CN201269780Y - Dual light path denoising carrier-envelope phase measuring apparatus - Google Patents
Dual light path denoising carrier-envelope phase measuring apparatus Download PDFInfo
- Publication number
- CN201269780Y CN201269780Y CNU2008200598918U CN200820059891U CN201269780Y CN 201269780 Y CN201269780 Y CN 201269780Y CN U2008200598918 U CNU2008200598918 U CN U2008200598918U CN 200820059891 U CN200820059891 U CN 200820059891U CN 201269780 Y CN201269780 Y CN 201269780Y
- Authority
- CN
- China
- Prior art keywords
- lens
- reflected
- beam splitting
- splitting chip
- light path
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Landscapes
- Spectrometry And Color Measurement (AREA)
Abstract
The utility model relates to a double light path noise-removal carrier-envelop phase measuring device which comprises the following components: a first lens, a white stone sheet, a second lens and a first beam splitter are arranged in sequence in the advance direction of a laser beam to be measured. The first beam splitter splits the laser into a transmitted beam and a reflected beam; the transmitted beam is reflected by a second beam splitter after being delayed by a delay timer; the reflected beam passes through a third lens, a BBO crystal and a fourth lens after being reflected by a first reflector, is reflected by a second reflector, passes through the second beam splitter, combines with the reflected beam of the second beam splitter, and then shines into the slit of a spectrometer. The spectrometer is connected with a computer; the white stone sheet is positioned at the focus of the first lens; the BBO crystal is positioned behind the focus of the third lens; and the first beam splitter, the second beam splitter, the first reflector and the second reflector are intersecting with the beam shining into the spectrometer at an angle of 45 degrees. The double light path noise-removal carrier-envelop phase measuring device has the advantages of clear interference fringe and convenient measurement, and is fast and accurate.
Description
Technical field
The utility model relates to ultrashort laser pulse, is a kind of double-light path denoising carrier wave-envelope phase measuring apparatus that is used for the accurate measurement of ultrashort laser pulse carrier wave-envelope phase (Carrier-Envelope Phase abbreviates CEP as) shake.
Background technology
Laser pulse constantly develops to shorter stronger direction, and pulse width has broken through femtosecond and entered Ah second's epoch.But when laser pulse is short to the cycle magnitude, it is consistent that the phase place of electric-field carrier and envelope just can not be regarded as.Obtain more significant single chirped pulse, the CEP of seed laser is stabilized in certain scope.
At present, adopt the CEP measurement mechanism on monochromatic light road to come in the world mostly to measuring than macro-energy low repeatability laser pulse (referring to technology [1] Masayuki Kakehata etc. formerly, " Single-shot measurement of carrier-envelope phase changes by spectralinterferometry ", Optic Letters Vol, 26, No.18,1436-1438 (2001)).Its method is that ultrashort pulse is injected photonic crystal fiber (or white stone) spectrum widening and obtained super continuous white light.Frequency-doubling crystal is to the low-frequency component frequency multiplication in the white light, then the radio-frequency component of frequency doubled light and white light is interfered, obtain having the interference fringe of CEP information, with the stripe information of spectrometer in record a period of time that connects on computers, stripe information is carried out data processing can obtain the jitter conditions of interior CEP during this period of time.Concrete index path is referring to Fig. 2, and incident light focuses on through convex lens 14 and beats on white stone 15, and the broadening light of outgoing is injected barium metaborate (β-BaB successively through convex lens 16 collimations
2O is designated hereinafter simply as BBO) crystal 17 and Glan prism 18, select to finish interference through frequency multiplication and polarization, to get at last in the slit of spectrometer 12, computing machine 13 links to each other with spectrometer 12, and interference fringe is gathered in real time.Its light path design is simply compact, and when not considering environmental impact, the error of introducing is less.But the shortcoming of this monochromatic light drive test amount technology is:
1, because fundamental component and frequency multiplication composition are in a branch of light, only depend on and rotate Glan prism and regulate their relative intensity, adjustable scope is little, it is big to regulate difficulty, relatively the composition of frequency multiplication composition and broadening often very little, the interference fringe that obtains is clear inadequately.
