CN102998261B - Terahertz wave pseudo heat light source-based imaging device - Google Patents
Terahertz wave pseudo heat light source-based imaging device Download PDFInfo
- Publication number
- CN102998261B CN102998261B CN201210548893.4A CN201210548893A CN102998261B CN 102998261 B CN102998261 B CN 102998261B CN 201210548893 A CN201210548893 A CN 201210548893A CN 102998261 B CN102998261 B CN 102998261B
- Authority
- CN
- China
- Prior art keywords
- thz wave
- terahertz
- schottky barrier
- light source
- imaging device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Abstract
The invention discloses a terahertz wave pseudo heat light source-based imaging device. The terahertz wave pseudo heat light source-based imaging device comprises a terahertz wave parametric oscillator, a terahertz wave focusing lens, a rotating quarry-faced silicon wafer, a terahertz wave collimating lens, a terahertz wave beam splitter, a terahertz transmission light path system, a terahertz reflection light path system and a coincidence measurement circuit, wherein the terahertz transmission light path system consists of an object to be imaged, a terahertz wave collection lens, a terahertz attenuation wafer, a schottky barrier photodiode; and the terahertz reflection light path system consists of a terahertz wave attenuation wafer and a schottky barrier photodiode. The terahertz wave pseudo heat light source-based imaging device has the advantages of being simple in structure, flexible to operate, strong in anti-interference capability, and the like.
Description
Technical field
The present invention relates to THz wave optoelectronics technical field, be specifically related to a kind of THz wave imaging device.
Background technology
THz wave (THz ripple) refers to the electromagnetic wave (1THz=10 of frequency within the scope of 0.1-10THz
12hz), its wave band is in electromagnetic wave spectrum between millimeter wave and far red light.In recent years, along with THz wave photoelectron technology develops rapidly, THz wave imaging technique aspect makes rapid progress.At present, the most common THz wave imaging technique is pulse THz wave time-domain spectroscopy imaging technique.It, by the Fourier transform to the THz wave time domain impulse containing imaging object information, just can acquire its intensity and the space distribution information of phase place, and then the THz wave image of object, also can obtain the information such as the Spatial Density Distribution of object, refractive index.But this THz wave imaging system light channel structure is comparatively complicated, and too much optical element causes its stability of layout poor, complicated data handling procedure causes image acquisition procedures not directly perceived.
Another kind of common THz wave imaging technique is continuous THz wave imaging technique.This THz wave imaging system is embodied as picture by record THz wave through the strength information after object (or through reflections off objects), therefore compared with time-domain spectroscopy imaging system, comparatively simple, rapid on image-forming data acquisition and processing mode, imaging system structure is also relatively simple.The major defect of this imaging technique is that amount of image information is few, and THz wave multiple reflections in the optical path coherence stack can occur in an experiment, causes may there is interference fringe in image.
In above-mentioned two kinds of THz wave imaging techniques, also all have the following disadvantages:
(1) when the THz wave of carrying imaging object information is at space propagation, be easy to the random disturbance being subject to external environment, such as air flowing, humidity change, flue dust etc., imaging effect will inevitably be affected, antijamming capability is poor, which limits these practical application of THz wave imaging technique in rugged surroundings.
(2) usual used terahertz radiation source in THz wave imaging technique, such as based on the pulse Terahertz wave source, carcinotron, optical pumping THz wave laser instrument etc. of femto-second laser, what have is expensive, operation and maintenance cost is high, some volumes are large, complicated operation, job stability needs to be improved further, limits its practical sexual development.
Summary of the invention
The defect existed for above-mentioned prior art or deficiency, the object of the invention is to, and provides the imaging device based on the pseudo-thermal light source of THz wave that a kind of structure is simple, antijamming capability is strong.
