CN104483514A - Core test fixture for thin-film capacitors - Google Patents
Core test fixture for thin-film capacitors Download PDFInfo
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- CN104483514A CN104483514A CN201410765204.4A CN201410765204A CN104483514A CN 104483514 A CN104483514 A CN 104483514A CN 201410765204 A CN201410765204 A CN 201410765204A CN 104483514 A CN104483514 A CN 104483514A
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Abstract
The invention discloses a core test fixture for thin-film capacitors. The core test fixture comprises an insulating base, a fixed chuck, an insulating fixed chuck support, a movable chuck, an insulating movable chuck support and wiring terminals, wherein a fixed chuck guide rod is arranged on one side of the fixed chuck; a positioning nut is arranged on the fixed chuck guide rod and is positioned on the outer side of the insulating fixed chuck support, and a spring is arranged on the fixed chuck guide rod and is positioned on the inner side of the insulating fixed chuck support; one end of the spring is connected to the insulating fixed chuck support, and the other end of the spring is connected to the fixed chuck; a movable chuck guide rod is arranged on one side of the movable chuck; adjusting nuts are arranged on the movable chuck guide rod and are positioned on the two sides of the insulating movable chuck support; symmetrical grooves are formed in the fixed chuck, and are vertical to the movable chuck in the direction of the base. The core test fixture for the thin-film capacitors disclosed by the invention can meet core tests of the thin-film capacitors with different length specifications, and is also suitable for testing not only flat cores after being flattened but also circular capacitor cores with core rods, so that the test precision is high, and the test work efficiency is high.
Description
Technical field
The present invention relates to thin film capacitor production technical field, particularly relate to a kind of thin-film capacitor fuse test fixture.
Background technology
In thin film capacitor production run, the various electric performance tests such as capacity, insulation, loss tangent, proof voltage must be carried out to semi-manufacture fuse, according to the situation of change of its measured value, analyze Problems existing in production technology, thus have for the proposition scheme of dealing with problems.Existing test fixture can not meet thin film capacitor semi-manufacture diversity requirements, need change different test fixture to different semi-manufacture, not only affects accurate testing but also affect test job efficiency.
Summary of the invention
The object of the invention is for the deficiencies in the prior art, a kind of thin-film capacitor fuse test fixture is provided, improve accurate testing degree, the flat fuse after flattening but also the test of appropriate bands plug circular capacitor fuse were not only applicable to, without the need to changing test fixture when testing different semi-manufacture, improve test job efficiency.
The technical solution used in the present invention is as follows:
A kind of thin-film capacitor fuse test fixture, comprise insulator foot, fixed chuck, insulating fixing clamp head bracket, active chuck, insulation active chuck support and connection terminal, described insulating fixing clamp head bracket and insulation active chuck support are fixed on insulator foot, described fixed chuck side is provided with threaded fixed chuck guide pole, insulating fixing clamp head bracket is provided with the first through hole, fixed chuck guide pole is arranged on insulating fixing clamp head bracket through the first through hole, fixed chuck guide pole is positioned at outside insulating fixing clamp head bracket and is provided with setscrew nut, be positioned at inside insulating fixing clamp head bracket and be provided with spring, spring one end connects insulating fixing clamp head bracket, the other end is connected and fixed chuck, described active chuck side is provided with threaded active chuck guide pole, insulation active chuck support is provided with the second through hole, active chuck guide pole is arranged on insulation active chuck support through the second through hole, active chuck guide pole is positioned at insulation active chuck support both sides and is provided with setting nut, for regulate testing length different capacitor core time fixed chuck and active chuck spacing, described fixed chuck guide pole and active chuck guide pole end are respectively equipped with connection terminal, described fixed chuck vertical with active chuck with base direction on offer symmetrical groove.
Described fixed chuck and active chuck are square structure.
Described groove is the groove of dark 5mm, wide 5mm.
When the present invention uses, unclamp the setting nut on active chuck guide pole, regulate fixed chuck and active chuck spacing, the spacing making the spring between fixed chuck and insulating fixing clamp head bracket be in fixed chuck and active chuck under release conditions is less than tested thin-film capacitor core length 3-5mm, then tested thin-film capacitor fuse one end is first contacted fixed chuck and exerts pressure, fixed chuck is retracted under the action of the spring and is made tested thin-film capacitor fuse other end non-resistance drop in active chuck, stopping is exerted pressure, tested capacitor core is reliably clipped between fixed chuck and active chuck, be electrically connected with testing tool by connection terminal, start and test, when the circular capacitor fuse of calibration tape plug, plug is put into the groove of fixed chuck and active chuck symmetry, chuck and capacitor core end face reliable contacts when just can ensure to test.
