CN202033420U

CN202033420U - Special circuit for time parameter tests of analog integrated circuit test system

Info

Publication number: CN202033420U
Application number: CN2011201157628U
Authority: CN
Inventors: 钟锋浩
Original assignee: Hangzhou Changchuan Technology Co Ltd
Current assignee: Hangzhou Changchuan Technology Co Ltd
Priority date: 2011-04-19
Filing date: 2011-04-19
Publication date: 2011-11-09
Anticipated expiration: 2021-04-19

Abstract

A special circuit for time parameter tests of an analog integrated circuit test system comprises a precise DA (digital-analog) conversion module, an input signal processing module, a trigger module and a high-speed counting module. The precise DA conversion module and the input signal processing module are connected with the trigger module, and the trigger module is connected with the high-speed counting module. Compared with the prior art, the special circuit has the advantages of 1 reasonable design, 2 high integration level and 3 wide parameter measurement range, and parameter measurement precision and measurement extension are improved greatly since the special circuit adopts the large-scale integrated circuit and the high-speed comparison trigger.

Description

The time parameter test special circuit that is used for the Analogous Integrated Electronic Circuits test macro

Technical field

The utility model relates to a kind of wide region time parameter test special circuit that is used for the Analogous Integrated Electronic Circuits test macro, belongs to technical field of integrated circuits.

Background technology

Time parameters commonly used such as general Analogous Integrated Electronic Circuits test machine can only test frequency, cycle, and the parameter area that can test is little generally arrive the scope of 100mS at 1uS, also can only be in 10V to tested signal voltage range.This special circuit not only allows the measured signal voltage range to expand to ± 50V, and correlation time, parameter also expanded tens nanoseconds to 1 second to, can finish the time parameter test of thumping majority IC.

Summary of the invention

The purpose of this utility model is to overcome the deficiency of above-mentioned existence, but provides the wide region time parameter of the Analogous Integrated Electronic Circuits test macro of functions such as a kind of reasonable in design, frequency that measuring-signal can be provided, cycle, high level width, low level width, rising edge time, negative edge time to measure special circuit.

The purpose of this utility model is finished by following technical solution, a kind of time parameter test special circuit that is used for the Analogous Integrated Electronic Circuits test macro, and it comprises accurate DA modular converter, input signal processing module, trigger module, high speed counting module; Described accurate DA modular converter is connected trigger module respectively with the input signal processing module; Described trigger module connects high speed counting module; Described accurate DA modular converter provides accurate triggering level for trigger module, described trigger module is output as high speed counting module the high-speed counting control signal is provided, and upper computer software is calculated corresponding time parameter according to high-speed counting value and corresponding counting clock frequency meter; Designed in actual applications four the tunnel independently time parameter measure special circuit.

The utility model compared with prior art has following positive effect: 1, reasonable in design; 2, integrated level height; 3, parameter measurement wide ranges owing to adopted large scale integrated circuit and trigger at a high speed relatively in the special circuit, makes the precision of parameter testing and can survey scope and improve greatly.

Description of drawings

Fig. 1 is each module connection diagram of the utility model embodiment.

Fig. 2 is the circuit diagram of the accurate DA modular converter of the utility model embodiment.

Fig. 3 is the circuit diagram of the utility model embodiment input signal processing module.

Fig. 4 is the circuit diagram of the utility model embodiment trigger module.

Fig. 5 is the circuit diagram of the utility model embodiment high speed counting module.

Embodiment

Below in conjunction with accompanying drawing the utility model is done detailed introduction: as shown in Figure 1: a kind of time parameter test special circuit that is used for the Analogous Integrated Electronic Circuits test macro, it comprises accurate DA modular converter 1, input signal processing module 2, trigger module 3, high speed counting module 4; Described accurate DA modular converter 1 is connected trigger module 3 respectively with input signal processing module 2; Described trigger module 3 connects high speed counting module 4; Described accurate DA modular converter provides accurate triggering level for trigger module 3, described trigger module 3 is output as high speed counting module 4 the high-speed counting control signal is provided, and upper computer software is calculated corresponding time parameter according to high-speed counting value and corresponding counting clock frequency meter; Designed in actual applications four the tunnel independently time parameter measure special circuit.

Referring to Fig. 2, accurate DA modular converter 1 is mainly formed (U11 U12) by two 12 DA converters, every provides 4 road analog voltage output signals, every numeral input is by the total line traffic control of I2C (SCL SDA), and provide the reference signal of VREF by the outside, after amplifying through amplifier (U002 U003 etc.), output provides 8 tunnel-10V offset signal, as the triggering datum of four road trigger modules to+10V scope.By changing the output valve of DA, be equivalent to change the trigger point of signal measurement, obtain the time parameter of actual needs.

Referring to Fig. 3,2 pairs of input signals of input signal processing module carry out impedance matching, voltage matches and Filtering Processing, eliminate corresponding undesired signal, for the trigger module of back provides desirable measured signal.Owing to provide the voltage matches circuit here, the voltage range of measured signal expanded to ± 50V.

Referring to Fig. 4, one road signal of trigger module 3 derives from measured signal, another road derives from the benchmark triggering level of DA conversion, and this trigger module is the high speed respective comparator, when satisfying trigger condition, comparer output is directly delivered to FPGA with the logic level of FPGA coupling, cut down the number of intermediate links, improve the time measurement precision, owing to adopted high-speed comparator here, can make the time parameter of measured signal little of tens nanoseconds, practical frequency can reach more than the 10MHZ.When the time parameter of needs measurement is frequency or cycle,, in the time will measuring high-low level width or rising edge or negative edge, needs two comparers and different triggering levels is set as long as with wherein one road comparer is just passable.The time parameter that needs is obtained in the time parameter measurement of the output control FPGA of two comparers.

Referring to Fig. 5, high speed counting module 4 is actually a FPGA, the clock signal of 50MHZ is provided by the outside, produce the count pulse of higher frequency through inner frequency multiplication, select suitable count frequency in the tested scope of signal, to count according to the actual range of measured signal, to finish counted data and be put in the buffer memory and to wait for that host computer reads, host computer calculates corresponding time parameter according to the count frequency that is provided with after reading corresponding data again.Because but the count frequency program is established in actual applications

Put, make in the scope of tested time parameter that guaranteed under the prerequisite of measuring accuracy greatly broadening, reality is the longest at present can measure 1000mS (in the practical application greater than this time with regard to accident, so limit).

Claims

1. a time parameter that is used for the Analogous Integrated Electronic Circuits test macro is tested special circuit, and it comprises accurate DA modular converter (1), input signal processing module (2), trigger module (3), high speed counting module (4); Described accurate DA modular converter (1) is connected trigger module (3) respectively with input signal processing module (2); Described trigger module (3) connects high speed counting module (4).