CN106226691A - A kind of test equipment for relay - Google Patents
A kind of test equipment for relay Download PDFInfo
- Publication number
- CN106226691A CN106226691A CN201610664487.2A CN201610664487A CN106226691A CN 106226691 A CN106226691 A CN 106226691A CN 201610664487 A CN201610664487 A CN 201610664487A CN 106226691 A CN106226691 A CN 106226691A
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- China
- Prior art keywords
- relay
- diode
- pin
- control system
- analog control
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/3277—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches
- G01R31/3278—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches of relays, solenoids or reed switches
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The present invention relates to a kind of test equipment for relay, including relay contact analog control system motherboard circuit and MCU unit, the described input of relay contact analog control system motherboard circuit is connected with the outfan of power subsystem, the outfan of described relay contact analog control system motherboard circuit is connected with the input of extension/drive circuit, the outfan of the input of described relay contact analog control system motherboard circuit tool compatible with test is connected, the outfan of described relay contact analog control system motherboard circuit is connected with the input of MCU unit, the input of described MCU unit also with power subsystem, the outfan of extension/drive circuit and the compatible tool of test is connected, the described outfan of MCU unit is connected with the input of host computer.The present invention can effectively reduce application cost by detection, contributes to shortening test period, reduces testing cost.
Description
Technical field
The present invention relates to a kind of test equipment, particularly relate to a kind of test equipment for relay, belong to quasiconductor neck
Territory.
Background technology
Generally at semiconductor applications, the cost of a chips has focused largely on the pressure that semiconductor test brings.
When semiconductor test, have on the interface card that substantial amounts of relay application is tested to FT Yu CP.For cutting
Change TCH test channel, adjust the various functions such as circuit.And the quality of relay, the quality of test and the effect of test can be directly affected
Rate.So, in order to basic detection required during test, it is requisite for developing a relay test set, is used for
Get rid of the defective products of required relay.Reduce the testing cost caused therefrom.
Because above-mentioned defect, the design people, the most in addition research and innovation, to found a kind of new structure for
The test equipment of relay so that it is have more the value in industry.
Summary of the invention
For solving above-mentioned technical problem, it is an object of the invention to provide a kind of test equipment for relay.
For achieving the above object, the present invention adopts the following technical scheme that
A kind of test equipment for relay, including relay contact analog control system motherboard circuit and MCU unit, described relay is surveyed
The input of examination motherboard circuit is connected with the outfan of power subsystem, the outfan of described relay contact analog control system motherboard circuit and expansion
The input of exhibition/drive circuit is connected, the outfan of the input of described relay contact analog control system motherboard circuit tool compatible with test
Being connected, the outfan of described relay contact analog control system motherboard circuit is connected with the input of MCU unit, the input of described MCU unit
The outfan of also compatible with power subsystem, extension/drive circuit and test tool is connected, and the outfan of described MCU unit is with upper
The input of position machine is connected.
Further, the described test equipment for relay, wherein, described relay contact analog control system motherboard circuit includes continuing
Electrical equipment chip, the first pin of described relay chip is connected with DC5V, and also is connected with the negative electrode of diode D33, two poles
The anode of pipe D33 is connected with the 8th pin of relay chip, the 8th external first signal terminal of pin of relay chip,
Second pin of described relay chip is connected with the anode of diode D32, and the negative electrode of the D32 of diode is connect by resistance R41
Ground, the second pin external secondary signal terminals of relay chip, external 3rd letter of the 3rd pin of described relay chip
Number terminals, the 4th pin of described relay chip is connected with the anode of diode D34, and the negative electrode of described diode D34 leads to
Crossing resistance R42 ground connection, and the 4th external 4th signal terminal of pin of relay chip, the 5th of described relay chip draws
Foot is connected with the anode of diode D36, and the negative electrode of diode D36 passes through resistance R44 ground connection, outside the 5th pin of relay chip
Connect the 5th signal terminal, the 6th external 6th signal terminal of pin of described relay chip, the 7th of described relay
Pin is connected with the anode of diode D35, and the negative electrode of diode D35 passes through resistance 43 ground connection, and the 7th of relay chip draws
External 7th signal terminal of foot.
Further, the described test equipment for relay, wherein, described diode D32, diode D34, two
Pole pipe D35, diode D36 are light emitting diode.
Further, the described test equipment for relay, wherein, described extension/drive circuit is 74HC373
Drive circuit, or be 74HC238IO expanded circuit.
The most further, the described test equipment for relay, wherein, the compatible tool of described test is compatible
The tool of PCB interface/insertion slot type.
The most further, the described test equipment for relay, wherein, described relay contact analog control system motherboard circuit with
Connect between test product and have transmission line.
The most further, the described test equipment for relay, wherein, described transmission line is provided with delay time T,
Its formula is as follows:
Wherein, the overall length of L: transmission line；
C: the light velocity 3 × 108m/s；
The dielectric constant of ε: PCB medium.
The most further, the described test equipment for relay, wherein, also include over-current protecting unit, described
Over-current protecting unit is connected with relay contact analog control system motherboard circuit.
By such scheme, the present invention at least has the advantage that
1) warehouse-in relay is detected, get rid of defective relay, it is to avoid defective relay is to subsequent product
Function and malfunction elimination cause direct or indirect impact, reduce application cost.
2) when helping tester to solve test, the malfunction elimination to relay, alleviate the workload of tester,
Contribute to shortening test period, reduce testing cost.
Described above is only the general introduction of technical solution of the present invention, in order to better understand the technological means of the present invention,
And can be practiced according to the content of description, below with presently preferred embodiments of the present invention and coordinate accompanying drawing describe in detail as after.
Accompanying drawing explanation
In order to be illustrated more clearly that the technical scheme of the embodiment of the present invention, below by embodiment required use attached
Figure is briefly described, it will be appreciated that the following drawings illustrate only certain embodiments of the present invention, and it is right to be therefore not construed as
The restriction of scope, for those of ordinary skill in the art, on the premise of not paying creative work, it is also possible to according to this
A little accompanying drawings obtain other relevant accompanying drawings.
Fig. 1 is the structural representation of the present invention；
Fig. 2 is the structural representation of relay contact analog control system motherboard circuit.
Detailed description of the invention
Below in conjunction with the accompanying drawings and embodiment, the detailed description of the invention of the present invention is described in further detail.Hereinafter implement
Example is used for illustrating the present invention, but is not limited to the scope of the present invention.
In order to make those skilled in the art be more fully understood that the present invention program, below in conjunction with attached in the embodiment of the present invention
Figure, is clearly and completely described the technical scheme in the embodiment of the present invention, it is clear that described embodiment is only this
Invent a part of embodiment rather than whole embodiments.Generally herein described in accompanying drawing and the embodiment of the present invention that illustrates
Assembly can arrange with various different configurations and design.Therefore, enforcement to the present invention provided in the accompanying drawings below
The detailed description of example is not intended to limit the scope of claimed invention, but is merely representative of the selected enforcement of the present invention
Example.Based on embodiments of the invention, it is all that those skilled in the art are obtained on the premise of not making creative work
Other embodiments, broadly fall into the scope of protection of the invention.
Embodiment
As it is shown in figure 1, a kind of test equipment for relay, including relay contact analog control system motherboard circuit 1 and MCU unit 2,
The input of described relay contact analog control system motherboard circuit 1 is connected with the outfan of power subsystem 3, described relay contact analog control system motherboard circuit
The outfan of 1 is connected with the input of extension/drive circuit 4, and the input of described relay contact analog control system motherboard circuit 1 is held concurrently with test
The outfan holding tool 5 is connected, and the outfan of described relay contact analog control system motherboard circuit 1 is connected with the input of MCU unit 2, institute
The outfan of also compatible with power subsystem 3, extension/drive circuit 4 and the test tool 5 of input stating MCU unit 2 is connected, institute
The input of the outfan and upper 6 machines of stating MCU unit 2 is connected.By coordinating of MCU unit and relay contact analog control system motherboard circuit
The detection of the automatization to relay can be realized, it is ensured that the yield of the relay of use, thus reduce application cost and test into
This.
As in figure 2 it is shown, heretofore described relay contact analog control system motherboard circuit includes relay chip, described relay chip
The first pin be connected with DC5V, and also be connected with the negative electrode of diode D33, the anode of diode D33 and relay chip
The 8th pin be connected, the 8th external first signal terminal of pin of relay chip, the second of described relay chip is drawn
Foot is connected with the anode of diode D32, and the negative electrode of the D32 of diode passes through resistance R41 ground connection, the second pin of relay chip
External secondary signal terminals, the 3rd external 3rd signal terminal of pin of described relay chip, described relay chip
The 4th pin be connected with the anode of diode D34, the negative electrode of described diode D34 passes through resistance R42 ground connection, and relay core
4th external 4th signal terminal of pin of sheet, the 5th pin of described relay chip is connected with the anode of diode D36,
The negative electrode of diode D36 pass through resistance R44 ground connection, the 5th external 5th signal terminal of pin of relay chip, described in continue
6th external 6th signal terminal of pin of electrical equipment chip, the 7th pin of described relay and the anode phase of diode D35
Even, the negative electrode of diode D35 passes through resistance 43 ground connection, and the 7th external 7th signal terminal of pin of relay chip.Logical
Cross this device and can detect the quality of relay, so that it is guaranteed that the normal use of institute's use relay.