2, this measuring method is very high to the stability requirement of surrounding environment, requires optical table, mirror holder highly stable, and the shake of incident intensity also can be introduced measuring error, brings difficulty to measurement.
3, when the conversion wavelength, owing to can't introduce the continually varying optical path difference, the measuring method on this monochromatic light road needs long test just can find needed striped.For tunable incident light source, amplify (Optical Parametric Amplification abbreviates OPA as) system as our used tunable optical parameter, the practicality of this method is very poor.
Summary of the invention
The technical problems to be solved in the utility model is to overcome the problem that above-mentioned prior art exists, and proposes a kind of double-light path denoising carrier wave-envelope phase measuring apparatus, this device should have interference fringe clear, measure convenient, fast and accurate characteristics.
Technical solution of the present utility model is as follows:
A kind of double-light path denoising carrier wave-envelope phase measuring apparatus, feature is that its formation comprises: along on the working direction of testing laser bundle being first lens, white stone sheet, second lens and first beam splitting chip successively, this first beam splitting chip is divided into transmitted light beam and folded light beam with laser, described transmitted light beam is reflected by second beam splitting chip after the chronotron time-delay; Described folded light beam by first mirror reflects after the 3rd lens, bbo crystal, the 4th lens, by second mirror reflects, see through described second beam splitting chip, be merged into a branch of with the folded light beam of this second beam splitting chip, inject in the slit of spectrometer, this spectrometer is connected with computing machine, described white stone sheet is positioned at the focus of first lens, described bbo crystal is positioned at after the focus of described the 3rd lens 1 centimetre, and described first beam splitting chip, second beam splitting chip, first catoptron and second catoptron are 45 ° with the light beam of injecting.
Measuring principle of the present utility model is as follows:
Adopt the double light path measuring method, broadening light is divided into two bundles, interfere with the radio-frequency component of another bundle after wherein a branch of low-frequency component frequency multiplication, thereby can regulate the relative light intensity of two-way easily and obtain interference fringe more clearly by rotating frequency-doubling crystal.Changing continuously under the situation of wavelength,, can find soon, saving the plenty of time by regulating the optical path difference of chronotron change two-way light.And eliminate the error that light path shake is introduced by measuring two-way broadening Light Interference Streaks simultaneously, obtained good effect experimentally.
Advantage of the present utility model:
1, the utility model adopts double light path, compares with monochromatic light road carrier wave-envelope phase measuring apparatus, and it can regulate relative light intensity easily, thereby obtains interference fringe clearly, is convenient to data processing.
2, the optical path difference of two-beam can be regulated by chronotron in the utility model, conveniently different wavelength of laser is measured, and has more practicality and agility.
3, the utility model can partly be eliminated because light intensity is shaken caused measuring error, has more accuracy.
In a word, the utility model side have interference fringe clear, measure just, fast, characteristic of accurate.
Description of drawings
Fig. 1 is the utility model double-light path denoising carrier wave-envelope phase measuring apparatus structural representation.
Fig. 2 is existing monochromatic light road carrier envelope-phase measurement device synoptic diagram.
Fig. 3 battery of tests data that to be us record in the tunable OPA system of building.
Embodiment
The utility model is described in further detail below in conjunction with drawings and Examples, but should not limit protection domain of the present utility model with this.
See also Fig. 1 earlier, Fig. 1 is the utility model double-light path denoising carrier wave-envelope phase measuring apparatus structural representation.As seen from the figure, the utility model double-light path denoising carrier wave-envelope phase measuring apparatus, its formation comprises: along on the working direction of testing laser bundle being first lens 1, white stone sheet 2, second lens 3 and first beam splitting chip 4 successively, this first beam splitting chip 4 is divided into transmitted light beam and folded light beam with laser, described transmitted light beam is reflected by second beam splitting chip 11 after chronotron 5 time-delays; Described folded light beam is reflected after the 3rd lens 7 by first catoptron 6, bbo crystal 8, the 4th lens 9, by 10 reflections of second catoptron, see through described second beam splitting chip 11, be merged into a branch of with the folded light beam of this second beam splitting chip 11, inject in the slit of spectrometer 12, this spectrometer 12 is connected with computing machine 13, described white stone sheet 2 is positioned at the focus of first lens 1, described bbo crystal 8 is positioned at after the focus of described the 3rd lens 71 centimetre, described first beam splitting chip 4, second beam splitting chip 11, first catoptron 6 and second catoptron 10 are 45 ° with the light beam of injecting.
