CN103217619A - Low resistance and open short circuit synchronous testing system for printed circuit board (PCB) - Google Patents
Low resistance and open short circuit synchronous testing system for printed circuit board (PCB) Download PDFInfo
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- CN103217619A CN103217619A CN 201310132663 CN201310132663A CN103217619A CN 103217619 A CN103217619 A CN 103217619A CN 201310132663 CN201310132663 CN 201310132663 CN 201310132663 A CN201310132663 A CN 201310132663A CN 103217619 A CN103217619 A CN 103217619A
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Abstract
The invention discloses a low resistance and open short circuit synchronous testing system for a printed circuit board (PCB). The low resistance and open short circuit synchronous testing system is used for synchronously finishing testing of an ordinary testing circuit and a low resistance testing circuit of the PCB. The ordinary testing circuit is provided with first testing pads, the low resistance testing circuit is provided with second testing pads, the testing system comprises a testing machine bench and a testing jig, the testing machine bench comprises an ordinary testing module and a low resistance testing module, the ordinary testing module can test the open short circuit of the ordinary testing circuit, the low resistance testing module can simultaneously test the open short circuit and the low resistance of the low resistance testing circuit, first testing probes are arranged on the testing jig corresponding to the first testing pads, the first testing probes are electrically connected with the ordinary testing module, second testing probes are arranged on the testing jig corresponding to the second testing pads, and the second testing probes are electrically connected with the low resistance testing module. The low resistance and open short circuit synchronous testing system can finish low resistance testing and open short circuit testing on the PCB in one time, simplifies operation procedures for testing the PCB and improves working efficiency for testing the PCB.
Description
Technical field
The present invention relates to a kind of pcb board test macro, be specifically related to a kind of pcb board low-resistance and open short circuit synchronism detection system.
Background technology
In the pcb board production and processing technology, the thickness of the copper wire of printing directly influences the conducting resistance of pcb board, and when copper wire was thin partially, it is big that conducting resistance can become.Therefore, there are two kinds of different circuits that require test in the pcb board after the production and processing, the circuit that promptly needs to carry out the circuit of common open-short circuit and need carry out the test of common open-short circuit and low-resistance simultaneously.And in the prior art, each testing weld pad of the circuit of the corresponding above-mentioned two kinds of different test requests of measurement jig all is provided with a test probe, it is so-called twin wire test, though the measurement jig of this form can satisfy the demand of common test circuit, but can't satisfy the demand of circuit of carrying out the test of common open-short circuit and low-resistance simultaneously, this be because, when carrying out the low-resistance test, usually will adopt the four-wire type test to finish, the twin wire test can't be measured small resistance difference.Therefore, pcb board need add a four-wire type low-resistance test again after carrying out normal open-short circuit, promptly need twice test just can finish usually.Like this, just exist testing process loaded down with trivial details, the problem of repeated test operation.Testing process is loaded down with trivial details will directly to cause the inefficient problem of test job, and pcb board may cause unnecessary scratch to pcb board through test repeatedly, produce bad product.
Summary of the invention
In order to solve the problems of the technologies described above, the present invention proposes a kind of pcb board low-resistance and opens short circuit synchronism detection system, can disposablely finish test of pcb board low-resistance and open-short circuit, simplifies pcb board test jobs flow process, improves pcb board test job efficient.
Technical scheme of the present invention is achieved in that
A kind of pcb board low-resistance and open short circuit synchronism detection system, be used for finishing synchronously the common test circuit and the low-resistance measurement circuit of test pcb board, described common test circuit has first testing weld pad, described low-resistance measurement circuit has second testing weld pad, described test macro comprises tester table and measurement jig, described tester table comprises common test module and low-resistance test module, described common test module can be tested the short circuit of opening of common test circuit, and what described low-resistance test module can be tested the low-resistance measurement circuit simultaneously opens short circuit and low-resistance; Corresponding each described first testing weld pad, described measurement jig is provided with one first test probe, and described first test probe is electrically connected with described common test module; Corresponding each described second testing weld pad, described measurement jig is provided with two second test probes, and described second test probe is electrically connected with described low-resistance test module.
The invention has the beneficial effects as follows: the invention provides a kind of pcb board low-resistance and open short circuit synchronism detection system, each first testing weld pad of corresponding common test circuit is provided with a test probe by the prior art mode, can carry out common open-short circuit; Each second testing weld pad of corresponding low-resistance measurement circuit is provided with two tests, two test probes can satisfy the demand of four-wire type low-resistance test, therefore, can open short circuit when testing, the low-resistance of low-resistance measurement circuit is carried out the four-wire type test low-resistance measurement circuit common.Like this, same set of tool comprises that two kinds are established the needle mould formula, two kinds of test modules that cooperate tester table, can disposablely finish the test of common open-short circuit and four-wire type low-resistance, reach the minimizing testing process, improve the purpose of test job efficient, and the minimizing of testing process, avoided repeatedly repeated test, thereby the unnecessary scratch of avoiding repeated test that pcb board is caused improves the product yield.
Description of drawings
Fig. 1 is a principle of the invention synoptic diagram.
In conjunction with the accompanying drawings, make the following instructions:
1---pcb board 2---common test circuit
3---low-resistance measurement circuits 4---, first testing weld pad
5---second testing weld pads 6---, first test probe
7---second test probe
Embodiment
As shown in Figure 1, a kind of pcb board low-resistance and open short circuit synchronism detection system, be used for finishing synchronously the common test circuit 2 and the low-resistance measurement circuit 3 of test pcb board 1, described common test circuit has first testing weld pad 4, described low-resistance measurement circuit has second testing weld pad 5, described test macro comprises tester table and measurement jig, described tester table comprises common test module and low-resistance test module, described common test module can be tested the short circuit of opening of common test circuit, and what described low-resistance test module can be tested the low-resistance measurement circuit simultaneously opens short circuit and low-resistance; Corresponding each described first testing weld pad, described measurement jig is provided with one first test probe 6, and described first test probe is electrically connected with described common test module; Corresponding each described second testing weld pad, described measurement jig is provided with two second test probes 7, and described second test probe is electrically connected with described low-resistance test module.
Each first testing weld pad of corresponding common test circuit is provided with a test probe by the prior art mode, can carry out common open-short circuit; Each second testing weld pad of corresponding low-resistance measurement circuit is provided with two tests, two test probes can satisfy the demand of four-wire type low-resistance test, therefore, can open short circuit when testing, the low-resistance of low-resistance measurement circuit is carried out the four-wire type test low-resistance measurement circuit common.Like this, same set of tool comprises that two kinds are established the needle mould formula, two kinds of test modules that cooperate tester table, can disposablely finish the test of common open-short circuit and four-wire type low-resistance, reach the minimizing testing process, improve the purpose of test job efficient, and the minimizing of testing process, avoided repeatedly repeated test, thereby the unnecessary scratch of avoiding repeated test that pcb board is caused improves the product yield.
Above embodiment is with reference to accompanying drawing, to a preferred embodiment of the present invention will be described in detail.Those skilled in the art is by carrying out modification or the change on the various forms to the foregoing description, but do not deviate under the situation of essence of the present invention, all drops within protection scope of the present invention.
Claims (1)
1. a pcb board low-resistance and open short circuit synchronism detection system, be used for finishing synchronously the common test circuit (2) and the low-resistance measurement circuit (3) of test pcb board (1), described common test circuit has first testing weld pad (4), described low-resistance measurement circuit has second testing weld pad (5), it is characterized in that: described test macro comprises tester table and measurement jig, described tester table comprises common test module and low-resistance test module, described common test module can be tested the short circuit of opening of common test circuit, and what described low-resistance test module can be tested the low-resistance measurement circuit simultaneously opens short circuit and low-resistance; Corresponding each described first testing weld pad, described measurement jig is provided with one first test probe (6), and described first test probe is electrically connected with described common test module; Corresponding each described second testing weld pad, described measurement jig is provided with two second test probes (7), and described second test probe is electrically connected with described low-resistance test module.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201310132663 CN103217619A (en) | 2013-04-17 | 2013-04-17 | Low resistance and open short circuit synchronous testing system for printed circuit board (PCB) |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201310132663 CN103217619A (en) | 2013-04-17 | 2013-04-17 | Low resistance and open short circuit synchronous testing system for printed circuit board (PCB) |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103217619A true CN103217619A (en) | 2013-07-24 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201310132663 Pending CN103217619A (en) | 2013-04-17 | 2013-04-17 | Low resistance and open short circuit synchronous testing system for printed circuit board (PCB) |
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| CN (1) | CN103217619A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103954877A (en) * | 2014-04-15 | 2014-07-30 | 京东方科技集团股份有限公司 | Integrated circuit testing method and device |
| CN112698184A (en) * | 2020-12-17 | 2021-04-23 | 珠海杰赛科技有限公司 | Low resistance test method of PCB |
-
2013
- 2013-04-17 CN CN 201310132663 patent/CN103217619A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103954877A (en) * | 2014-04-15 | 2014-07-30 | 京东方科技集团股份有限公司 | Integrated circuit testing method and device |
| CN103954877B (en) * | 2014-04-15 | 2017-03-08 | 京东方科技集团股份有限公司 | IC testing method and test device |
| CN112698184A (en) * | 2020-12-17 | 2021-04-23 | 珠海杰赛科技有限公司 | Low resistance test method of PCB |
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| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20130724 |