CN103424088A - Chamfer testing method and chamfer measuring instrument - Google Patents

Chamfer testing method and chamfer measuring instrument Download PDF

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Publication number
CN103424088A
CN103424088A CN2013103487931A CN201310348793A CN103424088A CN 103424088 A CN103424088 A CN 103424088A CN 2013103487931 A CN2013103487931 A CN 2013103487931A CN 201310348793 A CN201310348793 A CN 201310348793A CN 103424088 A CN103424088 A CN 103424088A
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China
Prior art keywords
chamfering
light
measured
measuring instrument
image
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CN2013103487931A
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CN103424088B (en
Inventor
王刚
许强
徐小胜
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NINGBO YUNSHENG INTELLIGENT TECHNOLOGY Co Ltd
YUNSHENG HOLDING GROUP CO Ltd
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NINGBO YUNSHENG INTELLIGENT TECHNOLOGY Co Ltd
YUNSHENG HOLDING GROUP CO Ltd
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Publication of CN103424088A publication Critical patent/CN103424088A/en
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Abstract

The invention discloses a chamfer testing method and a chamfer measuring instrument. Light horizontally irradiates a chamfer to be measured between two vertical surfaces and is reflected by 90 degrees to form a bright light strip; the width of the light strip is measured by acquiring an image of the bright light strip and corresponds to an R value of the chamfer to be measured. The chamfer testing method and the chamfer measuring instrument have the advantages that errors caused by a contact operation method are avoided by non-contact optical measurement of the R value of the chamfer to be measured, measuring results are obtained by processing data of the image, the influence of human factors on the measuring results is eliminated, measuring precision and measuring efficiency are high, and chamfers with any sizes can be measured.