Described chronotron 5 is to be placed on the shifting sledge by orthogonal two total reflective mirrors to constitute with adjusting screw(rod).
It now is the principle of work of example explanation the utility model device with 1600nm ultra-short pulse laser to be measured.
Ultra-short pulse laser to be measured incides on first lens 1 and is focused, and the white stone 2 at focus place is with the video stretching of laser.Incident 1600nm laser, the spectral range behind the broadening can reach 800-2000nm, and we are referred to as white light, and it is dispersed, and the white light of 3 pairs of generations of second lens collimates, and is divided into transmission and reflection two-beam through first beam splitting chip 4.Transmitted light beam reflexes to second beam splitting chip 11 through chronotron 5; Described folded light beam is reflexed on the 3rd lens 7 by first catoptron 6, be mapped to after the line focus on the bbo crystal 8, the low-frequency component of 8 pairs of white lights of this bbo crystal carries out frequency multiplication, (for example, the composition frequency multiplication of 1800nm is arrived 900nm), through the 4th lens 9 collimations, reflex on second beam splitting chip 11 then by second catoptron 10.11 pairs of second beam splitting chips are through the light beam transmissions of frequency multiplication, and to another bundle reflection, two-beam is combined into a branch of light once more and injects in the slit of spectrometer 12 like this.Because the existence of optical path difference, two-beam can interfere.Utilize spectrometer 12, can photograph two kinds of interference fringes near 900nm: a kind of is that the white light of two-way broadening is interfered mutually at the composition at 950nm place, another kind be in the white light of chronotron 5 one tunnel 900nm composition with through frequency multiplication one route 1800nm place frequency multiplication and the composition of 900nm interfere mutually.Because the optical path difference difference of above two kinds of interference, the cycle of two kinds of interference fringes is also inequality.
If the electric field of incident laser:
Wherein: ω is the frequency of incident light (1600nm),
Be carrier wave-envelope phase, A is an electric field amplitude, can regard constant as.
Behind the white stone broadening, the electric field of white light becomes:
ω
jExpression is from the various light frequencies of 800-2000nm.
If the frequency at 950nm place is ω
1, the frequency at 1800nm place is ω
2, then the frequency at 900nm place is 2 ω
2If be called light path 1 from white stone 2 through first beam splitting chip 4, chronotron 5 to second beam splitting chips 11, its light path is L
1Be called light path 2 through first beam splitting chip 4, first catoptron 6, the 3rd lens 7, bbo crystal 8, the 4th lens 9, second catoptron, 10 to second beam splitting chips 11 successively from white stone 2, its light path is L
2So, the fundamental frequency optical electric field at the 950nm place can be expressed as respectively through light path 1 and light path 2:
Electric field after the interference can be expressed as:
For absolute stable system, E
3Be a constant, the noise information in the light path has been represented in its variation.
Through light path 1, the white light electric field at the 900nm place can be expressed as:
Through light path 2, the electric field of white light composition after frequency multiplication at 1800nm place can be expressed as:
E
4And E
5Obtain after the interference:
Exponential term in the following formula has comprised the phase place of our ultimate demands
, but other phase place 2 ω
2(L
1-L
2) must disappear.We notice in (5) formula and have comprised similar phase term.
So, by (5) and (8) two formulas as can be seen:, calculate by simple mathematical and can be easy to draw carrier wave-envelope phase if obtain both phase places
.
In experiment, the electric field intensity that spectrometer 12 obtains is kept in the computing machine with data mode, and the composition that extracts 900nm and 950nm from data has respectively just obtained the interference electric field strength E that (5), (8) two formulas are explained
3And E
6
(5) formula is taken from right logarithm and got imaginary part:
Φ
noise＝ω
1·(L
1—L
2)/c (9)
Φ
NoiseThe phase place of expression noise.
(8) formula is taken from right logarithm and got imaginary part:
Φ
Ce﹠amp; NoiseThe mixed-phase of expression signal and noise.
We obtain not having the carrier wave-envelope phase of noise by formula (9) and (10)
:
The interference fringe in a certain moment is handled the carrier wave-envelope phase value that just can obtain at that time
Interference fringe in a period of time is sampled, just can obtain the situation of change of interior CEP value during this period of time, promptly obtained the stability of carrier wave-envelope phase.
In sum, the white light after utilizing beam splitting chip with broadening in the utility model is divided into two bundles, can regulate the relative intensity of two-way light by rotating frequency-doubling crystal like this, regulates optical path difference by regulating chronotron, thereby obtain interference fringe more clearly.It should be noted that, this device can obtain fundamental frequency light and frequency multiplication Light Interference Streaks (having mixed noise and CEP information) and two-way fundamental frequency Light Interference Streaks (comprising noise information) simultaneously, both handle simultaneously and can purify the former, obtain CEP information, avoided The noise such as light path shake and incident intensity shake.
Concrete structure and the parameter of the utility model device embodiment are as follows:
Arrange light path as Fig. 2, first lens 1, second lens 3, the 3rd lens 7, the 4th lens 9 all are the lens of focal length 10cm, the thickness of white stone 2 is 2mm, the thickness of bbo crystal 8 is 3mm, white stone 2 is placed on the focus of first lens 1, and bbo crystal 8 is placed on about 1cm after the focus of the 3rd lens 7.First beam splitting chip 4, second beam splitting chip 11 and total reflective mirror all with incident laser placement at 45.Chronotron 5 vertically is placed on the shifting sledge by the two sides total reflective mirror and constitutes, first mirror of this chronotron and the 4 parallel placements of first beam splitting chip.Drive chronotron 5 by adjusting screw(rod) and move, can change light path by the laser beam of this chronotron 5 along light path.White stone 2 is placed with bbo crystal 8 is all vertical with laser beam.
Fig. 3 battery of tests data that to be us record in the tunable OPA system of building.Horizontal ordinate is illustrated in 700 data points of gathering within hour, ordinate is represented the phase place in every represented moment, be mixed-phase shake root mean square ((the root mean square of the root mean square in one hour from top to bottom successively, be designated hereinafter simply as rms), rms=0.4763rad), white light phase jitter (rms=0.3322rad) and CEP shake (rms=0.2299rad).Wherein, the mixed-phase shake has comprised the mixed information of CEP shake and noise, and the information of noise is represented in white light phase jitter, after the correction of the latter to the former, has obtained carrier envelope-phase stabilization situation accurately.Record finally that CEP is dithered as rms=0.2299rad in one hour.
Claims (2)
1, a kind of double-light path denoising carrier wave-envelope phase measuring apparatus, feature is that its formation comprises: along on the working direction of testing laser bundle being first lens (1), white stone sheet (2), second lens (3) and first beam splitting chip (4) successively, this first beam splitting chip (4) is divided into transmitted light beam and folded light beam with laser, described transmitted light beam is reflected by second beam splitting chip (11) after chronotron (5) time-delay; Described folded light beam is reflected after the 3rd lens (7) by first catoptron (6), bbo crystal (8), the 4th lens (9), reflected by second catoptron (10), see through described second beam splitting chip (11), be merged into a branch of with the folded light beam of this second beam splitting chip (11), inject in the slit of spectrometer (12), this spectrometer (12) is connected with computing machine (13), described white stone sheet (2) is positioned at the focus of first lens (1), described bbo crystal (8) is positioned at after the focus of described the 3rd lens (7) 1 centimetre, described first beam splitting chip (4), second beam splitting chip (11), first catoptron (6) and second catoptron (10) are 45 ° with the light beam of injecting.