Compared with the prior art, beneficial effect of the present invention is as follows:
Thin-film capacitor fuse test fixture of the present invention, by the thin-film capacitor fuse test regulating active chuck position can meet different length specification; Be provided with spring between fixed chuck and fixed chuck support, ensure that test cartridge and thin-film capacitor fuse end face reliable contacts, improve accurate testing degree; Fixed chuck and active chuck offer symmetrical groove, makes it be applicable to the test of cored bar circular capacitor fuse.Thin-film capacitor fuse test fixture of the present invention not only can meet the thin-film capacitor fuse test of different length specification, and be not only applicable to the flat fuse after flattening but also the test of appropriate bands plug circular capacitor fuse, without the need to changing test fixture when testing different semi-manufacture, accurate testing degree is high, and test job efficiency is high.
Accompanying drawing explanation
Fig. 1 is structural representation of the present invention;
Fig. 2 is vertical view of the present invention.
Embodiment
See accompanying drawing, a kind of thin-film capacitor fuse test fixture, comprise insulator foot 1, fixed chuck 2, insulating fixing clamp head bracket 3, active chuck 4, insulation active chuck support 5 and connection terminal 6, described insulating fixing clamp head bracket 3 and insulation active chuck support 5 are fixed on insulator foot 1, described fixed chuck 2 side is provided with threaded fixed chuck guide pole 7, insulating fixing clamp head bracket 3 is provided with the first through hole 301, fixed chuck guide pole 7 is arranged on insulating fixing clamp head bracket 3 through the first through hole 301, fixed chuck guide pole 7 is positioned at outside insulating fixing clamp head bracket 3 and is provided with setscrew nut 8, be positioned at inside insulating fixing clamp head bracket 3 and be provided with spring 9, spring 9 one end connects insulating fixing clamp head bracket 3, the other end is connected and fixed chuck 2, described active chuck 4 side is provided with threaded active chuck guide pole 10, insulation active chuck support 5 is provided with the second through hole 501, active chuck guide pole 10 is arranged on insulation active chuck support 5 through the second through hole 501, active chuck guide pole 10 is positioned at insulation active chuck support 5 both sides and is provided with setting nut 11, for regulate testing length different capacitor core time fixed chuck 2 and active chuck 4 spacing, described fixed chuck guide pole 7 and active chuck guide pole 10 end are respectively equipped with connection terminal 6, described fixed chuck 2 vertical with active chuck 4 with insulator foot 1 direction on offer symmetrical dark 5mm, the groove 12 of wide 5mm, described fixed chuck 2 is square structure with active chuck 4.When the present invention uses, unclamp the setting nut 11 on active chuck guide pole 10, regulate fixed chuck 2 and active chuck 4 spacing, under making the spring 9 between fixed chuck 2 and insulating fixing clamp head bracket 3 be in release conditions, fixed chuck 2 is less than tested thin-film capacitor fuse 13 length 3-5mm with the spacing of active chuck 4, then tested thin-film capacitor fuse 13 one end is first contacted fixed chuck 2 and exerts pressure, fixed chuck 2 is retracted and is made tested thin-film capacitor fuse other end non-resistance drop in active chuck 4 under the effect of spring 9, stopping is exerted pressure, tested capacitor core is reliably clipped between fixed chuck 2 and active chuck 4, be electrically connected with testing tool by connection terminal 6, start and test, when the circular capacitor fuse of calibration tape plug, plug is put into the groove 12 of fixed chuck and active chuck symmetry, chuck and capacitor core end face reliable contacts when just can ensure to test.Thin-film capacitor fuse test fixture of the present invention not only can meet the thin-film capacitor fuse test of different length specification, and be not only applicable to the flat fuse after flattening but also the test of appropriate bands plug circular capacitor fuse, without the need to changing test fixture when testing different semi-manufacture, accurate testing degree is high, and test job efficiency is high.
Claims (3)
1. a thin-film capacitor fuse test fixture, it is characterized in that: comprise insulator foot, fixed chuck, insulating fixing clamp head bracket, active chuck, insulation active chuck support and connection terminal, described insulating fixing clamp head bracket and insulation active chuck support are fixed on insulator foot, described fixed chuck side is provided with threaded fixed chuck guide pole, insulating fixing clamp head bracket is provided with the first through hole, fixed chuck guide pole is arranged on insulating fixing clamp head bracket through the first through hole, fixed chuck guide pole is positioned at outside insulating fixing clamp head bracket and is provided with setscrew nut, be positioned at inside insulating fixing clamp head bracket and be provided with spring, spring one end connects insulating fixing clamp head bracket, the other end is connected and fixed chuck, described active chuck side is provided with threaded active chuck guide pole, insulation active chuck support is provided with the second through hole, active chuck guide pole is arranged on insulation active chuck support through the second through hole, active chuck guide pole is positioned at insulation active chuck support both sides and is provided with setting nut, described fixed chuck guide pole and active chuck guide pole end are respectively equipped with connection terminal, described fixed chuck vertical with active chuck with base direction on offer symmetrical groove.
2. thin-film capacitor fuse test fixture according to claim 1, is characterized in that: described fixed chuck and active chuck are square structure.
3. thin-film capacitor fuse test fixture according to claim 1, is characterized in that: described groove is the groove of dark 5mm, wide 5mm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410765204.4A CN104483514A (en) | 2014-12-11 | 2014-12-11 | Core test fixture for thin-film capacitors |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410765204.4A CN104483514A (en) | 2014-12-11 | 2014-12-11 | Core test fixture for thin-film capacitors |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN104483514A true CN104483514A (en) | 2015-04-01 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410765204.4A Pending CN104483514A (en) | 2014-12-11 | 2014-12-11 | Core test fixture for thin-film capacitors |
Country Status (1)
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| CN (1) | CN104483514A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106771498A (en) * | 2017-01-16 | 2017-05-31 | 吉林大学 | Can wireless, passive, noncontact, the device and method of multi-thread measurement DC current |
| CN107991596A (en) * | 2017-12-12 | 2018-05-04 | 贵州航天计量测试技术研究所 | A kind of TO-252 encapsulation diodes age test fixtures and its test method |
| CN108126846A (en) * | 2016-03-23 | 2018-06-08 | 长沙德科投资管理咨询有限公司 | A kind of Horizontal cylinder shape ceramic product clamping device |
| CN109541340A (en) * | 2018-10-29 | 2019-03-29 | 山东同方鲁颖电子有限公司 | A kind of chip electronic component test device |
| CN111102903A (en) * | 2018-10-25 | 2020-05-05 | 东莞东阳光科研发有限公司 | Device and method for measuring bulge height of capacitor |
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| CN203502443U (en) * | 2013-10-17 | 2014-03-26 | 中国振华（集团）新云电子元器件有限责任公司 | Chip solid capacitor test fixture |
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| CN204255994U (en) * | 2014-12-11 | 2015-04-08 | 铜陵市启动电子制造有限责任公司 | A kind of thin-film capacitor fuse test fixture |
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2014
- 2014-12-11 CN CN201410765204.4A patent/CN104483514A/en active Pending
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| EP1014096A2 (en) * | 1998-12-21 | 2000-06-28 | Shinko Electric Industries Co. Ltd. | Substrate and method for inspection |
| CN2901319Y (en) * | 2006-05-15 | 2007-05-16 | 常州市天宁天达电子设备有限公司 | Thin film capacitor test clamp |
| CN201130237Y (en) * | 2007-11-27 | 2008-10-08 | 天津市百利电气有限公司 | Experimental device for plate post-insertion type circuit breaker |
| CN201837647U (en) * | 2010-11-08 | 2011-05-18 | 中国计量学院 | Fixture for testing impedance |
| CN201984086U (en) * | 2010-12-06 | 2011-09-21 | 中兴通讯股份有限公司 | Clamp used for clamping patch-type resistance capacitance device |
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108126846A (en) * | 2016-03-23 | 2018-06-08 | 长沙德科投资管理咨询有限公司 | A kind of Horizontal cylinder shape ceramic product clamping device |
| CN106771498A (en) * | 2017-01-16 | 2017-05-31 | 吉林大学 | Can wireless, passive, noncontact, the device and method of multi-thread measurement DC current |
| CN106771498B (en) * | 2017-01-16 | 2017-11-10 | 吉林大学 | Can wireless, passive, non-contact, the multi-thread device and method for measuring DC current |
| CN107991596A (en) * | 2017-12-12 | 2018-05-04 | 贵州航天计量测试技术研究所 | A kind of TO-252 encapsulation diodes age test fixtures and its test method |
| CN107991596B (en) * | 2017-12-12 | 2024-06-07 | 贵州航天计量测试技术研究所 | TO-252 packaged diode aging test fixture and test method thereof |
| CN111102903A (en) * | 2018-10-25 | 2020-05-05 | 东莞东阳光科研发有限公司 | Device and method for measuring bulge height of capacitor |
| CN109541340A (en) * | 2018-10-29 | 2019-03-29 | 山东同方鲁颖电子有限公司 | A kind of chip electronic component test device |
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| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20150401 |
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| RJ01 | Rejection of invention patent application after publication |