Heretofore described diode D32, diode D34, diode D35, diode D36 are light emitting diode, adopt
Can effectively watch in relay with light emitting diode which goes wrong, facilitate the maintenance in later stage, make it to repeat profit
With, make up to the purpose reducing cost.
Heretofore described extension/drive circuit 4 is 74HC373 drive circuit, or is 74HC238IO expanded circuit, adopts
Can be when connecing not occur in relay contact analog control system motherboard circuit with extension/drive circuit 4, can be by extension/drive circuit 4 to it
I/O port expands, and makes up to reasonable demand.
The compatible tool 5 of the most described test is the tool of compatible PCB interface/insertion slot type, due to different
Incompatible probability is deposited in the foot position of relay and encapsulation, in order to the relay of the most producers of compatibility, design one is held concurrently
Hold the tool of PCB interface/insertion slot type, reach the tool of the foot position of compatible different relay, reduce it and use different surveys
Electricity testing device, thus reduce use cost.
For above-mentioned tool, for using the relay of paster, it is possible to use only the tool of insertion slot type, pass through insertion slot type
Tool be connected with relay contact analog control system motherboard circuit, thus meet test convenience.But also readily accessible, easily operate, the most main
Want is the precision that can control on delay test.
And for the relay of PCB interface, have interface daughter board, and measured relay being arranged on interface daughter board, daughter board has
Standby corresponding signaling transfer point, allows the foot position of measured relay match with the foot position of mainboard, to realize testing requirement.
It is connected between relay contact analog control system motherboard circuit and test product described in above-mentioned wiring and has transmission line, and described
Transmission line is provided with delay time T, and its formula is as follows:
Wherein, the overall length of L: transmission line；
C: the light velocity 3 × 108m/s；
The dielectric constant of ε: PCB medium.
When reality is tested, owing to the time delay of relay is tested, owing to relay contact analog control system, needing to use
Transmission line, and use transmission line can produce certain delay time T, general delay time time delay is in nanosecond rank, even can
Less, in order to ensure the relay time delay accuracy detected, need the time delay of transmission line is controlled by, just can obtain accurately
Result.
The operation principle of the present invention is as follows:
Power subsystem is as the electric supply installation of relay contact analog control system motherboard circuit, at relay contact analog control system motherboard circuit by test
Being connected with relay contact analog control system motherboard circuit by relay under the effect of compatible tool, the instruction transmitted by MCU unit is to relay
Relay is detected by circuit automatically that carry in device test flap circuit, the break-make of circuitry self test relay and time delay, and
The data tested out by relay contact analog control system motherboard circuit are sent out and are fed back to MCU unit again, and the data finally fed back to by MCU unit are sent out
Deliver to the good or bad situation allowing tester can be apparent from this relay in host computer.
In the present invention for the personal safety of tester, with the addition of over-current protecting unit.When electric current more than 2A time the most electric
Source can disconnect, and the software being equipped with also has equipment self-inspection function, and after the power-up, first equipment can carry out self-inspection, confirms shape
State is the most normal, the most just can operate.When test, device panel has LED intuitively and carrys out the state of display device.
The present invention at least has the advantage that
1) warehouse-in relay is detected, get rid of defective relay, it is to avoid defective relay is to subsequent product
Function and malfunction elimination cause direct or indirect impact, reduce application cost.
2) when helping tester to solve test, the malfunction elimination to relay, alleviate the workload of tester,
Contribute to shortening test period, reduce testing cost.
The above is only the preferred embodiment of the present invention, is not limited to the present invention, it is noted that for this skill
For the those of ordinary skill in art field, on the premise of without departing from the technology of the present invention principle, it is also possible to make some improvement and
Modification, these improve and modification also should be regarded as protection scope of the present invention.
Claims (8)
1. the test equipment for relay, it is characterised in that: include relay contact analog control system motherboard circuit and MCU unit, institute
The outfan of the input and power subsystem of stating relay contact analog control system motherboard circuit is connected, described relay contact analog control system motherboard circuit defeated
Go out end to be connected with the input of extension/drive circuit, the input of described relay contact analog control system motherboard circuit tool compatible with test
Outfan be connected, the outfan of described relay contact analog control system motherboard circuit is connected with the input of MCU unit, described MCU unit
Input also outfan with power subsystem, extension/drive circuit and the compatible tool of test be connected, described MCU unit defeated
Go out end to be connected with the input of host computer.
Test equipment for relay the most according to claim 1, it is characterised in that: described relay contact analog control system mainboard electricity
Road includes relay chip, and the first pin of described relay chip is connected with DC5V, and also with the negative electrode phase of diode D33
Even, the anode of diode D33 is connected with the 8th pin of relay chip, the 8th external first signal of pin of relay chip
Terminals, the second pin of described relay chip is connected with the anode of diode D32, and the negative electrode of the D32 of diode is by electricity
Resistance R41 ground connection, the second pin external secondary signal terminals of relay chip, the 3rd pin of described relay chip is external
3rd signal terminal, the 4th pin of described relay chip is connected with the anode of diode D34, described diode D34's
Negative electrode passes through resistance R42 ground connection, and the 4th external 4th signal terminal of pin of relay chip, described relay chip
5th pin is connected with the anode of diode D36, and the negative electrode of diode D36 passes through resistance R44 ground connection, the 5th of relay chip
External 5th signal terminal of pin, the 6th external 6th signal terminal of pin of described relay chip, described relay
The 7th pin be connected with the anode of diode D35, the negative electrode of diode D35 passes through resistance 43 ground connection, and relay chip
7th external 7th signal terminal of pin.
Test equipment for relay the most according to claim 2, it is characterised in that: described diode D32, diode
D34, diode D35, diode D36 are light emitting diode.
Test equipment for relay the most according to claim 1, it is characterised in that: described extension/drive circuit is
74HC373 drive circuit, or be 74HC238IO expanded circuit.
Test equipment for relay the most according to claim 1, it is characterised in that: the compatible tool of described test is double
Hold the tool of PCB interface/insertion slot type.
Test equipment for relay the most according to claim 2, it is characterised in that: described relay contact analog control system mainboard electricity
It is connected between road with test product and has transmission line.
Test equipment for relay the most according to claim 6, it is characterised in that: when described transmission line is provided with time delay
Between T, its formula is as follows:
Wherein, the overall length of L: transmission line；
C: the light velocity 3 × 108m/s；
The dielectric constant of ε: PCB medium.
8. according to the test equipment for relay described in any one in claim 1 to 7, it is characterised in that: also wrap
Including over-current protecting unit, described over-current protecting unit is connected with relay contact analog control system motherboard circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610664487.2A CN106226691B (en) | 2016-08-15 | 2016-08-15 | Test equipment for relay |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610664487.2A CN106226691B (en) | 2016-08-15 | 2016-08-15 | Test equipment for relay |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106226691A true CN106226691A (en) | 2016-12-14 |
| CN106226691B CN106226691B (en) | 2023-03-21 |
Family
ID=57547492
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610664487.2A Active CN106226691B (en) | 2016-08-15 | 2016-08-15 | Test equipment for relay |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106226691B (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108445387A (en) * | 2018-05-30 | 2018-08-24 | 江苏七维测试技术有限公司 | A kind of electromagnetic relay reliability test box |
| CN109347522A (en) * | 2018-09-20 | 2019-02-15 | 刘泰康 | Transmission system is isolated in induction information based on magnetic line of force medium |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06174782A (en) * | 1992-12-04 | 1994-06-24 | Sony Corp | Test system for electronic component |
| CN2585500Y (en) * | 2002-12-16 | 2003-11-05 | 中国电子科技集团公司第三十研究所 | Multi-channel signal selecting device used for testing device |
| JP2007333387A (en) * | 2006-06-12 | 2007-12-27 | Matsushita Electric Ind Co Ltd | Semiconductor inspection system |
| CN204188783U (en) * | 2014-11-14 | 2015-03-04 | 武汉华中数控股份有限公司 | A kind of proving installation of Switching Power Supply |
| CN206470367U (en) * | 2016-08-15 | 2017-09-05 | 苏州韬盛电子科技有限公司 | A kind of test equipment for relay |
-
2016
- 2016-08-15 CN CN201610664487.2A patent/CN106226691B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06174782A (en) * | 1992-12-04 | 1994-06-24 | Sony Corp | Test system for electronic component |
| CN2585500Y (en) * | 2002-12-16 | 2003-11-05 | 中国电子科技集团公司第三十研究所 | Multi-channel signal selecting device used for testing device |
| JP2007333387A (en) * | 2006-06-12 | 2007-12-27 | Matsushita Electric Ind Co Ltd | Semiconductor inspection system |
| CN204188783U (en) * | 2014-11-14 | 2015-03-04 | 武汉华中数控股份有限公司 | A kind of proving installation of Switching Power Supply |
| CN206470367U (en) * | 2016-08-15 | 2017-09-05 | 苏州韬盛电子科技有限公司 | A kind of test equipment for relay |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108445387A (en) * | 2018-05-30 | 2018-08-24 | 江苏七维测试技术有限公司 | A kind of electromagnetic relay reliability test box |
| CN108445387B (en) * | 2018-05-30 | 2023-09-19 | 江苏七维测试技术有限公司 | Electromagnetic relay reliability test box |
| CN109347522A (en) * | 2018-09-20 | 2019-02-15 | 刘泰康 | Transmission system is isolated in induction information based on magnetic line of force medium |
Also Published As
| Publication number | Publication date |
|---|---|
| CN106226691B (en) | 2023-03-21 |
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