CN105158671A - Time parameter test circuit - Google Patents
Time parameter test circuit Download PDFInfo
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- CN105158671A CN105158671A CN201510287391.4A CN201510287391A CN105158671A CN 105158671 A CN105158671 A CN 105158671A CN 201510287391 A CN201510287391 A CN 201510287391A CN 105158671 A CN105158671 A CN 105158671A
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Abstract
The invention discloses a time parameter test circuit, in which, an analog-to-digital conversion module and an input signal processing module are connected to a trigger module and the trigger module is connected to a high-speed counting module; a power supply module is connected to a first switching circuit and a second switching circuit, the first switching circuit is connected to a first voltage converter, the first voltage converter is connected to the analog-to-digital conversion module and a first voltage detecting circuit, and the first voltage detecting circuit is connected to a first alarm circuit; and the second switching circuit is connected to a second voltage converter, the second voltage converter is connected to the input signal processing module and a second voltage detecting circuit, and the second voltage detecting circuit is connected to a second alarm circuit. The time parameter test circuit provided by the invention can achieve effective circuit protection and a wide parameter measurement range.
Description
Technical field
The present invention relates to a kind of time parameter test circuit, be specifically related to a kind of large power supply special circuit for simulation of integrated circuit test machine, the time parameter test circuit of temperature alarm can be realized.
Background technology
In prior art, on high-power integrated circuit simulation test machine, the measurement of time parameter can be carried out.In this measuring process, if use too frequent, or is connected to go wrong with power supply and causes short circuit etc., test circuit temperature can be caused to rise fast, cause test circuit reduction in serviceable life.Therefore, when load occurs abnormal, how to send alarm and protection, be the technical matters that prior art needs solution badly.
Summary of the invention
For solving the deficiencies in the prior art, the object of the present invention is to provide a kind of time parameter test circuit, to solve in prior art the technical matters being difficult to realize being difficult to realizing circuit protection in time parameter measuring process.
In order to realize above-mentioned target, the present invention adopts following technical scheme:
Time parameter test circuit, comprises analog-to-digital conversion module, input signal processing module, trigger module, high speed counting module, it is characterized in that, also comprise: power supply, the first electric pressure converter, the second electric pressure converter.First on-off circuit, second switch circuit, first voltage detecting circuit, the second voltage detecting circuit, the first warning circuit, the second warning circuit, analog-to-digital conversion module, input signal processing module connect trigger module respectively, and trigger module connects high speed counting module; Described power supply module connects the first on-off circuit, second switch circuit respectively, described first on-off circuit connects the first electric pressure converter, described first electric pressure converter connects analog-to-digital conversion module and the first voltage detecting circuit respectively, and described first voltage detecting circuit connects the first warning circuit; Described second switch circuit connects the second electric pressure converter, and described second electric pressure converter connects input signal processing module and the second voltage detecting circuit, and described second voltage detecting circuit connects the second warning circuit.
Aforesaid time parameter test circuit, is characterized in that, described first on-off circuit comprises the first transistor, and described second switch circuit comprises transistor seconds.
Aforesaid time parameter test circuit, it is characterized in that, described the first transistor and transistor seconds are P-MOS pipe, the drain electrode of described the first transistor connects the input end of the first electric pressure converter, the grid of described the first transistor connects described first voltage detecting circuit, the source electrode of described the first transistor connects described power supply, the source electrode of described transistor seconds connects described power supply, the drain electrode of transistor seconds connects the input end of the second electric pressure converter, and the grid of described transistor seconds connects described second voltage detecting circuit.
Of the present invention benefiting is: a kind of time parameter test circuit of the present invention; the available protecting to circuit can be realized; parameter measurement wide ranges; owing to have employed large scale integrated circuit in special circuit and comparing trigger at a high speed; make the precision of parameter testing and scope can be surveyed greatly to improve; simultaneously because safeguard measure is proper, avoid test circuit because the faults such as load cause damage.
Accompanying drawing explanation
Fig. 1 is a structural representation preferably implemented of the present invention;
Fig. 2 is the structural representation of analog-to-digital conversion module of the present invention;
Fig. 3 is the structural representation of input signal processing module of the present invention;
Fig. 4 is the structural representation of trigger module of the present invention;
Fig. 5 is the structural representation of high speed counting module of the present invention;
Fig. 6 is the schematic diagram of protection module of the present invention.
The implication of Reference numeral in figure:
1, power supply module, the 2, first electric pressure converter, the 3, second electric pressure converter, 4, the first on-off circuit, 5, second switch circuit, the 6, first voltage detecting circuit, the 7, second voltage detecting circuit, 8, the first warning circuit, 9, the second warning circuit, 10, analog-to-digital conversion module, 11, input signal processing module, 12, trigger module, 13, high speed counting module.
Embodiment
Below in conjunction with the drawings and specific embodiments, concrete introduction is done to the present invention.
With reference to shown in Fig. 1, time parameter test circuit of the present invention, comprise analog-to-digital conversion module 10, input signal processing module 11, trigger module 12, high speed counting module 13, also comprise: power supply module 1, first electric pressure converter 2, second electric pressure converter 3, first on-off circuit 4, second switch circuit 5, first voltage detecting circuit 6, second voltage detecting circuit 7, first warning circuit 8, second warning circuit 9, analog-to-digital conversion module 10, input signal processing module 11 connect trigger module 12 respectively, and trigger module 12 connects high speed counting module 13; Power supply module 1 connects the first on-off circuit 4, second switch circuit 5 respectively, first on-off circuit 4 connects the first electric pressure converter 2, first electric pressure converter 2 connects analog-to-digital conversion module 10 respectively and the first voltage detecting circuit 6, first voltage detecting circuit 6 connects the first warning circuit 8; Second switch circuit 5 connects the second electric pressure converter 3, second electric pressure converter 3 and connects input signal processing module 11 and the second voltage detecting circuit 7, second voltage detecting circuit 7 connects the second warning circuit 9.Whether the first voltage detecting circuit 6 has fault to occur for detecting the first electric pressure converter 2.Whether the second voltage detecting circuit 7 has fault to occur for detecting the second electric pressure converter 3.When the first voltage detecting circuit 6 detects that the first electric pressure converter 2 has fault to occur, the first on-off circuit 4 cuts off the first electric pressure converter 2, and power-supply unit drives the first warning circuit 8 to report to the police simultaneously.When the second voltage detecting circuit 7 detects that the second electric pressure converter 3 has fault to occur, second switch circuit 5 cuts off the second electric pressure converter 3, and power-supply unit drives the second warning circuit 9 to report to the police simultaneously.
Analog-to-digital conversion module 10 provides 8 tunnel-10V to the reference signal of+10V scope, as the trigger reference level of four road trigger modules 12.Input signal processing module 11 pairs of input signals carry out impedance matching, voltage matches and filtering process, eliminate corresponding undesired signal, for trigger module 12 below provides desirable measured signal.Owing to this providing voltage matches circuit, the voltage range of measured signal is expanded to ± 50V.One road signal of trigger module 12 derives from measured signal, another road derives from the benchmark triggering level of DA conversion, this trigger module 12 is high speed respective comparator, when a triggering condition is met, comparer exports the logic level of mating with FPGA and directly delivers to FPGA, cut down the number of intermediate links, improve time resolution.High speed counting module 13 is one piece of FPGA, the clock signal of 50MHZ is provided by outside, the count pulse of higher frequency is produced through inner frequency multiplication, suitable count frequency is selected to count in the tested scope of signal according to the actual range of measured signal, the data completing counting be put in buffer memory and wait for that host computer reads, host computer calculates corresponding time parameter according to the count frequency arranged after reading corresponding data again.
As Fig. 6, the first on-off circuit 4 comprises the first transistor, and second switch circuit 5 comprises transistor seconds.The first transistor and transistor seconds are P-MOS pipe, the drain electrode of the first transistor connects the input end of the first electric pressure converter 2, the grid of the first transistor connects the first voltage detecting circuit 6, the source electrode of the first transistor connects power supply, the source electrode of transistor seconds connects power supply, the drain electrode of transistor seconds connects the input end of the second electric pressure converter 3, and the grid of transistor seconds connects the second voltage detecting circuit 7.
The voltage that first electric pressure converter 2 runs for being supplied to analog-to-digital conversion module 10, the second electric pressure converter 3 is for being supplied to input signal processing module 11 working voltage.When the first voltage detecting circuit 6 input voltage reduces, the first transistor cuts off the first electric pressure converter 2, and when the second voltage detecting circuit 7 input voltage reduces, transistor seconds cuts off the second electric pressure converter 3.First electric pressure converter 2 output terminal is connected to a load, second electric pressure converter 3 output terminal is connected to another load, the first transistor and transistor seconds are P-MOS electricity crystalline substance and manage, the drain electrode of this first transistor is connected to the first electric pressure converter 2 input end, first crystal tube grid connects the first voltage detecting circuit 6, the first transistor source electrode is connected to power-supply unit, transistor seconds source electrode is connected to power-supply unit, transistor seconds drain electrode is connected to the second electric pressure converter 3 input end, and transistor seconds grid is connected to the second voltage detecting circuit 7.First voltage detecting circuit 6 comprises a third transistor and one the 4th transistor, third transistor and the 4th transistor are NPN transistor, third transistor collector is connected to first crystal tube grid by a resistance, third transistor emitter is connected to ground, third transistor base stage is connected to the first electric pressure converter 2 output terminal, 4th transistor collector is connected to power-supply unit, 4th emitter ground connection, 4th transistor base is connected to power-supply unit, is interconnected between third transistor collector and the 4th transistor collector.Second voltage detecting circuit 7 comprises one the 5th transistor and one the 6th transistor, 5th transistor and the 6th transistor are NPN transistor, 5th transistor collector is connected to transistor seconds grid by a resistance, 5th emitter is connected to ground, 5th transistor base is connected to the second electric pressure converter 3 output terminal, 6th transistor collector is connected to power-supply unit, 6th emitter ground connection, 6th transistor base is connected to power-supply unit, is interconnected between the 5th transistor collector and the 6th transistor collector.First warning circuit 8 and the second warning circuit 9 can be loudspeaker or light emitting diode, have fault by alarm electric pressure converter.
