CN109883952A - A kind of nonlinear factor measuring device and its measurement method based on weak measuring technique - Google Patents
A kind of nonlinear factor measuring device and its measurement method based on weak measuring technique Download PDFInfo
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- CN109883952A CN109883952A CN201910179334.2A CN201910179334A CN109883952A CN 109883952 A CN109883952 A CN 109883952A CN 201910179334 A CN201910179334 A CN 201910179334A CN 109883952 A CN109883952 A CN 109883952A
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Abstract
The present invention provides a kind of nonlinear factor measuring devices and its measurement method based on weak measuring technique, including probe portion and non-linear generation part；The non-linear generation part: pump light is radiated on nonlinear material to be measured, generates non-linear phenomena；The probe portion: will detect spot center of the light by the pump light on nonlinear material to be measured, generates center spectrum offset, carries out nonlinear factor measurement.The features such as present invention carries out nonlinear factor measurement to center spectrum offset using weak measuring technique, has measurement accurate high, and the nonlinear factor suitable for different optical materials measures, and apparatus structure is simple, easy to use, and environment resistant interference performance is strong.
Description
Technical field
The present invention relates to field of measuring technique, and in particular, to a kind of nonlinear factor measurement based on weak measuring technique
Device and its measurement method.
Background technique
With the rapid development of the fields such as optic communication and optical information processing technology, the research of nonlinear optical material is increasingly heavy
It wants.The nonlinear characteristic of medium has important application in the fields such as communication and accurate measurement, and wherein precise measurement medium is non-linear
Coefficient has great importance.It is to find the essential tool of Ideal Nonlinear material with convenient reliable measurement method.
Currently, the method for measurement nonlinear factor measurement is measured using round-about way, such as Publication No.
The patent " optical non-linear measuring device and measurement method of non-linear thickness photonics material " of CN105092477A, the spirit of measurement
Sensitivity and accuracy are influenced by measuring instrument.
Weak measuring technique is that measurement result can be exaggerated strongly in the case where selecting after having, and is considered in weak measurement
Measuring system and measuring instrument between stiffness of coupling it is weaker, selection measures the screening of result after utilization, thus
Measurement result is set to obtain significant amplification effect in the case that stiffness of coupling is very weak.Weak measuring technique is to grind at present in accurate measurement
The popular direction studied carefully, and there is important research significance.
Summary of the invention
For the defects in the prior art, the object of the present invention is to provide a kind of nonlinear factors based on weak measuring technique
Measuring device and its measurement method.
A kind of nonlinear factor measuring device based on weak measuring technique provided according to the present invention, including probe portion and
Non-linear generation part；
The non-linear generation part: pump light is radiated on nonlinear material 7 to be measured, generates non-linear phenomena；
The probe portion: spot center of the light by the pump light on nonlinear material 7 to be measured will be detected, is generated
Center spectrum offset, carries out nonlinear factor measurement.
Preferably, the probe portion includes: probe source 1, the first Glan-Taylor prism 4, the second Glan-Taylor prism
12, polarization beam apparatus 5, reflecting mirror 6, wave plate 11 and spectrometer 13；
The detection light that the probe source 1 issues generates linearly polarized photon, linear polarization by first Glan prism 4
Light is divided into two-beam after entering the polarization beam apparatus 5, and the nonlinear material 7 to be measured is located therein in the optical path of light beam,
Two-beam pass through respectively reflecting mirror 6 again pass by the polarization beam apparatus 5 be output to the wave plate 11 and enter second lattice
Blue prism 12 is measured by the spectrometer 13.
Preferably, being in the non-orthogonal states at the angle ε between first Glan prism 4 and second Glan prism 12.
Preferably, the value range of the ε is 0 < ε < < 1.
Preferably, the nonlinear factor measurement includes:
The phase change that detection light generates in nonlinear material 7 to be measuredAre as follows:
Wherein, n is total refractive index, n0For linear refractive index, n2For the nonlinear factor of nonlinear material 7 to be measured, E is light
Electric field, Δ n are the variations in refractive index of nonlinear material to be measured (7), IpFor pump light intensities, π 3.14, λ are pump wavelength,
D is the thickness of nonlinear material to be measured (7)；
Detect the center spectrum shifted by delta ω that light generates are as follows:
Wherein, ω is the frequency for detecting light, and τ is the delay generated after nonlinear material to be measured (7), and σ is detection light
Line width；
The nonlinear factor n of nonlinear material 7 to be measured2Are as follows:
Wherein, c is the light velocity, and σ is the line width for detecting light.
Preferably, between the probe source 1 and first Glan prism 4 further include: the first lens 2 and the first aperture
3。
Preferably, the first lens 2, the first aperture 3, polarization beam splitting that the detection light that the probe source 1 issues is passed through
Device 5, reflecting mirror 6, the optical axis height of wave plate 11 and spectrometer 13 are identical.
Preferably, the wave plate 11 includes quarter-wave plate.
Preferably, the non-linear generating unit point includes: pump light source 10, the second lens 8 and second orifice 9；
The pump light that the pump light source 10 issues is radiated to be measured by the second orifice 9 and second lens 8
On nonlinear material 7.
A kind of nonlinear factor measurement method based on weak measuring technique provided according to the present invention, using it is above-mentioned based on
The nonlinear factor measuring device of weak measuring technique executes step:
The pump light that S1, adjusting are radiated on nonlinear material 7 to be measured, generates non-linear phenomena；
S2, spot center of the light by the pump light on nonlinear material 7 to be measured will be detected, it is inclined generates center spectrum
It moves；
S3, the nonlinear factor for calculating nonlinear material 7 to be measured.
Compared with prior art, the present invention have it is following the utility model has the advantages that
The present invention carries out nonlinear factor measurement to center spectrum offset using weak measuring technique, has measurement accurate
Height, the nonlinear factor suitable for different optical materials measure, and apparatus structure is simple, and easy to use, environment resistant interference performance is strong
The features such as.
Detailed description of the invention
Upon reading the detailed description of non-limiting embodiments with reference to the following drawings, other feature of the invention,
Objects and advantages will become more apparent upon:
Fig. 1 is the index path of measuring device of the present invention；
Appended drawing reference: 1- probe source；The first lens of 2-；The first aperture of 3-；The first Glan-Taylor prism of 4-；5- polarization point
Beam device；6- reflecting mirror；7- nonlinear material to be measured；The second lens of 8-；9- second orifice；10- pump light source；11- wave plate；12-
Second Glan-Taylor prism；13- spectrometer.
Specific embodiment
The present invention is described in detail combined with specific embodiments below.Following embodiment will be helpful to the technology of this field
Personnel further understand the present invention, but the invention is not limited in any way.It should be pointed out that the ordinary skill of this field
For personnel, without departing from the inventive concept of the premise, several changes and improvements can also be made.These belong to the present invention
Protection scope.
As shown in Figure 1, a kind of nonlinear factor measuring device based on weak measuring technique provided according to the present invention, including
Probe portion and non-linear generation part.
Pump light is radiated on nonlinear material 7 to be measured by non-linear generation part, generates non-linear phenomena；Probe portion
By detection light by spot center of the pump light on nonlinear material 7 to be measured, center spectrum offset is generated, nonlinear system is carried out
Number measurement.
Specifically, probe portion include: probe source 1, the first lens 2, the first aperture 3, the first Glan-Taylor prism 4,
Second Glan-Taylor prism 12, polarization beam apparatus 5, reflecting mirror 6, wave plate 11 and spectrometer 13；
The detection light that probe source 1 issues enters first Glan Taylor's rib after the first lens 2, the first aperture 3 collimation
Mirror 4 generates linearly polarized photon, and linearly polarized photon is divided into two-beam after entering polarization beam apparatus 5, and nonlinear material 7 to be measured is located at it
In the optical path of middle light beam, two-beam, which passes through reflecting mirror 6 respectively and again passes by polarization beam apparatus 5, to be output to wave plate 11 and enters the
Two Glan prisms 12, are measured by spectrometer 13.Wherein, the first Glan-Taylor prism 4 and the second Glan-Taylor prism 12 it
Between be in the angle ε non-orthogonal states, the value range of ε is 0 < ε < < 1.First that the detection light of the sending of probe source 1 is passed through is saturating
Mirror 2, the first aperture 3, polarization beam apparatus 5, reflecting mirror 6, the optical axis height of wave plate 11 and spectrometer 13 are identical.In the present embodiment
In, the first Glan-Taylor prism 4 and horizontal angle at 45 °, wave plate 11 uses quarter-wave plate, but the present invention does not limit this
System.
