CN1937871A - Detection and repair system and method - Google Patents
Detection and repair system and method Download PDFInfo
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- CN1937871A CN1937871A CN 200510104964 CN200510104964A CN1937871A CN 1937871 A CN1937871 A CN 1937871A CN 200510104964 CN200510104964 CN 200510104964 CN 200510104964 A CN200510104964 A CN 200510104964A CN 1937871 A CN1937871 A CN 1937871A
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Abstract
The invention relates to an inspection recovery system and the method. The detection recovery system, which is used in organic light emitting devices applied in the organic luminous device including a ranger, a processing controller, a detector and a high-energy beam generator. Among them, the rangefinder automatically detects the position of the organic luminous device; the controller generates the first control signal according to the detecting result of the range finder to adjust relative position of the detectors and organic luminous device automatically; the detector detects the defect position of the organic luminous device, the processing controller generates the second controlling signal for place based on the detected defect position information; the high-energy beam generator based on the second controlling signal generates a high-energy beam which focuses on the defect position to isolate it. Furthermore, the invention also provides inspection recovery method applied in above device.
Description
Technical field
The present invention relates to a kind of detection repair system and detect restorative procedure, particularly relate to a kind of detection repair system and detection restorative procedure in order to detect the defective of repairing an organic luminous panel or organic light emission spare.
Background technology
The various communications that the information communication industry has become now main flow industry, particularly portable show the emphasis that product develops especially.And because flat-panel screens is communication interface between people and the information, so its development particular importance that seems.The technology that is applied in flat-panel screens at present includes plasma display panel (Plasma Display), LCD (Liquid Crystal Display), inorganic electroluminescence display (Inorganic Electroluminescence Display), light-emitting diode (LightEmitting Diode), vacuum fluorescent display (Vacuum Fluorescence Display), field-emitter display (Field Emission Display) and electrochromics display (Electro-Chromic Display) or the like.
Compared to other flat-panel screens, organic luminous panel or organic illuminating element (below be generically and collectively referred to as organic light emitting apparatus) with its self-luminous, no visual angle, power saving, processing procedure is simple and easy, low-cost, operating temperature is extensive, the advantage of high answer speed and full-colorization or the like, make it have great shallow power, therefore be expected to become the main flow of flat-panel screens of future generation.
Organic light emitting apparatus is the product that a kind of self luminous characteristic of utilizing organic functional material (organic functionalmaterials) reaches display effect, molecular weight difference according to the organic functional material, it can be divided into micromolecule organic light emitting apparatus (small molecule OLED, SM-OLED) with macromolecule organic light emitting apparatus (polymer light-emitting device, PLED) two big classes.Its ray structure is made of the organic functional material layer of pair of electrodes and between electrode.When electric current by between two electrodes, make electronics and electric hole can be in the organic functional material layer again in conjunction with and when producing exciton, just can make the organic functional material layer according to its material behavior, and produce the mechanism of giving out light of different colours.
When making organic light emitting apparatus, if when having a little particulate to be attached to substrate to be coated surperficial, it is unusual to make behind the plated film pixel surface of formed organic light emitting apparatus produce film stack, even cause two interelectrode short circuit phenomenon of the pixel of organic light emitting apparatus, cause the brightness variation of device integral body and make the quality of organic light emitting apparatus and reliability influenced, therefore, for guaranteeing the product turnout quality, the detection of organic light emitting apparatus and reparation are to be very important important topic.
For addressing the above problem, the reparation board that the dealer can utilize a detection board and with light microscope to have the high-energy light beam guiding generator usually carries out the detection and the reparation of organic light emitting apparatus.
From the above, whether the existing known detection mode pixel of utilizing a detection board with light microscope to inspect an organic light emitting apparatus in the mode of scanning exists defective and the defective position of being inspected out is located.Again defective organic light emitting apparatus is moved to reparation board afterwards and make defect repair with high-energy light beam guiding generator, it repairs principle is to utilize the high-energy light beam guiding generator that the defective that is detected is shone with high-energy light beam guiding, so that defective is done contactless completely cutting off.
With regard to above-mentioned detection, repair mode, after there is defective in the pixel that detects organic light emitting apparatus, must again organic light emitting apparatus self-test board be moved to the reparation board, so that carry out repair action.Yet, on actual job, after organic light-emitting device self-test board moves on the reparation board, and can't make repair action at the defective of organic light emitting apparatus immediately, but must again defective locations be remake once search, locate after, the beginning can start and repairs one by one at the defective locations that is detected.
In addition; though being attached to the particulate of substrate surface to be coated, can to cause organic light emitting apparatus behind the plated film to produce film stack unusual; even cause two interelectrode short circuit phenomenon of the picture element of organic light emitting apparatus; but; when fine-grained particles is minimum, unusual slightly even organic light emitting apparatus produces film stack, still can not cause two interelectrode short circuits of the picture element of organic light emitting apparatus; this type of defective in fact can be ignored in actual utilization, must not repair.Yet in the existing known detection mode, it is the defective of utilizing light microscope to inspect organic light emitting apparatus in the mode of scanning, the method also can't judge whether the defective of being inspected will cause two interelectrode short circuits, therefore when repairing phase, all detected defectives must be repaired one by one, in other words, if with prior art with all defectives that exist all through an one scan, location, the step that scans again, relocate, repair, then will cause expending of cost on the processing procedure.
From the above, the defective that how to detect efficiently, repair organic light emitting apparatus is one of problem important in the current organic light emitting apparatus production.
Summary of the invention
The objective of the invention is to, a kind of new detection repair system is provided and detects restorative procedure, technical problem to be solved is to make its defective that can detect efficiently, repair organic light emitting apparatus, thereby is suitable for practicality more.
Edge is for reaching above-mentioned purpose, to be to be applied to organic light emitting apparatus (device) according to detection repair system of the present invention, and to comprise a rangefinder, a processing controller, a detector and a high-energy light beam guiding generator.In the present invention, rangefinder is the position in order to the Auto-Sensing organic light emitting apparatus; Processing controller is to link with rangefinder, and produces one first control signal in order to the detecting result of foundation rangefinder, so that the relative position of automatic adjustment-detector and organic light emitting apparatus; Detector is at least one defective locations of detecting organic light emitting apparatus, and processing controller is to produce one second control signal according to the defective locations data that is detected; The high-energy light beam guiding generator is to link with processing controller, and produces a high-energy light beam guiding according to second control signal, and it is to focus on defective locations with the isolate defects position.
The present invention also discloses a kind of detection restorative procedure in addition, and it is to be applied to organic light emitting apparatus, and may further comprise the steps: the position that utilizes a rangefinder Auto-Sensing organic light emitting apparatus; Utilize a processing controller that links with rangefinder to produce one first control signal with the detecting result of foundation rangefinder; Automatically adjust the relative position of a detector and organic light emitting apparatus according to first control signal; The zone to be detected of organic light emitting apparatus is passed to a bias voltage; Utilize at least one defective locations of detector detecting organic light emitting apparatus; The defective locations that foundation is detected is in order to produce one second control signal with processing controller; And utilize a high-energy light beam guiding generator and focus on the high-energy light beam guiding of defective locations according to second control signal, so that a certain defective locations is isolated.
Moreover the present invention more proposes the another kind of repair system that detects, and uses organic light emitting apparatus (device), comprises a processing controller, a detector and a high-energy light beam guiding generator.In the present invention, processing controller is the position according to organic light emitting apparatus, produces one first control signal; Detector is at least one defective locations of detecting organic light emitting apparatus, and processing controller is to produce one second control signal according to the defective locations data that is detected; The high-energy light beam guiding generator is to link with processing controller, and produces a high-energy light beam guiding according to second control signal, and it is to focus on defective locations with the isolate defects position.
From the above, because of according to detection repair system of the present invention and to detect restorative procedure be when the detecting defective locations, utilize rangefinder and processing controller to adjust the relative position of organic light emitting apparatus and detector automatically earlier, zone to be detected with organic light emitting apparatus passes to bias voltage again, and utilizes detector to detect defective locations (as producing the defective locations of low-light phenomenon); Then utilize high-energy light beam guiding that defective locations is isolated, therefore needn't use two kinds of boards to finish detection, repair, and can locate organic light emitting apparatus automatically, to reduce issuable mistake of manual operation and waste of manpower resource.Therefore, the defective that can detect efficiently, repair organic light emitting apparatus according to detection repair system of the present invention and detection restorative procedure.
Through as can be known above-mentioned, the invention relates to a kind of detection repair system and detect restorative procedure.This detects repair system, and it is to be applied to organic light emitting apparatus (device), comprises a rangefinder, a processing controller, a detector and a high-energy light beam guiding generator.Wherein, the position of rangefinder Auto-Sensing organic light emitting apparatus; Processing controller produces one first control signal according to the detecting result of rangefinder, with the relative position of automatic adjustment detector and organic light emitting apparatus; The defective locations of detector detecting organic light emitting apparatus, and processing controller produces one second control signal contraposition according to the defective locations data that is detected; The high-energy light beam guiding generator produces a high-energy light beam guiding according to second control signal, and it is to focus on defective locations with the isolate defects position.In addition, the present invention also provides a kind of detection restorative procedure that is applied to above-mentioned detection prosthetic device.
Above-mentioned explanation only is the general introduction of technical solution of the present invention, for can clearer understanding technological means of the present invention, and can be implemented according to the content of specification, and for above-mentioned and other purposes, feature and advantage of the present invention can be become apparent, below especially exemplified by preferred embodiment, and conjunction with figs., describe in detail as.
Description of drawings
Fig. 1 is a schematic diagram, shows the schematic diagram according to the detection repair system of preferred embodiment of the present invention.
Fig. 2 is a schematic diagram, shows the schematic diagram of detection repair system as shown in Figure 1, and wherein the distance of organic light emitting apparatus and high-energy light beam guiding generator is to be adjusted into suitable distance.
Fig. 3 is a flow chart, shows the flow process according to the detection restorative procedure of preferred embodiment of the present invention.
1: detect repair system 11: rangefinder
13: processing controller 131: display
15: detector 17: the high-energy light beam guiding generator
19: carrying platform 191: power suppling part
193: positive power terminal 195: negative power source terminal
3: organic light emitting apparatus 31: defective locations
Di: initial range D2: suitable distance
S01～S07: the step that detects restorative procedure
Embodiment
Reach technological means and the effect that predetermined goal of the invention is taked for further setting forth the present invention, below in conjunction with accompanying drawing and preferred embodiment, detection repair system and its embodiment of detection restorative procedure, structure, method, step, feature and effect thereof to foundation the present invention proposition, describe in detail as after, wherein components identical will be illustrated with identical reference marks.Be to be to comprise organic luminous panel and organic illuminating element what this must illustrate once more in the organic light emitting apparatus described in the present embodiment.
See also Figure 1 and Figure 2, comprise a rangefinder 11, a processing controller 13, a detector 15, a high-energy light beam guiding generator 17, an optical amplifier 18 and a carrying platform 19 according to the detection repair system 1 of preferred embodiment of the present invention.
Rangefinder 11 is the positions in order to Auto-Sensing one organic light emitting apparatus 3; Detector 15 is at least one defective locations 31 that see through optical amplifier 18 detecting organic light emitting apparatus 3; Processing controller 13 is to link with rangefinder 11, detector 15, high-energy light beam guiding generator 17 and optical amplifier 18 respectively, processing controller 13 is that the detecting result according to rangefinder 11 produces one first control signal, so that locate organic light emitting apparatus 3 and detector 15 automatically.In the present embodiment, rangefinder 11 is to focus device for a laser, its be send a detection signal (as laser beam) so as to judge organic light emitting apparatus 3 and detector 15 between initial range D1, in this, because detector 15 is to see through the zone to be detected that optical amplifier 18 is detected organic light emitting apparatus 3, so initial range D1 is the distance (as shown in Figure 1) of optical amplifier 18 with organic light emitting apparatus 3, at this moment, rangefinder 11 can be sent to processing controller 13 with the detecting result, so that judge by processing controller 13 whether initial range D1 is a proper handling distance; If processing controller 13 judge initial range D1 non-be a proper handling apart from the time, processing controller 13 can produce first control signal, so that utilize first control signal to control to relatively move organic light emitting apparatus 3 and detector 15 (or optical amplifier 18), make the distance between organic light emitting apparatus 3 and the detector 15 (or optical amplifier 18) change into a suitable distance D 2, in this, because detector 15 is to see through the zone to be detected that optical amplifier 18 is detected organic light emitting apparatus 3, so the suitable distance D 2 after changing is to be the distance (as shown in Figure 2) of optical amplifier 18 with organic light emitting apparatus 3.Wherein, processing controller 13 can be a computer, and it more comprises a display 131, and it is to link with processing controller 13, in order to the picture that shows that processing controller 13 is exported.In addition, the high-energy light beam guiding that high-energy light beam guiding generator 17 is produced can or have high-octane light beam for the laser of specific wavelength, is enough to the function that defective locations is completely cut off.
From the above, rangefinder 11 is a kind of instrument of detecting distance, its function is as the foundation of auxiliary correction organic light emitting apparatus 3 with the distance of detector 15 (or optical amplifier 18), can utilize laser, infrared ray, ultrasonic waves as the signal of detecting distance, and its signal can be by optical amplifier 18 or not via optical amplifier 18, and the rangefinder 11 of present embodiment can be thunder survey rangefinder, infrared ambulator, ultrasonic waves rangefinder relatively.In addition, the mode of desiring to reach the distance of assisting correction organic light emitting apparatus 3 and detector 15 (or optical amplifier 18) is except using above-mentioned rangefinder 11, still can utilize an image comparison mode to carry out, optical image can be obtained from optical amplifier 18, and obtains revising foundation to correct suitable distance D 2 by the mode that processing controller 13 is handled with image contrast.
Moreover, optical amplifier 18 is optical facilities, purposes is image is amplified, to use as defective image detecting and high-energy light beam guiding isolate defects position, the optical loupes group or the CCD optical coupling element that wherein can comprise different multiplying, the high-energy light beam guiding that mentioned high-energy light beam guiding generator 17 is produced in this case can be done the location to reach isolated effect by 18 pairs of defective locations of this optical amplifier.Note that the diameter of the high-energy light beam guiding that high-energy light beam guiding generator 17 is produced also can be controlled earlier, so that not via optical amplifier 18, directly high-energy light beam guiding is focused to defective locations, with isolated defective locations.
In addition, carrying platform 19 is carrying organic light emitting apparatus 3, and carrying platform 19 is to receive first control signal, so that according to first control signal relatively move organic light emitting apparatus 3 and optical amplifier 18.In the present embodiment, carrying platform 19 can independent mobile organic light emitting apparatus 3 or mobile optical amplifier 18, or mobile simultaneously organic light emitting apparatus 3 and optical amplifier 18, so that the distance between organic light emitting apparatus 3 and the optical amplifier 18 is adjusted into suitable distance D 2 automatically; Wherein, carrying platform 19 is to be one or three mobile position platforms.In addition, can also on optical amplifier 18, install additional another three mobile controlling organizations with the distance of reaching mobile organic light emitting apparatus 3 and optical amplifier 18 to suitable distance D 2, and then can control defective locations that detector 15 detected and optical amplifier 18 to bit motion.
In addition, be to be provided with a power suppling part 191 on the carrying platform 19, power suppling part 191 is to have a positive power terminal 193 and a negative power source terminal 195 respectively, when whether the detecting of low-light detector 15 desires has the low-light phenomenon, organic light emitting apparatus 3 is to provide negative bias or micro-forward bias by power suppling part 191, and this bias voltage will make the defective locations that forms short circuit produce low-light phenomenon (as shown in phantom in Figure 2).What deserves to be mentioned is, at this moment, processing controller 13 is more to produce one second control signal and one the 3rd control signal according to the defective locations 31 that is detected, carrying platform 19 and high-energy light beam guiding generator 17 are that the 3rd control signal and second control signal that are produced according to processing controller 13 are respectively done, wherein carrying platform 19 is according to the 3rd control signal relatively move high-energy light beam guiding generator 17 (and/or optical amplifier 18) and organic light emitting apparatus 3, so that allow high-energy light beam guiding generator 17 (seeing through optical amplifier 18) aim at the defective locations 31 of organic light emitting apparatus 3, then high-energy light beam guiding generator 17 is to produce a high-energy light beam guiding according to second control signal, this high-energy light beam guiding is to focus on defective locations 31 with the isolate defects position, so can be with the defect repair in the zone to be detected of an organic light emitting apparatus.
As previously mentioned, detector 15 is to be a low-light detector, and defective locations 31 is to produce the low-light phenomenon, so that the low-light detector detects the defective locations 31 that produces the low-light phenomenon.The person of noting, the low-light phenomenon that above-mentioned defective locations 31 places produce can be by comprising photon (photon), infrared light (infrared, IR) and/or heat energy (thermal) produce, and its relative low-light detector 15 is to be photon detector, ultrared sensing device and heat energy detector.
Below will specify the detection restorative procedure of preferred embodiment of the present invention according to Fig. 3.For ease of explanation, in present embodiment, will quote the figure number explanation in the foregoing description.
As shown in Figure 3, detection restorative procedure of the present invention is may further comprise the steps: the position (step S01) that utilizes a rangefinder (focusing device as laser) Auto-Sensing organic light emitting apparatus; Detecting result according to rangefinder produces one first control signal (step S02) to utilize a processing controller; Automatically adjust the relative position (step S03) of a detector (as the low-light detector) and organic light emitting apparatus according to first control signal; The zone to be detected of organic light emitting apparatus is passed to a bias voltage (step S04); Utilize at least one defective locations (step S05) of detector detecting organic light emitting apparatus (producing the low-light phenomenon); The defective locations that foundation is detected is in order to produce one second control signal (step S06) with processing controller; And focus on the high-energy light beam guiding of defective locations to utilize the high-energy light beam guiding generator to produce one according to second control signal, so that defective locations is isolated (step S07).
And for the high-energy light beam guiding that high-energy light beam guiding generator 17 is produced can be mapped to and focus on defective locations 31 places of organic light emitting apparatus 3 exactly, processing controller 13 is to produce the 3rd control signal, with start one carrying platform 19.And organic light emitting apparatus 3 is to place on the carrying platform 19.Therefore, can relatively move detector 17 and organic light emitting apparatus 3 to adjust its relative position, and then can allow high-energy light beam guiding focus on exactly on the defective locations 31 of organic light emitting apparatus 3, or allowing high-energy light beam guiding see through an optical amplifier 18 exactly focuses on the defective locations 31 of organic light emitting apparatus 3.
From the above, because the present invention detects repair system and method can be when the detecting defective locations, utilize laser range finder and processing controller to adjust the relative position of organic light emitting apparatus and (low-light) detector (and optical amplifier) automatically earlier, zone to be detected with organic light emitting apparatus passes to bias voltage again, and utilizes (low-light) detector to detect (generation low-light phenomenon) defective locations; Then utilize high-energy light beam guiding that defective locations is isolated, therefore needn't use two kinds of boards to finish detection, repair, and can adjust, locate organic light emitting apparatus automatically, to reduce issuable mistake of manual operation and waste of manpower resource.Therefore, can when detecting organic light emitting apparatus, directly judge the defective that needs reparation according to detection repair system of the present invention and detection restorative procedure, and can automatically adjust the relative position of organic light emitting apparatus and high-energy light beam guiding generator, not only make whole detection restorative procedure be simplified and save the cost of detection reparation, the defective that also can detect efficiently, repair organic light emitting apparatus.
The above, it only is preferred embodiment of the present invention, be not that the present invention is done any pro forma restriction, though the present invention discloses as above with preferred embodiment, yet be not in order to limit the present invention, any those skilled in the art, in not breaking away from the technical solution of the present invention scope, when the method that can utilize above-mentioned announcement and technology contents are made a little change or be modified to the equivalent embodiment of equivalent variations, but every content that does not break away from technical solution of the present invention, according to technical spirit of the present invention to any simple modification that above embodiment did, equivalent variations and modification all still belong in the scope of technical solution of the present invention.
Claims (13)
1, a kind of detection repair system, it is to be applied to organic light emitting apparatus, it is characterized in that it comprises:
One rangefinder, it is the position in order to the Auto-Sensing organic light emitting apparatus;
One processing controller, it is to link with rangefinder, according to the detecting result of rangefinder, produces one first control signal;
One detector, it is to link with processing controller, automatically adjust the relative position of detector and organic light emitting apparatus according to first control signal, and detect at least one defective locations of organic light emitting apparatus, processing controller is to produce one second control signal according to the defective locations that is detected; And
One high-energy light beam guiding generator, it is to link with processing controller, device and foundation second control signal focus on the high-energy light beam guiding of defective locations, with the isolate defects position.
2, a kind of detection restorative procedure, it is to be applied to organic light emitting apparatus, it is characterized in that detecting restorative procedure and may further comprise the steps:
Utilize the position of a rangefinder Auto-Sensing organic light emitting apparatus;
Detecting result according to rangefinder produces one first control signal to utilize a processing controller;
Automatically adjust the relative position of a detector and organic light emitting apparatus according to first control signal;
The zone to be detected of organic light emitting apparatus is passed to a bias voltage;
Utilize at least one defective locations of detector detecting organic light emitting apparatus;
The defective locations that foundation is detected is in order to produce one second control signal with processing controller; And
Focus on the high-energy light beam guiding of defective locations according to second control signal to utilize a high-energy light beam guiding generator to produce one, so that defective locations is isolated.
3, a kind of detection repair system, it is to be applied to organic light emitting apparatus, it is characterized in that it comprises:
One processing controller, it is the position according to organic light emitting apparatus, produces one first control signal;
One detector, it is to link with processing controller, adjusts the relative position of detector and organic light emitting apparatus automatically with foundation first control signal, and detects at least one defective locations of organic light emitting apparatus, processing controller is according to the defective locations that is detected, and produces one second control signal; And
One high-energy light beam guiding generator, it is and processing controller links, and focuses on the high-energy light beam guiding of defective locations according to second control signal, with the isolate defects position.
4, detection repair system according to claim 3 is characterized in that more comprising:
One carrying platform, it is the carrying organic light emitting apparatus, wherein processing controller more produces one the 3rd control signal according to the defective locations data that is detected, carrying platform is according to the 3rd control signal relatively move organic light emitting apparatus and high-energy light beam guiding generator, doing bit motion, and make high-energy light beam guiding focus on defective locations at defective locations and high-energy light beam guiding generator.
5, detection repair system according to claim 4 is characterized in that wherein carrying platform more is provided with a power suppling part, and when detector detecting defective locations, organic light emitting apparatus is to provide a negative bias by power suppling part.
6, detection repair system according to claim 4 is characterized in that wherein carrying platform more is provided with a power suppling part, and when detector detecting defective locations, organic light emitting apparatus is to provide a micro-forward bias by power suppling part.
7, detection repair system according to claim 4 is characterized in that wherein carrying platform is to be one or three mobile position platforms.
8, detection repair system according to claim 3 is characterized in that more comprising:
One optical amplifier, it is to amplify in order to the area image to be detected with organic light emitting apparatus, wherein detector more links with optical amplifier, and in optical amplifier institute amplified images, detect defective locations high-energy light beam guiding generator, more link, so that penetrate high-energy light beam guiding via optical amplifier with optical amplifier.
9, detection repair system according to claim 3 is characterized in that more comprising:
One display, it is to link with processing controller, in order to the picture that shows that processing controller is exported.
10, detection repair system according to claim 3 is characterized in that wherein organic light emitting apparatus is to be organic luminous panel or organic illuminating element.
11, detection repair system according to claim 3 is characterized in that wherein detector is to be a low-light detector, and defective locations is to produce the low-light phenomenon, so that the low-light detector detects the defective locations that produces the low-light phenomenon.
12, detection repair system according to claim 11 is characterized in that wherein the low-light detector is to be a photon detector, infrared light detector or heat energy detector.
