CN204903381U - Nonlinearity thin film materials's optical nonlinearity measuring device - Google Patents
Nonlinearity thin film materials's optical nonlinearity measuring device Download PDFInfo
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Abstract
The utility model discloses a nonlinearity thin film materials's optical nonlinearity measuring device belongs to the optical nonlinearity measuring device that non -linear photonics material and nonlinear optics measured the non -linear photonics material among the technical field, and its aim at provides a nonlinearity thin film materials's optical nonlinearity measuring device. It includes laser instrument, pumping light path, surveys the light path, measures light path and computer processing system, incident laser forms pumping light, surveys light behind first beam splitter, survey light production reflection on need checking sample and form reflection laser, reflection laser incides to same CCD detector and obtains a series of measurement faculas and the monitoring facula on the CCD detector through the attenuator after light path, obturator measurement light path are measured in the trompil respectively through the measurement light that forms behind the second beam splitter. The device of the utility model is simple in structure, it is convenient to measure, but wide application in especially nontransparent thin film materials's optical nonlinearity measurement of non -linear thin film materials.
Description
Technical field
The utility model belongs to nonlinear photon material and nonlinear optics field of measuring technique, relates to a kind of optical non-linear measuring device of nonlinear photon material, particularly relates to a kind of optical non-linear measuring device of Nonlinear Thin membrane material.
Background technology
In recent years, along with the high speed development in the fields such as high power laser light technology, optical communication and optical information processing, the application of nonlinear optical material in photoswitch, all-optical device, high speed optoelectronic equipment, high power laser light device, lasing safety and optical Limiting etc. causes the extensive concern of people day by day.And the development of nonlinear optical material depends on the research of optical nonlinearity measuring technique.At present, conventional optical nonlinearity measuring technique has degeneration four-wave mixing, three wave mixing, third harmonic method, nonlinear interference method, non linear elliptic Polarization Method, Mach-Zehnder interferometric method, 4f phase coherent imaging method, Z scanning method etc.Wherein Z scan method (M.Sheik-Bahae, A.A.Said, E.W.VanStryland.High-sensitivity, Single-beamn2Measurements.Opt.Lett.1989,14:955 – 957) be measurement materials optical non-linear method the most conventional at present, it has can measure nonlinear refraction and non-linear absorption simultaneously, and device is simple, sensitivity advantages of higher.4f phase coherence imaging system (G.BoudebsandS.Cherukulappurath, " Nonlinearopticalmeasurementsusinga4fcoherentimagingsyste mwithphaseobject " Phys.Rev.A, 69,053813 (2004)) be a kind of new method of the measurement optical nonlinearity that development in recent years is got up, have that light path is simple, single-pulse measurement, move without the need to sample, to energy of light source stability requirement not advantages of higher.
Application number be 200820041810.1 utility model patent disclose a kind of based on Z scanning pump probe device.This pump probe device comprises LASER Light Source, beam splitter, and described beam splitter is divided into two bundles incoming laser beam, and enter pumping light path and detection light path respectively, described pumping light path comprises time delay parts and convex lens; Described detection light path comprises convex lens, outgoing beam splitter and two detectors, and testing sample is positioned on the back focal plane of convex lens, before the convex lens of described detection light path, is provided with phase object.Laser beam is divided into two bundles, and stronger a branch of of light intensity is pump light, more weak a branch of be detection light, delays of pump light elapsed time focuses on testing sample, makes the nonlinear sample generation non-linear absorption and the nonlinear refraction that are in ground state; Testing sample is arranged on the focal plane of detection light light path convex lens, and the detection light of outgoing is divided into two bundles through a spectroscope, a branch ofly directly enters the first detector, and another bundle enters the second detector after being closed by the small-bore diaphragm of a center and optical axis coincidence; In described detection light light path, before convex lens, be provided with phase object.