In order to realize above-mentioned task, the present invention adopts following technical solution:
A kind of imaging device based on the pseudo-thermal light source of THz wave, it is characterized in that, comprise terahertz-wave parametric oscillator, THz wave condenser lens, the hair side silicon chip rotated, THz wave collimation lens, THz wave beam splitter, Terahertz reflected light path system and Terahertz transmitted light path system, and coincidence measurement device; Wherein:
Described hair side silicon chip is placed in the near focal point of THz wave condenser lens, and hair side silicon chip is the focal length of THz wave collimation lens to the distance of THz wave collimation lens;
Described Terahertz transmitted light path system by object to be imaged, THz wave collecting lens, the first Terahertz attenuator and the first schottky barrier photodiode composition; Wherein, the first schottky barrier photodiode is placed in the focus of THz wave collecting lens; First Terahertz attenuator is placed between THz wave collecting lens and the first schottky barrier photodiode;
Described Terahertz reflected light path system is made up of the second Terahertz attenuator and the second schottky barrier photodiode; Wherein, the second schottky barrier photodiode does space plane image scanning; First schottky barrier photodiode and the second schottky barrier photodiode are connected to coincidence measurement device.
Imaging device based on the pseudo-thermal light source of THz wave of the present invention, there is the advantages such as flexible operation, structure is simple, antijamming capability is strong, can be widely used in the fields such as military surveillance, remote sensing, biomedical imaging, safety and anti-terrorism, Multifunction Sensor, application prospect is huge.Compared with existing common THz wave imaging technique, have the following advantages:
1, in this THz imaging technology, object to be imaged is positioned in Terahertz transmitted light path, the THz wave of carrying object image-forming information is all received by a point probe that is fixing, that do not do spatial discrimination, and the point probe in Terahertz reflected light path does aerial image flat scanning, serve as measurement of spatial resolution task.Like this, being separated of object and imaging detector is just achieved.That is, even if after the light field of carrying imaging object information in Terahertz transmitted light path is subject to the random disturbance of external environment, still can obtain in Terahertz reflected light path clearly as.Therefore, this THz imaging technology can significantly improve antijamming capability and the imaging dirigibility of terahertz imaging system;
2, in this imaging technique based on the pseudo-thermal light source of THz wave, because its image-forming principle is the principle based on intensity fluctuation association, therefore lower to the sensitivity requirement of terahertz detector, select the schottky barrier photodiode of terahertz wave band.
3, terahertz radiation source is terahertz-wave parametric oscillator, it have volume little, simple and compact for structure, with low cost, be easy to safeguard, can room temperature running, and can produce that coherence is good, good directionality, linear polarization, narrow linewidth, linear polarization, high-octane pulse terahertz radiation.
Accompanying drawing explanation
Fig. 1 is the image device structure schematic diagram based on the pseudo-thermal light source of THz wave of the present invention.
Mark in figure represents respectively: 1, terahertz-wave parametric oscillator, 2, THz wave condenser lens, 3, the hair side silicon chip that rotates, 4, THz wave collimation lens, 5, THz wave beam splitter, 6, object to be imaged, 7, THz wave collecting lens, the 8, first Terahertz attenuator, 9 first schottky barrier photodiodes, 10, the second Terahertz attenuator, the 11, second schottky barrier photodiode, 12, coincidence measurement device.
Below in conjunction with drawings and Examples, the present invention is described in further detail.
Embodiment
As shown in Figure 1, the present embodiment provides a kind of imaging device based on the pseudo-thermal light source of THz wave, comprise terahertz-wave parametric oscillator 1, THz wave condenser lens 2, the hair side silicon chip 3 rotated, THz wave collimation lens 4, THz wave beam splitter 5, Terahertz transmitted light path system and Terahertz reflected light path system, and coincidence measurement device 12; Wherein:
Hair side silicon chip 3 is placed in the near focal point of THz wave condenser lens 2, and hair side silicon chip 3 is the focal length of THz wave collimation lens 4 to the distance of THz wave collimation lens 4;
Terahertz transmitted light path system is by object 6 to be imaged, and THz wave collecting lens 7, first Terahertz attenuator 8 and the first schottky barrier photodiode 9 form; Wherein, the first schottky barrier photodiode 9 is placed in the focus of THz wave collecting lens 7; First Terahertz attenuator 8 is placed between THz wave collecting lens 7 and the first schottky barrier photodiode 9;
Terahertz reflected light path system is made up of the second Terahertz attenuator 10 and the second schottky barrier photodiode 11; Wherein, the second schottky barrier photodiode 11 does space plane image scanning; First schottky barrier photodiode 9 and the second schottky barrier photodiode 11 are connected to coincidence measurement device 12.
In the present embodiment, select MgO:LiNbO
3crystal or LiNbO
3crystal is as terahertz-wave parametric oscillator 1(TPO) actuating medium, TPO have volume little, simple and compact for structure, cheap, can the advantage such as room temperature running, and the terahertz radiation of continuously adjustable, good directionality, relevant narrow linewidth can be produced.In addition, the THz wave that TPO produces has high line bias, can significantly improve the visibility based on the pseudo-thermo-optical imaging of THz wave.
In the present embodiment, Terahertz focus lamp 2, THz wave collimation lens 4 and THz wave collecting lens 7 are all utilize high density white polyethylene or TPX material to make.
The THz wave that Terahertz focus lamp 2 couples of TPO produce focuses on, and places the hair side silicon chip 3 be made up of high resistivity silicon at its near focal point, and rotates with angular velocity omega, the coherence time of the THz wave of transmission is shortened, has the character of pseudo-thermo-optical.The scope of first, second schottky barrier photodiode (9, the 11) time response used at terahertz wave band will be reached coherence time.Distance between hair side silicon chip 3 and THz wave collimation lens 4 is the focal length of THz wave collimation lens 4, makes the pseudo-thermo-optical of the Terahertz by rotating hair side silicon chip 3 become the parallel beam of collimation like this.By adjustment hair side silicon chip 3 in the position of THz wave focus lamp 2 near focal point, to control the size by the pseudo-thermo-optical hot spot of the Terahertz after THz wave collimation lens 4, the visibility of imaging and the optimum matching of resolution can be realized, to adapt to the concrete actual conditions of testing.
The pseudo-thermo-optical of this narrow band terahertz band is incident on the THz wave beam splitter 5 be made up of twin polishing high resistivity wafers, by changing THz wave incident angle, the THz wave of the THz wave of transmission and reflection is made to export energy equal, and make the facular model regularity of distribution of two THz wave light beams identical, the intensity fluctuation Changing Pattern of two hot spots in the same point of correspondence is also identical.
Object 6 to be imaged is placed in the THz wave transmission light path of THz wave beam splitter 5 transmission, the THz wave of carrying object spatial information is collected by THz wave collecting lens 7, and in its focus, placing one, fixing point probe---the first Schottky-barrier diode 9 being operated in terahertz wave band detects.The first Terahertz attenuator 8 is placed, to prevent the first schottky barrier photodiode 9 saturated between THz wave collecting lens 7 and the first schottky barrier photodiode 9.In the present embodiment, above-mentioned light path is defined as Terahertz transmitted light path system.From THz wave beam splitter 5 to the distance of object 6 to be imaged, and do not limit from object 6 to be imaged to the distance of THz wave collecting lens 7.
From the THz wave that THz wave beam splitter 5 reflects, after the second Terahertz attenuator 10 is decayed, received by the second schottky barrier photodiode 11 doing space plane image scanning.In the present embodiment, above-mentioned light path is defined as Terahertz reflected light path system.Do not limit from the distance of THz wave beam splitter 5 to the second schottky barrier photodiode 11 aerial image plane of scanning motion.
The signal of the first schottky barrier photodiode 9 in Terahertz transmitted light path system and the second schottky barrier photodiode 11 in Terahertz reflected light path system enters the coincidence measurement device 12 be made up of time-to-amplitude conversion instrument and multichannel analyzer, and carries out image-forming data acquisition with computer.
It should be noted that; above-mentioned is a kind of optimal way of the present invention with embodiment; should be understood to further understand the present invention by above-described embodiment for those skilled in the art; the invention is not restricted to above-described embodiment; those skilled in the art is on the technical scheme basis that above-described embodiment provides; the interpolation made and equivalence are replaced, and all should belong to protection scope of the present invention.
Claims (6)
1. the imaging device based on the pseudo-thermal light source of THz wave, it is characterized in that, comprise terahertz-wave parametric oscillator (1), THz wave condenser lens (2), the hair side silicon chip (3) rotated, THz wave collimation lens (4), THz wave beam splitter (5), Terahertz transmitted light path system and Terahertz reflected light path system, and coincidence measurement device (12); Wherein:
The actuating medium of described terahertz-wave parametric oscillator (1) is MgO:LiNbO
3crystal or LiNbO
3crystal;
Described hair side silicon chip (3) is placed in the near focal point of THz wave condenser lens (2), and hair side silicon chip (3) is the focal length of THz wave collimation lens (4) to the distance of THz wave collimation lens (4);
Described Terahertz transmitted light path system by object to be imaged (6), THz wave collecting lens (7), the first Terahertz attenuator (8) and the first schottky barrier photodiode (9) composition; Wherein, the first schottky barrier photodiode (9) is placed in the focus of THz wave collecting lens (7); First Terahertz attenuator (8) is placed between THz wave collecting lens (7) and the first schottky barrier photodiode (9);
Described Terahertz reflected light path system is made up of the second Terahertz attenuator (10) and the second schottky barrier photodiode (11); Wherein, the second schottky barrier photodiode (11) does space plane image scanning; First schottky barrier photodiode (9) and the second schottky barrier photodiode (11) are connected to coincidence measurement device (12).
2. as claimed in claim 1 based on the imaging device of the pseudo-thermal light source of THz wave, it is characterized in that, described hair side silicon chip (3) adopts high resistivity silicon to make.
3. as claimed in claim 1 based on the imaging device of the pseudo-thermal light source of THz wave, it is characterized in that, described THz wave beam splitter (5) adopts the high resistivity silicon of twin polishing to make.
4., as claimed in claim 1 based on the imaging device of the pseudo-thermal light source of THz wave, it is characterized in that, first, second schottky barrier photodiode described (9,11) is the schottky barrier photodiode being operated in THz wave wave band.
5. as claimed in claim 1 based on the imaging device of the pseudo-thermal light source of THz wave, it is characterized in that, described THz wave condenser lens (2), THz wave collimation lens (4) and THz wave collecting lens (7) are made by high density white polyethylene or TPX.
6., as claimed in claim 1 based on the imaging device of the pseudo-thermal light source of THz wave, it is characterized in that, described coincidence measurement device (12) comprises time-to-amplitude conversion instrument and multichannel analyzer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210548893.4A CN102998261B (en) | 2012-12-17 | 2012-12-17 | Terahertz wave pseudo heat light source-based imaging device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210548893.4A CN102998261B (en) | 2012-12-17 | 2012-12-17 | Terahertz wave pseudo heat light source-based imaging device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102998261A CN102998261A (en) | 2013-03-27 |
| CN102998261B true CN102998261B (en) | 2015-02-04 |
Family
ID=47927108
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201210548893.4A Expired - Fee Related CN102998261B (en) | 2012-12-17 | 2012-12-17 | Terahertz wave pseudo heat light source-based imaging device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102998261B (en) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103256503B (en) * | 2013-04-19 | 2015-04-15 | 中国科学院上海光学精密机械研究所 | Preparation method for addressing type high-speed pseudo-thermal light source |