Non-linear generating unit point includes: pump light source 10, the second lens 8 and second orifice 9；The pump that pump light source 10 issues
Pu light is radiated on nonlinear material 7 to be measured after passing through 8 expanded light beam area of second orifice 9 and the second lens.Second lens 8 can
Using convex lens.
Nonlinear factor measurement includes:
The phase change that detection light generates in nonlinear material 7 to be measuredAre as follows:
Wherein, n is total refractive index, n0For linear refractive index, n2For the nonlinear factor of nonlinear material 7 to be measured, E is light
Electric field, Δ n are the variations in refractive index of nonlinear material to be measured (7), IpFor pump light intensities, π 3.14, λ are pump wavelength,
D is the thickness of nonlinear material to be measured (7)；
Detect the center spectrum shifted by delta ω that light generates are as follows:
Wherein, ω is the frequency for detecting light, and τ is the delay generated after nonlinear material to be measured (7), and σ is detection light
Line width；
The nonlinear factor n of nonlinear material 7 to be measured2Are as follows:
Wherein, c is the light velocity, and σ is the line width for detecting light.
Non-linear generating unit point includes: pump light source 10, the second lens 8 and second orifice 9；
The pump light that pump light source 10 issues is radiated at nonlinear material 7 to be measured by second orifice 9 and the second lens 8
On.
On the basis of a kind of above-mentioned nonlinear factor measuring device based on weak measuring technique, provide according to the present invention
A kind of nonlinear factor measurement method based on weak measuring technique is measured using the above-mentioned nonlinear factor based on weak measuring technique
Device executes step:
The pump light that S1, adjusting are radiated on nonlinear material 7 to be measured, generates non-linear phenomena；
S2, detection light is passed through into spot center of the pump light on nonlinear material 7 to be measured, generation center spectrum offset；
S3, the nonlinear factor for calculating nonlinear material 7 to be measured.
Specific embodiments of the present invention are described above.It is to be appreciated that the invention is not limited to above-mentioned
Particular implementation, those skilled in the art can make a variety of changes or modify within the scope of the claims, this not shadow
Ring substantive content of the invention.In the absence of conflict, the feature in embodiments herein and embodiment can any phase
Mutually combination.
Claims (10)
1. a kind of nonlinear factor measuring device based on weak measuring technique, which is characterized in that including probe portion and non-linear
Generate part；
The non-linear generation part: pump light is radiated on nonlinear material to be measured (7), generates non-linear phenomena；
The probe portion: will detect spot center of the light by the pump light on nonlinear material to be measured (7), in generation
Heart spectrum offset carries out nonlinear factor measurement.
2. the nonlinear factor measuring device according to claim 1 based on weak measuring technique, which is characterized in that the spy
Surveying part includes: probe source (1), the first Glan-Taylor prism (4), the second Glan-Taylor prism (12), polarization beam apparatus
(5), reflecting mirror (6), wave plate (11) and spectrometer (13)；
The detection light that the probe source (1) issues generates linearly polarized photon, linear polarization by first Glan prism (4)
Light is divided into two-beam after entering the polarization beam apparatus (5), and the nonlinear material (7) to be measured is located therein the optical path of light beam
On, two-beam pass through respectively reflecting mirror (6) again pass by the polarization beam apparatus (5) be output to the wave plate (11) and enter institute
The second Glan prism (12) are stated, are measured by the spectrometer (13).
3. the nonlinear factor measuring device according to claim 2 based on weak measuring technique, which is characterized in that described
It is in the non-orthogonal states at the angle ε between one Glan prism (4) and second Glan prism (12).
4. the nonlinear factor measuring device according to claim 3 based on weak measuring technique, which is characterized in that the ε
Value range be 0 < ε < < 1.
