CN1978191B - 一种具有多层镀膜的模具 - Google Patents

一种具有多层镀膜的模具 Download PDF

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CN1978191B
CN1978191B CN200510102017A CN200510102017A CN1978191B CN 1978191 B CN1978191 B CN 1978191B CN 200510102017 A CN200510102017 A CN 200510102017A CN 200510102017 A CN200510102017 A CN 200510102017A CN 1978191 B CN1978191 B CN 1978191B
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layer
mould
carbon
chromium
multicoating
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CN1978191A (zh
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陈杰良
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Hongfujin Precision Industry Shenzhen Co Ltd
Hon Hai Precision Industry Co Ltd
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Hongfujin Precision Industry Shenzhen Co Ltd
Hon Hai Precision Industry Co Ltd
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Abstract

本发明提供一种具有多层镀膜的模具,其包括一基材,以及在该基材上依次形成的一铬层或硅化铬层,一硅层,一碳化硅层,一碳化硅与碳的组合层及一含氢类金刚石碳层。本发明通过在基材上形成一铬层或硅化铬层以及一硅层,可增强后续镀层与基材的附着性;最外层选用含氢类金刚石碳材,可有效增强模具的脱膜性;另,碳化硅具有较强的硬度,中间采用一碳化硅层及一碳化硅与碳的组合层,可增强模具的耐磨性。

Description

一种具有多层镀膜的模具
【技术领域】
本发明涉及一种模具,尤其是一种具有多层镀膜的模具。
【背景技术】
随着社会发展,科技进步,人们对于模具的性能要求愈来愈高。但是,通常模具基材一般难以满足较高综合性能的要求,因此往往需采用表面处理技术在模具基材表面镀上一些修饰材料,以便于在一定程度上弥补模具基材本身的不足。
近年来,在科学技术快速发展的推动下,表面处理技术中出现了一种类金刚石碳镀层。类金刚石碳是在结构中混合了SP2石墨平面键结与SP3四面体钻石共价键结的非晶态碳。类金刚石碳中的SP2键结的石墨组织,层与层之间以微弱的范德华键键结,导致层与层间极易滑动,可使类金刚石碳镀层具有低摩擦系数与润滑等效果,具有较好的脱膜性。
由于类金刚石碳具有良好的镀层性能,在模具表面处理技术中应用较多。目前,通常采用单层纯类金刚石碳镀层来改善模具性能,而当类金刚石碳镀膜厚度太厚时,会产生较大内应力,使其与基材附着性不佳,易脱落;厚度太薄时,容易使基材元素扩散至保护膜表层,导致类金刚石碳镀膜变色而与基材发生反应,丧失其脱膜性。
有鉴于此,提供一种与基材附着性强,且脱膜性佳的镀膜模具实为必需。
【发明内容】
下面将以具体实施例说明一种与基材附着性强,且脱膜性佳的镀膜模具。
一种具有多层镀膜的模具,包括一基材,以及在该基材上依次形成的一铬层或硅化铬层,一硅层,一碳化硅层,一碳化硅与碳的组合层及一含氢类金刚石碳层。
与现有技术相比,所述具有多层镀膜的模具,通过在基材上形成一铬层或硅化铬层以及一硅层,可增强后续镀层与基材的附着性;最外层选用含氢类金刚石碳材,可有效增强模具的脱膜性;另,碳化硅具有较强的硬度,中间采用一碳化硅层及一碳化硅与碳的组合层,可增强模具的耐磨性。
【附图说明】
图1是本实施例所提供的具有多层镀膜的模具示意图。
图2是本实施例中形成该具有多层镀膜的模具的装置示意图。
【具体实施方式】
下面将结合附图对本发明实施例作进一步的详细说明。
请参见图1,一种具有多层镀膜的模具100,包括:一基材110,以及一铬层或硅化铬层120,一硅层130,一碳化硅层140,一碳化硅与碳的组合层150及一含氢类金刚石碳层160。
其中,该基材110的材质为不锈钢,如铁碳铬合金、铁碳铬钼合金、铁碳铬硅合金、铁碳铬镍钼合金、铁碳铬镍钛合金、铁碳铬钨锰合金、铁碳铬钨钒合金、铁碳铬钼钒合金或铁碳铬钼钒硅合金等。
该铬层或硅化铬层120的厚度范围为2~8纳米,优选为4~6纳米。
该硅层130的厚度范围也为2~8纳米,优选为4~6纳米。
设置该铬层或硅化铬层120的目的在于增加后续镀层与基材110的附着性。
所述碳化硅层140及碳化硅与碳的组合层150的厚度范围均为20~100纳米,优选均为40~80纳米。
所述含氢类金刚石碳层160的厚度范围为20~3000纳米,优选为100~2000纳米。
结合图2,提供一溅镀装置200,该溅镀装置200具有一密封腔室210,该密封腔室210内设置有一底座212,其可自由旋转,一基材110设置于该底座212上,其可随底座212一起旋转,亦可自转。腔室210内与该底座212相对的位置设置有一可旋转的固定装置214,其上固定有一第一靶材222,一第二靶材232以及一第三靶材242。其中,该第一靶材222的材质可选用铬或硅化铬,第二靶材232的材质可选用硅或碳化硅,第三靶材242为石墨。
射频电源224、234、244的负极分别与该第一靶材222、第二靶材232及第三靶材242连接,射频电源224、234、244的正极均连接基材110。射频电源224、234、244的工作频率均为13.56百万赫兹。一偏置电源250设置于底座212的一端,在底座212上施加一负偏压,以加速正离子向基材110的沉积速度。偏置电源250可为直流或交流电源,本实施例中采用交流电源,其频率为20~800千赫,优选为40~400千赫,其电压为-100~-30伏,优选为-60~-40伏。
由于溅镀时腔室210内需充有工作气体,工作气体通常为不与靶材、基材110以及后续形成的镀膜发生反应的惰性气体,该惰性气体可选用氩气或氪气。当然,根据待镀膜层的需要,工作气体可为上述惰性气体与其它气体的混合气体,为此,该腔室210设置有一抽气口260,一气体输入口270。
制作上述具有多层镀膜的模具100包括以下步骤:
在基材110上形成一铬层或硅化铬层120。具体步骤为:首先,从抽气口260将腔室210抽为真空后,从气体输入口270向腔室210内充入氩气或氪气,开启射频电源224,射频电源234、244均处于关闭状态,旋转固定装置214或底座212,使第一靶材222处于与基材110垂直相对的位置,在第一靶材222与作为阳极的底座212之间发生辉光放电,由于氩气分子在射频电源224作用下会被离子化为带正电荷的氩离子,在电场作用下,氩离子向负极即第一靶材222方向加速运动,并不断撞击第一靶材222的表面,氩离子的动能转移至靶材原子,当靶材原子获得足够动能后,便脱离第一靶材222的表面而沉积在基材110上形成该铬层或硅化铬层120。该溅镀过程中,基材110可进行自转,以便在基材110表面溅镀上比较均匀的铬层或硅化铬层120。该自转速度可为10~200转/分钟,优选为20~80转/分钟。且控制溅镀时间,使沉积在基材110上的铬层或硅化铬层120的厚度为2~8纳米,优选为4~6纳米。
在铬层或硅化铬层120上形成一硅层130。与形成铬层或硅化铬层120原理类似,同样使用溅镀装置200,开启射频电源234,关闭射频电源224,244处于关闭状态,旋转固定装置214或底座212,使第二靶材232处于与基材110垂直相对的位置,在第二靶材232与作为阳极的底座212之间发生辉光放电,从而在铬层或硅化铬层120上形成一硅层130,本步骤中第二靶材232的材质采用硅。该溅镀过程中,基材110可进行自转,以便在铬层或硅化铬层120表面溅镀上比较均匀的硅层130。该自转速度可为10~200转/分钟,优选为20~80转/分钟。且控制溅镀时间,使沉积在铬层或硅化铬层120上的硅层130的厚度为2~8纳米,优选为4~6纳米。
在硅层130上形成碳化硅层140。与形成硅层130原理类似,同样使用溅镀装置200,不同之处是:本步骤中第二靶材232的材质采用碳化硅。射频电源234处于开启状态,射频电源224、244均处于关闭状态,旋转固定装置214或底座212,使第二靶材232处于与基材110垂直相对的位置,在第二靶材232与作为阳极的底座212之间发生辉光放电,从而于硅层130上形成一碳化硅层140。该溅镀过程中,基材110可进行自转,以便在硅层130表面溅镀上比较均匀的碳化硅层140。该自转速度可为10~200转/分钟,优选为20~80转/分钟。且控制溅镀时间,使碳化硅层140的厚度为20~100纳米,优选为40~80纳米。
在碳化硅层140上形成一碳化硅与碳的组合层150。与形成碳化硅层140原理类似,同样使用溅镀装置200,不同之处是:本步骤采用第二靶材232及第三靶材242共同溅镀。射频电源234处于开启状态,并开启射频电源244,射频电源224处于关闭状态,即,以第二靶材232与第三靶材242作为阴极,在第二靶材232、第三靶材242与底座212之间进行辉光放电,从而在碳化硅层140上形成一碳化硅与碳的组合层150。该溅镀过程中,基材110可进行自转,以便在碳化硅层140表面溅镀上比较均匀的碳化硅与碳的组合层150。该自转速度可为10~200转/分钟,优选为20~80转/分钟。且控制溅镀时间,使该碳化硅与碳的组合层150的厚度为20~100纳米,优选为40~80纳米。
在碳化硅与碳的组合层150上形成一含氢类金刚石碳层160。与形成组合层150原理类似,同样使用溅镀装置200,不同之处是:保持腔室210内的压力条件下,从抽气口260将腔室210抽真空,再从气体输入口270向腔室210中输入一定比例的氢气与氩气的混合气体,该比例满足条件:氢气在混合气体中的体积比为5~20%。当然,也可以输入氢气与氪气的混合气体,甲烷与氩气的混合气体或甲烷与氪气的混合气体,其中,氢气与甲烷在其混合气体中所占的体积比5~20%。射频电源244处于开启状态,射频电源224处于关闭状态,将射频电源234关闭,即,以第三靶材242作为阴极,且第三靶材242处于与基材110垂直相对的位置,在第三靶材242与底座212之间进行辉光放电,从而在碳化硅与碳的组合层150上形成一含氢类金刚石碳层160。该溅镀过程中,基材110可进行自转,以便在碳化硅与碳的组合层150表面溅镀上比较均匀的含氢类金刚石碳层160。该自转速度可为10~200转/分钟,优选为20~80转/分钟。且控制溅镀时间,使该含氢类金刚石碳层160的厚度为20~3000纳米,优选为100~2000纳米。
经过上述制程,最终得到在基材110上形成有一铬层或硅化铬层120,一硅层130,一碳化硅层140,一碳化硅与碳的组合层150,以及一含氢类金刚石碳层160的具有多层镀膜的模具100。
本实施例所提供的具有多层镀膜的模具100通过在基材110上形成一铬层或硅化铬层120以及一硅层130,可增强后续镀层与基材110的附着性;最外层选用含氢类金刚石碳材,可有效增强模具100的脱膜性;另,碳化硅具有较强的硬度,中间采用一碳化硅层140及一碳化硅与碳的组合层150,可增强模具100的耐磨性。

