CN205049603U - Discrete device's sorting test fixture - Google Patents
Discrete device's sorting test fixture Download PDFInfo
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- CN205049603U CN205049603U CN201520721018.0U CN201520721018U CN205049603U CN 205049603 U CN205049603 U CN 205049603U CN 201520721018 U CN201520721018 U CN 201520721018U CN 205049603 U CN205049603 U CN 205049603U
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Abstract
The utility model relates to a discrete device's sorting test fixture, including platen, first bottom plate, first apron, second bottom plate, second cover, first test piece group, second test piece group and third test piece group, first bottom plate and second bottom plate are all fixed on the platen, and first bottom plate and second bottom plate mutual disposition on the platen, first apron is removable to be fixed on first bottom plate, and first test piece group and second test piece group all press from both sides and establish between first bottom plate and first apron, and all stretch out outside the first apron at the both ends of first test piece group and second test piece group, second cover is removable to be fixed on the second bottom plate, and third test piece group presss from both sides and establishes between second bottom plate and second cover, and stretch out outside the second cover at the both ends of third test piece group, first test piece group, second test piece group and third test piece are organized and are all comprised two test pieces, and fix as an organic wholely by the insulating cement bonding between two test pieces. The utility model discloses simple structure, and improve the measuring accuracy.
Description
Technical field
The utility model relates to a kind of test fixture, is specifically related to a kind of sorting test fixture of discrete device.
Background technology
The package dimension of existing discrete device is more and more less, and product all needs to carry out electric performance test before dispatching from the factory, and to be testedly qualifiedly just to dispatch from the factory afterwards.Discrete device described in the utility model refers to that there are two pins the side outside encapsulating shell, and opposite side has the discrete device of a pin.
In prior art, for the discrete device of this kind of specification when carrying out the high speed test of electrical property, require that the pin of discrete device and test pieces will have good Ohmic contact.Concrete test process is: before each test, tester is all needed to be connected with the end thereof contacts of corresponding test pieces respectively by each pin of discrete device, and ensure that multiple test pieces forms good test channel in less lead pin pitch, and require that between each test pieces, mutually insulated is interference-free, the other end of each test pieces just carries out electric performance test by corresponding coaxial p-wire and test machine, like this, inefficiency is made.If test passes, then by the vacuum slot of separator, device is placed on qualified region, otherwise, if test failure, then by the vacuum slot of separator, device is placed on defective region, each pin due to discrete device in prior art is all contact with a test pieces, because test pieces is not fixing, so in test process, occur that test pieces and pin can not carry out good contact unavoidably, once pin is separated with test pieces, and tester can not Timeliness coverage, and this will affect the degree of accuracy of test greatly.
Summary of the invention
The purpose of this utility model is: not only structure is simple to provide one, and the sorting test fixture of the discrete device of raising measuring accuracy, to overcome the deficiencies in the prior art.
In order to achieve the above object, the technical solution of the utility model is: a kind of sorting test fixture of discrete device, and its innovative point is: comprise platen, the first base plate, the first cover plate, the second base plate, the second cover plate, the first test pieces group, the second test pieces group and the 3rd test pieces group;
Described first base plate and the second base plate are all fixed on platen, and the first base plate and the second base plate positioned opposite on platen;
Described first cover plate is removable to be fixed on the first base plate, and the first test pieces group and the second test pieces group are all folded between the first base plate and the first cover plate, and the two ends of the first test pieces group and the second test pieces group are all stretched out outside the first cover plate;
Described second cover plate is removable to be fixed on the second base plate, and the 3rd test pieces group is folded between the second base plate and the second cover plate, and the two ends of the 3rd test pieces group are stretched out outside the second cover plate;
Described first test pieces group, the second test pieces group and the 3rd test pieces group are all made up of two test pieces, and are adhesively fixed by insulating gel between two test pieces and are integrated.