More than show and describe ultimate principle of the present invention, principal character and advantage.The technician of the industry should understand, and above-described embodiment does not limit the present invention in any form, the technical scheme that the mode that all employings are equal to replacement or equivalent transformation obtains, and all drops in protection scope of the present invention.
Claims (3)
1. time parameter test circuit, comprises analog-to-digital conversion module, input signal processing module, trigger module, high speed counting module, it is characterized in that, also comprise: power supply, the first electric pressure converter, the second electric pressure converter; First on-off circuit, second switch circuit, first voltage detecting circuit, the second voltage detecting circuit, the first warning circuit, the second warning circuit, analog-to-digital conversion module, input signal processing module connect trigger module respectively, and trigger module connects high speed counting module; Described power supply module connects the first on-off circuit, second switch circuit respectively, described first on-off circuit connects the first electric pressure converter, described first electric pressure converter connects analog-to-digital conversion module and the first voltage detecting circuit respectively, and described first voltage detecting circuit connects the first warning circuit; Described second switch circuit connects the second electric pressure converter, and described second electric pressure converter connects input signal processing module and the second voltage detecting circuit, and described second voltage detecting circuit connects the second warning circuit.
2. time parameter test circuit according to claim 1, is characterized in that, described first on-off circuit comprises the first transistor, and described second switch circuit comprises transistor seconds.
3. time parameter test circuit according to claim 2, it is characterized in that, described the first transistor and transistor seconds are P-MOS pipe, the drain electrode of described the first transistor connects the input end of the first electric pressure converter, the grid of described the first transistor connects described first voltage detecting circuit, the source electrode of described the first transistor connects described power supply, the source electrode of described transistor seconds connects described power supply, the drain electrode of transistor seconds connects the input end of the second electric pressure converter, and the grid of described transistor seconds connects described second voltage detecting circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510287391.4A CN105158671B (en) | 2015-05-29 | 2015-05-29 | time parameter test circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510287391.4A CN105158671B (en) | 2015-05-29 | 2015-05-29 | time parameter test circuit |
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| CN105158671A true CN105158671A (en) | 2015-12-16 |
| CN105158671B CN105158671B (en) | 2017-12-26 |
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| CN201510287391.4A Active CN105158671B (en) | 2015-05-29 | 2015-05-29 | time parameter test circuit |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN202033420U (en) * | 2011-04-19 | 2011-11-09 | 杭州长川科技有限公司 | Special circuit for time parameter tests of analog integrated circuit test system |
| CN104135691A (en) * | 2014-08-14 | 2014-11-05 | 广州创维平面显示科技有限公司 | MCU resetting control circuit and TV set |
| CN104285352A (en) * | 2012-02-24 | 2015-01-14 | 皮尔茨公司 | Safety switchgear with power supply unit |
| CN104332958A (en) * | 2014-10-30 | 2015-02-04 | 华为技术有限公司 | Overvoltage protection circuit and method |
| CN204925332U (en) * | 2015-05-29 | 2015-12-30 | 杭州长川科技股份有限公司 | Time parameter testing circuit |
-
2015
- 2015-05-29 CN CN201510287391.4A patent/CN105158671B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN202033420U (en) * | 2011-04-19 | 2011-11-09 | 杭州长川科技有限公司 | Special circuit for time parameter tests of analog integrated circuit test system |
| CN104285352A (en) * | 2012-02-24 | 2015-01-14 | 皮尔茨公司 | Safety switchgear with power supply unit |
| CN104135691A (en) * | 2014-08-14 | 2014-11-05 | 广州创维平面显示科技有限公司 | MCU resetting control circuit and TV set |
| CN104332958A (en) * | 2014-10-30 | 2015-02-04 | 华为技术有限公司 | Overvoltage protection circuit and method |
| CN204925332U (en) * | 2015-05-29 | 2015-12-30 | 杭州长川科技股份有限公司 | Time parameter testing circuit |
Also Published As
| Publication number | Publication date |
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| CN105158671B (en) | 2017-12-26 |
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