CN111226108B - Device for detecting and repairing inner wall defects of micro-fine tube - Google Patents
Device for detecting and repairing inner wall defects of micro-fine tube Download PDFInfo
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- CN111226108B CN111226108B CN201880067097.4A CN201880067097A CN111226108B CN 111226108 B CN111226108 B CN 111226108B CN 201880067097 A CN201880067097 A CN 201880067097A CN 111226108 B CN111226108 B CN 111226108B
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- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
Abstract
The application discloses microtube inner wall defect detecting prosthetic devices includes: the device comprises a detection probe, a repair probe and a processing device connected with the detection probe and the repair probe; the detection probe irradiates coherent light to the inner wall of the micro-tube and transmits the reflected coherent light to the processing device; the processing device obtains a speckle image of the inner wall of the microtube according to the reflected coherent light; and when the inner wall of the microtube has defects according to the speckle images, controlling the repair probe to repair the defects on the inner wall of the microtube. By adopting the method and the device, the problem that the defects of the inner wall of the microtube cannot be accurately detected in the prior art is solved, and the defects of the inner wall of the microtube are repaired.
Description
Technical Field
The application relates to the field of pipeline detection, in particular to a microtube inner wall defect detecting and repairing device.
Background
The micro-fine tube and the inner hole with small size characteristics are widely applied in the fields of mechanical manufacturing industry, chemical industry, medical instruments and the like. Once explosion, leakage and other accidents happen to the critical inner hole structure, the whole machine cannot work, and even the life and property of people are seriously threatened. The defect repair of the inner wall of the microtube has important significance for manufacturing, quality control and safety guarantee.
However, the aperture of the micro-tube is generally between 1mm and 15mm, and the existing repair tool cannot extend into the micro-tube to repair the defects in the micro-tube, so that the defects on the inner wall of the micro-tube seriously threaten the production safety.
Disclosure of Invention
The embodiment of the application provides a microtube inner wall defect detecting and repairing device, solves the problem that the defects of the microtube inner wall cannot be repaired in the prior art, and ensures production safety.
In a first aspect, an embodiment of the present application provides a device for detecting and repairing defects on an inner wall of a microtube, including:
the device comprises a detection probe, a repair probe and a processing device connected with the detection probe and the repair probe; the repairing probe comprises at least one of a polishing probe, a filling probe, a cleaning probe and a dust suction probe;
the detection probe is used for irradiating incident coherent light onto the inner wall of the micro-tube and transmitting the reflected coherent light to the processing device;
the processing device is used for obtaining a speckle image of the inner wall of the microtube according to the reflected coherent light; and when the inner wall of the microtube has defects according to the speckle images, controlling the repair probe to repair the defects on the inner wall of the microtube.
In a possible embodiment, the processing means comprises:
the coherent light emitter is used for generating the incident coherent light and transmitting the incident coherent light to the detection probe through an optical fiber;
the coherent light receiver is used for converting the reflected coherent light into a speckle image of the inner wall of the micro-tube and transmitting the speckle image of the inner wall of the micro-tube to the image processor;
the image processor is used for judging whether a defect exists on the inner wall of the micro-tube according to the speckle image; when the inner wall of the microtube is determined to have defects, determining the defect type of the inner wall of the microtube;
and the controller is used for controlling the functional probe corresponding to the defect type in the repair probe to repair the defect on the inner wall of the microtube according to the defect type stored on the inner wall of the microtube.
In a possible embodiment, the image processor is specifically configured to:
inputting the speckle images of the inner wall of the micro-tube into a defect identification model for calculation to obtain a calculation result;
and acquiring the defect type corresponding to the calculation result according to the corresponding relation table of the calculation result and the defect type.
In a possible embodiment, the image processor is further configured to:
when the inner wall of the micro-capillary is determined to have a defect, determining the coordinate (x, y) of the speckle image of the speckle pattern block corresponding to the defect on the inner wall of the micro-capillary;
determining position information (L, alpha) of the defect in the inner wall of the micro-tube according to the coordinates (x, y) of the speckle image of the speckle pattern block corresponding to the defect on the inner wall of the micro-tube, wherein L is beta x, and alpha is beta y/2 pi r 360 DEG
Wherein L is the distance between the defect and a detection inlet of the inner wall of the microtube, alpha is an included angle between a straight line connecting the defect and the center of the cross section where the defect is located and a horizontal line, and r is the inner radius of the microtube; the beta is a constant.
In a possible embodiment, the inspection and repair device further comprises a movement mechanism connected with the repair probe, the repair probe comprises a marking probe, the marking probe is bent, and the marking probe comprises a rotating device;
the marking probe is used for moving to position information (L, alpha) of the defect in the inner wall of the micro-tube under the traction of the moving mechanism and the control of a rotating device; and marking the defects.
In a possible embodiment, the detection and repair device further includes a moving mechanism connected to the repair probe, the defect type is deformation, and when the deformation causes the inner wall of the microtube to generate a convex surface, the repair probe includes a polishing probe and a garbage recovery probe; the controller controls the repair probe to repair the defects on the inner wall of the micro-tube, and the method comprises the following steps:
the controller controls the movement mechanism to pull the polishing probe and the garbage recycling probe to move to the position of the convex surface;
the polishing probe is used for polishing the convex surface on the inner wall of the microtube so as to eliminate the convex surface caused by deformation;
the garbage recycling probe is used for recycling waste generated when the polishing probe polishes the defects on the inner wall of the micro-tube.
In a possible embodiment, the detection and repair device further includes a moving mechanism connected to the repair probe, the defect type is deformation, and when the deformation causes the inner wall of the microtube to generate a concave surface, the repair probe includes a filling probe, a polishing probe and a garbage recovery probe; the controller controls the repair probe to repair the defects on the inner wall of the micro-tube, and the method comprises the following steps:
the controller controls the movement mechanism to pull the filling probe, the polishing probe and the garbage recycling probe to move to the positions of the concave surfaces;
the filling probe is used for filling the concave surface by using a material which is the same as that of the microtube so as to eliminate the concave surface caused by deformation;
the polishing probe is used for polishing the filled concave surface;
and the garbage recycling probe is used for recycling waste generated when the filled concave surface is ground by the grinding probe.
In a possible embodiment, the inspection and repair device further includes a moving mechanism connected to the repair probe, the defect type is dirt, and the dirt is caused by dust, the repair probe includes a dust suction probe, and the controller controls the repair probe to repair the defect on the inner wall of the micro-capillary, including:
the controller controls the moving mechanism to pull the dust collection probe to move to the position of the dirt;
the dust collection probe is used for treating dust at the dirty position so as to eliminate the dirty position.
In a possible embodiment, the inspection and repair device further includes a moving mechanism connected to the repair probe, the defect type is a stain, and the stain is caused by a viscous material, the repair probe includes a cleaning probe, a material type detection probe, and a garbage recovery probe, and the controller controls the repair probe to repair the defect on the inner wall of the micro-capillary, including:
the controller controls the movement mechanism to pull the cleaning probe, the material type detection probe and the garbage recovery probe to move to the position of the dirt;
the substance type detection probe is used for detecting the substance type of the sticky matter;
the cleaning probe uses a corresponding cleaning agent to clean the sticky substances according to the substance classes of the sticky substances;
the garbage recycling probe is used for recycling garbage generated when the cleaning probe cleans the foreign matters.
In one possible embodiment, the coherent light is a laser of any frequency from ultraviolet light to near-infrared light.
It can be seen that, in the scheme of the embodiment of the application, the speckle image of the inner wall of the micro-tube is obtained through the coherent light, and whether the inner wall of the micro-tube has the defect or not is determined according to the speckle image; and when the defect is determined to exist, controlling a corresponding functional probe in the repair probe to repair the defect according to the type of the defect. By adopting the embodiment of the application, the problem that the defects of the inner wall of the micro-fine pipe cannot be repaired in the prior art is solved, and the production safety is ensured.