| CN103776795B (en) * | 2013-12-31 | 2016-05-18 | 西北大学 | A kind of Terahertz-Stokes two-photon of spherical wave pumping tangles imaging device |
| CN106290226B (en) * | 2016-09-19 | 2020-04-17 | 成都曙光光纤网络有限责任公司 | Terahertz transmission imaging device and method |
| CN106769997A (en) * | 2016-11-14 | 2017-05-31 | 中国电子科技集团公司第四十研究所 | A kind of Terahertz scanned imagery device |
| CN107727234B (en) * | 2017-09-27 | 2020-03-10 | 上海理工大学 | Device and method for rapidly detecting terahertz output frequency instability of backward wave tube |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2040094A2 (en) * | 2007-09-18 | 2009-03-25 | Honeywell International Inc. | Correlated ghost imager |
-
2012
- 2012-12-17 CN CN201210548893.4A patent/CN102998261B/en not_active Expired - Fee Related
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2040094A2 (en) * | 2007-09-18 | 2009-03-25 | Honeywell International Inc. | Correlated ghost imager |
Non-Patent Citations (5)
| Title |
|---|
| Wu Ling-An et.al.《Correlated two-photon imaging with true thermal light》.《Optics Letters》.2005,第30卷(第18期),第2354-2355页,第3段. * |
| Zhai Yan-Hua et.al.《Two-photon interference with two independent pseudothermal sources》.《Physical Review A》.2006,(第74期),全文. * |
| 孙博等.《基于光学方法的太赫兹辐射源》.《中国激光》.2006,第33卷(第10期),全文. * |
| 曹彬等.《利用红外光源实现二维"鬼"成像》.《半导体光电》.2011,第31卷(第4期),全文. * |
| 陈明亮等.《基于稀疏阵赝热光系统的强度关联成像研究》.《光学学报》.2012,第32卷(第5期),第3部分第1段,图2. * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102998261A (en) | 2013-03-27 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US10393657B2 (en) | SPR detection system and method | |
| US7897924B2 (en) | Beam scanning imaging method and apparatus | |
| US9733108B2 (en) | Method and apparatus for remote sensing using optical orbital angular momentum (OAM)-based spectroscopy for detecting lateral motion of a remote object | |
| RU2442107C2 (en) | Device for optical distance measurement | |
| CN102998261B (en) | Terahertz wave pseudo heat light source-based imaging device | |
| CN102998260B (en) | Two-photon entanglement-based terahertz wave imaging device | |
| CN102692394B (en) | Two-dimensional imaging method and device based on thermal lens effect | |
| CN106290227B (en) | Terahertz wave reflection imaging device and method | |
| CN103712993A (en) | Method and device for detecting three-dimensional distribution of absorption characteristics in transparent optical material body | |
| CN106769994B (en) | Terahertz sub-wavelength resolution imaging device | |
| CN109946710A (en) | A kind of more polarized laser imaging devices of dual wavelength | |
| JP2009222616A (en) | Method and apparatus for measuring azimuth | |
| CN103149158A (en) | Double-prism water quality monitoring optical fiber sensing system | |
| CN103292899A (en) | High-sensitivity high-resolution-ratio terahertz radiation detector capable of working at room temperature | |
| CN104677497A (en) | Detection device and method for properties of terahertz waves | |
| CN101832910B (en) | Reverse collinear transient heat reflection measurement system | |
| CN102156286B (en) | Brillouin scattering underwater laser imaging detector based on photonic crystal filter | |
| KR20130064684A (en) | Terahertz continuous wave system and three dimension imaging abtainning method thereof | |
| KR101296748B1 (en) | Spectroscopy and imaging system of high-speed and high-resolution using electromagnetic wave based on optics | |
| CN108180995B (en) | Novel polarization spectrum camera | |
| CN202676595U (en) | Two-dimensional imaging device based on thermal lens effect | |
| CN104535199B (en) | A kind of method of coherent measurement THz wave frequency | |
| CN110361363A (en) | The resolution compensation device of THz wave decaying total reflection imaging and compensation method | |
| CN201653881U (en) | Reverse collinear transient heat-reflecting measuring system | |
| CN203643362U (en) | Detection device for three-dimensional distribution of absorption characteristics in transparent optical material |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20150204 Termination date: 20151217 |
|
| EXPY | Termination of patent right or utility model |