CN105158671B - time parameter test circuit - Google Patents
time parameter test circuit Download PDFInfo
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- CN105158671B CN105158671B CN201510287391.4A CN201510287391A CN105158671B CN 105158671 B CN105158671 B CN 105158671B CN 201510287391 A CN201510287391 A CN 201510287391A CN 105158671 B CN105158671 B CN 105158671B
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Abstract
The invention discloses a kind of time parameter test circuit, including：Analog-to-digital conversion module, input signal processing module connect trigger module, trigger module connection high speed counting module respectively；Power supply module connects first switch circuit, second switch circuit respectively, the first switch circuit connects first voltage converter, the first voltage converter connects analog-to-digital conversion module and first voltage detection circuit respectively, and the first voltage detection circuit connects the first warning circuit；The second switch circuit connects second voltage converter, second voltage converter connection input signal processing module and second voltage the detection circuit, and the second voltage detection circuit connects the second warning circuit.A kind of time parameter test circuit of the present invention, can realize effective protection to circuit, and parameter measurement scope is wide.
Description
Technical field
The present invention relates to a kind of time parameter test circuit, and in particular to a kind of for the big of simulation of integrated circuit test machine
On power power-supply special circuit, the time parameter test circuit of temperature alarm can be realized.
Background technology
In the prior art, on high-power integrated circuit simulation test machine, the measurement of time parameter can be carried out.It is this to measure
Cheng Zhong, if using excessively frequently, or it is connected to go wrong with power supply and causes short circuit etc., test circuit temperature can be caused
Rapid increase, cause the reduction of test circuit service life.Therefore, when load occurs abnormal, how alarm and protection is sent, is existing
There is the technical problem of technology urgent need to resolve.
The content of the invention
To solve the deficiencies in the prior art, it is an object of the invention to provide a kind of time parameter test circuit, to solve
It is difficult to be difficult to the technical problem of circuit protection in the prior art in time parameter measurement process.
In order to realize above-mentioned target, the present invention adopts the following technical scheme that：
Time parameter test circuit, including analog-to-digital conversion module, input signal processing module, trigger module, high-speed counting
Module, it is characterised in that also include：Power supply, first voltage converter, second voltage converter.First switch circuit, second open
Powered-down road, first voltage detection circuit, second voltage detection circuit, the first warning circuit, the second warning circuit, analog-to-digital conversion mould
Block, input signal processing module connect trigger module, trigger module connection high speed counting module respectively；The power supply module
Connection first switch circuit, second switch circuit respectively, the first switch circuit connection first voltage converter, described first
Electric pressure converter connects analog-to-digital conversion module and first voltage detection circuit, the first voltage detection circuit connection first respectively
Warning circuit；The second switch circuit connects second voltage converter, and the second voltage converter is connected at input signal
Module and second voltage detection circuit are managed, the second voltage detection circuit connects the second warning circuit.
Foregoing time parameter test circuit, it is characterised in that the first switch circuit includes the first transistor, described
Second switch circuit includes second transistor.
Foregoing time parameter test circuit, it is characterised in that the first transistor and second transistor are P-MOS
Pipe, the input of the drain electrode connection first voltage converter of the first transistor, the grid connection institute of the first transistor
First voltage detection circuit is stated, the source electrode of the first transistor connects the power supply, the source electrode connection of the second transistor
The power supply, the input of the drain electrode connection second voltage converter of second transistor, the grid connection of the second transistor
The second voltage detects circuit.
The helpful of the present invention is：A kind of time parameter test circuit of the present invention, can be realized to the effective of circuit
Protection, parameter measurement scope is wide, due to employing large scale integrated circuit and high ratio in special circuit compared with trigger, makes parameter
The precision of test and scope can be surveyed greatly improve, simultaneously because safeguard measure is proper, avoid test circuit because load etc. therefore
Barrier causes to damage.
Brief description of the drawings
Fig. 1 is the structural representation being preferable to carry out of the present invention；
Fig. 2 is the structural representation of analog-to-digital conversion module of the present invention；
Fig. 3 is the structural representation of input signal processing module of the present invention；
Fig. 4 is the structural representation of trigger module of the present invention；
Fig. 5 is the structural representation of high speed counting module of the present invention；
Fig. 6 is the schematic diagram of protection module of the present invention.
The implication of reference in figure：
1st, power supply module, 2, first voltage converter, 3, second voltage converter, 4, first switch circuit, 5,
Two on-off circuits, 6, first voltage detection circuit, 7, second voltage detection circuit, the 8, first warning circuit, 9, second alarm electricity
Road, 10, analog-to-digital conversion module, 11, input signal processing module, 12, trigger module, 13, high speed counting module.
Embodiment
Make specific introduce to the present invention below in conjunction with the drawings and specific embodiments.
