CN201681903U - Encapsulation structure of base-island exposed and sinking base-island exposed passive device - Google Patents
Encapsulation structure of base-island exposed and sinking base-island exposed passive device Download PDFInfo
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- CN201681903U CN201681903U CN2010201847544U CN201020184754U CN201681903U CN 201681903 U CN201681903 U CN 201681903U CN 2010201847544 U CN2010201847544 U CN 2010201847544U CN 201020184754 U CN201020184754 U CN 201020184754U CN 201681903 U CN201681903 U CN 201681903U
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32245—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32245—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/32257—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic the layer connector connecting to a bonding area disposed in a recess of the surface of the item
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/48137—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/73—Means for bonding being of different types provided for in two or more of groups H01L24/10, H01L24/18, H01L24/26, H01L24/34, H01L24/42, H01L24/50, H01L24/63, H01L24/71
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/0132—Binary Alloys
- H01L2924/01322—Eutectic Alloys, i.e. obtained by a liquid transforming into two solid phases
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/191—Disposition
- H01L2924/19101—Disposition of discrete passive components
- H01L2924/19105—Disposition of discrete passive components in a side-by-side arrangement on a common die mounting substrate
Abstract
The utility model relates to an encapsulation structure of a base-island exposed and sinking base-island exposed passive device which comprises base islands (1), pins (2), a conductive or non-conductive bonding material (6), a chip (7), a metal wire (8) and packed plastic package material (9), wherein two groups of base islands (1) are available, one group is a first base island (1.1), and the other group is a second base island (1.2); the central area at the front surface of the second base island (1.2) is sinking; the front surfaces of the first base island (1.1) and the pins (2) are provided with first metal layers (4); the back surfaces of the first base island (1.1), the second base island (1.2) and the pins (2) are provided with second metal layers (5); passive devices are connected among the pins (2) or among the pins (2) and the base islands (1) in a spanning way; the peripheral areas of the pins (2), the areas among the pins (2) and the first base island (1.1), the area between the first base island (1.1) and the second base island (1.2), and the areas among the second base island (1.2) and the pins (2) are embedded with packless plastic package materials (3); and the sizes of the back surfaces of the base islands (1) and the pins (2) are smaller than those of the front surfaces of the base islands (1) and the pins (2). Plastic package bodies and metal pins of the utility model have high bonding capability.
Description
(1) technical field
The utility model relates to a kind of base island exposed type and sinks base island exposed type passive device encapsulating structure.Belong to the semiconductor packaging field.
(2) background technology
Traditional encapsulating structure mainly contains two kinds:
First kind: after chemical etching and surface electrical coating are carried out in the front of employing metal substrate, stick the resistant to elevated temperatures glued membrane of one deck at the back side of metal substrate and form the leadframe carrier (as shown in Figure 3) that to carry out encapsulation process;
Second kind: after chemical etching and surface electrical coating are carried out in the front of employing metal substrate, promptly finish the making (as shown in Figure 4) of lead frame.Back etched is then carried out at the back side of lead frame again in encapsulation process.
And the not enough point of two kinds of above-mentioned lead frames below in encapsulation process, having existed:
First kind:
1) but the lead frame of this kind must stick the glued membrane of one deck costliness high temperature resistance because of the back side.So directly increased high cost.
2) but also because the glued membrane of one deck high temperature resistance must be sticked in the back side of the lead frame of this kind, so the load technology in encapsulation process can only be used conduction or nonconducting resin technology, and the technology that can not adopt eutectic technology and slicken solder is fully carried out load, so selectable product category just has bigger limitation.
3) but again because the glued membrane of one deck high temperature resistance must be sticked in the back side of the lead frame of this kind, and in the ball bonding bonding technology in encapsulation process, because but the glued membrane of this high temperature resistance is a soft materials, so caused the instability of ball bonding bonding parameter, seriously influenced the quality of ball bonding and the stability of production reliability.