Above-mentioned pumping sniffer is with may be used for determining that the optical nonlinearity mechanism of material also can measure the important nonlinear optical mathematic(al) parameter of material accurately simultaneously.Because the light intensity as pump light is stronger in this pump probe device, and this pump light is through imaging on the detector again after detected materials, thus when detected materials is membraneous material, the stronger pump light of light intensity is transmitted through after membraneous material, because cumulative heating effect may cause damage to membraneous material, the various optical characteristics of membraneous material can be affected.If be non-transparent film material, can because transmitance be too low, causing cannot Measurement accuracy.In addition, because the laser through testing sample is detected by two detectors respectively at two bundle laser after spectroscope, laser instrument carries out in the process of optical nonlinearity measurement at Emission Lasers, may be different at the laser energy do not launched by laser instrument in the same time, the response of two photodetectors is also not quite identical, thus the difference of the laser energy of laser instrument transmitting will affect the optical nonlinearity measurement result of testing sample, finally cause the optical nonlinearity measuring result error of testing sample larger.
Summary of the invention
Goal of the invention of the present utility model is: for prior art Problems existing, a kind of optical non-linear measuring device of Nonlinear Thin membrane material is provided, in measurement mechanism, pump light and detection light produce reflection on membraneous material, reduce the damage that pump light causes membraneous material, be also applicable to the measurement of non-transparent film material simultaneously; And one piece of CCD camera is set in this measurement mechanism receives " perforate " simultaneously and measure light and " closed pore " and measure light, the laser energy can effectively eliminated because of laser instrument transmitting shakes the impact caused the optical nonlinearity measurement result of testing sample, improves the accuracy of measurement result.
To achieve these goals, the technical solution adopted in the utility model is:
An optical non-linear measuring device for Nonlinear Thin membrane material, comprises laser instrument, pumping light path, detection light path, optical path and computer processing system; Pump light and detection light is divided into by the first beam splitter after the incident laser that described laser instrument produces is incident to the first beam splitter; Described pump light is incident to testing sample through pumping light path, described detection light is incident to testing sample through detection light path, described detection light produces and reflects to form reflects laser on testing sample, is divided into transmission measurement light and reflection measurement light after reflects laser is incident to the second beam splitter by the second beam splitter; Described transmission measurement light, reflection measurement light are incident to same ccd detector by attenuator respectively and on ccd detector, obtain a series of perforate after perforate optical path, closed pore optical path measures hot spot and closed pore measurement hot spot; Described ccd detector is electrically connected with computer processing system, and the measurement hot spot that described ccd detector obtains and monitoring hot spot transfer to computer processing system.
As preferred version of the present utility model, described detection light path comprises the first catoptron, phase diaphragm and the first lens, described detection light produces and reflects to form reflected detection laser light on the first catoptron, and reflected detection laser light is incident to testing sample successively after phase diaphragm, the first lens.
As preferred version of the present utility model, described phase diaphragm is loop configuration, and the shadow region, center of described phase diaphragm and the phase differential in other regions are pi/2.
As preferred version of the present utility model, described phase diaphragm is placed on the front focal plane of the first lens, and described testing sample is placed on the back focal plane of the first lens.
As preferred version of the present utility model, the angle α between the pump light inciding testing sample and the detection light being incident to testing sample is 10 °-20 °.
As preferred version of the present utility model, described pumping light path comprises the second catoptron, right-angle prism, the 3rd catoptron and the second lens, described pump light is incident to generation on the second catoptron and reflects to form reflection pumping laser, reflection pumping laser is incident to the 3rd catoptron and produces again to reflect to form on the 3rd catoptron and reflects pumping laser again after right-angle prism, then reflects pumping laser be incident to testing sample after the second lens.
As preferred version of the present utility model, described perforate optical path comprises the 4th catoptron, described transmission measurement light is incident to the 4th catoptron and produces on the 4th catoptron and reflects to form perforate measurement light, and described perforate is measured light and is incident to ccd detector by attenuator and on ccd detector, obtains a series of perforate measurement hot spot.Described closed pore optical path comprises aperture, and described reflection measurement light forms closed pore by aperture and measures light, and described closed pore is measured light and is incident to ccd detector by attenuator and on ccd detector, obtains a series of closed pore measurement hot spot.