Description

A kind of chamfering method of testing and chamfering measuring instrument
Technical field
The present invention relates to a kind of chamfering method of testing and surveying instrument, especially relate to a kind of method of testing and surveying instrument for measuring chamfering between two vertical planes.
Background technology
Chamfering is as a parameter in industrial design field, the whether qualified properties of product that sometimes directly affect of its overall size.Such as in field of magnetic material, the size of chamfering overall size finally affects the operational characteristic of magnetic material product, and when chamfering is too small, after electroplating, chamfer site there will be electrodeposited coating to pile up projection; When chamfering is excessive, the periphery of magnetic material can weaken due usefulness.
At present, the chamfering major part results between two vertical planes of workpiece, and between two vertical planes, the measuring equipment of chamfering overall size generally has chamfering wheel profile measuring apparatus, R rule and microscope.When the chamfering wheel profile measuring apparatus is measured chamfering, at first two vertical planes of workpiece for measurement are close to two positioning straight arms of angle of chamfering wheel profile measuring apparatus, chamfer site to be measured pushes up back the probe of measuring instrument, now reads the data on the scale dial plate, and then correspondence goes out corresponding chamfering value; The chamfering wheel profile measuring apparatus is contact type measurement, in measuring process, sensor probe must contact with measured workpiece chamfer site surface, because sensor probe hardness is very high, be not suitable for measuring soft workpiece and the less workpiece of size, and in measuring process due to human factor to affect measuring accuracy not high.When R rule are measured chamfering, with workpiece, chamfer site to be measured goes to be close to the R rule of different R values, observes the tightening degree that workpiece and R advise, and R advises the test mode artificial observation judgement that places one's entire reliance upon, and measuring accuracy is low, and efficiency is also low.When microscope is measured chamfering, workpiece chamfer site to be measured is placed under microscope, by microscope, reads the distance of the sideline of chamfering apart from the edge of work; But the microscopical visual field is very little, be only suitable for measuring the workpiece of very little chamfering, and the difference of artificial measurement and reading manner, also can affect its measuring accuracy.
Summary of the invention
It is high that technical matters to be solved by this invention is to provide a kind of measuring accuracy, measures efficiency higher, and chamfering method of testing and the chamfering measuring instrument that can be measured arbitrary dimension size chamfering.
The present invention solves the problems of the technologies described above adopted technical scheme: a kind of chamfering method of testing comprises the following steps:
1. light level is shone on chamfering to be measured, chamfering to be measured is the chamfering between two vertical planes;
2. shine after light on chamfering to be measured becomes 90 ° of reflections and form a bright light belt at image mechanism;
3. obtain bright light belt image and measure the width of this light band, this width corresponds to the R value of chamfering to be measured.
Described light is produced by strip source or annular light source.
A kind of chamfering measuring instrument, comprise locating device and image mechanism, the light source of emission level light and data acquisition processing device, described image mechanism is connected with described data acquisition processing device, described locating device Height Adjustable, when the workpiece by chamfering to be measured is placed on described locating device, described light source emission level light forms a bright light belt at image mechanism after shining on chamfering to be measured and becoming 90 ° of reflections, described image mechanism is taken the image of this bright light belt and is transferred to described data acquisition processing device, described data acquisition processing device is processed the width that obtains this light belt to image, this width corresponds to the R value of chamfering to be measured.
Described chamfering measuring instrument also comprises worktable and is fixed on the column on described worktable, described locating device is for comprising test platform, described test platform is arranged on described column by height adjustment mechanism, described light source is arranged on the top of described test platform, described image mechanism is fixedly mounted on the below of described test platform, be provided with light hole on described test platform, described horizontal light forms a bright light belt image and is taken by described image mechanism at image mechanism after becoming 90 ° of reflections while irradiating chamfer site from described light hole passes.
Described test platform comprises base plate and is arranged on the shelf on described base plate, described light hole is arranged on described base plate, described shelf is positioned at a side of described light hole, described shelf is the first end face near the end face of described light hole, described the first end face is vertical with described base plate, described the first end face is comprised of two vertical planes and the inner concave between two vertical planes, described light hole is between two vertical planes and over against described inner concave, be provided with the test pointer perpendicular to described the first end face on described base plate, the extended line of described test pointer is through the center of described light hole, during test, workpiece for measurement is placed on described shelf, make the vertical plane of two vertical planes of chamfering to be measured and two vertical planes in one plane, chamfer site to be measured is over against described test pointer.
Described test pointer is to be arranged on the groove on described base plate or to be arranged on protruding stupefied on described base plate.
Described image mechanism comprises camera and camera lens, and described camera lens is arranged on described camera.
The lens protection parts are installed on described camera lens.
Described light source is strip source or annular light source.
Compared with prior art, the invention has the advantages that in the chamfering method of testing by light level being shone on the chamfering to be measured between two vertical planes, shine after light on chamfering to be measured becomes 90 ° of reflections and form a bright light belt at image mechanism, measure the width of this light belt by obtaining bright light belt image, the width of this light belt corresponds to the R(radius of chamfering to be measured) value, adopt the R value of contactless optical measurement chamfering to be measured, the error of having avoided contact method of operating reason to cause, obtain measurement result by image being carried out to the data processing simultaneously, eliminated the impact of human factor on measurement result, measuring accuracy is high, measures efficiency higher, and can be measured arbitrary dimension size chamfering, in the chamfering measuring instrument, pass through test platform, the light source of emission level light, image mechanism and data acquisition processing device combine, when test, open light source, image mechanism and data acquisition processing device, the workpiece of chamfering to be measured is placed on test platform, light source emission level light shines on chamfering to be measured, now, light on chamfering to be measured forms a bright light belt at image mechanism after becoming 90 ° of reflections, image mechanism is taken the image of this light belt and is transferred to data acquisition processing device, data acquisition processing device is processed the width that obtains this light belt to image, this width corresponds to the R value of chamfering to be measured, adopt contactless optical measurement to obtain the R value of chamfering to be measured, the error of having avoided contact method of operating reason to cause, obtain measurement result by image being carried out to the data processing simultaneously, eliminated the impact of human factor on measurement result, measuring accuracy is high, measures efficiency higher, and can be measured arbitrary dimension size chamfering,