Shown in reference picture 1, time parameter test circuit of the present invention, including analog-to-digital conversion module 10, input signal processing mould
Block 11, trigger module 12, high speed counting module 13, in addition to：Power supply module 1, first voltage converter 2, second voltage
Converter 3, first switch circuit 4, second switch circuit 5, first voltage detection circuit 6, second voltage detection circuit 7, first
Warning circuit 8, the second warning circuit 9, analog-to-digital conversion module 10, input signal processing module 11 connect respectively trigger module 12,
Trigger module 12 connects high speed counting module 13；Power supply module 1 connects first switch circuit 4, second switch circuit respectively
5, first switch circuit 4 connects first voltage converter 2, and first voltage converter 2 connects analog-to-digital conversion module 10 and the respectively
One voltage detecting circuit 6, first voltage detection circuit 6 connect the first warning circuit 8；Second switch circuit 5 connects second voltage
Converter 3, second voltage converter 3 connect input signal processing module 11 and second voltage detection circuit 7, second voltage detection
Circuit 7 connects the second warning circuit 9.First voltage detection circuit 6 is used to detect the whether faulty hair of first voltage converter 2
It is raw.Second voltage detection circuit 7 is used to detect the whether faulty generation of second voltage converter 3.When first voltage detects circuit 6
When detecting first voltage 2 faulty generation of converter, first switch circuit 4 cuts off first voltage converter 2, while power supply supplies
The first warning circuit of module drive 8 is answered to alarm.When second voltage detection circuit 7 detects 3 faulty hair of second voltage converter
When raw, second switch circuit 5 cuts off second voltage converter 3, while power supply module drives the second warning circuit 9 to alarm.
Analog-to-digital conversion module 10 provides the reference signal that 8 tunnel -10V arrive+10V scopes, as touching for four road trigger modules 12
Send out datum.Input signal processing module 11 carries out impedance matching, voltage matches and filtering process to input signal, eliminates
Corresponding interference signal, preferable measured signal is provided for trigger module 12 below.Due to providing voltage matches electricity here
Road, the voltage range of measured signal is set to be expanded to ± 50V.The signal all the way of trigger module 12 derives from measured signal, another
Road derives from the benchmark triggering level of DA conversions, and the trigger module 12 is high speed respective comparator, when a triggering condition is met, than
The logic level matched compared with device output with FPGA is directly sent to FPGA, cuts down the number of intermediate links, and improves time resolution.Count at a high speed
Digital-to-analogue block 13 is one piece of FPGA, by the outside clock signal for providing 50MHZ, by the counting arteries and veins of internal frequency multiplication generation higher frequency
Punching, select suitable count frequency to be tested in signal in scope according to the actual range of measured signal and counted, will complete to count
Several data, which are put into caching, waits host computer to read, and the count frequency after host computer reading corresponding data further according to setting calculates
Go out corresponding time parameter.
Such as Fig. 6, first switch circuit 4 includes the first transistor, and second switch circuit 5 includes second transistor.First is brilliant
Body pipe and second transistor are P-MOS pipes, and draining for the first transistor connects the input of first voltage converter 2, and first
The grid connection first voltage detection circuit 6 of transistor, the source electrode connection power supply module of the first transistor, second transistor
Source electrode connection power supply module, the input of the drain electrode connection second voltage converter 3 of second transistor, second transistor
Grid connection second voltage detection circuit 7.
First voltage converter 2 is used for the voltage for being supplied to analog-to-digital conversion module 10 to run, and second voltage converter 3 is used for
It is supplied to the working voltage of input signal processing module 11.When first voltage detection circuit 6 input voltage reduces, the first transistor
First voltage converter 2 is cut off, when second voltage detection circuit 7 input voltage reduces, second transistor cut-out second voltage
Converter 3.The output end of first voltage converter 2 is connected to a load, and the output end of second voltage converter 3 is connected to another negative
Carry, the first transistor is the brilliant pipe of P-MOS electricity with second transistor, and the first transistor drain electrode is connected to first voltage converter
2 inputs, first crystal tube grid connection first voltage detection circuit 6, the first transistor source electrode are connected to power supply module,
Second transistor source electrode is connected to power supply module, and second transistor drain electrode is connected to the input of second voltage converter 3, the
Two-transistor grid is connected to second voltage detection circuit 7.First voltage detection circuit 6 includes a third transistor and one the 4th
Transistor, third transistor and the 4th transistor are NPN transistor, and third transistor colelctor electrode is connected to by a resistance
First crystal tube grid, third transistor emitter stage are connected to the ground, and it is defeated that third transistor base stage is connected to first voltage converter 2
Go out end, the 4th transistor collector is connected to power supply module, the 4th emitter ground connection, and the 4th transistor base connects
Power supply module is connected to, is connected with each other between third transistor colelctor electrode and the 4th transistor collector.Second voltage detection electricity
Road 7 includes one the 5th transistor and one the 6th transistor, and the 5th transistor and the 6th transistor are NPN transistor, and the 5th
Transistor collector is connected to second transistor grid by a resistance, and the 5th emitter is connected to the ground, the 5th transistor
Base stage is connected to the output end of second voltage converter 3, and the 6th transistor collector is connected to power supply module, the 6th transistor
Grounded emitter, the 6th transistor base are connected to power supply module, the 5th transistor collector and the 6th transistor current collection
Interpolar is connected with each other.First warning circuit 8 and the second warning circuit 9 can be loudspeaker or light emitting diode, pass through alarm
Prompt electric pressure converter faulty.