As preferred version of the present utility model, the size in the aperture of described aperture and the diffraction pattern of phase diaphragm in far field measure-alike
As preferred version of the present utility model, described perforate measurement light and closed pore are measured light and are parallel to each other.
As preferred version of the present utility model, the reflection-transmittance of described first beam splitter is greater than 10:1.
In sum, owing to have employed technique scheme, the beneficial effects of the utility model are:
In the utility model, pump light is incident to testing sample through pumping light path, pump light makes the nonlinear thin film material being in ground state produce non-linear absorption and nonlinear refraction, detection light is incident to testing sample through detection light path, detection light produces and reflects to form reflects laser on testing sample, is starkly lower than the damage caused membraneous material when laser produces transmission on testing sample when laser produces reflection on testing sample to the damage that membraneous material causes; Measure light and monitor light and after attenuator, be incident to same ccd detector successively and on ccd detector, obtain a series of measurement hot spot and monitoring hot spot, light and monitoring light is measured due to one piece of ccd detector receiving simultaneously, measured hot spot by process and monitoring hot spot and draw in the process of the nonlinear refractive index of testing sample, the laser energy can effectively eliminated because of laser instrument transmitting is shaken the impact caused the optical nonlinearity measurement result of testing sample, thus is improved the accuracy of measurement result.
In addition, the time delay parts be made up of two catoptrons and a right-angle prism are provided with in pumping light path, by mobile right-angle prism, regulate the distance between right-angle prism and catoptron, change pump beam propagation distance, reach the object of control lag time, thus the optical nonlinearity time response of membraneous material can be measured.
Accompanying drawing explanation
Fig. 1 is structural representation of the present utility model;
Fig. 2 is the phase diaphragm schematic diagram in the utility model
Wherein, Reference numeral is: 1-laser instrument, the 2-the first beam splitter, the 5-the first catoptron, 6-phase diaphragm, the 7-the first lens, 8-testing sample, the 9-the second catoptron, 10-right-angle prism, the 11-the three catoptron, the 12-the second lens, the 13-the second beam splitter, the 14-the four catoptron, 15-aperture, 16-attenuator, 17-ccd detector, 18-computer processing system.
Embodiment
Below in conjunction with accompanying drawing, the utility model is described in detail.
In order to make the purpose of this utility model, technical scheme and advantage clearly understand, below in conjunction with drawings and Examples, the utility model is further elaborated.Should be appreciated that specific embodiment described herein only in order to explain the utility model, and be not used in restriction the utility model.
embodiment 1
An optical non-linear measuring device for Nonlinear Thin membrane material, this optical non-linear measuring device is mainly used in optical nonlinearity parameter and the optical nonlinearity time response of measuring Nonlinear Thin membrane material.
This optical non-linear measuring device comprises laser instrument 1, pumping light path, detection light path, optical path and computer processing system 18.Laser instrument 1 produces incident laser and is incident to the first beam splitter 2, and incident laser is divided into pump light and detection light two to restraint laser by the first beam splitter 2.This pump light enters pumping light path and is incident to testing sample 8 by pumping light path.Wherein, this pumping light path comprises the second catoptron 9, right-angle prism 10, the 3rd catoptron 11 and the second lens 12, and the pump light entering to inject pump light road is first incident to the second catoptron 9, and pump light produces and reflects to form reflected pump light on the second catoptron 9.Reflected pump light is incident to the 3rd catoptron 11 after right-angle prism 10, and produces again to reflect to form on the 3rd catoptron 11 and reflect pumping laser again, then reflects pumping laser and after the second lens 12, penetrate pumping light path be incorporated to and be incident upon testing sample 8.The common makeup time delay unit of second catoptron 9, right-angle prism 10 and the 3rd catoptron 11, and regulate the distance between right-angle prism 10 and the second catoptron 9, the 3rd catoptron 11 by mobile right-angle prism 10, change the propagation distance of pump light in pumping light path, reach the object of control lag time.This detection light enters detection light path and is incident to testing sample 8 by detection light path.Wherein, this detection light path comprises the first catoptron 5, phase diaphragm 6 and the first lens 7, the detection light entering to inject detection light path is first incident to the first catoptron 5, detection light produces and reflects to form reflective exploring laser light on the first catoptron 