4) but again because the glued membrane of one deck high temperature resistance must be sticked in the back side of the lead frame of this kind, and the plastic package process process in encapsulation process, because the high pressure of plastic packaging relation is easy to cause between lead frame and the glued membrane and infiltrates plastic packaging material, be that the kenel of conduction has become insulation pin (as shown in Figure 5) on the contrary because of having infiltrated plastic packaging material and will formerly should belong to metal leg.
Second kind:
The lead frame structure of this kind has carried out etching partially technology in the metal substrate front, though can solve the problem of first kind of lead frame, but because only carried out the work that etches partially in the metal substrate front, and plastic packaging material only envelopes the height of half pin in the plastic packaging process, so the constraint ability of plastic-sealed body and metal leg has just diminished, when if the plastic-sealed body paster is not fine to pcb board, does over again again and heavily paste, with regard to the problem (as shown in Figure 6) that is easy to generate pin.
Especially the kind of plastic packaging material is to adopt when filler is arranged, because material is at the environment and the follow-up surface-pasted stress changing relation of production process, can cause metal and plastic packaging material to produce the crack of vertical-type, its characteristic is the high more then hard more crisp more crack that is easy to generate more of proportion of filler.
(3) summary of the invention
The purpose of this utility model is to overcome above-mentioned deficiency, provides a kind of and reduces that packaging cost, selectable product category are wide, the big base island exposed type and the base island exposed type passive device encapsulating structure that sinks of constraint ability of good stability, plastic-sealed body and the metal leg of the quality of ball bonding and production reliability.
The purpose of this utility model is achieved in that a kind of base island exposed type and sinks base island exposed type passive device encapsulating structure, comprise Ji Dao, pin, conduction or non-conductive bonding material, chip, metal wire and the filler plastic packaging material arranged, described Ji Dao has two groups, one group is first Ji Dao, another group is second Ji Dao, front, described second basic island middle section sinks, front at described first Ji Dao and pin is provided with the first metal layer, at described first Ji Dao, the back side of second Ji Dao and pin is provided with second metal level, be provided with chip in positive central sunken regions in the second basic island and front, the first basic island by conduction or non-conductive bonding material, all be connected between chip front side and the pin front the first metal layer and between chip and the chip with metal wire, in cross-over connection between pin and the pin or between pin and the basic island passive device is arranged, top and chip at described Ji Dao and pin, metal wire and passive device are encapsulated with the filler plastic packaging material outward, zone in described pin periphery, zone between the pin and the first basic island, no filler plastic packaging material is set in zone between first Ji Dao and the second basic island and the zone between second Ji Dao and the pin, described no filler plastic packaging material is with periphery, pin bottom, the pin and the first Ji Dao bottom, first Ji Dao and the second Ji Dao bottom and second Ji Dao and pin bottom link into an integrated entity, and make described Ji Dao and pin back side size less than Ji Dao and the positive size of pin, form up big and down small Ji Dao and pin configuration.
The beneficial effects of the utility model are:
1) but the glued membrane of one deck costliness high temperature resistance need not sticked in the back side of the lead frame of this kind.So directly reduced high cost.
2) but because the glued membrane of one deck high temperature resistance need not sticked in the back side of the lead frame of this kind yet, so the load technology in encapsulation process is except using conduction or nonconducting resin technology, can also adopt the technology of eutectic technology and slicken solder to carry out load, so selectable product category is just wide.
3) but again because the glued membrane of one deck high temperature resistance need not sticked in the back side of the lead frame of this kind, guaranteed the stability of ball bonding bonding parameter, guaranteed the quality of ball bonding and the stability of production reliability.
4) but again because the lead frame of this kind need not stick the glued membrane of one deck high temperature resistance, and the plastic package process process in encapsulation process can not cause between lead frame and the glued membrane fully and infiltrate plastic packaging material.
5) because the soft gap filler of no filler is set in the zone between described metal leg (pin) and metal leg, this packless soft gap filler has the filler plastic packaging material to envelope the height of whole metal leg with the routine in the plastic packaging process, so the constraint ability of plastic-sealed body and metal leg just becomes big, do not have the problem that produces pin again.