The basic principles, principal features and advantages of the present invention have been shown and described above.The technical staff of the industry should
Understand, the invention is not limited in any way for above-described embodiment, all to be obtained by the way of equivalent substitution or equivalent transformation
Technical scheme, all fall within protection scope of the present invention.
Claims (1)
1. time parameter test circuit, including analog-to-digital conversion module, input signal processing module, trigger module, high-speed counting mould
Block, it is characterised in that also include：Power supply module, first voltage converter, second voltage converter, first switch circuit,
Second switch circuit, first voltage detection circuit, second voltage detection circuit, the first warning circuit, the second warning circuit, mould
Number modular converter, input signal processing module connect trigger module, trigger module connection high speed counting module respectively；The power supply
Supply module connects first switch circuit, second switch circuit respectively, and the first switch circuit connects first voltage converter,
The first voltage converter connects analog-to-digital conversion module and first voltage detection circuit respectively, and the first voltage detects circuit
Connect the first warning circuit；The second switch circuit connects second voltage converter, and the second voltage converter connection is defeated
Enter signal processing module and second voltage detection circuit, the second voltage detection circuit connects the second warning circuit；
The first switch circuit includes the first transistor, and the second switch circuit includes second transistor；
The first transistor and second transistor are P-MOS pipes, and the drain electrode connection first voltage of the first transistor turns
The input of parallel operation, the grid of the first transistor connect the first voltage detection circuit, the source of the first transistor
Pole connects the power supply module, and the source electrode of the second transistor connects the power supply module, second transistor
The input of drain electrode connection second voltage converter, the grid of the second transistor connect the second voltage detection circuit；
Wherein, first voltage converter, for the voltage for being supplied to analog-to-digital conversion module to run；Second voltage converter, is used for
It is supplied to input signal processing module working voltage；When first voltage detection circuit input voltage reduces, the first transistor is cut
Disconnected first voltage converter, when second voltage detection circuit input voltage reduces, second transistor cut-out second voltage conversion
Device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510287391.4A CN105158671B (en) | 2015-05-29 | 2015-05-29 | time parameter test circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510287391.4A CN105158671B (en) | 2015-05-29 | 2015-05-29 | time parameter test circuit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105158671A CN105158671A (en) | 2015-12-16 |
| CN105158671B true CN105158671B (en) | 2017-12-26 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510287391.4A Active CN105158671B (en) | 2015-05-29 | 2015-05-29 | time parameter test circuit |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN202033420U (en) * | 2011-04-19 | 2011-11-09 | 杭州长川科技有限公司 | Special circuit for time parameter tests of analog integrated circuit test system |
| CN104135691A (en) * | 2014-08-14 | 2014-11-05 | 广州创维平面显示科技有限公司 | MCU resetting control circuit and TV set |
| CN104285352A (en) * | 2012-02-24 | 2015-01-14 | 皮尔茨公司 | Safety switchgear with power supply unit |
| CN104332958A (en) * | 2014-10-30 | 2015-02-04 | 华为技术有限公司 | Overvoltage protection circuit and method |
| CN204925332U (en) * | 2015-05-29 | 2015-12-30 | 杭州长川科技股份有限公司 | Time parameter testing circuit |
-
2015
- 2015-05-29 CN CN201510287391.4A patent/CN105158671B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN202033420U (en) * | 2011-04-19 | 2011-11-09 | 杭州长川科技有限公司 | Special circuit for time parameter tests of analog integrated circuit test system |
| CN104285352A (en) * | 2012-02-24 | 2015-01-14 | 皮尔茨公司 | Safety switchgear with power supply unit |
| CN104135691A (en) * | 2014-08-14 | 2014-11-05 | 广州创维平面显示科技有限公司 | MCU resetting control circuit and TV set |
| CN104332958A (en) * | 2014-10-30 | 2015-02-04 | 华为技术有限公司 | Overvoltage protection circuit and method |
| CN204925332U (en) * | 2015-05-29 | 2015-12-30 | 杭州长川科技股份有限公司 | Time parameter testing circuit |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105158671A (en) | 2015-12-16 |
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