13, detection repair system according to claim 3 is characterized in that more comprising:
One laser range finder, it is the position in order to the Auto-Sensing organic light emitting apparatus, produces first control signal so that processing controller to be provided according to the position of the organic light emitting apparatus that rangefinder was detected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200510104964 CN1937871A (en) | 2005-09-22 | 2005-09-22 | Detection and repair system and method |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200510104964 CN1937871A (en) | 2005-09-22 | 2005-09-22 | Detection and repair system and method |
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| CN1937871A true CN1937871A (en) | 2007-03-28 |
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| CN 200510104964 Pending CN1937871A (en) | 2005-09-22 | 2005-09-22 | Detection and repair system and method |
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Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN102956844A (en) * | 2011-08-22 | 2013-03-06 | 三星显示有限公司 | Method of repairing display panel and apparatus for performing the same |
| CN103100792A (en) * | 2013-03-12 | 2013-05-15 | 合肥知常光电科技有限公司 | Laser preprocessing and restoring method and device having on-line detection function and used for optical elements |
| CN104779264A (en) * | 2014-01-10 | 2015-07-15 | 上海和辉光电有限公司 | Method for repairing defect of mixed-color type mask opening in organic light-emitting diode display screen |
| TWI632666B (en) * | 2017-12-11 | 2018-08-11 | 台灣愛司帝科技股份有限公司 | Method and device for repairing a semiconductor chip |
| CN108594484A (en) * | 2018-04-19 | 2018-09-28 | 武汉精测电子集团股份有限公司 | Panel detection and reparation integral system |
| CN108593264A (en) * | 2018-04-27 | 2018-09-28 | 武汉华星光电技术有限公司 | The method that OLED device measurement system and automatic positioning OLED device measure point |
| CN111226108A (en) * | 2018-07-27 | 2020-06-02 | 合刃科技（深圳）有限公司 | Device for detecting and repairing inner wall defects of micro-fine tube |
| JP2021018386A (en) * | 2019-07-23 | 2021-02-15 | 株式会社ジャパンディスプレイ | Display device repair system |
| CN112394270A (en) * | 2020-11-27 | 2021-02-23 | 华南理工大学 | Online quality detection method and application of OLED device |
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2005
- 2005-09-22 CN CN 200510104964 patent/CN1937871A/en active Pending
Cited By (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102956844A (en) * | 2011-08-22 | 2013-03-06 | 三星显示有限公司 | Method of repairing display panel and apparatus for performing the same |
| CN103100792A (en) * | 2013-03-12 | 2013-05-15 | 合肥知常光电科技有限公司 | Laser preprocessing and restoring method and device having on-line detection function and used for optical elements |
| CN103100792B (en) * | 2013-03-12 | 2015-04-22 | 合肥知常光电科技有限公司 | Laser preprocessing and restoring method and device having on-line detection function and used for optical elements |
| CN104779264A (en) * | 2014-01-10 | 2015-07-15 | 上海和辉光电有限公司 | Method for repairing defect of mixed-color type mask opening in organic light-emitting diode display screen |
| CN109904086A (en) * | 2017-12-11 | 2019-06-18 | 台湾爱司帝科技股份有限公司 | Semiconductor die sheet repairing method and semiconductor wafer repair apparatus |
| TWI632666B (en) * | 2017-12-11 | 2018-08-11 | 台灣愛司帝科技股份有限公司 | Method and device for repairing a semiconductor chip |
| CN108594484A (en) * | 2018-04-19 | 2018-09-28 | 武汉精测电子集团股份有限公司 | Panel detection and reparation integral system |
| CN108593264A (en) * | 2018-04-27 | 2018-09-28 | 武汉华星光电技术有限公司 | The method that OLED device measurement system and automatic positioning OLED device measure point |
| CN111226108A (en) * | 2018-07-27 | 2020-06-02 | 合刃科技（深圳）有限公司 | Device for detecting and repairing inner wall defects of micro-fine tube |
| CN111226108B (en) * | 2018-07-27 | 2021-12-31 | 合刃科技（深圳）有限公司 | Device for detecting and repairing inner wall defects of micro-fine tube |
| JP2021018386A (en) * | 2019-07-23 | 2021-02-15 | 株式会社ジャパンディスプレイ | Display device repair system |
| TWI792022B (en) * | 2019-07-23 | 2023-02-11 | 日商日本顯示器股份有限公司 | Repair System for Display Devices |
| JP7292138B2 (en) | 2019-07-23 | 2023-06-16 | 株式会社ジャパンディスプレイ | Display device repair system |
| CN112394270A (en) * | 2020-11-27 | 2021-02-23 | 华南理工大学 | Online quality detection method and application of OLED device |
| CN112394270B (en) * | 2020-11-27 | 2022-03-29 | 华南理工大学 | Online quality detection method and application of OLED device |
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