5, and reflected detection laser light penetrates detection light path successively and is incident to testing sample 8 after phase diaphragm 6, first lens 7.Be incident on testing sample 8 after reflected detection laser light injection detection light path, reflected detection laser light produces and reflects and form reflects laser on testing sample 8, then reflects laser is incident to the second beam splitter 13, and reflects laser is divided into transmission measurement light and reflection measurement light by the second beam splitter 13.Transmission measurement light, reflection measurement light are incident to same ccd detector 17 by attenuator 16 respectively after perforate optical path, closed pore optical path.Wherein, the 4th catoptron 14 is provided with in perforate optical path, transmission measurement light is incident to the 4th catoptron 14 and produces on the 4th catoptron 14 and reflects to form perforate measurement light after entering perforate optical path, perforate is re-shoot to ccd detector 17 by attenuator 16 after measuring light injection perforate optical path, and on ccd detector 17, obtain a series of perforate measurement hot spot.Closed pore optical path comprises aperture 15, and reflection measurement light forms closed pore by aperture 15 and measures light, and this closed pore is measured light and is incident to same ccd detector 14 by attenuator 13 and on ccd detector 14, obtains a series of closed pore measurement hot spot.This ccd detector 17 is electrically connected with computer processing system 18, the measurement hot spot that ccd detector 17 obtains and monitoring hot spot transfer to computer processing system 18, and computer processing system 18 is to measuring hot spot and monitoring the nonlinear characteristic that can obtain testing sample 8 after hot spot carries out data processing.
The measuring process of this measurement mechanism is:
(1), light path is arranged by shown in device, put film sample to be measured, mobile right-angle prism 10, ccd detector 17 receives " perforate " and " closed pore " energy of different time delay simultaneously, and " perforate " of drawing different time delay through energy trace with " closed pore " through energy trace.
(2), through energy trace, data processing is carried out, the optical nonlinearity coefficient of the film sample to be measured needed for acquisition through energy trace and " closed pore " to " perforate " of above-mentioned different time delay.
Data processing in step (2) comprises carries out integration to " perforate " light spot image on ccd detector 17 and " closed pore " light spot image respectively, obtain " perforate " through energy with the change curve of time delay and " closed pore " through the change curve of energy with time delay.Because " perforate " is only relevant with non-linear absorption through energy trace, carrying out matching to " perforate " through energy trace can obtain non-linear absorption coefficient." closed pore " is relevant to non-linear absorption and nonlinear refraction through energy trace, when known non-linear absorption coefficient, carries out matching obtain nonlinear refractive index to closed pore divided by perforate energy trace.
Pump light is incident to testing sample 8 through pumping light path, pump light makes the nonlinear thin film material being in ground state produce non-linear absorption and nonlinear refraction, detection light is incident to testing sample 8 through detection light path, detection light produces and reflects to form reflects laser on testing sample 8, is starkly lower than the damage caused membraneous material when laser produces transmission on testing sample 8 when laser produces reflection on testing sample 8 to the damage that membraneous material causes, closed pore measures light and perforate measurement light is incident to same ccd detector 17 successively and on ccd detector 17, obtains a series of perforate measurement hot spot and closed pore measurement hot spot after attenuator 16, light and perforate measurement light is measured owing to one piece of ccd detector 17 receiving closed pore simultaneously, measuring hot spot by process perforate measurement hot spot and closed pore and drawing in the process of the nonlinear refractive index of testing sample 8, the laser energy can effectively eliminated because of laser instrument 1 transmitting shakes the impact caused the optical nonlinearity measurement result of testing sample 8, thus improve the accuracy of measurement result.In addition, the time delay parts be made up of two catoptrons and a right-angle prism 10 are provided with in pumping light path, by mobile right-angle prism 10, regulate the distance between right-angle prism 10 and catoptron, change pump beam propagation distance, reach the object of control lag time, thus the optical nonlinearity time response of membraneous material can be measured.
embodiment 2
On the basis of embodiment one, this phase diaphragm 6 is loop configuration, and the phase differential in other regions of the shadow region, center of this phase diaphragm 6 and phase diaphragm 6 is pi/2.Above-mentioned phase differential is by being coated with deielectric-coating to realize on the glass plate shadow region of phase diaphragm 6.