2, double-light path denoising carrier wave-envelope phase measuring apparatus according to claim 1 is characterized in that described chronotron (5) is to be placed on the shifting sledge by orthogonal two total reflective mirrors to constitute with adjusting screw(rod).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2008200598918U CN201269780Y (en) | 2008-06-18 | 2008-06-18 | Dual light path denoising carrier-envelope phase measuring apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2008200598918U CN201269780Y (en) | 2008-06-18 | 2008-06-18 | Dual light path denoising carrier-envelope phase measuring apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201269780Y true CN201269780Y (en) | 2009-07-08 |
Family
ID=40842387
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNU2008200598918U Expired - Fee Related CN201269780Y (en) | 2008-06-18 | 2008-06-18 | Dual light path denoising carrier-envelope phase measuring apparatus |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201269780Y (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102313605A (en) * | 2011-07-15 | 2012-01-11 | 中国科学院上海光学精密机械研究所 | Method and device for measuring self-referenced spectral interference femtosecond laser pulse in real time |
| CN112821170A (en) * | 2020-12-30 | 2021-05-18 | 中国科学院西安光学精密机械研究所 | Broadband light source with stable and controllable carrier envelope phase and generation method thereof |
-
2008
- 2008-06-18 CN CNU2008200598918U patent/CN201269780Y/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102313605A (en) * | 2011-07-15 | 2012-01-11 | 中国科学院上海光学精密机械研究所 | Method and device for measuring self-referenced spectral interference femtosecond laser pulse in real time |
| CN102313605B (en) * | 2011-07-15 | 2013-08-14 | 中国科学院上海光学精密机械研究所 | Method and device for measuring self-referenced spectral interference femtosecond laser pulse in real time |
| CN112821170A (en) * | 2020-12-30 | 2021-05-18 | 中国科学院西安光学精密机械研究所 | Broadband light source with stable and controllable carrier envelope phase and generation method thereof |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101308091B (en) | Method for measuring optical non-linear 4f phase coherent imaging | |
| CN101762332B (en) | Single ultrashort laser pulse contrast measuring device | |
| CN101806723B (en) | Double-beam multi-functional z scanning optical non-linear measuring device and method | |
| CN101315301B (en) | Double-light path denoising carrier wave-envelope phase measuring apparatus | |
| CN104730279B (en) | A kind of chirped pulse velocity interferometer | |
| CN102937573A (en) | Z-scan optical nonlinear measuring device and method | |
| CN103219638A (en) | Super-continuum spectrum light source and coherent anti Stokes Raman scattering imaging system | |
| CN103487146A (en) | Ultra wide band stimulated raman spectroscopy microscopic imaging system simple and convenient to use | |
| CN101216350B (en) | High power ultra-short laser pulse contrast measuring apparatus and measurement method | |
| CN106289499A (en) | A kind of micrometer vibrational system utilizing femtosecond laser and micrometer method for oscillating | |
| CN105403533A (en) | Multi-channel material optical nonlinearity measurement method | |
| CN109030451A (en) | Ultrashort pulse time-interleaving degree measuring device and method in CARS micro imaging system | |
| CN103900963B (en) | Heavy caliber light absorption coefficient of crystal material measurement mechanism | |
| CN201247199Y (en) | Non-linear 4f phase coherent imaging apparatus for measuring optics | |
| CN103592652A (en) | Double-frequency Doppler laser radar detection system based on single solid body FP etalon four-edge technology | |
| CN102175333B (en) | Method and device for measuring laser pulse width and relative phase by simultaneous phase-shifting interferometry | |
| CN201269780Y (en) | Dual light path denoising carrier-envelope phase measuring apparatus | |
| CN110243574A (en) | The measuring device and method of polarization maintaining optical fibre double refractive inde based on soliton self-frequency sh | |
| CN106248636A (en) | A kind of method measuring material nonlinearity absorption curve | |
| CN201166588Y (en) | Apparatus for measuring high power ultra-short laser pulse contrast | |
| CN206348271U (en) | Each spectrum composition Annual distribution of ultrafast super continuous spectrums and time coherence measurement instrument | |
| CN101799419A (en) | Measuring system and method of Raman gain coefficient of solid material | |
| CN101532959A (en) | Method for measuring optical nonlinearity of material based on monopulse and single beam | |
| CN100554942C (en) | Eliminate the nonlinear refraction character measuring method of non-linear absorption influence | |
| US7551267B2 (en) | Systems and methods for measuring ultra-short light pulses |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20090708 Termination date: 20110618 |