When test platform comprises base plate and is arranged on the shelf on base plate, light hole is arranged on base plate, shelf is positioned at a side of instrument connection, shelf is the first end face near the end face of light hole, the first end face is vertical with base plate, the first end face is comprised of two vertical planes and the inner concave between two vertical planes, light hole is between two vertical planes and over against inner concave, be provided with the test pointer perpendicular to the first end face on base plate, the extended line of test pointer is through the center of light hole, while placing on the shelf by product to be measured thus, make a vertical plane of chamfering two vertical planes to be measured and two vertical planes in one plane, chamfer site to be measured is over against described test pointer, realized on the one hand the precise positioning of product to be measured, guarantee that on the other hand the light that light source sends can shine detected part fully, further improve measuring accuracy and detection efficiency.
The accompanying drawing explanation
The principle schematic that Fig. 1 is chamfering method of testing of the present invention;
Fig. 2 is chamfering of the present invention place optical forming schematic diagram;
The one-piece construction schematic diagram that Fig. 3 is chamfering measuring instrument of the present invention;
The side view that Fig. 4 is chamfering measuring instrument of the present invention;
Fig. 5 is to be the workpiece laying method schematic diagram of chamfering measuring instrument of the present invention.
Embodiment
Below in conjunction with accompanying drawing, embodiment is described in further detail the present invention.
The invention discloses a kind of chamfering method of testing, comprise the following steps:
1. light level is shone on chamfering to be measured, chamfering to be measured is the chamfering between two vertical planes;
2. shine after light on chamfering to be measured becomes 90 ° of reflections and form a bright light belt at image mechanism;
3. obtain bright light belt image and measure the width of this light band, this width corresponds to the R value of chamfering to be measured.
The schematic diagram of chamfering method of testing of the present invention as shown in Figure 1, when light level that light source 4 sends shines on the chamfering to be measured of workpiece for measurement 9, form a bright light belt 10 at image mechanism become 90 ° of reflections on chamfering after, adopt camera 5 to take the image of this light belt, the width d of this light belt corresponds to chamfering R value to be measured, thus the measurement of chamfering R value is converted to the measurement of light belt width d, finally adopts image processing method to obtain the light belt width, as shown in Figure 2.Horizontal light in chamfering method of testing of the present invention can be by generations such as strip source or annular light sources.
It is chamfering measuring instrument by above-mentioned chamfering measuring method that the present invention also provides a kind of.
Embodiment mono-: as shown in Figure 3, a kind of chamfering measuring instrument, comprise worktable 1, be fixed on the column 2 on worktable 1, locating device, light source 4, image mechanism 5 and data acquisition processing device 6, locating device comprises by height adjustment mechanism and is arranged on the test platform 3 on column 2, light source 4 is annular light source, light source 4 is arranged on the outer ring of test platform 3, be provided with light hole 31 on test platform 3, image mechanism 5 is fixedly mounted on the below of test platform 3, light hole 31 is in the coverage of image mechanism 5, image mechanism 5 is connected with data acquisition processing device 6.
In the present embodiment, test platform 3 comprises base plate 32 and is arranged on the shelf 33 on base plate 32, light hole 31 is arranged on base plate, shelf 33 is positioned at a side of light hole 31, shelf 33 is the first end face 34 near the end face of light hole 31, the first end face 34 is vertical with base plate 32, two vertical planes 35 and the inner concave between two vertical planes 35 36 that the first end face 34 is connected by one form, light hole 31 is between two vertical planes 35 and over against inner concave 36, be provided with the test pointer 37 perpendicular to the first end face 34 on base plate 32, the extended line of test pointer 37 is through light hole 31De center, data acquisition processing device 6 is computing machine, image mechanism 5 is connected by data line 8 with data acquisition processing device 6.
In the present embodiment, test pointer 37 is for being arranged on protruding stupefied on base plate, and light hole 31 is circular hole; Image mechanism 5 comprises camera 51 and camera lens 52, and camera lens 52 is arranged on camera 51, annular light source 4, camera 51 and camera lens 52 concentrics.Lens protection parts 53 are installed on camera lens 52.Annular light source 4 is connected with light source controller 7, and light source controller 7 is for adjusting the light luminance of controlling annular light source 4.
The principle of work of the chamfering measuring instrument of the present embodiment is: as shown in Figure 4, adjust the height of test platform 3, make camera 51 reach the optimal imaging effect, now, the upper surface of shelf 33 is vertical with the axle center of camera and camera lens, light hole 31 is concentric with camera 51, camera lens 52 and annular light source 4, workpiece for measurement 9 is placed on shelf 33, a vertical plane of chamfering two vertical planes to be measured and two vertical planes 35 are in one plane, chamfer site to be measured is over against test pointer 37, between two vertical planes to be measured, chamfer site is positioned at light hole 31 tops, as shown in Figure 4; Open annular light source 4, camera 51 and data acquisition processing device 6, the horizontal light that annular light source 4 sends shines on workpiece for measurement 9, when horizontal light irradiates chamfer site, become 90 ° of reflections to see through afterwards light hole 31 and form a bright light belt 10 at image mechanism, camera 51 is taken the image of this bright light belt 10 and is transferred to data acquisition processing device 6,6 pairs of images of data acquisition processing device are processed the width d that obtains this light belt, this width d corresponds to the R value of chamfering to be measured, as depicted in figs. 1 and 2, data acquisition processing device 6 is computing machine.
Embodiment bis-: the present embodiment and embodiment mono-are basic identical, and difference only is that in the present embodiment, light source 4 is strip source, and test pointer 37 is for to be arranged on the groove on base plate 32, and the present embodiment is larger with respect to embodiment mono-difficulty of processing.

Claims (9)

1. a chamfering method of testing is characterized in that comprising the following steps:
1. light level is shone on chamfering to be measured, chamfering to be measured is the chamfering between two vertical planes;
2. shine after light on chamfering to be measured becomes 90 ° of reflections and form a bright light belt in image mechanism;
3. obtain bright light belt image and measure the width of this bright light belt, this width corresponds to the R value of chamfering to be measured.
2. a kind of chamfering method of testing according to claim 1, is characterized in that described light is produced by strip source or annular light source.
3. a right to use requires the chamfering measuring instrument of 1 described chamfering method of testing, it is characterized in that comprising locating device and image mechanism, the light source of emission level light and data acquisition processing device, described image mechanism is connected with described data acquisition processing device, described locating device Height Adjustable, when the workpiece by chamfering to be measured is placed on described locating device, described light source emission level light forms a bright light belt at image mechanism after shining on chamfering to be measured and becoming 90 ° of reflections, described image mechanism is taken the image of this bright light belt and is transferred to described data acquisition processing device, described data acquisition processing device is processed the width that obtains this light belt to image, this width corresponds to the R value of chamfering to be measured.
4. a kind of chamfering measuring instrument according to claim 3, it is characterized in that described chamfering measuring instrument also comprises worktable and is fixed on the column on described worktable, described locating device is for comprising test platform, described test platform is arranged on described column by height adjustment mechanism, described light source is arranged on the top of described test platform, described image mechanism is fixedly mounted on the below of described test platform, be provided with light hole on described test platform, described horizontal light forms a bright light belt image and is taken by described image mechanism at image mechanism after becoming 90 ° of reflections while irradiating chamfer site from described light hole passes.
5. chamfering measuring instrument according to claim 4, it is characterized in that described test platform comprises base plate and is arranged on the shelf on described base plate, described light hole is arranged on described base plate, described shelf is positioned at a side of described light hole, described shelf is the first end face near the end face of described light hole, described the first end face is vertical with described base plate, described the first end face is comprised of two vertical planes and the inner concave between two vertical planes, described light hole is between two vertical planes and over against described inner concave, be provided with the test pointer perpendicular to described the first end face on described base plate, the extended line of described test pointer is through the center of described light hole, during test, workpiece for measurement is placed on described shelf, make a vertical plane of chamfering two vertical planes to be measured and two vertical planes in one plane, chamfer site to be measured is over against described test pointer.
6. chamfering measuring instrument according to claim 5, is characterized in that described test pointer is to be arranged on the groove on described base plate or to be arranged on protruding stupefied on described base plate.
7. chamfering measuring instrument according to claim 3, is characterized in that described image mechanism comprises camera and camera lens, and described camera lens is arranged on described camera.
8. chamfering measuring instrument according to claim 7, is characterized in that on described camera lens being equipped with the lens protection parts.
9. chamfering measuring instrument according to claim 3, is characterized in that described light source is strip source or annular light source.
CN201310348793.1A 2013-08-12 2013-08-12 A kind of chamfering measuring instrument Active CN103424088B (en)