These and other aspects of the present application will be more readily apparent from the following description of the embodiments.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a schematic structural diagram of a defect inspection and repair apparatus for an inner wall of a microtube according to an embodiment of the present disclosure;
FIG. 2 is a schematic diagram illustrating a partial structure of a defect inspection and repair apparatus for an inner wall of a microtube according to an embodiment of the present disclosure;
fig. 3 is a schematic partial structural diagram of another apparatus for detecting and repairing defects on an inner wall of a capillary according to an embodiment of the present disclosure;
FIG. 4 is a schematic diagram illustrating a defect inspection and repair of an inner wall of a microtube according to an embodiment of the present disclosure;
FIG. 5 is a schematic diagram illustrating another principle of detecting, repairing and detecting defects on an inner wall of a micro-capillary according to an embodiment of the present disclosure;
FIG. 6 is a schematic diagram of determining defect location information;
FIG. 7 is a schematic diagram of another method for determining defect location information;
FIG. 8 is a schematic diagram illustrating the working principle of a marking probe according to an embodiment of the present disclosure;
FIG. 9 is a partial image of a speckle image of the inner wall of a microtube.
Detailed Description
Embodiments of the present application are described below with reference to the drawings.
Referring to FIG. 1, FIG. 1 is a schematic structural diagram of a microtube inner wall defect detecting and repairing apparatus according to an embodiment of the present disclosure. As shown in fig. 1, the apparatus for detecting and repairing defects on the inner wall of a micro-capillary comprises:
the device comprises a detection probe 101, a repair probe 102 and a processing device 104 connected with the detection probe 101 and the repair probe 102;
the detection probe 101 is configured to irradiate an incident coherent light beam 10 onto an inner wall of the microtube 109, and transmit a reflected coherent light beam 11 to the processing device 104; the reflected coherent light 11 is coherent light reflected or scattered by the inner wall of the microtube 109;
the processing device 104 is configured to obtain a speckle image of the inner wall of the microtube 109 according to the reflected coherent light 11; and when the inner wall of the micro-tube 109 is determined to have the defect according to the speckle image, controlling the repair probe 102 to repair the defect of the inner wall of the micro-tube 109.
Wherein, the detection probe 101 and the repair probe 102 are in the same sleeve 103.
The coherent light emitter 1041 is configured to generate the incident coherent light, and transmit the incident coherent light to the detection probe 101 through an optical fiber;
a coherent light receiver 1042 for converting the reflected coherent light 11 into a speckle image of the inner wall of the microtube 109 and transmitting the speckle image of the inner wall of the microtube 109 to an image processor 1043;
the image processor 1043 is configured to determine whether a defect exists on the inner wall of the microtube 109 according to the speckle image; determining the type of defect in the inner wall 109 of the microtube when it is determined that the inner wall 109 of the microtube has a defect;
the controller 1044 is configured to control the repair probe 103 to repair the defect of the inner wall of the microtube 109 according to the type of the defect existing in the inner wall of the microtube 109.
The coherent light receiver 1042 may be a CCD camera or a CMOS camera.
Specifically, as shown in fig. 3, the incident coherent light generated by the coherent light emitter 1041 is irradiated onto the half mirror 106 through the first lens 107, transmitted to the detection probe 101 through the optical fiber 105, and irradiated onto the inner wall of the microtube 109 through the conical mirror 1011 provided at the distal end of the detection probe 101. As shown in fig. 4, the conical mirror 1011 in the detection probe 101 reflects the coherent light 11 reflected or scattered by the inner wall of the microtube 109, the reflected or scattered coherent light 11 passes through the optical fiber 105, the half mirror 106 and the second lens 108 to the coherent light receiver 1042, and the coherent light receiver 1042 converts the received coherent light into a speckle image of the inner wall of the microtube and transmits the speckle image of the inner wall of the microtube to the image processor 1043.
After the image processor 1043 receives the speckle image of the inner wall of the microtube, the image processor 1043 inputs the speckle image of the inner wall of the microtube into the defect identification model for calculation to obtain a calculation result; and acquiring the defect type corresponding to the calculation result from the corresponding relation table of the calculation result and the defect type.
The defect identification model is a neural network model or a deep learning model.
Further, before receiving the speckle image of the inner wall of the micro-capillary, the image processor 1043 obtains the defect identification model and the corresponding relation table between the calculation result and the defect type from a third-party server, or; the image processor 1043 acquires a plurality of speckle images corresponding to different defect types, and performs neural network operation on the speckle images to obtain the defect identification model and the corresponding relationship table between the calculation result and the defect type.