In technique scheme, described first base plate is provided with the first groove and the second groove that are arranged side by side, and the first test pieces group is located in the first groove, and the second test pieces group is located in the second groove; Described second base plate is provided with the 3rd groove, and the 3rd test pieces group is located in the 3rd groove.
In technique scheme, described platen is provided with discrete device holder, and discrete device holder is provided with detent, and described discrete device fixed seating is between the first test pieces group and the 3rd test pieces group.
The good effect that the utility model has is: after adopting sorting test fixture of the present utility model, during use, discrete device is placed on platen, and two of discrete device side pins contact with one end of the first test pieces group and one end of the second test pieces group respectively, a pin of opposite side contacts with one end of the 3rd test pieces group, and the coaxial p-wire electrical connection that the first test pieces group, the second test pieces group and the 3rd test pieces group other end are corresponding to test machine respectively, then can implement the electric performance test of discrete device; Because test pieces group is fixing, tester is when testing discrete device, workpiece for measurement is placed on platen, and make three of workpiece pins can carry out good contact with test pieces group respectively, and guarantee that pin can not be separated with test pieces group, therefore, it is possible to greatly improve testing efficiency; Again because test pieces group is made up of two test pieces, and be adhesively fixed by insulating gel between two test pieces and be integrated, to make between two test pieces and non-conductive, improve the degree of accuracy of test.Achieve the purpose of this utility model.
Accompanying drawing explanation
Fig. 1 is the structural representation of a kind of embodiment of the utility model;
Fig. 2 is the A-A cross-sectional schematic of Fig. 1;
Fig. 3 is the B-B cross-sectional schematic of Fig. 1;
Fig. 4 is the C-C cross-sectional schematic of Fig. 1.
Embodiment
Below in conjunction with accompanying drawing and the embodiment that provides, the utility model is further described, but is not limited thereto.
As shown in Figure 1,2,3, 4, a kind of sorting test fixture of discrete device, comprises platen 1, first base plate 2, first cover plate 3, second base plate 4, second cover plate 5, first test pieces group 6, second test pieces group 7 and the 3rd test pieces group 8;
Described first base plate 2 and the second base plate 4 are all screwed on platen 1, and the first base plate 2 and the second base plate 4 positioned opposite on platen 1;
Described first cover plate 3 is fixed on the first base plate 2 with screw is removable, and the first test pieces group 6 and the second test pieces group 7 are all folded between the first base plate 2 and the first cover plate 3, and the two ends of the first test pieces group 6 and the second test pieces group 7 are all stretched out outside the first cover plate 3;
Described second cover plate 5 is fixed on the second base plate 4 with screw is removable, and the 3rd test pieces group 8 is folded between the second base plate 4 and the second cover plate 5, and the two ends of the 3rd test pieces group 8 are stretched out outside the second cover plate 5;
Described first test pieces group 6, second test pieces group 7 and the 3rd test pieces group 8 are all made up of two test pieces, and are adhesively fixed by insulating gel between two test pieces and are integrated.
As shown in Figure 3,4, for the ease of fixing and assembling test pieces group, described first base plate 2 is provided with the first groove 2-1 and the second groove 2-2 that are arranged side by side, and the first test pieces group 6 is located in the first groove 2-1, and the second test pieces group 7 is located in the second groove 2-2; Described second base plate 4 is provided with the 3rd groove 4-1, and the 3rd test pieces group 8 is located in the 3rd groove 4-1.
As shown in Figure 1, 2, position for the ease of device under test, further raising testing efficiency, described platen 1 is provided with discrete device holder 9, and discrete device holder 9 is provided with detent 9-1, described discrete device holder 9 is between the first test pieces group 6 and the 3rd test pieces group 8.
