in that:The compatible tool of test is simultaneous Hold the tool of PCB interfaces/insertion slot type.
4. the test equipment according to claim 1 for relay, it is characterised in that:The relay contact analog control system mainboard electricity Transmission line is connected between road and test product.
5. the test equipment according to claim 4 for relay, it is characterised in that:When the transmission line is provided with delay Between T, its formula is as follows:
Wherein, L:The overall length of transmission line;
C:The light velocity 3 × 108m/s;
ε:The dielectric constant of PCB media.
6. the test equipment for relay according to any one in claim 1 to 5, it is characterised in that:Also wrap Over-current protecting unit is included, the over-current protecting unit is connected with relay contact analog control system motherboard circuit.
CN201620877368.0U 2016-08-15 2016-08-15 A kind of test equipment for relay Active CN206470367U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201620877368.0U CN206470367U (en) 2016-08-15 2016-08-15 A kind of test equipment for relay

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201620877368.0U CN206470367U (en) 2016-08-15 2016-08-15 A kind of test equipment for relay

Publications (1)

Publication Number Publication Date
CN206470367U true CN206470367U (en) 2017-09-05

Family

ID=59709672

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201620877368.0U Active CN206470367U (en) 2016-08-15 2016-08-15 A kind of test equipment for relay

Country Status (1)

Country Link
CN (1) CN206470367U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106226691A (en) * 2016-08-15 2016-12-14 苏州韬盛电子科技有限公司 A kind of test equipment for relay

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106226691A (en) * 2016-08-15 2016-12-14 苏州韬盛电子科技有限公司 A kind of test equipment for relay
CN106226691B (en) * 2016-08-15 2023-03-21 苏州韬盛电子科技有限公司 Test equipment for relay

Similar Documents

Publication Publication Date Title
CN100473997C (en) False pin soldering test device and method
US20170060214A1 (en) Indication system and electronic device utilizing the same
CN102999096B (en) Computing machine
CN216901630U (en) Interface conversion circuit and chip burning device
CN206470367U (en) A kind of test equipment for relay
CN202583376U (en) I/O detection system of FPGA development board
CN214041466U (en) Universal aging motherboard, adapter plate and testing device
CN106226691B (en) Test equipment for relay
CN103777386A (en) LCM (Liquid Crystal Display Module) testing machine
CN201589829U (en) Liquid crystal display module short circuit detecting system
CN101813733B (en) MSP85 mode panel-selecting driving tester
CN203479945U (en) Aviation plug port testing apparatus
CN104183272A (en) Self-inspection and burning device and method of stamp hole packaging core board
US20130328580A1 (en) Test circuit for power supply unit
CN201965202U (en) Electrostatic discharge (ESD) test equipment
CN205210259U (en) EMMC test circuit
CN104793093B (en) Computer external interface reliability test device
CN211505837U (en) On-off detection device supporting various cables
CN202471877U (en) Detection apparatus for open circuit and short circuit
CN104422844A (en) Aviation plug interface test device
CN203133129U (en) DC-DC probe card board
CN203519782U (en) Electronic device
CN105163480A (en) Circuit board and intelligent terminal
CN203324973U (en) Onboard USB automatic switching protection device
CN204291255U (en) A kind of VGA data wire tester

Legal Events

Date Code Title Description
GR01 Patent grant
GR01 Patent grant