CN203950220U - 半导体激光器测试系统环境温度控制装置 - Google Patents
半导体激光器测试系统环境温度控制装置 Download PDFInfo
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- CN203950220U CN203950220U CN201420324147.1U CN201420324147U CN203950220U CN 203950220 U CN203950220 U CN 203950220U CN 201420324147 U CN201420324147 U CN 201420324147U CN 203950220 U CN203950220 U CN 203950220U
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- Semiconductor Lasers (AREA)
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
Abstract
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201420324147.1U CN203950220U (zh) | 2014-06-17 | 2014-06-17 | 半导体激光器测试系统环境温度控制装置 |
Applications Claiming Priority (1)
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CN201420324147.1U CN203950220U (zh) | 2014-06-17 | 2014-06-17 | 半导体激光器测试系统环境温度控制装置 |
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CN203950220U true CN203950220U (zh) | 2014-11-19 |
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CN201420324147.1U Expired - Lifetime CN203950220U (zh) | 2014-06-17 | 2014-06-17 | 半导体激光器测试系统环境温度控制装置 |
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CN (1) | CN203950220U (zh) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106597263A (zh) * | 2017-01-20 | 2017-04-26 | 深圳清华大学研究院 | 一种半导体激光器芯片的测试系统 |
CN106597264A (zh) * | 2017-01-20 | 2017-04-26 | 深圳清华大学研究院 | 一种半导体激光器芯片的测试系统 |
CN109031084A (zh) * | 2018-08-23 | 2018-12-18 | 东莞市捷新检测设备有限公司 | 一种高功率水冷烧测设备 |
-
2014
- 2014-06-17 CN CN201420324147.1U patent/CN203950220U/zh not_active Expired - Lifetime
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106597263A (zh) * | 2017-01-20 | 2017-04-26 | 深圳清华大学研究院 | 一种半导体激光器芯片的测试系统 |
CN106597264A (zh) * | 2017-01-20 | 2017-04-26 | 深圳清华大学研究院 | 一种半导体激光器芯片的测试系统 |
CN109031084A (zh) * | 2018-08-23 | 2018-12-18 | 东莞市捷新检测设备有限公司 | 一种高功率水冷烧测设备 |
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Date | Code | Title | Description |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right |
Effective date of registration: 20201110 Address after: 511300 No.78, west of Zhucun Avenue, Zhucun street, Zengcheng District, Guangzhou City, Guangdong Province Patentee after: CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING Research Institute (THE FIFTH ELECTRONIC Research Institute OF MIIT)(CEPREI LABORATORY)) Address before: 510610 No. 110 Zhuang Road, Tianhe District, Guangdong, Guangzhou, Dongguan Patentee before: GUANGZHOU CEPREI INSTRUMENT AND EQUIPMENT Co.,Ltd. |
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TR01 | Transfer of patent right | ||
CX01 | Expiry of patent term |
Granted publication date: 20141119 |