CN203502443U - Chip solid capacitor test fixture - Google Patents
Chip solid capacitor test fixture Download PDFInfo
- Publication number
- CN203502443U CN203502443U CN201320640169.4U CN201320640169U CN203502443U CN 203502443 U CN203502443 U CN 203502443U CN 201320640169 U CN201320640169 U CN 201320640169U CN 203502443 U CN203502443 U CN 203502443U
- Authority
- CN
- China
- Prior art keywords
- fixture
- base
- fixed
- chip
- screw rods
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000003990 capacitor Substances 0.000 title claims abstract description 34
- 239000007787 solid Substances 0.000 title claims abstract description 14
- 238000012360 testing method Methods 0.000 title claims abstract description 13
- 125000006850 spacer group Chemical group 0.000 claims abstract description 6
- 238000009413 insulation Methods 0.000 claims description 9
- 239000000853 adhesive Substances 0.000 claims description 4
- 230000001070 adhesive effect Effects 0.000 claims description 4
- 230000015572 biosynthetic process Effects 0.000 claims 1
- 238000001514 detection method Methods 0.000 abstract description 3
- 239000011159 matrix material Substances 0.000 description 8
- 238000004519 manufacturing process Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 3
- 230000007547 defect Effects 0.000 description 2
- 238000005192 partition Methods 0.000 description 2
- 230000007812 deficiency Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000004080 punching Methods 0.000 description 1
Images
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- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The utility model discloses a chip solid capacitor test fixture, and belongs to a tool for testing chip capacitors, and an objective is to provide a fixture which can perform whole board detection on a plurality of chip solid capacitors stuck on an outgoing line frame. The fixture comprises a positioning device and a clamping device disposed on a base. The positioning device is formed by insulating spacers (3) fixed on a base (4), and two locating pins (7). The clamping device is formed by two screw rods (2) fixed on the base (4), layerings (1) respectively disposed on the two screw rods through an insulating sleeve (6), springs (5) disposed on the screw rods (2), and nuts respectively fixed on the screw rods (2). The fixture can detect all parameters by one-step clamping, efficiency is improved, and a conventional measuring fixture is easy to cause discharge ignition phenomenon of a part of capacitors due to bad contact. The fixture is used to test chip solid capacitors.
Description
Technical field
The utility model relates to a kind of technological equipment, relates in particular to a kind of for testing the fixture of chip solid capacitor.
Background technology
As everyone knows, in the manufacture process of chip capacitor, be all that capacitor body is sticked on the extension line framework matrix that punching is in advance good conventionally, and then cut away unnecessary part, finally again capacitor body is encapsulated.For guaranteeing the q&r of chip-type solid capacitor, need to it, carry out by fixture the tests such as capacity, loss, equivalent series resistance and electric leakage performance.
Current fixture can only be tested chip-type solid capacitor in bulk; And chip-type solid capacitor volume is little, quantity is many, be installed on one by one on fixture not only trouble, labour intensity is large, efficiency is low, and need to be carried out multiple bearing, clamping, not only loaded down with trivial details, but also easily cause capacitor damage; The 3rd, while utilizing conventional brace to leak electricity the test such as performance to many bulk capacitors simultaneously, the electrode that is difficult to guarantee every capacitor all can with fixture good contact, therefore easily cause partition capacitance device to damage because of electric discharge sparking.If can be in conjunction with chip capacitor manufacturing process, develop a kind of can be to being pasted on many fixtures that chip-type solid capacitor carries out justifying test on extension line framework matrix, not only can significantly reduce labour intensity, boost productivity, and can also overcome multiple bearing, clamping and cause the defect of damaged products.
Summary of the invention
In order to overcome the deficiencies in the prior art, the utility model aims to provide a kind of chip-type solid capacitor testing fixture, utilizes this fixture to carry out justifying test to many chip-type solid capacitors that are pasted on extension line framework.
To achieve these goals, the utility model by the following technical solutions: it comprises locating device and the clamp device being located on base; Described locating device forms by being fixed on two register pins on base and the insulation spacer being fixed on this base, and described clamp device is by being fixed on two screw rods on base, being located at press strip on described two screw rods, being located on each screw rod and being formed at the spring between base and press strip, the nut that is separately fixed on each screw rod respectively by insulation sliding sleeve.
The back side at press strip is fixed with Magnetic adhesive mat.
Compared with the prior art, the utility model is owing to having adopted technique scheme, two register pins that adopted the fabrication hole that carries with extension line framework matrix to coordinate on base, therefore can carry out justifying location to many chip capacitors that are pasted on extension line framework matrix, clamped one time can be realized the detection of all parameters; Not only significantly reduced labour intensity, improved efficiency, and can also overcome multiple bearing, clamping and cause the defect of damaged products.In addition, because each chip capacitor is parallel between two extension line framework matrixs, therefore guaranteed that the electrode of every capacitor all can contact with fixture well, the phenomenon of thoroughly having avoided traditional measurement fixture easily to cause partition capacitance device to discharge and strike sparks because of loose contact.
Accompanying drawing explanation
Fig. 1 is structural representation of the present utility model
Fig. 2 is the vertical view of Fig. 1;
Fig. 3 is the A-A cut-open view in Fig. 1.
In figure: press strip 1, screw rod 2, insulation spacer 3, base 4, spring 5, insulation sliding sleeve 6, register pin 7, Magnetic adhesive mat 8, extension line framework matrix 9, chip capacitor 10.
Embodiment
Below in conjunction with accompanying drawing and specific embodiment, the utility model is described in further detail:
As shown in Figures 1 to 3: locating device has flexible insulation spacer 3 on this base and forms by being fixed on two register pins 7 on base 4 and being fixed on, clamp device is by being fixed on two screw rods 2 on base 4, being located at press strip 1 on described two screw rods, being located on each screw rod 2 and being formed at the spring 5 between base 4 and press strip 1, the nut that is separately fixed on each screw rod 2 respectively by insulation sliding sleeve 6.
In order to ensure press strip 1 can with the anodal close contact that sticks on every the chip capacitor 10 on extension line framework matrix 9, at the back side of press strip 1, be fixed with Magnetic adhesive mat 8.
Principle of work: as shown in Figure 2, be parallel to two many chip capacitors 10 between extension line framework matrix 9 and be fixed on these two extension line framework matrixs by bonding method, on that piece extension line framework matrix 9 being connected with chip capacitor 10 negative poles, have two with the suitable fabrication hole (not shown) of register pin 7.During use, the chip capacitor of justifying 10 is positioned on base 4 by described fabrication hole, puts down press strip 1 positive pole of chip capacitor 10 is pressed on insulation spacer 3; Then the positive pole of power supply is connected with the positive pole of chip capacitor 10, the negative pole of power supply is connected and can carries out the detection of related data with the negative pole of chip capacitor 10.
Claims (2)
1. a chip-type solid capacitor testing fixture, comprises the locating device and the clamp device that are located on base; It is characterized in that: described locating device forms by being fixed on two register pins (7) on base (4) and being fixed on insulation spacer (3) on this base, described clamp device by be fixed on two screw rods (2) on base (4), respectively by insulation sliding sleeve (6) be located at press strip (1) on described two screw rods, to be located at each screw rod (2) upper and be positioned at spring (5) between base (4) and press strip (1), be separately fixed at the nut formation on each screw rod (2).
2. chip-type solid capacitor testing fixture according to claim 1, is characterized in that: at the back side of press strip (1), be fixed with Magnetic adhesive mat (8).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320640169.4U CN203502443U (en) | 2013-10-17 | 2013-10-17 | Chip solid capacitor test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320640169.4U CN203502443U (en) | 2013-10-17 | 2013-10-17 | Chip solid capacitor test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203502443U true CN203502443U (en) | 2014-03-26 |
Family
ID=50333413
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201320640169.4U Expired - Lifetime CN203502443U (en) | 2013-10-17 | 2013-10-17 | Chip solid capacitor test fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203502443U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104483514A (en) * | 2014-12-11 | 2015-04-01 | 铜陵市启动电子制造有限责任公司 | Core test fixture for thin-film capacitors |
| CN109738772A (en) * | 2019-01-18 | 2019-05-10 | 洛阳隆盛科技有限责任公司 | A kind of device for high-voltage capacitor voltage-withstand test |
-
2013
- 2013-10-17 CN CN201320640169.4U patent/CN203502443U/en not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104483514A (en) * | 2014-12-11 | 2015-04-01 | 铜陵市启动电子制造有限责任公司 | Core test fixture for thin-film capacitors |
| CN109738772A (en) * | 2019-01-18 | 2019-05-10 | 洛阳隆盛科技有限责任公司 | A kind of device for high-voltage capacitor voltage-withstand test |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term | ||
| CX01 | Expiry of patent term |
Granted publication date: 20140326 |