CN201984138U - SMD (surface mount device)-type white-light simple-point testing device - Google Patents
SMD (surface mount device)-type white-light simple-point testing device Download PDFInfo
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- CN201984138U CN201984138U CN 201020673597 CN201020673597U CN201984138U CN 201984138 U CN201984138 U CN 201984138U CN 201020673597 CN201020673597 CN 201020673597 CN 201020673597 U CN201020673597 U CN 201020673597U CN 201984138 U CN201984138 U CN 201984138U
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Abstract
The utility model relates to an SMD-type white-light simple-point testing device, which comprises a testing master computer, wherein an external interface end is arranged on the master computer; a clamp for monocrystal is arranged in the master computer; the clamp for monocrystal comprises a mold plate and a cover plate; the mold plate comprises a frame; a base plate is embedded in the frame; all-positive and all-negative electrodes are arranged on the base plate at intervals; and flat cables are led out by the all-positive and the all-negative electrodes to be connected with the external interface end of the master computer. The testing device has the benefits that a combined structure of the clamp for monocrystal and the testing master computer as well as the function of periphery testing and controlling is adopted, the device not only supports the row-measuring function of the monocrystal, but also supports the point-measuring function and complete-measuring function; the clamp is installed on the testing master computer and connected with the peripheral power supply and the computer for playing the SMD row-measuring function; the technique fills the gap of the conventional equipment, can count the faults of failure lamp, leakage current and the like, and provides high-speed and accurate data support for the improvement on the processing procedure, thereby reducing abnormal phenomena and the loss of enterprises.
Description
[technical field]
The utility model relates to a kind of LED encapsulation production test equipment, refers in particular to a kind of SMD white light single-spot testing device.
[background technology]
In the encapsulation procedure of existing SMD, lack the device that sheet is surveyed, so that it is electrically bad to add up the various dead lamps of LED, IR etc., can not provide the data support for the various links in the encapsulation procedure, analyze to reach the purpose of improvement, management and control.Since in the process of doing miniwatt SMD white light, need be to a control of glue amount, and present method of testing must be taken off some LED lamp well from support, on test machine, test, reach to a control of glue amount, in getting the process of lamp, be stained with glue easily, cause indeterminacy.
In the processing procedure of SMD, still there is not at present a proving installation in addition, add up the various bad of product, mostly be by could roughly obtaining a part of data behind the light splitting machine, it is long that shortcoming is to obtain cycle of data, do not have ageing, the 2nd, comprehensive accuracy of obtaining data is not high, is difficult to see the essence that goes wrong.
[summary of the invention]
The purpose of this utility model is to have overcome above-mentioned defective, and a kind of SMD white light single-spot testing device is provided.
The purpose of this utility model is achieved in that a kind of SMD white light single-spot testing device, and it comprises Test Host, and main frame is provided with the external interface end, in be provided with the monocrystalline anchor clamps; Described monocrystalline is made up of template and cover plate with anchor clamps, and template comprises frame, and interlocking has substrate in the frame, just is being provided with altogether at interval on the substrate, negative electrode altogether, altogether just, be total to negative electrode and lead to winding displacement and link to each other with main frame external interface end;
In the said structure, described substrate is made by conductive material, protrudes boss on it at interval and just is being formed with altogether/negative electrode, is provided with insulation spacer between boss, and pad is provided with negative/positive electrode altogether;
In the said structure, described altogether just/upper surface of negative/positive electrode is in the same plane together for negative electrode;
In the said structure, the frame of described template is made by insulating material, is provided with magnet around template, and corresponding also is provided with magnet all around at cover plate;
In the said structure, described main frame is provided with control knob.
The beneficial effects of the utility model are to adopt the unitized construction of monocrystalline with anchor clamps and Test Host and peripheral test control, can not only support the row of monocrystalline to survey, also support point brake, brake entirely.By the utility model is related to anchor clamps be installed on the Test Host, couple together the row's brake that to realize SMD with peripheral power supply, computing machine, this technology has been filled up the blank of existing equipment, it is bad to count dead lamp, leakage current etc., for the improvement of processing procedure provides data support fast and accurately, thereby can reduce unusual generation, reduce enterprises' loss.
[description of drawings]
Below in conjunction with accompanying drawing in detail concrete structure of the present utility model is described in detail
Fig. 1 is a Test Host structural representation of the present utility model
Fig. 2 is a formwork structure vertical view of the present utility model
Fig. 3 is a formwork structure side view of the present utility model
Fig. 4 is a covering plate structure vertical view of the present utility model
Fig. 5 is substrate of the present utility model and convex platform electrode structural chart thereof
Fig. 6 be substrate of the present utility model just installing/negative electrode after structural drawing
[embodiment]
Below in conjunction with accompanying drawing the utility model specific embodiment is described in detail.
As shown in Figure 1, the utility model relates to a kind of SMD white light single-spot testing device, and it comprises Test Host 10, is provided with the monocrystalline anchor clamps in the main frame 10, which is provided with control knob 11 and external interface and rectifies negative pole 12,13.