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Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103673928A (en) * 2013-12-21 2014-03-26 大连宏海新能源发展有限公司 High-precision measuring device for micro-curvature of optical reflecting mirror
CN105318834A (en) * 2014-06-16 2016-02-10 昆山中辰矽晶有限公司 Portable measuring tool module
CN105783786A (en) * 2016-04-26 2016-07-20 北方工业大学 Method and device for measuring part chamfer based on structured light vision
CN105870035A (en) * 2016-06-03 2016-08-17 京东方科技集团股份有限公司 Chamfer detection method
CN107024158A (en) * 2016-01-29 2017-08-08 宇龙计算机通信科技(深圳)有限公司 A kind of device and method for detecting bloom chamfering angle size side
CN108050934A (en) * 2017-12-25 2018-05-18 武汉比天科技有限责任公司 A kind of vision perpendicular positioning method with chamfering workpiece
CN108195319A (en) * 2017-12-25 2018-06-22 武汉比天科技有限责任公司 A kind of vision sloped position method with chamfering workpiece
CN109238156A (en) * 2018-07-27 2019-01-18 天津大学 Backlight image-type roller root bottom part chamfering measurement method

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5912738A (en) * 1996-11-25 1999-06-15 Sandia Corporation Measurement of the curvature of a surface using parallel light beams
CN1271086A (en) * 2000-05-12 2000-10-25 清华大学 Schileren instrument for the measurement of body surface appearance
CN1482491A (en) * 2002-09-15 2004-03-17 深圳市泛友科技有限公司 Three-dimensional photographic technology
CN101036045A (en) * 2004-10-08 2007-09-12 皇家飞利浦电子股份有限公司 Optical inspection of test surfaces
CN201425470Y (en) * 2009-04-27 2010-03-17 东莞康视达自动化科技有限公司 Measured equilateral polygonal object on-line data measurement system based on machine vision

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5912738A (en) * 1996-11-25 1999-06-15 Sandia Corporation Measurement of the curvature of a surface using parallel light beams
CN1271086A (en) * 2000-05-12 2000-10-25 清华大学 Schileren instrument for the measurement of body surface appearance
CN1482491A (en) * 2002-09-15 2004-03-17 深圳市泛友科技有限公司 Three-dimensional photographic technology
CN101036045A (en) * 2004-10-08 2007-09-12 皇家飞利浦电子股份有限公司 Optical inspection of test surfaces
CN201425470Y (en) * 2009-04-27 2010-03-17 东莞康视达自动化科技有限公司 Measured equilateral polygonal object on-line data measurement system based on machine vision

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103673928A (en) * 2013-12-21 2014-03-26 大连宏海新能源发展有限公司 High-precision measuring device for micro-curvature of optical reflecting mirror
CN105318834A (en) * 2014-06-16 2016-02-10 昆山中辰矽晶有限公司 Portable measuring tool module
CN105318834B (en) * 2014-06-16 2018-01-30 昆山中辰矽晶有限公司 Portable measurement tool module
CN107024158A (en) * 2016-01-29 2017-08-08 宇龙计算机通信科技(深圳)有限公司 A kind of device and method for detecting bloom chamfering angle size side
CN105783786B (en) * 2016-04-26 2018-08-17 北方工业大学 A kind of part chamfering measurement method and device based on structure light vision
CN105783786A (en) * 2016-04-26 2016-07-20 北方工业大学 Method and device for measuring part chamfer based on structured light vision
CN105870035B (en) * 2016-06-03 2018-12-21 京东方科技集团股份有限公司 Chamfering detection method
CN105870035A (en) * 2016-06-03 2016-08-17 京东方科技集团股份有限公司 Chamfer detection method
CN108195319A (en) * 2017-12-25 2018-06-22 武汉比天科技有限责任公司 A kind of vision sloped position method with chamfering workpiece
CN108050934A (en) * 2017-12-25 2018-05-18 武汉比天科技有限责任公司 A kind of vision perpendicular positioning method with chamfering workpiece
CN108195319B (en) * 2017-12-25 2020-07-14 武汉比天科技有限责任公司 Visual oblique positioning method for workpiece with chamfer
CN108050934B (en) * 2017-12-25 2020-07-14 武汉比天科技有限责任公司 Visual vertical positioning method for workpiece with chamfer
CN109238156A (en) * 2018-07-27 2019-01-18 天津大学 Backlight image-type roller root bottom part chamfering measurement method

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