As preferably, this phase diaphragm 6 is placed on the front focal plane of the first lens 7, and this testing sample 8 is placed on the back focal plane of the first lens 7.
embodiment 3
On the basis of embodiment one or embodiment two, the angle α incided between the pump light of testing sample 8 and the detection light being incident to testing sample 8 is 10 °-20 °, in the present embodiment, angle α is 15 °, guarantee that reflection of pump power light and detection reflected light do not overlap, ensure the accuracy of the measurement reflected light received.
embodiment 4
On the basis of above-described embodiment, light is measured in the perforate that the 4th catoptron 14 is formed and closed pore measurement light is parallel to each other, and guarantees that the accuracy of hot spot and closed pore measurement facula measurement is measured in perforate, also ensure that compactedness and the patency of light path simultaneously.
embodiment 5
On the basis of above-described embodiment, the reflection-transmittance of the first beam splitter 2 is greater than 10:1.In the present embodiment, the reflection-transmittance of the first beam splitter 2 is 15:1.
As preferably, transmitance and the reflectivity of the second beam splitter 13 are 50%, and ensureing perforate to measure light and closed pore, to measure luminous energy identical.
embodiment 6
On the basis of above-described embodiment, in monitoring light path, be also provided with aperture 15, the size in the aperture of this aperture 15 and the measure-alike of the diffraction pattern of phase diaphragm 6 in far field.At the diffraction pattern in far field, this phase diaphragm 6 refers to that incident laser propagates into the hot spot of aperture 15 position formation via phase diaphragm 6.
The foregoing is only preferred embodiment of the present utility model; not in order to limit the utility model; all do within spirit of the present utility model and principle any amendment, equivalent to replace and improvement etc., all should be included within protection domain of the present utility model.
Claims (10)
1. an optical non-linear measuring device for Nonlinear Thin membrane material, is characterized in that: comprise laser instrument (1), pumping light path, detection light path, optical path and computer processing system (18); The incident laser that described laser instrument (1) produces be incident to the first beam splitter (2) afterwards and by the first beam splitter (2) be divided into pump light and detection light; Described pump light is incident to testing sample (8) through pumping light path, described detection light is incident to testing sample (8) through detection light path, described detection light reflects to form reflects laser in the upper generation of testing sample (8), and reflects laser is incident to the second beam splitter (13) afterwards and be divided into transmission measurement light and reflection measurement light by the second beam splitter (13); Described transmission measurement light, reflection measurement light are incident to same ccd detector (17) by attenuator (16) respectively and on ccd detector (17), obtain a series of perforate after perforate optical path, closed pore optical path measures hot spot and closed pore measurement hot spot; Described ccd detector (17) is electrically connected with computer processing system (18), and the measurement hot spot that described ccd detector (17) obtains and monitoring hot spot transfer to computer processing system (18).
2. the optical non-linear measuring device of Nonlinear Thin membrane material as claimed in claim 1, it is characterized in that: described detection light path comprises the first catoptron (5), phase diaphragm (6) and the first lens (7), described detection light reflects to form reflected detection laser light in the upper generation of the first catoptron (5), and reflected detection laser light is incident to testing sample (8) successively after phase diaphragm (6), the first lens (7).
3. the optical non-linear measuring device of Nonlinear Thin membrane material as claimed in claim 2, it is characterized in that: described phase diaphragm (6) is loop configuration, the shadow region, center of described phase diaphragm (6) and the phase differential in other regions are pi/2.
4. the optical non-linear measuring device of Nonlinear Thin membrane material as claimed in claim 2 or claim 3, it is characterized in that: described phase diaphragm (6) is placed on the front focal plane of the first lens (7), described testing sample (8) is placed on the back focal plane of the first lens (7).