Referring to Fig. 2-4, monocrystalline is made up of template and cover plate 300 with anchor clamps, best high-insulativity, the material wear-resistant, that hardness is higher of adopting of template made (just passable such as the PVC material, this kind material is transparent better, be convenient to check), it comprises frame 100, frame 100 is made wherein to rabbet by insulating material substrate 1, be provided with magnet 200 around the frame 100 of template, corresponding also is provided with magnet 400 all around at cover plate 300.
As Fig. 5,6, the interval just is being provided with altogether, is being total to negative electrode 101,103 on substrate 1, just is being total to, is being total to negative electrode 101,103 and linking to each other with the proper negative pole 12,13 of main frame 10 external interfaces by the winding displacement of drawing.Best, aforesaid substrate 1 is directly made (is aluminum alloy materials as the main material characteristic) by conductive material, protruding boss on it at interval just is being formed with altogether/negative electrode 101, be provided with insulation spacer 102 in 101 of boss, pad 102 is provided with negative/positive electrode 103 altogether, isolate with insulation spacer 102 between two electrodes, middle bonding with seccotine, and altogether just/upper surface of negative/positive electrode 103 is in the same plane together for negative electrode 101.
It should be noted that in addition:
1, at assembling positive electrode together during negative electrode altogether, check positive electrode altogether together the upper surface of negative electrode whether on same surface level.Being 0K on same surface level, is defective on the surface level that do not coexist.
2, the size after the inspection injection moulding.
3, testing electrical property, on anchor clamps, put into the packaged lamp of a slice (electrically good), cover cover plate, at lead-in wire P1---P18 is last with the stabilized current supply positive pole that meets 20mA, N1---N10 connects the stabilized current supply negative pole of 20mA successively at lead-in wire, when lighting, observe whether the lamp that does not work is arranged at every turn, promising defective.
It is to be noted; the utility model is not limited to above-mentioned embodiment; for example this product can be by adding a few joint dry cells in the combination; be assembled into the handheld test device; its benefit is succinct; convenient; particularly in the processing procedure of doing the encapsulation of miniwatt white light; advantage is just very outstanding; as long as will put above support behind the glue is placed on; cover cover plate; just can arbitraryly light arbitrary lamp, use, measure its performance parameter with star spectrum tester; problem in the judging point glue processing procedure; thereby it is unusual to control processing procedure fast, reaches the purpose of the production that reduces defective products, has improved product quality; saved cost; therefore improved the benefit of enterprise, any simple modification of in based on technical solutions of the utility model, the foregoing description being done of any those skilled in the art; equivalent variations and modification all belong in the protection domain of the present utility model.
Claims (5)
1. SMD white light single-spot testing device, it is characterized in that: it comprises Test Host, main frame is provided with the external interface end, in be provided with the monocrystalline anchor clamps; Described monocrystalline is made up of template and cover plate with anchor clamps, and template comprises frame, and interlocking has substrate in the frame, just is being provided with altogether at interval on the substrate, negative electrode altogether, altogether just, be total to negative electrode and lead to winding displacement and link to each other with main frame external interface end.
2. SMD white light single-spot testing device as claimed in claim 1, it is characterized in that: described substrate is made by conductive material, protrudes boss on it at interval and just is being formed with altogether/negative electrode, is provided with insulation spacer between boss, and pad is provided with negative/positive electrode altogether.
3. SMD white light single-spot testing device as claimed in claim 2 is characterized in that: described altogether just/upper surface of negative/positive electrode is in the same plane together for negative electrode.
4. SMD white light single-spot testing device as claimed in claim 1, it is characterized in that: the frame of described template is made by insulating material, is provided with magnet around template, and corresponding also is provided with magnet all around at cover plate.
5. SMD white light single-spot testing device as claimed in claim 1, it is characterized in that: described main frame is provided with control knob.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201020673597 CN201984138U (en) | 2010-12-16 | 2010-12-16 | SMD (surface mount device)-type white-light simple-point testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201020673597 CN201984138U (en) | 2010-12-16 | 2010-12-16 | SMD (surface mount device)-type white-light simple-point testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201984138U true CN201984138U (en) | 2011-09-21 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201020673597 Expired - Fee Related CN201984138U (en) | 2010-12-16 | 2010-12-16 | SMD (surface mount device)-type white-light simple-point testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201984138U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109581248A (en) * | 2018-12-18 | 2019-04-05 | 深圳市瑞丰光电紫光技术有限公司 | A kind of dead lamp inspection slowdown monitoring circuit and warning device |
-
2010
- 2010-12-16 CN CN 201020673597 patent/CN201984138U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109581248A (en) * | 2018-12-18 | 2019-04-05 | 深圳市瑞丰光电紫光技术有限公司 | A kind of dead lamp inspection slowdown monitoring circuit and warning device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20170727 Address after: 114000 Anshan province Liaoning City mountain spectrum Road No. 16 Patentee after: Anshan Xinguang Electronic Technology Co., Ltd. Address before: Tak Road Economic Development Zone Suining City, Sichuan province 629000 ship mountain Patentee before: Sichuan Bonshine Optical Electron Technology Co., Ltd. |
|
| TR01 | Transfer of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20110921 Termination date: 20181216 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |