CN102175333B - Method and device for measuring laser pulse width and relative phase by simultaneous phase-shifting interferometry - Google Patents

Method and device for measuring laser pulse width and relative phase by simultaneous phase-shifting interferometry Download PDF

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CN102175333B
CN102175333B CN201110027568.9A CN201110027568A CN102175333B CN 102175333 B CN102175333 B CN 102175333B CN 201110027568 A CN201110027568 A CN 201110027568A CN 102175333 B CN102175333 B CN 102175333B
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semi
light
phase
prism
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CN102175333A (en
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刘世炳
贺雪鹏
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Beijing University of Technology
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Beijing University of Technology
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Abstract

The invention discloses a method and a device for measuring a laser pulse width and a relative phase by a simultaneous phase-shifting interferometry, which can measure a femtosecond pulse and an attosecond pulse of which the pulse width is very narrow. In the technology, a component prism is used for splitting light beams, and simultaneously, a plurality of simultaneous phase-shifting interference fringe patterns are obtained once in a spatial domain through a polarization interference method. By computational analysis on interference fields of a plurality of paths, the pulse width and the phase of an ultra-short pulse can be directly measured. The method provided by the invention is simple, clear in principles and excellent in shock resistance of the measuring result, and can implement on-site dynamic measurement and monitoring on the pulse width and the relative phase of the ultra-short pulse in an ultra-fast process. The measuring process is simple and convenient.

Description

Utilize simultaneous phase-shifting interferometry to measure the method and apparatus of laser pulse width and relative phase
Technical field
The present invention relates to a kind of method and apparatus that utilizes simultaneous phase-shifting interferometry to measure laser pulse pulsewidth and relative phase, can measure particularly the pulse width of psec, femtosecond and Ah second's ultrashort laser pulse and measure the relative phase delay amount of the two-beam pulse after beam of laser pulse light splitting.
Background technology
20th century the mid-80, Ultra Short Laser Pulse Technology has obtained develop rapidly, has entered the femtosecond stage from psec.Ultrashort pulse technology is widely used in studying the physical behavio(u)r under various ultrafast phenomenas and high field, as the metabolism of the relaxation process of molecule, biological cell, Chemical Kinetics, fast ignition laser fusion, table top nuclear physics etc.Make a general survey of the developing history of ultrashort pulse generation technology, its development progressive and measuring technique be unable to do without, therefore the new technology that research and probe femtosecond and even Ah wonderful's laser pulse are measured, width, phase place and the shape information of pulse understood on complete and accurate ground, is very important content in ultrafast technology.
As, in ultrafast pump-detection experiment, a branch of laser from laser emitting is divided into two bundles by beam splitter: a branch of as pump light, act on target to be detected, and produce physicochemical change; Another Shu Zuowei surveys light, is applied in target to be detected, to survey the variation of related physical quantity after time delay line time delay again.And in this experiment, how to measure in real time the relative phase of pumping pulse and direct impulse and the pulsewidth of monitoring pulse, be the key factor of ultrafast pump-detection experiment resolving accuracy.Only have pulsewidth and the relative phase of real-time monitoring pulse, could realize the accurate control to ultrafast process.
The technology of existing measurement ultrashort pulse pulsewidth and position phase comprises pulse autocorrelation technique (comprise intensity auto-correlation and interfere auto-correlation), frequency resolved optical gating (Frequency-resolved Optical Grating, FROG), relevant electric field reconstruction method (the Self-referencing Spectral Phase Interferometry for Direct Electric Reconstruction in self-reference spectrum position, SPIDER) etc., these technology all belong to the indirect method of measurement.Because the technology of existing measurement pulsewidth and relative phase all needs to apply the nonlinear effect of nonlinear crystal, when the very narrow non-linear hour effect of pulsewidth is difficult to guarantee good efficiency, so even pulsewidth and the phase place of chirped pulse are extremely difficult for measuring several femtoseconds.
Summary of the invention
In order to overcome the drawback of utilizing nonlinear crystal indirectly to measure pulsewidth and phase place, the invention provides a kind of technology that can directly measure pulsewidth and relative phase easy to use, easy to manufacture.It adopts combined prism to carry out beam splitting to light beam, once gathers multi-frame interferometry bar graph in conjunction with the method for polarization interference in spatial domain simultaneously.By to the real-time monitored of multipath interference field and the light intensity meter calculation and Analysis that obtains interference fringe picture, can obtain pulsewidth and the relative phase of ultrashort pulse.This technology, because directly using interference technique to measure, is not used nonlinear crystal, therefore can measure the very narrow femtosecond pulse of pulsewidth and chirped pulse.
The method of light splitting in the present invention, simultaneous phase-shifting and imaging, to form four road interference fields as example: incident light pulse is beamed into pulse 1 and pulse 2 through beam splitter prism.Pulse 1 projects on semi-transparent semi-reflecting prism 5 after right angle total reflective mirror 3; Pulse 2 projects on semi-transparent semi-reflecting prism 5 after quarter-wave plate 4.Although pulse 3 directions of propagation of the pulse 1 of reflecting via semi-transparent semi-reflecting prism 5 and transmission are consistent, polarizability difference, the synthetic light beam of composition forms interference field #1 and #2 after polarization splitting prism 8.The synthetic light beam forming via the pulse 1 of semi-transparent semi-reflecting prism 5 transmissions and the pulse 2 of reflection forms interference field #3 and #4 after polarization splitting prism 10.Can obtain four width interference fringe pictures with crossing these four interference fields.
Based on the measuring method of above-mentioned formation four road interference fields, the multipath interference fields such as the extendible formation of this patent method six tunnels, eight tunnels.Four tunnels extend to six road interference fields: the triangular prism in four road interference fields is replaced as semi-transparent semi-reflecting prism 6, can form interference field #5 and #6 through the new polarization phase-shifting unit being formed by polarization splitting prism and triangular prism again from the synthetic light beam of this semi-transparent semi-reflecting prism outgoing, so just form Liao Liu road interference field.In like manner, on the basis of Liu road interference field, by with semi-transparent semi-reflecting beam splitter prism displacement triangular prism, add new polarization phase-shifting unit and can expand to the multipath interference fields such as eight tunnels.
In the present invention, measure the method for pulsewidth and relative phase: by the real-time monitored of multipath interference field and to obtaining the light intensity meter calculation and Analysis of interference fringe picture, obtain pulsewidth and the relative phase of ultrashort pulse.Yi Si road interference field is example: laser pulse is beamed into 1 and 2 two pulses after semi-transparent semi-reflecting prismatic action, and pulse 1 after the effect of time delay line, forms four road interference field: #1, #2, #3, #4 by pulse scan mode and pulse 2 again.Utilize the time width of distribution and the pulse of spacing measure of the change of fringe intensity in interference field; Utilize the intensity level I of four road interference lights 1, I 2, I 3, I 4determine the relative phase of two-beam
Figure GDA0000425644230000031
it meets relation:
The polarization direction of the quick shaft direction of quarter-wave plate 4 and pulse 1 and 2 differs 45 degree.
The catoptrical electric vector direction of polarization splitting prism and the pulse 1 of incident and the polarization direction of pulse 2 differ 45 degree.
The inventive method and device, method is simple, and principle is clear, and device is compact, is easy to use.In device, each several part device easily obtains, and can reach very high precision, can effectively reduce experimental error.The Dynamic High-accuracy of using this device can realize arteries and veins ultrashort laser pulse pulsewidth and relative phase difference is measured.
Accompanying drawing explanation
Fig. 1 is that the four tunnel simultaneous phase-shifting interferometries that utilize that the present invention proposes are measured light path and the structural representation of light splitting, simultaneous phase-shifting and the imaging device of ultrashort laser pulse pulsewidth and relative phase
In Fig. 1: 1: the first beam pulse of incident, 2: another beam pulse of incident, 4: quarter-wave plate, 3,6,7,9,11 and 13: right angle total reflective mirror, 5: semi-transparent semi-reflecting prism, 8,10 and 12: polarization splitting prism, #1, #2, #3, #4,, #n+1: be respectively n+1 the interference field obtaining
Fig. 2 is light path and the structural representation of the basic polarization phase-shifting unit of Tu1Zhong n+1 road interference field
In Fig. 2: 1: semi-transparent semi-reflecting prism, 2: polarization splitting prism, 3: right angle total reflective mirror
Embodiment
Below in conjunction with drawings and Examples, detailed description realizes the proposed by the invention simultaneous phase-shifting interferometry that utilizes and measures the pulsewidth of ultrashort pulse and the method for relative phase.
Embodiment: as shown in Figure 1: first ultrashort pulse to be measured is divided into two bundles through beam splitter prism, a branch of as the pulse 1 in Fig. 1 light path, a branch of as the pulse 2 in Fig. 1 light path.Utilize the relative phase of the pulsewidth that this measuring method can ranging pulse 1 and 2.
Pulse 1 utilizes scan mode and pulse 2 effects to form interference field: #1, #2, #3, #4 ..., #n+1.
First interference field #1: pulse 1 is reflected by semi-transparent semi-reflecting prism 5 after 3 reflections of right angle total reflective mirror; Pulse 2 becomes circularly polarized light after quarter-wave plate 4, this circularly polarized light again after semi-transparent semi-reflecting prism 5 transmissions with the reflected light of semi-transparent semi-reflecting prism 5---the synthetic light beam of pulse 1 composition, this synthetic light beam forms interference field #1 after polarization splitting prism 8 and 7 reflections of right angle total reflective mirror, utilizes detector collection can obtain the first width interference fringe picture.
Second interference field #2: pulse 1 is reflected by semi-transparent semi-reflecting prism 5 after 3 reflections of right angle total reflective mirror; Pulse 2 becomes circularly polarized light after quarter-wave plate 4, this circularly polarized light again after semi-transparent semi-reflecting prism 5 transmissions with the reflected light of semi-transparent semi-reflecting prism 5---the synthetic light beam of pulse 1 composition, this synthetic light beam forms interference field #2 after polarization splitting prism 8 transmissions, utilizes detector collection can obtain the second width interference fringe picture.
The 3rd interference field #3: pulse 1 after right angle total reflective mirror 3 reflection by semi-transparent semi-reflecting prism 5 transmissions; Pulse 2 becomes circularly polarized light after quarter-wave plate 4, this circularly polarized light is reflected and the transmitted light of semi-transparent semi-reflecting prism 5 by semi-transparent semi-reflecting prism 5 again---the synthetic light beam of pulse 1 composition, this synthetic light beam forms interference field #3 after semi-transparent semi-reflecting prism 6, polarization splitting prism 10 and 9 reflections of right angle total reflective mirror, utilizes detector collection can obtain the 3rd width interference fringe picture.
The 4th interference field #4: pulse 1 after right angle total reflective mirror 3 reflection by semi-transparent semi-reflecting prism 5 transmissions; Pulse 2 becomes circularly polarized light after quarter-wave plate 4, this circularly polarized light is reflected and the transmitted light of semi-transparent semi-reflecting prism 5 by semi-transparent semi-reflecting prism 5 again---the synthetic light beam of pulse 1 composition, this synthetic light beam forms interference field #4 respectively after semi-transparent semi-reflecting prism 6 and polarization splitting prism 10 reflections and transmission, utilizes detector collection can obtain the 4th width interference fringe picture.
In like manner, can obtain the 5th, the 6th ..., n+1 interference field.
By analyzing the variation of light intensity value and the variation of speckle pattern interferometry spacing of interference fringe in n+1 interference field, can obtain the pulse width information of ultrashort pulse to be measured; Interference light intensity value by the n+1 width interference fringe picture that obtains can directly be calculated the relative phase obtaining between pulse 1 and pulse 2.
Yi Si road interference field is example: four road interference fields need be replaced as right angle total reflective mirror 6 by semi-transparent semi-reflecting lens 6.Laser pulse is beamed into 1 and 2 two pulses after semi-transparent semi-reflecting prismatic action, and pulse 1 after the effect of time delay line, forms four road interference field: #1, #2, #3, #4 by pulse scan mode and pulse 2 again.Utilize the time width of distribution and the pulse of spacing measure of the change of fringe intensity in interference field; Utilize the intensity level I of four road interference lights 1, I 2, I 3, I 4determine the relative phase of two-beam
Figure GDA0000425644230000061
it meets relation:
Figure GDA0000425644230000062

Claims (1)

1. a method of utilizing simultaneous phase-shifting interferometric method to measure laser pulse width and relative phase, it is characterized in that: comprising: 1) light pulse generates two-beam pulse through beam splitter prism beam splitting, described two-beam pulse is scanning impulse (1) and is scanned pulse (2), wherein scanning impulse (1) after the effect of time regulatable lag line be scanned pulse (2) and stagger in time a pulsewidth time interval, by regulating time delay line to make scanning impulse (1) scan and produce simultaneous phase-shifting interference being scanned pulse (2); 2) utilize the light intensity of interference fringe picture and the variation of fringe spacing reckoning acquisition pulse width information in the multipath interference field obtaining; 3) utilize the interference light intensity value in the interference fringe picture obtaining to calculate the relative phase information that obtains two pulses;
Realize the light path of multichannel light splitting, simultaneous phase-shifting and imaging: after the delayed line of scanning impulse (1) regulates, form n+1 road interference field with scan mode with being scanned pulse (2) effect, wherein n is odd number; Scanning impulse (1) is reflected by semi-transparent semi-reflecting prism (5) after the first right angle total reflective mirror (3) reflection, be scanned pulse (2) and become circularly polarized light after quarter-wave plate (4), this circularly polarized light synthesizes light beam with scanning impulse (1) through the reflected light composition of semi-transparent semi-reflecting prism (5) after semi-transparent semi-reflecting prism (5) transmission, and this synthetic light beam forms the first interference field after polarization splitting prism (8) and the reflection of the second right angle total reflective mirror (7); Scanning impulse (1) is reflected by semi-transparent semi-reflecting prism (5) after the first right angle total reflective mirror (3) reflection, be scanned pulse (2) and become circularly polarized light after quarter-wave plate (4), this circularly polarized light synthesizes light beam with scanning impulse (1) through the reflected light composition of semi-transparent semi-reflecting prism (5) after semi-transparent semi-reflecting prism (5) transmission, and this synthetic light beam forms the second interference field after polarization splitting prism (8) transmission; scanning impulse (1) after the first right angle total reflective mirror (3) reflection by semi-transparent semi-reflecting prism transmission after be scanned pulse (2) after quarter-wave plate (4) becomes circularly polarized light after semi-transparent semi-reflecting prism (5) reflection the synthetic light beam of formation as the incident light of multistage basic polarization phase-shifting unit, the each basic polarization phase-shifting unit of described multistage basic polarization phase-shifting unit is by semi-transparent semi-reflecting lens, polarization splitting prism and right angle total reflective mirror composition, wherein form an interference field through the light of semi-transparent semi-reflecting prismatic reflection through polarization splitting prism transmission, light after polarization splitting prism reflection reflects to form another interference field through right angle total reflective mirror again, and the incident light of every grade of basic polarization phase-shifting unit after the semi-transparent semi-reflecting prism transmission of this basic polarization phase-shifting unit as the emergent light of this polarization phase-shifting unit, in this multistage basic polarization phase-shifting unit, the afterbody emergent light of the basic polarization phase-shifting unit of afterbody reflects to form n interference field through right angle total reflective mirror again after corner cube mirror and polarization splitting prism reflection, described afterbody emergent light forms n+1 interference field after corner cube mirror reflection after polarization splitting prism transmission, the interference field that gathers all formation by detector obtains n+1 width interference fringe picture.
CN201110027568.9A 2011-01-25 2011-01-25 Method and device for measuring laser pulse width and relative phase by simultaneous phase-shifting interferometry Expired - Fee Related CN102175333B (en)

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CN102538987B (en) * 2011-12-14 2013-11-06 北京大学 Method for measuring attosecond X-ray pulses and application of method
CN102680115A (en) * 2012-04-18 2012-09-19 安徽三联事故预防研究所 Device and method for measuring plasma generated by delayed double-pulse laser
CN103364090B (en) * 2013-07-22 2015-10-21 北京工业大学 Measure the device and method that ultra-short pulse laser propagates phase velocity in media as well
CN107036714B (en) * 2017-04-25 2019-02-12 深圳大学 A kind of spectrum phase interference apparatus and system
CN108760058B (en) * 2018-04-17 2020-01-17 厦门大学 Method and device for measuring ultra-short laser pulse width
CN112180537B (en) * 2020-09-28 2021-08-10 北京大学 Array mirror frame for measuring ultrafast optical signal

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* Cited by examiner, † Cited by third party
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US5815266A (en) * 1996-11-15 1998-09-29 Litton Systems, Inc. Sensing method and apparatus
EP1796228A1 (en) * 2004-08-20 2007-06-13 Mitsubishi Denki Kabushiki Kaisha Laser phase difference detector and laser phase controller
CN101776488A (en) * 2010-01-21 2010-07-14 北京工业大学 Method for measuring optical phase by using synchronous phase-shifting interference method and implementing light path

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5815266A (en) * 1996-11-15 1998-09-29 Litton Systems, Inc. Sensing method and apparatus
EP1796228A1 (en) * 2004-08-20 2007-06-13 Mitsubishi Denki Kabushiki Kaisha Laser phase difference detector and laser phase controller
CN101776488A (en) * 2010-01-21 2010-07-14 北京工业大学 Method for measuring optical phase by using synchronous phase-shifting interference method and implementing light path

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