Claims (10)

1.一种具有多层镀膜的模具,包括一基材,其特征在于,该模具还包括在该基材上依次形成的一铬层或硅化铬层,一硅层,一碳化硅层,一碳化硅与碳的组合层以及一含氢类金刚石碳层。
2.如权利要求1所述具有多层镀膜的模具,其特征在于,所述基材的材质选自铁碳铬合金、铁碳铬钼合金、铁碳铬硅合金、铁碳铬镍钼合金、铁碳铬镍钛合金、铁碳铬钨锰合金、铁碳铬钨钒合金、铁碳铬钼钒合金以及铁碳铬钼钒硅合金。
3.如权利要求1所述具有多层镀膜的模具,其特征在于,所述铬层或硅化铬层的厚度范围为2~8纳米。
4.如权利要求3所述具有多层镀膜的模具,其特征在于,所述铬层或硅化铬层的厚度范围为4~6纳米。
5.如权利要求1所述具有多层镀膜的模具,其特征在于,所述硅层的厚度范围为2~8纳米。
6.如权利要求5所述具有多层镀膜的模具,其特征在于,所述硅层的厚度范围为4~6纳米。
7.如权利要求1所述具有多层镀膜的模具,其特征在于,所述碳化硅层及碳化硅与碳的组合层的厚度范围均为20~100纳米。
8.如权利要求7所述具有多层镀膜的模具,其特征在于,所述碳化硅层及碳化硅与碳的组合层的厚度范围均为40~80纳米。
9.如权利要求1所述具有多层镀膜的模具,其特征在于,所述含氢类金刚石碳层的厚度范围为20~3000纳米。
10.如权利要求9所述具有多层镀膜的模具,其特征在于,所述含氢类金刚石碳层的厚度范围为100~2000纳米。
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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1294545A (zh) * 1999-03-08 2001-05-09 时至准钟表股份有限公司 树脂成型用金属模及树脂成型用金属模形成硬质覆膜的方法
CN1541960A (zh) * 2003-04-28 2004-11-03 鸿富锦精密工业(深圳)有限公司 一种用于制造光学玻璃产品的模具及该模具的制造方法

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Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1294545A (zh) * 1999-03-08 2001-05-09 时至准钟表股份有限公司 树脂成型用金属模及树脂成型用金属模形成硬质覆膜的方法
CN1541960A (zh) * 2003-04-28 2004-11-03 鸿富锦精密工业(深圳)有限公司 一种用于制造光学玻璃产品的模具及该模具的制造方法

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