CN201535784U - 一种老化测试基板 - Google Patents
一种老化测试基板 Download PDFInfo
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- CN201535784U CN201535784U CN2009202121749U CN200920212174U CN201535784U CN 201535784 U CN201535784 U CN 201535784U CN 2009202121749 U CN2009202121749 U CN 2009202121749U CN 200920212174 U CN200920212174 U CN 200920212174U CN 201535784 U CN201535784 U CN 201535784U
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CN2009202121749U CN201535784U (zh) | 2009-11-10 | 2009-11-10 | 一种老化测试基板 |
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CN2009202121749U CN201535784U (zh) | 2009-11-10 | 2009-11-10 | 一种老化测试基板 |
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CN201535784U true CN201535784U (zh) | 2010-07-28 |
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CN2009202121749U Expired - Fee Related CN201535784U (zh) | 2009-11-10 | 2009-11-10 | 一种老化测试基板 |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102313842A (zh) * | 2011-03-29 | 2012-01-11 | 上海华碧检测技术有限公司 | 一种pcb板电阻变小失效现象的检测方法 |
TWI694263B (zh) * | 2019-03-07 | 2020-05-21 | 雍智科技股份有限公司 | 老化測試電路板模組 |
CN116821045A (zh) * | 2023-08-28 | 2023-09-29 | 悦芯科技股份有限公司 | 一种用于512dut存储器器件测试的板卡结构 |
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2009
- 2009-11-10 CN CN2009202121749U patent/CN201535784U/zh not_active Expired - Fee Related
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102313842A (zh) * | 2011-03-29 | 2012-01-11 | 上海华碧检测技术有限公司 | 一种pcb板电阻变小失效现象的检测方法 |
TWI694263B (zh) * | 2019-03-07 | 2020-05-21 | 雍智科技股份有限公司 | 老化測試電路板模組 |
CN116821045A (zh) * | 2023-08-28 | 2023-09-29 | 悦芯科技股份有限公司 | 一种用于512dut存储器器件测试的板卡结构 |
CN116821045B (zh) * | 2023-08-28 | 2023-11-14 | 悦芯科技股份有限公司 | 一种用于512dut存储器器件测试的板卡结构 |
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Legal Events
Date | Code | Title | Description |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (BEIJING Free format text: FORMER OWNER: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION Effective date: 20130221 |
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C41 | Transfer of patent application or patent right or utility model | ||
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Free format text: CORRECT: ADDRESS; FROM: 201203 PUDONG NEW AREA, SHANGHAI TO: 100176 DAXING, BEIJING |
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TR01 | Transfer of patent right |
Effective date of registration: 20130221 Address after: 100176 No. 18 Wenchang Avenue, Beijing economic and Technological Development Zone Patentee after: Semiconductor Manufacturing International (Beijing) Corporation Address before: 201203 Shanghai City, Pudong New Area Zhangjiang Road No. 18 Patentee before: Semiconductor Manufacturing International (Shanghai) Corporation |
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CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100728 Termination date: 20181110 |