6) owing to adopted positive method of separating the etching operation with the back side, so in the etching operation, can form the slightly little and big slightly structure of positive basic island size of the size of back side Ji Dao, and with the size that varies in size up and down of a Ji Dao by tighter more difficult generation slip that no filler plastic packaging material coated and fall pin.
(4) description of drawings
Fig. 1 is the base island exposed type of the utility model and the base island exposed type passive device encapsulating structure schematic diagram that sinks.
Fig. 2 is the vertical view of Fig. 1.
Fig. 3 was for sticked the resistant to elevated temperatures glued membrane figure of one deck operation in the past at the back side of metal substrate.
Fig. 4 was for to adopt the front of metal substrate to carry out chemical etching and surface electrical coating flow diagram in the past.
Fig. 5 was for formed insulation pin schematic diagram in the past.
Fig. 6 pin figure for what formed in the past.
Reference numeral among the figure:
Base island 1.1, the second basic island 1.2,1, the first basic island, pin 2, no filler plastic packaging material 3, the first metal layer 4, second metal level 5, conduction or non-conductive bonding material 6, chip 7, metal wire 8, filler plastic packaging material 9, passive device 10 are arranged.
(5) embodiment
Referring to Fig. 1～2, Fig. 1 is the base island exposed type of the utility model and the base island exposed type passive device encapsulating structure schematic diagram that sinks.Fig. 2 is the vertical view of Fig. 1.By Fig. 1 and Fig. 2 as can be seen, the base island exposed type of the utility model and the base island exposed type passive device encapsulating structure that sinks, comprise basic island 1, pin 2, conduction or non-conductive bonding material 6, chip 7, metal wire 8 and filler plastic packaging material 9 is arranged, described basic island 1 has two groups, one group is the first basic island 1.1, another group is the second basic island 1.2, the described second basic island 1.2 front middle sections sink, front at the described first basic island 1.1 and pin 2 is provided with the first metal layer 4, on the described first basic island 1.1, the back side of the second basic island 1.2 and pin 2 is provided with second metal level 5, be provided with chip 7 in the second basic island 1.2 positive central sunken regions and 1.1 fronts, the first basic island by conduction or non-conductive bonding material 6, chip 7 positive with pin 2 front the first metal layers 4 between and all be connected between chip 7 and the chip 7 with metal wire 8, in cross-over connection between pin 2 and the pin 2 or between pin 2 and the basic island 1 passive device 10 is arranged, top and chip 7 at described basic island 1 and pin 2, metal wire 8 and the passive device 10 outer filler plastic packaging materials 9 that are encapsulated with, zone in described pin 2 peripheries, zone between the pin 2 and the first basic island 1.1, no filler plastic packaging material 3 is set in zone between the first basic island 1.1 and the second basic island 1.2 and the zone between the second basic island 1.2 and the pin 2, described no filler plastic packaging material 3 is with periphery, pin bottom, pin 2 and 1.1 bottoms, the first basic island, the first basic island 1.1 and second 1.2 bottoms, basic island and the second basic island 1.2 link into an integrated entity with pin 2 bottoms, and make described basic island 1 and pin 2 back side sizes less than basic island 1 and pin 2 positive sizes, form up big and down small Ji Dao and pin configuration.