It should be noted that the incident coherent light may alternatively be a laser of any frequency from ultraviolet light to near-infrared light.
It should be noted here that, the inner wall of the microtube has a fixed structure or a smooth surface, defects are mainly distributed on the inner wall of the member, the size of the defects is generally between 50um and 1mm, and for coherent laser with a wavelength of 650nm, the precision of the defects on the inner wall of the microtube which can be detected can reach 1 um. The microscopic deformation of the inner wall of the microtube can cause the change of diffraction spots. When light is introduced to a rough surface, scattered light is present at every point on the surface, and the scattered light is coherent light, which has different amplitudes and phases and is randomly distributed. The scattered light is superposed to form granular structures with obvious contrast, which are speckles. As shown in fig. 5, after the incident coherent light irradiates the inner wall of the capillary, the inner wall of the capillary reflects or scatters the coherent light to the coherent light receiver, and the coherent light receiver converts the received light signal into an image, so as to obtain a speckle image of the inner wall of the capillary.
In a possible embodiment, the image processor 1043 is further configured to:
when the inner wall of the micro-capillary is determined to have a defect, determining the coordinate (x, y) of the speckle image of the speckle pattern block corresponding to the defect on the inner wall of the micro-capillary;
determining position information (L, alpha) of the defect in the inner wall of the micro-tube according to the coordinates (x, y) of the speckle image of the speckle pattern block corresponding to the defect on the inner wall of the micro-tube, wherein L is beta x, and alpha is beta y/2 pi r 360 DEG
Wherein L is the distance between the defect and a detection inlet of the inner wall of the microtube, alpha is an included angle between a straight line connecting the defect and the center of the cross section where the defect is located and a horizontal line, and r is the inner radius of the microtube; the beta is a constant.
As shown in fig. 6, the inspection probe 101 is an annular region having a width d in each inspection region of the inner wall of the microtube; the detecting probe 101 detects each annular region, and the coherent light receiver 1042 obtains a sub-speckle image of the inner wall of a microtube and transmits the sub-speckle image to the image processor 1043; after the detection probe 101 detects the inner wall of the microtube, the image processor 1043 acquires sub-speckle images of L1/d microtube inner walls; the image processor 1043 splices the sub speckle images of the inner wall of the L1/d microtubes to obtain a speckle image of the inner wall of the microtube.
The image processor 1043 inputs the speckle image of the inner wall of the microtube into the defect device model for calculation to obtain a calculation result; determining the defect type corresponding to the calculation result according to the corresponding relation table of the calculation result and the defect type; when it is determined that there is a defect on the inner wall of the micro-capillary, the image processor 1043 establishes a coordinate system as shown in fig. 6 for the speckle image on the inner wall of the micro-capillary, and determines the coordinates (x, y) of the speckle image on the inner wall of the micro-capillary corresponding to the defect; determining position information (L, alpha) of the defect in the inner wall of the micro-tube according to coordinates (x, y) of a speckle image of a speckle pattern block corresponding to the defect on the inner wall of the micro-tube, wherein L is beta x, and alpha is beta y/2 pi r 360 degrees; the L is a distance between the defect and a detection inlet of the inner wall of the microtube, the alpha is an included angle between a straight line connecting the defect and the center of the cross section where the defect is located and a horizontal line, and as shown in FIG. 7, the r is the inner radius of the microtube; the beta is a constant.
Wherein β is a ratio of a length of the microtube to a length of a speckle image on an inner wall of the microtube; or the ratio of the perimeter of the cross section of the microtube to the width of the speckle image of the inner wall of the microtube.
Further, after the image processor 1043 obtains the defect type existing in the inner wall of the micro-capillary and the position information of the defect in the inner wall of the micro-capillary, the image processor 1043 transmits the defect type and the position information of the defect in the inner wall of the micro-capillary to the controller 1044.
As shown in fig. 8, the inspection and repair device further comprises a movement mechanism 110 connected with the repair probe 103, wherein the repair probe 103 comprises a marking probe, the marking probe is bent, and the marking probe comprises a rotating device 1012;
the marking probe is used for moving to position information (L, alpha) of the defect in the inner wall of the micro-tube under the traction of the moving mechanism 110 and the control of a rotating device 1012; and marking the defects.
Specifically, the marking probe 101 is moved to a position at a distance L from the inner wall detection inlet of the microtube by the traction of the moving mechanism 110, and then the rotation device 1012 controls the marking probe to rotate by an angle α. At this time, the marking probe is aligned with a position where a defect exists, and after it is determined that a defect exists at the current position, the position information (L, α) is transmitted to the controller 1044, so that the controller 1044 controls other probes or other devices to repair the defect at the current position.
In a possible embodiment, the inspection and repair device further includes a moving mechanism 110 connected to the repair probe 103, where the defect type is deformation, and when the deformation causes a convex surface to be generated on the inner wall of the microtube, the repair probe 103 includes a polishing probe and a garbage recycling probe; and polish probe and rubbish and retrieve the probe and all include rotary device 1012, controller 1044 control repair the probe to the defect of microtube inner wall is restoreed, includes:
the controller 1044 controls the moving mechanism 110 to pull the polishing probe and the garbage recycling probe to move to a position L away from the inner wall detection inlet of the micro-capillary, and respectively controls the rotating devices 1012 of the polishing probe and the garbage recycling probe to rotate by an angle α, at which the polishing probe and the garbage recycling probe are both aligned with a position corresponding to the position information (L, α) in the inner wall of the micro-capillary, that is, the convex surface.
The polishing probe polishes the convex surface on the inner wall of the microtube to eliminate the convex surface caused by deformation; when the polishing probe polishes the convex surface of the inner wall of the micro-tube, the garbage recovery probe works simultaneously to recover waste generated when the polishing probe polishes the defects on the inner wall of the micro-tube.
In a possible embodiment, the inspection and repair apparatus further includes a moving mechanism 110 connected to the repair probe, where the defect type is deformation, and when the deformation causes a concave surface to be generated on the inner wall of the microtube, the repair probe includes a filling probe, a polishing probe, and a waste recovery probe, and the filling probe, the polishing probe, and the waste recovery probe include a rotating device 1012; the controller 1044 controls the repair probe to repair the defects on the inner wall of the capillary, including:
the controller 1044 controls the moving mechanism 110 to pull the filling probe, the polishing probe and the garbage collection probe to move to a position L away from the inner wall detection inlet of the micro-capillary, and respectively controls the rotating devices 1012 of the filling probe, the polishing probe and the garbage collection probe to rotate by an angle α, at this time, the filling probe, the polishing probe and the garbage collection probe are all aligned to a position corresponding to the position information (L, α) in the inner wall of the micro-capillary, that is, the recessed surface;
the filling probe is used for filling the concave surface by using a material which is the same as that of the micro-tube so as to eliminate the concave surface caused by deformation; after the filling of the concave surface is finished, the polishing probe polishes the filled concave surface; and when the polishing probe works, the garbage recovery probe starts to work to recover the wastes generated when the polishing probe polishes the filled concave surface.
Referring to fig. 9, fig. 9 is a partial image of a speckle image on the inner wall of the microtube. Wherein, the shadow part is a dark stripe, and a light stripe is arranged between two dark stripes. When it is determined that the defect on the inner wall of the micro-tube is deformed, the image processor 1043 further determines whether the defect corresponding to the defect position exists a convex surface or a concave surface according to the speckle image corresponding to the defect position; when the speckle image corresponding to the defect position is as shown in fig. 9 a, that is, the dark stripe is shifted to the left, the image processor 1043 determines that the defect corresponding to the defect position is a depressed surface; when the speckle image corresponding to the defective position is shown in fig. 9 b, that is, the dark stripe is shifted to the right, the image processor 1043 determines that the defect corresponding to the defective position is a convex surface.
The controller 1044 controls the corresponding functional probe of the repair probe 103 to repair the defect according to the defect type (concave surface or convex surface) determined by the image processor 1043.
When it is determined that the defect of the inner wall of the microtube is a crack, the repair probe 103 may repair the crack in the same manner as described above.
In a possible embodiment, the inspection and repair device further includes a moving mechanism 110 connected to the repair probe, the defect type is dirt, and the dirt is caused by dust, the repair probe includes a dust suction probe, and the dust suction probe includes a rotating device 1012, and the controller controls the repair probe to repair the defect on the inner wall of the micro-capillary, including:
the controller 1044 controls the moving mechanism 110 to pull the dust collection probe to move to a position L away from the inner wall of the micro-duct to detect the inlet, and respectively controls the rotation device 1012 of the dust collection probe to rotate by an angle α, at which the dust collection probe is aligned with a position corresponding to the position information (L, α) in the inner wall of the micro-duct, that is, a position where dust exists.
The dust collection probe starts to work to treat the dust at the dirty position and suck the dust away to eliminate the dirt.
In a possible embodiment, the inspection and repair device further includes a moving mechanism 110 connected to the repair probe, the defect type is dirty, and the dirty is caused by sticky, the repair probe includes a cleaning probe, a substance type detection probe, and a waste recovery probe, and the cleaning probe, the substance type detection probe, and the waste recovery probe all include a rotating device, and the controller 1044 controls the repair probe to repair the defect on the inner wall of the micro-capillary, including:
the controller 1044 controls the moving mechanism 110 to pull the cleaning probe, the material type detecting probe and the garbage recycling probe to move to a position L away from the detection entrance of the inner wall of the micro-tube, and respectively controls the rotating devices 1012 of the cleaning probe, the material type detecting probe and the garbage recycling probe to rotate at an angle of α, at which the polishing probe and the garbage recycling probe are both aligned with a position corresponding to the position information (L, α) of the defect in the inner wall of the micro-tube, i.e., a dirty position.
The substance type detection probe is used for detecting the substance type of the sticky matter; the cleaning probe uses a corresponding cleaning agent to clean the sticky substances according to the substance classes of the sticky substances; for example, when the sticky matter is oil stain, the corresponding cleaning agent can be liquid detergent or alcohol; when the sticky matter is soil, the corresponding cleaning agent is water.
When the cleaning probe works, the garbage recycling probe is started to recycle the garbage generated when the cleaning probe cleans the sticky objects.
Further, after the repair probe 103 repairs the defect in the inner wall of the micro tube, the detection probe 101 detects the inner wall of the micro tube by using the coherent light again, and the image processor 1043 obtains the speckle image of the inner wall of the micro tube again, and determines whether the defect exists in the inner wall of the micro tube by the above method.
It can be seen that, in the scheme of the embodiment of the application, the speckle image of the inner wall of the micro-tube is obtained through the coherent light, and whether the inner wall of the micro-tube has the defect or not is determined according to the speckle image; and when the defect is determined to exist, controlling a corresponding functional probe in the repair probe to repair the defect according to the type of the defect. By adopting the method and the device, the problem that the defects of the inner wall of the micro-fine pipe cannot be repaired in the prior art is solved, and the production safety is ensured.
The foregoing detailed description of the embodiments of the present application has been presented to illustrate the principles and implementations of the present application, and the above description of the embodiments is only provided to help understand the method and the core concept of the present application; meanwhile, for a person skilled in the art, according to the idea of the present application, there may be variations in the specific embodiments and the application scope, and in view of the above, the content of the present specification should not be construed as a limitation to the present application.
Claims (8)
1. A microtube inner wall defect detection and repair device is characterized by comprising:
the device comprises a detection probe, a repair probe and a processing device connected with the detection probe and the repair probe; the repairing probe comprises at least one of a polishing probe, a filling probe, a cleaning probe and a dust suction probe;
the detection probe is used for irradiating incident coherent light onto the inner wall of the micro-tube and transmitting the reflected coherent light to the processing device;
the processing device is used for obtaining a speckle image of the inner wall of the microtube according to the reflected coherent light; when the inner wall of the microtube is determined to have defects according to the speckle images, the repairing probe is controlled to repair the defects of the inner wall of the microtube, and the processing device comprises:
the coherent light emitter is used for generating the incident coherent light and transmitting the incident coherent light to the detection probe through an optical fiber;
the coherent light receiver is used for converting the reflected coherent light into a speckle image of the inner wall of the micro-tube and transmitting the speckle image of the inner wall of the micro-tube to the image processor;
the image processor is used for judging whether a defect exists on the inner wall of the micro-tube according to the speckle image; when determining that the inner wall of the microtube has defects, determining the defect type of the inner wall of the microtube, and specifically: inputting the speckle images of the inner wall of the micro-pipe into a defect identification model for calculation to obtain a calculation result, wherein the defect identification model is a neural network model or a deep learning model; acquiring a defect type corresponding to the calculation result according to the corresponding relation table of the calculation result and the defect type;
and the controller is used for controlling a repair probe corresponding to the defect type in the repair probes to repair the defects on the inner wall of the micro-fine tube according to the defect type of the inner wall of the micro-fine tube.
2. The apparatus of claim 1, wherein the image processor is further configured to:
when the inner wall of the micro-capillary is determined to have a defect, determining the coordinate (x, y) of the speckle image of the speckle pattern block corresponding to the defect on the inner wall of the micro-capillary;
determining position information (L, alpha) of the defect in the inner wall of the micro-capillary according to the coordinates (x, y) of the speckle image of the speckle pattern block corresponding to the defect on the inner wall of the micro-capillary, wherein L = beta x, alpha = beta y/2 pi r 360 DEG
Wherein L is the distance between the defect and a detection inlet of the inner wall of the microtube, alpha is an included angle between a straight line connecting the defect and the center of the cross section where the defect is located and a horizontal line, and r is the inner radius of the microtube; the beta is a constant.
3. The apparatus according to claim 2, wherein the inspection repair device further comprises a motion mechanism coupled to the repair probe, the repair probe comprising a marker probe, the marker probe being curved, the marker probe comprising a rotation device;
the marking probe is used for moving to the position of the defect in the inner wall of the micro-tube under the traction of the moving mechanism and the control of a rotating device; and marking the defects.
4. The device according to claim 1 or 3, wherein the inspection and repair device further comprises a movement mechanism connected with the repair probe, the defect type is deformation, and when the deformation causes the inner wall of the microtube to generate a convex surface, the repair probe comprises a grinding probe and a garbage recovery probe; the controller controls the repair probe to repair the defects on the inner wall of the micro-tube, and the method comprises the following steps:
the controller controls the movement mechanism to pull the polishing probe and the garbage recycling probe to move to the position of the convex surface;
the polishing probe is used for polishing the convex surface on the inner wall of the microtube so as to eliminate the convex surface caused by deformation;
the garbage recycling probe is used for recycling waste generated when the polishing probe polishes the defects on the inner wall of the micro-tube.
5. The device according to claim 1 or 3, wherein the inspection and repair device further comprises a movement mechanism connected with the repair probe, the defect type is deformation, and when the deformation causes the inner wall of the microtube to generate a concave surface, the repair probe comprises a filling probe, a grinding probe and a garbage recovery probe; the controller controls the repair probe to repair the defects on the inner wall of the micro-tube, and the method comprises the following steps:
the controller controls the movement mechanism to pull the filling probe, the polishing probe and the garbage recycling probe to move to the positions of the concave surfaces;
the filling probe is used for filling the concave surface by using a material which is the same as that of the microtube so as to eliminate the concave surface caused by deformation;
the polishing probe is used for polishing the filled concave surface;
and the garbage recycling probe is used for recycling waste generated when the filled concave surface is ground by the grinding probe.
6. The apparatus according to claim 1 or 3, wherein the inspection and repair apparatus further comprises a moving mechanism connected to the repair probe, the defect type is dirt, and the dirt is caused by dust, the repair probe comprises a dust suction probe, and the controller controls the repair probe to repair the defect on the inner wall of the micro-capillary, including:
the controller controls the moving mechanism to pull the dust collection probe to move to the position of the dirt;
the dust collection probe is used for treating dust at the dirty position so as to eliminate the dirty position.
7. The apparatus according to claim 1 or 3, wherein the inspection and repair apparatus further comprises a moving mechanism connected to the repair probe, the defect type is a stain, and the stain is caused by a viscous material, the repair probe comprises a cleaning probe, a material type detection probe and a garbage recovery probe, and the controller controls the repair probe to repair the defect on the inner wall of the micro-capillary, and the method comprises:
the controller controls the movement mechanism to pull the cleaning probe, the material type detection probe and the garbage recovery probe to move to the position of the dirt;
the substance type detection probe is used for detecting the substance type of the sticky matter;
the cleaning probe uses a corresponding cleaning agent to clean the sticky substances according to the substance classes of the sticky substances;
the garbage recycling probe is used for recycling garbage generated when the cleaning probe cleans the sticky substances.
8. The apparatus of claim 1, wherein the coherent light is a laser of any frequency from ultraviolet light to near-infrared light.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/CN2018/097661 WO2020019347A1 (en) | 2018-07-27 | 2018-07-27 | Defect detection and repair device for microtube inner wall |
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| Publication Number | Publication Date |
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| CN111226108A CN111226108A (en) | 2020-06-02 |
| CN111226108B true CN111226108B (en) | 2021-12-31 |
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| CN201880067097.4A Active CN111226108B (en) | 2018-07-27 | 2018-07-27 | Device for detecting and repairing inner wall defects of micro-fine tube |
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| CN (1) | CN111226108B (en) |
| WO (1) | WO2020019347A1 (en) |
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| CN113588685A (en) * | 2021-07-26 | 2021-11-02 | 江苏金润汽车传动科技有限公司 | Method and system for detecting defect size of valve core hole |
| CN113941669B (en) * | 2021-10-18 | 2024-04-02 | 青岛北琪实业有限公司 | Tinplate can inner wall defect repairing device based on machine vision |
| CN115424214B (en) * | 2022-11-03 | 2023-04-07 | 之江实验室 | Quasi-distributed liquid leakage detection method and device based on plastic optical fiber and electronic equipment |
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| US4967092A (en) * | 1988-05-17 | 1990-10-30 | Societe Anonyme Dite Hispano-Suiza | Apparatus for optically checking the inner profile of a tube or bore |
| JPH05149884A (en) * | 1991-04-26 | 1993-06-15 | Sekiyu Sangyo Kasseika Center | In-pipe inspection device |
| JPH0663777A (en) * | 1992-08-19 | 1994-03-08 | Olympus Optical Co Ltd | Device for repairing tube inside |
| JPH07113754A (en) * | 1993-10-18 | 1995-05-02 | Nippon Steel Corp | Pipe inside inspection improving device |
| CN1937871A (en) * | 2005-09-22 | 2007-03-28 | 铼宝科技股份有限公司 | Detection and repair system and method |
| CN204374098U (en) * | 2014-12-19 | 2015-06-03 | 东方电气河南电站辅机制造有限公司 | Pipeline endoscope apparatus |
| CN108181321A (en) * | 2017-12-29 | 2018-06-19 | 杭州清本科技有限公司 | The system that multiple carrier-borne aircraft tires are carried out at the same time laser speckle non-destructive testing |
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- 2018-07-27 WO PCT/CN2018/097661 patent/WO2020019347A1/en active Application Filing
- 2018-07-27 CN CN201880067097.4A patent/CN111226108B/en active Active
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| US4967092A (en) * | 1988-05-17 | 1990-10-30 | Societe Anonyme Dite Hispano-Suiza | Apparatus for optically checking the inner profile of a tube or bore |
| JPH05149884A (en) * | 1991-04-26 | 1993-06-15 | Sekiyu Sangyo Kasseika Center | In-pipe inspection device |
| JPH0663777A (en) * | 1992-08-19 | 1994-03-08 | Olympus Optical Co Ltd | Device for repairing tube inside |
| JPH07113754A (en) * | 1993-10-18 | 1995-05-02 | Nippon Steel Corp | Pipe inside inspection improving device |
| CN1937871A (en) * | 2005-09-22 | 2007-03-28 | 铼宝科技股份有限公司 | Detection and repair system and method |
| CN204374098U (en) * | 2014-12-19 | 2015-06-03 | 东方电气河南电站辅机制造有限公司 | Pipeline endoscope apparatus |
| CN108181321A (en) * | 2017-12-29 | 2018-06-19 | 杭州清本科技有限公司 | The system that multiple carrier-borne aircraft tires are carried out at the same time laser speckle non-destructive testing |
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| Publication number | Publication date |
|---|---|
| CN111226108A (en) | 2020-06-02 |
| WO2020019347A1 (en) | 2020-01-30 |
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