CN203422066U - Device for measuring infinitesimal based on optical diffraction - Google Patents
Device for measuring infinitesimal based on optical diffraction Download PDFInfo
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- CN203422066U CN203422066U CN201320485211.XU CN201320485211U CN203422066U CN 203422066 U CN203422066 U CN 203422066U CN 201320485211 U CN201320485211 U CN 201320485211U CN 203422066 U CN203422066 U CN 203422066U
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Abstract
The utility model provides a device for measuring an infinitesimal based on optical diffraction, solving the problems that, in physical experiments, the measurement of an infinitesimal of an object is carried out by using a vernier caliper or a micrometer caliper, which is not suitable for precise measurement of noncontact objects; and the measurement using a microscope requires high magnification, but provides low measuring precision. The device comprises a sodium lamp, an adjustable slit instrument, a first lens, a second lens and a micrometer ocular lens which are sequentially arranged from left to right, wherein the center of a slit of the adjustable slit instrument, the center of the first lens and the center of the second lens are in the same straight line; the width of the slit of the adjustable slit instrument is smaller than 0.1mm; and the micrometer ocular lens is fixedly connected with an optical angle measurement bench. The device provided by the utility model is used for measuring an infinitesimal of an object.
Description
Technical field
The utility model relates to a kind of device of measuring object small quantity.
Background technology
At present, in Lab of General Physics, conventionally adopt following two kinds of methods to measure object small quantity: one, adopt vernier caliper or micrometer caliper to measure, two kinds of measurements belong to direct contact measurement, be not suitable for accurate non-contact object, and for measuring microsize object inconvenient operation.Two, adopt microscope to measure, for small quantity, require microscopical enlargement factor high, but measuring accuracy is but not high.
Utility model content
The purpose of this utility model is in Physical Experiment, to measure object small quantity and adopt vernier caliper or micrometer caliper to measure in order to solve, and is not suitable for accurate non-contact object and measures; And adopt microscope to measure, and require microscopical enlargement factor high, measuring accuracy is not high problem but, and a kind of device of measuring small quantity based on optical diffraction is provided.
The utility model is to address the above problem the technical scheme of taking to be:
A kind of device of measuring small quantity based on optical diffraction, its composition comprises sodium vapor lamp, adjustable slit instrument, first lens, the second lens, micrometer eyepiece, optics angle measurement platform, described sodium vapor lamp, adjustable slit instrument, first lens, the second lens and micrometer eyepiece set gradually from left to right, being centered close on same straight line of the center of the slit on adjustable slit instrument, the center of first lens and the second lens, slit width on adjustable slit instrument is less than 0.1mm, and micrometer eyepiece is fixedly connected with optics angle measurement platform.
Compared with the prior art the utility model has following beneficial effect:
The utility model utilizes the Fraunhofer diffraction principle of optics, and scioptics converge to diffracted beam on the graticule on micrometer eyepiece, and by the rotation of micrometer eyepiece, can record angle of diffraction, by the measurement of angle of diffraction, thereby calculates the gap of object under test.The utility model has been realized non-contact measurement, and of the present utility model simple in structure, easy to operate, and measuring accuracy is high.
Accompanying drawing explanation
Fig. 1 is one-piece construction front view of the present utility model.
Embodiment
Embodiment 1:
A kind of device of measuring small quantity based on optical diffraction, its composition comprises sodium vapor lamp 1, adjustable slit instrument 2, first lens 3, the second lens 4, micrometer eyepiece 5, optics angle measurement platform 6, sodium vapor lamp 1, adjustable slit instrument 2, first lens 3, the second lens 4 and micrometer eyepiece 5 set gradually from left to right, being centered close to of slit 2-1 center on adjustable slit instrument 2, the center of first lens 3 and the second lens 4 (coaxial) on same straight line, slit 2-1 width on adjustable slit instrument 2 is less than 0.1mm, guarantee diffraction fringe clear with visual field light intensity; Being centered close on same straight line of slit 2-1 center on adjustable slit instrument 2, the center of first lens 3 and the second lens 4, adjustable slit instrument 2 is positioned on the focal plane of first lens 3, the light that can guarantee to incide on slit to be measured is parallel beam, and micrometer eyepiece 5 is fixedly connected with optics angle measurement platform 6.The wavelength of sodium vapor lamp 1 is 5893A.
Measuring process of the present utility model: during use, sodium vapor lamp 1, adjustable slit instrument 2, first lens 3, the second lens 4, micrometer eyepiece 5 and optics angle measurement platform 6 are fixed on optics anti-vibration platform by minute adjustment base respectively, to increase the stability of experiment.Object under test 7 is placed between first lens 3 and the second lens 4, and the gap 7-1 of object under test 7 and slit 2-1 are over against setting, with the second lens 4, diffracted beam is converged on the graticule on micrometer eyepiece 5, regulate gap 7-1 to make it vertical, and make the millimeter groove of graticule parallel with diffraction fringe, micrometer eyepiece 5, along with optics angle measurement platform 6 rotates, can record angle of diffraction thus.By measuring angle of diffraction, by measuring the angle of diffraction of the first dark line, just can calculate seam wide.
Claims (1)
1. a device of measuring small quantity based on optical diffraction, its composition comprises sodium vapor lamp (1), adjustable slit instrument (2), first lens (3), the second lens (4), micrometer eyepiece (5), optics angle measurement platform (6), described sodium vapor lamp (1), adjustable slit instrument (2), first lens (3), the second lens (4) and micrometer eyepiece (5) set gradually from left to right, it is characterized in that: the center of the slit (2-1) on adjustable slit instrument (2), being centered close on same straight line of the center of first lens (3) and the second lens (4), slit (2-1) width on adjustable slit instrument (2) is less than 0.1mm, micrometer eyepiece (5) is fixedly connected with optics angle measurement platform (6).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320485211.XU CN203422066U (en) | 2013-08-05 | 2013-08-05 | Device for measuring infinitesimal based on optical diffraction |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320485211.XU CN203422066U (en) | 2013-08-05 | 2013-08-05 | Device for measuring infinitesimal based on optical diffraction |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203422066U true CN203422066U (en) | 2014-02-05 |
Family
ID=50021161
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201320485211.XU Expired - Fee Related CN203422066U (en) | 2013-08-05 | 2013-08-05 | Device for measuring infinitesimal based on optical diffraction |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203422066U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104990507A (en) * | 2015-07-11 | 2015-10-21 | 赵杰 | Object length minimal change fine measurement device |
| CN107091611A (en) * | 2017-05-17 | 2017-08-25 | 中山大学 | A kind of slit micro-displacement measuring device and its measuring method |
| CN107727012A (en) * | 2017-10-07 | 2018-02-23 | 佛山智北汇科技有限公司 | A kind of plastic part surface flatness detecting device based on optical diffraction |
-
2013
- 2013-08-05 CN CN201320485211.XU patent/CN203422066U/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104990507A (en) * | 2015-07-11 | 2015-10-21 | 赵杰 | Object length minimal change fine measurement device |
| CN107091611A (en) * | 2017-05-17 | 2017-08-25 | 中山大学 | A kind of slit micro-displacement measuring device and its measuring method |
| CN107727012A (en) * | 2017-10-07 | 2018-02-23 | 佛山智北汇科技有限公司 | A kind of plastic part surface flatness detecting device based on optical diffraction |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140205 Termination date: 20140805 |
|
| EXPY | Termination of patent right or utility model |