Before the utility model uses, platen 1 is screwed on the worktable of test machine, then by the first test pieces group 6, the coaxial p-wire that the afterbody of the second test pieces group 7 and the 3rd test pieces group 8 is corresponding to test machine is respectively electrically connected, during test, discrete device is placed in the detent 9-1 of the discrete device holder 9 on platen 1, and two of discrete device side pins carry out good contact with the head of the first test pieces group 6 and the head of the second test pieces group 7 respectively, a pin of opposite side and the head of the 3rd test pieces group 8 carry out good contact, then the electric performance test of discrete device can be implemented, because the utility model is fixed on the worktable of test machine, and test pieces group is fixing, tester is when testing discrete device, workpiece for measurement is placed on platen at every turn, and make three of workpiece pins can carry out good contact with test pieces group respectively, and guarantee that pin can not be separated with test pieces group, and need not as all need in prior art at every turn adjustment device under test with and revocable test pieces carries out good contact, therefore, it is possible to greatly improve testing efficiency, again because test pieces group is made up of two test pieces, and be adhesively fixed by insulating gel between two test pieces and be integrated, to make between two test pieces and non-conductive, improve the degree of accuracy of test.
The utility model pilot run shows, and its effect is well-content.
Claims (3)
1. a sorting test fixture for discrete device, is characterized in that: comprise platen (1), the first base plate (2), the first cover plate (3), the second base plate (4), the second cover plate (5), the first test pieces group (6), the second test pieces group (7) and the 3rd test pieces group (8);
Described first base plate (2) and the second base plate (4) are all fixed on platen (1), and the first base plate (2) and the second base plate (4) are gone up positioned opposite at platen (1);
Described first cover plate (3) is removable to be fixed on the first base plate (2), first test pieces group (6) and the second test pieces group (7) are all folded between the first base plate (2) and the first cover plate (3), and the first cover plate (3) is all stretched out outward in the two ends of the first test pieces group (6) and the second test pieces group (7);
Described second cover plate (5) is removable to be fixed on the second base plate (4), and the 3rd test pieces group (8) is folded between the second base plate (4) and the second cover plate (5), and the two ends of the 3rd test pieces group (8) are stretched out outside the second cover plate (5);
Described first test pieces group (6), the second test pieces group (7) and the 3rd test pieces group (8) are all made up of two test pieces, and are adhesively fixed by insulating gel between two test pieces and are integrated.
2. the sorting test fixture of discrete device according to claim 1, it is characterized in that: described first base plate (2) is provided with the first groove (2-1) and the second groove (2-2) that are arranged side by side, first test pieces group (6) is located in the first groove (2-1), and the second test pieces group (7) is located in the second groove (2-2); Described second base plate (4) is provided with the 3rd groove (4-1), and the 3rd test pieces group (8) is located in the 3rd groove (4-1).
3. the sorting test fixture of discrete device according to claim 1, it is characterized in that: described platen (1) is provided with discrete device holder (9), and discrete device holder (9) is provided with detent (9-1), described discrete device holder (9) is positioned between the first test pieces group (6) and the 3rd test pieces group (8).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520721018.0U CN205049603U (en) | 2015-09-17 | 2015-09-17 | Discrete device's sorting test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520721018.0U CN205049603U (en) | 2015-09-17 | 2015-09-17 | Discrete device's sorting test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205049603U true CN205049603U (en) | 2016-02-24 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201520721018.0U Active CN205049603U (en) | 2015-09-17 | 2015-09-17 | Discrete device's sorting test fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205049603U (en) |
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2015
- 2015-09-17 CN CN201520721018.0U patent/CN205049603U/en active Active
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C56 | Change in the name or address of the patentee | ||
| CP01 | Change in the name or title of a patent holder |
Address after: 213022 Changzhou, North New District, Jiangsu Yangtze River Road, No. 19 Patentee after: Changzhou Galaxy century microelectronics Limited by Share Ltd Address before: 213022 Changzhou, North New District, Jiangsu Yangtze River Road, No. 19 Patentee before: Changzhou Galaxy Century Micro-Electronics Co., Ltd. |