5. the optical non-linear measuring device of Nonlinear Thin membrane material as claimed in claim 1, is characterized in that: the angle α incided between the pump light of testing sample (8) and the detection light being incident to testing sample (8) is 10 °-20 °.
6. the optical non-linear measuring device of Nonlinear Thin membrane material as claimed in claim 1, it is characterized in that: described pumping light path comprises the second catoptron (9), right-angle prism (10), 3rd catoptron (11) and the second lens (12), described pump light is incident to the upper generation of the second catoptron (9) and reflects to form reflection pumping laser, reflection pumping laser is incident to the 3rd catoptron (11) and again reflects to form in the upper generation of the 3rd catoptron (11) and reflects pumping laser again after right-angle prism (10), reflect pumping laser again and be incident to testing sample (8) after the second lens (12).
7. the optical non-linear measuring device of Nonlinear Thin membrane material as claimed in claim 1, it is characterized in that: described perforate optical path comprises the 4th catoptron (14), described transmission measurement light is incident to the 4th catoptron (14) and reflects to form perforate in the upper generation of the 4th catoptron (14) measures light, and described perforate is measured light and is incident to ccd detector (14) by attenuator (13) and on ccd detector (14), obtains a series of perforate measurement hot spot; Described closed pore optical path comprises aperture (15), described reflection measurement light forms closed pore by aperture (15) and measures light, and described closed pore measurement light is incident to ccd detector (14) by attenuator (13) and on ccd detector (14), obtains a series of closed pore measures hot spot.
8. the optical non-linear measuring device of Nonlinear Thin membrane material as claimed in claim 7, is characterized in that: the size in the aperture of described aperture (15) and the measure-alike of phase diaphragm (6) diffraction pattern in far field.
9. the optical non-linear measuring device of Nonlinear Thin membrane material as claimed in claim 1, is characterized in that: described perforate measurement light and closed pore are measured light and be parallel to each other.
10. the optical non-linear measuring device of Nonlinear Thin membrane material as claimed in claim 1, is characterized in that: the reflection-transmittance of described first beam splitter (2) is greater than 10:1.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105699297A (en) * | 2016-04-20 | 2016-06-22 | 中国工程物理研究院激光聚变研究中心 | Light Kerr coefficient measuring device for single-shooting materials |
| CN109883952A (en) * | 2019-02-28 | 2019-06-14 | 上海交通大学 | A kind of nonlinear factor measuring device and its measurement method based on weak measuring technique |
| CN111024137A (en) * | 2019-12-27 | 2020-04-17 | 中国科学院长春光学精密机械与物理研究所 | Linear measuring system |
| CN113008929A (en) * | 2021-02-22 | 2021-06-22 | 哈尔滨工业大学（深圳） | Thermal conductivity measurement device, system and method |
-
2015
- 2015-09-06 CN CN201520680761.6U patent/CN204903381U/en not_active Expired - Fee Related
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105699297A (en) * | 2016-04-20 | 2016-06-22 | 中国工程物理研究院激光聚变研究中心 | Light Kerr coefficient measuring device for single-shooting materials |
| CN105699297B (en) * | 2016-04-20 | 2018-08-17 | 中国工程物理研究院激光聚变研究中心 | A kind of single-shot time material light Kerr coefficient measuring device |
| CN109883952A (en) * | 2019-02-28 | 2019-06-14 | 上海交通大学 | A kind of nonlinear factor measuring device and its measurement method based on weak measuring technique |
| CN111024137A (en) * | 2019-12-27 | 2020-04-17 | 中国科学院长春光学精密机械与物理研究所 | Linear measuring system |
| CN111024137B (en) * | 2019-12-27 | 2021-07-16 | 中国科学院长春光学精密机械与物理研究所 | Linear measuring system |
| CN113008929A (en) * | 2021-02-22 | 2021-06-22 | 哈尔滨工业大学（深圳） | Thermal conductivity measurement device, system and method |
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