5. the nonlinear factor measuring device according to claim 3 based on weak measuring technique, which is characterized in that described non-
Linear coefficient measurement includes:
Detect the phase change that light generates in nonlinear material to be measured (7)Are as follows:
N=n0+n2|E|2, Δ n=n2Ip,
Wherein, n is total refractive index, n0For linear refractive index, n2For the nonlinear factor of nonlinear material to be measured (7), E is photoelectricity
, Δ n is the variations in refractive index of nonlinear material to be measured (7), IpFor pump light intensities, π 3.14, λ are pump wavelength, d
For the thickness of nonlinear material to be measured (7)；
Detect the center spectrum shifted by delta ω that light generates are as follows:
Wherein, ω is the frequency for detecting light, and τ is the delay generated after nonlinear material to be measured (7), and σ is the line for detecting light
It is wide；
The nonlinear factor n of nonlinear material (7) to be measured2Are as follows:
Wherein, c is the light velocity, and σ is the line width for detecting light.
6. the nonlinear factor measuring device according to claim 2 based on weak measuring technique, which is characterized in that the spy
It surveys between light source (1) and first Glan prism (4) further include: the first lens (2) and the first aperture (3).
7. the nonlinear factor measuring device according to claim 6 based on weak measuring technique, which is characterized in that the spy
Survey light source (1) issue detection light passed through the first lens (2), the first aperture (3), polarization beam apparatus (5), reflecting mirror (6),
Wave plate (11) is identical with the optical axis of spectrometer (13) height.
8. the nonlinear factor measuring device according to claim 2 based on weak measuring technique, which is characterized in that the wave
Piece (11) includes quarter-wave plate.
9. the nonlinear factor measuring device according to claim 1 based on weak measuring technique, which is characterized in that described non-
Linear generating unit point includes: pump light source (10), the second lens (8) and second orifice (9)；
The pump light that the pump light source (10) issues by the second orifice (9) and second lens (8) be radiated to
It surveys on nonlinear material (7).
10. a kind of nonlinear factor measurement method based on weak measuring technique, which is characterized in that any using claim 1 to 8
Based on the nonlinear factor measuring device of weak measuring technique described in one, step is executed:
The pump light that S1, adjusting are radiated on nonlinear material to be measured (7), generates non-linear phenomena；
S2, spot center of the light by the pump light on nonlinear material to be measured (7) will be detected, it is inclined generates center spectrum
It moves；
S3, the nonlinear factor for calculating nonlinear material (7) to be measured.
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| CN201222032Y (en) * | 2008-07-17 | 2009-04-15 | 苏州大学 | Pump detection device based on Z scanning |
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| CN104914644A (en) * | 2015-05-25 | 2015-09-16 | 西安交通大学 | Femtosecond optical Kerr gate gated imaging device and method based on directional filtering |
| CN105092477A (en) * | 2015-08-26 | 2015-11-25 | 中国工程物理研究院激光聚变研究中心 | Optical nonlinearity measuring device and measuring method for nonlinearity thick photonics materials |
| CN204903381U (en) * | 2015-09-06 | 2015-12-23 | 中国工程物理研究院激光聚变研究中心 | Nonlinearity thin film materials's optical nonlinearity measuring device |
| CN105403534A (en) * | 2015-06-18 | 2016-03-16 | 苏州微纳激光光子技术有限公司 | Method for measuring transient optical nonlinearity of material |
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2019
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| CN201222032Y (en) * | 2008-07-17 | 2009-04-15 | 苏州大学 | Pump detection device based on Z scanning |
| CN104390935A (en) * | 2014-12-10 | 2015-03-04 | 上海理工大学 | Device and method for testing nonlinear polarization coefficient and absorption coefficient at terahertz band |
| CN104914644A (en) * | 2015-05-25 | 2015-09-16 | 西安交通大学 | Femtosecond optical Kerr gate gated imaging device and method based on directional filtering |
| CN105403534A (en) * | 2015-06-18 | 2016-03-16 | 苏州微纳激光光子技术有限公司 | Method for measuring transient optical nonlinearity of material |
| CN105092477A (en) * | 2015-08-26 | 2015-11-25 | 中国工程物理研究院激光聚变研究中心 | Optical nonlinearity measuring device and measuring method for nonlinearity thick photonics materials |
| CN204903381U (en) * | 2015-09-06 | 2015-12-23 | 中国工程物理研究院激光聚变研究中心 | Nonlinearity thin film materials's optical nonlinearity measuring device |
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