Claims (1)
1. a base island exposed type and the base island exposed type passive device encapsulating structure that sinks, comprise Ji Dao (1), pin (2), conduction or non-conductive bonding material (6), chip (7), metal wire (8) and filler plastic packaging material (9) is arranged, described Ji Dao (1) has two groups, one group is first Ji Dao (1.1), another group is second Ji Dao (1.2), described second Ji Dao (1.2) front middle section sinks, front at described first Ji Dao (1.1) and pin (2) is provided with the first metal layer (4), at described first Ji Dao (1.1), the back side of second Ji Dao (1.2) and pin (2) is provided with second metal level (5), be provided with chip (7) in positive central sunken regions of second Ji Dao (1.2) and first Ji Dao (1.1) front by conduction or non-conductive bonding material (6), chip (7) positive with pin (2) front the first metal layer (4) between and all use metal wire (8) to be connected between chip (7) and the chip (7), in cross-over connection between pin (2) and the pin (2) or between pin (2) and the Ji Dao (1) passive device (10) is arranged, top and chip (7) at described Ji Dao (1) and pin (2), the outer filler plastic packaging material (9) that is encapsulated with of metal wire (8) and passive device (10), it is characterized in that: in the peripheral zone of described pin (2), zone between pin (2) and first Ji Dao (1.1), no filler plastic packaging material (3) is set in zone between first Ji Dao (1.1) and second Ji Dao (1.2) and the zone between second Ji Dao (1.2) and the pin (2), described no filler plastic packaging material (3) is with periphery, pin bottom, pin (2) and first Ji Dao (1.1) bottom, first Ji Dao (1.1) and second Ji Dao (1.2) bottom and second Ji Dao (1.2) link into an integrated entity with pin (2) bottom, and make described Ji Dao (1) and pin (2) back side size less than Ji Dao (1) and the positive size of pin (2), form up big and down small Ji Dao and pin configuration.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010201847544U CN201681903U (en) | 2010-05-05 | 2010-05-05 | Encapsulation structure of base-island exposed and sinking base-island exposed passive device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010201847544U CN201681903U (en) | 2010-05-05 | 2010-05-05 | Encapsulation structure of base-island exposed and sinking base-island exposed passive device |
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| CN201681903U true CN201681903U (en) | 2010-12-22 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN2010201847544U Expired - Lifetime CN201681903U (en) | 2010-05-05 | 2010-05-05 | Encapsulation structure of base-island exposed and sinking base-island exposed passive device |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103579167A (en) * | 2012-07-23 | 2014-02-12 | 矽品精密工业股份有限公司 | Semiconductor package and fabrication method thereof |
| CN116884932A (en) * | 2023-09-06 | 2023-10-13 | 深圳智芯微电子科技有限公司 | Chip packaging structure |
-
2010
- 2010-05-05 CN CN2010201847544U patent/CN201681903U/en not_active Expired - Lifetime
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103579167A (en) * | 2012-07-23 | 2014-02-12 | 矽品精密工业股份有限公司 | Semiconductor package and fabrication method thereof |
| CN103579167B (en) * | 2012-07-23 | 2016-09-07 | 矽品精密工业股份有限公司 | Semiconductor package and fabrication method thereof |
| CN116884932A (en) * | 2023-09-06 | 2023-10-13 | 深圳智芯微电子科技有限公司 | Chip packaging structure |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20161222 Address after: The 200127 Tianjin Tianjin FTA test area (Dongjiang Bonded Port) No. 6865 North Road, 1-1-1802-7 financial and trade center of Asia Patentee after: Xin Xin finance leasing (Tianjin) Co., Ltd. Address before: 214434 Binjiang Middle Road, Jiangyin Development Zone, Jiangsu, China, 275 Patentee before: Jiangsu Changdian Sci. & Tech. Co., Ltd. |
|
| EE01 | Entry into force of recordation of patent licensing contract | ||
| EE01 | Entry into force of recordation of patent licensing contract |
Assignee: Jiangsu Changjiang Electronics Technology Co., Ltd. Assignor: Xin Xin finance leasing (Tianjin) Co., Ltd. Contract record no.: 2017320000152 Denomination of utility model: Encapsulation structure of base-island exposed and sinking base-island exposed passive device Granted publication date: 20101222 License type: Exclusive License Record date: 20170614 |
|
| EC01 | Cancellation of recordation of patent licensing contract | ||
| EC01 | Cancellation of recordation of patent licensing contract |
Assignee: JIANGSU CHANGJIANG ELECTRONICS TECHNOLOGY Co.,Ltd. Assignor: Xin Xin finance leasing (Tianjin) Co., Ltd. Contract record no.: 2017320000152 Date of cancellation: 20200416 |
|
| CX01 | Expiry of patent term | ||
| CX01 | Expiry of patent term |
Granted publication date: 20101222 |