CN203275467U - Low-resistance and open-short synchronous test system of PCB board - Google Patents
Low-resistance and open-short synchronous test system of PCB board Download PDFInfo
- Publication number
- CN203275467U CN203275467U CN 201320193401 CN201320193401U CN203275467U CN 203275467 U CN203275467 U CN 203275467U CN 201320193401 CN201320193401 CN 201320193401 CN 201320193401 U CN201320193401 U CN 201320193401U CN 203275467 U CN203275467 U CN 203275467U
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- test
- low
- resistance
- pcb board
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Abstract
The utility model discloses a low-resistance and open-short synchronous test system of a PCB board. The system is used for synchronously testing common test circuits and low-resistance test circuits of a PCB board. The common test circuit has first test bonding pads. The low-resistance test circuit has second test bonding pads. The test system comprises a testing machine and a test fixture. The testing machine comprises a common test module and a low-resistance test module. The common test module can be used to test open-short of the common test circuits. The low-resistance test module can be used to simultaneously test open-short and low resistance of the low-resistance test circuits. The test fixture is provided with first test probes corresponding to the first test bonding pads. The first test probes are electrically connected with the common test module. The test fixture is provided with second test probes corresponding to the second test bonding pads. The second test probes are electrically connected with the low-resistance test module. The low-resistance and open-short synchronous test system provided by the utility model can be adopted to complete low-resistance test and open-short test of the PCB board at a time, simplify PCB board test operation procedures and raise PCB board test efficiency.
Description
Technical field
The utility model relates to a kind of pcb board test macro, is specifically related to a kind of pcb board low-resistance and opens the short circuit synchronous test system.
Background technology
In the pcb board production and processing technology, the thickness of the copper wire of printing directly affects the conducting resistance of pcb board, and when copper wire was partially thin, it is large that conducting resistance can become.Therefore, there are two kinds of different circuits that require test in the pcb board after production and processing, the circuit that namely needs to carry out the circuit of common open-short circuit and need to carry out simultaneously the test of common open-short circuit and low-resistance.And in prior art, each testing weld pad of the circuit of the corresponding above-mentioned two kinds of different test requests of measurement jig all arranges a test probe, it is so-called twin wire test, although the measurement jig of this form can satisfy the demand of common test circuit, but can't satisfy the demand of circuit of carrying out simultaneously the test of common open-short circuit and low-resistance, this be because, when carrying out the low-resistance test, usually will adopt the four-wire type test to complete, the twin wire test can't be measured small resistance difference.Therefore, pcb board need to add a four-wire type low-resistance test again after carrying out normal open-short circuit, namely usually need twice test just can complete.Like this, just exist testing process loaded down with trivial details, the problem of repeated test operation.Testing process is loaded down with trivial details will directly cause the inefficient problem of test job, and pcb board may cause unnecessary scratch to pcb board through test repeatedly, produce bad product.
Summary of the invention
In order to solve the problems of the technologies described above, the utility model proposes a kind of pcb board low-resistance and open the short circuit synchronous test system, can disposablely complete the test of pcb board low-resistance and open-short circuit, simplify pcb board test jobs flow process, improve pcb board test job efficient.
The technical solution of the utility model is achieved in that
A kind of pcb board low-resistance and open the short circuit synchronous test system, be used for synchronously completing common test circuit and the low-resistance measurement circuit of test pcb board, described common test circuit has the first testing weld pad, described low-resistance measurement circuit has the second testing weld pad, described test macro comprises tester table and measurement jig, described tester table comprises common test module and low-resistance test module, described common test module can be tested the short circuit of opening of common test circuit, and what described low-resistance test module can be tested the low-resistance measurement circuit simultaneously opens short circuit and low-resistance; Corresponding each described first testing weld pad, described measurement jig is provided with first test probe, and described the first test probe is electrically connected to described common test module; Corresponding each described second testing weld pad, described measurement jig is provided with two the second test probes, and described the second test probe is electrically connected to described low-resistance test module.
The beneficial effects of the utility model are: the utility model provides a kind of pcb board low-resistance and opens the short circuit synchronous test system, and each first testing weld pad of corresponding common test circuit arranges a test probe by the prior art mode, can carry out common open-short circuit; Each second testing weld pad of corresponding low-resistance measurement circuit arranges two tests, two test probes can satisfy the demand of four-wire type low-resistance test, therefore, can open short circuit when testing to low-resistance measurement circuit common, the low-resistance of low-resistance measurement circuit is carried out the four-wire type test.Like this, same set of tool comprises that two kinds are established the needle mould formula, two kinds of test modules that coordinate tester table, can disposablely complete the test of common open-short circuit and four-wire type low-resistance, reach the minimizing testing process, improve the purpose of test job efficient, and the minimizing of testing process, avoided repeatedly repeated test, thereby the unnecessary scratch of avoiding repeated test that pcb board is caused improves product yield.
Description of drawings
Fig. 1 is the utility model principle schematic.
By reference to the accompanying drawings, make the following instructions:
1---pcb board 2---common test circuit
3---low-resistance measurement circuit 4---first testing weld pad
5---second testing weld pad 6---first test probe
7---the second test probe
Embodiment
as shown in Figure 1, a kind of pcb board low-resistance and open the short circuit synchronous test system, be used for synchronously completing common test circuit 2 and the low-resistance measurement circuit 3 of test pcb board 1, described common test circuit has the first testing weld pad 4, described low-resistance measurement circuit has the second testing weld pad 5, described test macro comprises tester table and measurement jig, described tester table comprises common test module and low-resistance test module, described common test module can be tested the short circuit of opening of common test circuit, what described low-resistance test module can be tested the low-resistance measurement circuit simultaneously opens short circuit and low-resistance, corresponding each described first testing weld pad, described measurement jig is provided with first test probe 6, and described the first test probe is electrically connected to described common test module, corresponding each described second testing weld pad, described measurement jig is provided with two the second test probes 7, and described the second test probe is electrically connected to described low-resistance test module.
Each first testing weld pad of corresponding common test circuit arranges a test probe by the prior art mode, can carry out common open-short circuit; Each second testing weld pad of corresponding low-resistance measurement circuit arranges two tests, two test probes can satisfy the demand of four-wire type low-resistance test, therefore, can open short circuit when testing to low-resistance measurement circuit common, the low-resistance of low-resistance measurement circuit is carried out the four-wire type test.Like this, same set of tool comprises that two kinds are established the needle mould formula, two kinds of test modules that coordinate tester table, can disposablely complete the test of common open-short circuit and four-wire type low-resistance, reach the minimizing testing process, improve the purpose of test job efficient, and the minimizing of testing process, avoided repeatedly repeated test, thereby the unnecessary scratch of avoiding repeated test that pcb board is caused improves product yield.
Above embodiment is with reference to accompanying drawing, and preferred embodiment of the present utility model is elaborated.Those skilled in the art is by carrying out modification or the change on various forms to above-described embodiment, but do not deviate from the situation of essence of the present utility model, within all dropping on protection domain of the present utility model.
Claims (1)
1. a pcb board low-resistance and open the short circuit synchronous test system, be used for synchronously completing common test circuit (2) and the low-resistance measurement circuit (3) of test pcb board (1), described common test circuit has the first testing weld pad (4), described low-resistance measurement circuit has the second testing weld pad (5), it is characterized in that: described test macro comprises tester table and measurement jig, described tester table comprises common test module and low-resistance test module, described common test module can be tested the short circuit of opening of common test circuit, what described low-resistance test module can be tested the low-resistance measurement circuit simultaneously opens short circuit and low-resistance, corresponding each described first testing weld pad, described measurement jig is provided with first test probe (6), and described the first test probe is electrically connected to described common test module, corresponding each described second testing weld pad, described measurement jig is provided with two the second test probes (7), and described the second test probe is electrically connected to described low-resistance test module.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320193401 CN203275467U (en) | 2013-04-17 | 2013-04-17 | Low-resistance and open-short synchronous test system of PCB board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320193401 CN203275467U (en) | 2013-04-17 | 2013-04-17 | Low-resistance and open-short synchronous test system of PCB board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203275467U true CN203275467U (en) | 2013-11-06 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201320193401 Expired - Fee Related CN203275467U (en) | 2013-04-17 | 2013-04-17 | Low-resistance and open-short synchronous test system of PCB board |
Country Status (1)
| Country | Link |
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| CN (1) | CN203275467U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107167685A (en) * | 2017-06-27 | 2017-09-15 | 苏州苏纳光电有限公司 | The electrical testing method and system of face-down bonding |
-
2013
- 2013-04-17 CN CN 201320193401 patent/CN203275467U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107167685A (en) * | 2017-06-27 | 2017-09-15 | 苏州苏纳光电有限公司 | The electrical testing method and system of face-down bonding |
| CN107167685B (en) * | 2017-06-27 | 2019-09-06 | 苏州苏纳光电有限公司 | The electrical testing method and system of face-down bonding |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20131106 Termination date: 20160417 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |