CN203218259U - Ultra-fast recovery high-voltage diode - Google Patents

Ultra-fast recovery high-voltage diode Download PDF

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Publication number
CN203218259U
CN203218259U CN2013201847073U CN201320184707U CN203218259U CN 203218259 U CN203218259 U CN 203218259U CN 2013201847073 U CN2013201847073 U CN 2013201847073U CN 201320184707 U CN201320184707 U CN 201320184707U CN 203218259 U CN203218259 U CN 203218259U
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CN
China
Prior art keywords
die
ultra
tube core
voltage diode
fast recovery
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Expired - Fee Related
Application number
CN2013201847073U
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Chinese (zh)
Inventor
侯宜颂
陈�峰
汪鹏
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AN'SHAN SUN LOCUS HV COMPONENTS CORP Ltd
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AN'SHAN SUN LOCUS HV COMPONENTS CORP Ltd
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Priority to CN2013201847073U priority Critical patent/CN203218259U/en
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Publication of CN203218259U publication Critical patent/CN203218259U/en
Anticipated expiration legal-status Critical
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The utility model relates to an ultra-fast recovery high-voltage diode which is composed of a die, a body and leads. The body made of epoxy resin is internally provided with the die. Two ends of the die are welded with the leads. The area of the die meets a formula: (forward current (A))/(40A/cm2)>the area of die>(forward current (A))/(50/cm2). The die is formed by laminating multilayer silicon chips made of platinum diffusion technology. The body is externally sealed as a cuboid structure with a size of 7*7*21mm. The ends of the leads are of a round table structure. The diameter N of the bottom end of each round table is 2.5mm, the thickness L of each round table is 1mm, and the diameter D of each lead is 1.16-1.2mm. The ultra-fast recovery high-voltage diode is advantaged by meeting requirements of a high-frequency and high-voltage power supply for ultrahigh-frequency characteristics, employing platinum diffusion technology, realizing ultra-fast recovery and solving contradiction between reverse recovery time and forward voltage drop.

Description

The Ultrafast recovery high-voltage diode
Technical field
The utility model relates to a kind of high-voltage diode, is specifically related to a kind of high-voltage diode of Ultrafast recovery.
Background technology
Along with the development of electronic product, for big electric current, fast recover, the demand of high voltage diode constantly increases, though Schottky diode has big electric current, the fast characteristic of recovering, its reverse voltage can only be accomplished not satisfy high-tension requirement below the 200V; Common high-voltage diode can satisfy high-tension requirement, but for big electric current with recover soon and seem helpless, particularly high-frequency and high-voltage power supply is for the requirement of the frequency characteristic of diode.So need a kind of big electric current, fast recovery, high-tension diode of being applicable to, satisfy the demand of high frequency, high-power high voltage source.
Summary of the invention
For overcoming the deficiencies in the prior art, the purpose of this utility model provides and a kind ofly is applicable to big electric current, but the Ultrafast recovery high-voltage diode that snap back recovers.
For achieving the above object, the utility model is achieved through the following technical solutions:
A kind of Ultrafast recovery high-voltage diode is made of tube core, body, lead-in wire, is provided with tube core in the body that is made of epoxy resin, tube core two ends welding lead, and described die area satisfies:
Figure DEST_PATH_GDA0000304833991
>die area>
Figure DEST_PATH_GDA0000304833992
The silicon chip stack that described tube core utilizes the platinum diffusion technology to make by multilayer constitutes, and described body covering is rectangular structure, is of a size of 7*7*21mm, described lead-in wire end is frustum cone structure, round platform bottom diameter is N=2.5mm, and round platform thickness is L=1mm, and diameter wire is D=1.16~1.2mm.
Compared with prior art, the beneficial effects of the utility model are:
Can satisfy high frequency, high voltage source for the requirement of hyperfrequency characteristic, adopt the platinum diffusion technology to make, realize Ultrafast recovery, solve the contradiction between reverse recovery time and the forward voltage drop.
Description of drawings
Fig. 1 is structural representation of the present utility model.
Among the figure: 1-tube core 2-body 3-lead-in wire.
Embodiment
Below in conjunction with Figure of description the utility model is described in detail, but should be noted that enforcement of the present utility model is not limited to following execution mode.
See Fig. 1, a kind of Ultrafast recovery high-voltage diode is made of tube core 1, body 2, lead-in wire 3, is provided with tube core 1 in the body 2 that is made of epoxy resin, tube core 1 two ends welding lead 3, and described tube core 1 area satisfies:
Figure DEST_PATH_GDA0000304833993
>die area>
Figure DEST_PATH_GDA0000304833994
Wherein, A is current unit, ampere; The silicon chip stack that described tube core 1 utilizes the platinum diffusion technology to make by multilayer constitutes, and body 2 coverings are rectangular structure, are of a size of 7*7*21mm, described lead-in wire 3 ends are frustum cone structure, round platform bottom diameter is N=2.5mm, and round platform thickness is L=1mm, and 3 diameters that go between are D=1.16~1.2mm.
Because the silicon chip of tube core 1 adopts the platinum diffusion technology to make, and makes the reverse recovery time of high-voltage diode less than 40ns, realizes Ultrafast recovery.
Tube core 1 and lead-in wire 3 are welded together, and after it is carried out suitable processing, encapsulate and be made into diode.
The utility model can satisfy high frequency, high voltage source for the requirement of hyperfrequency characteristic, adopts the platinum diffusion technology to make, and realizes Ultrafast recovery, solves the contradiction between reverse recovery time and the forward voltage drop.

Claims (1)

1. a Ultrafast recovery high-voltage diode is made of tube core, body, lead-in wire, is provided with tube core in the body that is made of epoxy resin, and tube core two ends welding lead is characterized in that, described die area satisfies:
Figure FDA0000304304031
>die area>
Figure FDA0000304304032
The silicon chip stack that described tube core utilizes the platinum diffusion technology to make by multilayer constitutes, and described body covering is rectangular structure, is of a size of 7*7*21mm, described lead-in wire end is frustum cone structure, round platform bottom diameter is N=2.5mm, and round platform thickness is L=1mm, and diameter wire is D=1.16~1.2mm.
CN2013201847073U 2013-04-12 2013-04-12 Ultra-fast recovery high-voltage diode Expired - Fee Related CN203218259U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2013201847073U CN203218259U (en) 2013-04-12 2013-04-12 Ultra-fast recovery high-voltage diode

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2013201847073U CN203218259U (en) 2013-04-12 2013-04-12 Ultra-fast recovery high-voltage diode

Publications (1)

Publication Number Publication Date
CN203218259U true CN203218259U (en) 2013-09-25

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN2013201847073U Expired - Fee Related CN203218259U (en) 2013-04-12 2013-04-12 Ultra-fast recovery high-voltage diode

Country Status (1)

Country Link
CN (1) CN203218259U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108155104A (en) * 2017-12-27 2018-06-12 中国振华集团永光电子有限公司(国营第八三七厂) A kind of manufacturing method of glassivation surface mount packages fast-recovery commutation silicon stack

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108155104A (en) * 2017-12-27 2018-06-12 中国振华集团永光电子有限公司(国营第八三七厂) A kind of manufacturing method of glassivation surface mount packages fast-recovery commutation silicon stack

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GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20130925

Termination date: 20140412