CN1828939A - 射频开关和将双栅晶体管修改成射频开关的方法 - Google Patents
射频开关和将双栅晶体管修改成射频开关的方法 Download PDFInfo
- Publication number
- CN1828939A CN1828939A CNA200610006159XA CN200610006159A CN1828939A CN 1828939 A CN1828939 A CN 1828939A CN A200610006159X A CNA200610006159X A CN A200610006159XA CN 200610006159 A CN200610006159 A CN 200610006159A CN 1828939 A CN1828939 A CN 1828939A
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- 238000000034 method Methods 0.000 title claims abstract description 19
- 230000009977 dual effect Effects 0.000 title abstract 2
- 239000004065 semiconductor Substances 0.000 claims description 7
- 229910044991 metal oxide Inorganic materials 0.000 claims description 3
- 150000004706 metal oxides Chemical class 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 4
- 230000005669 field effect Effects 0.000 description 4
- 238000012986 modification Methods 0.000 description 4
- 230000004048 modification Effects 0.000 description 4
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 239000002800 charge carrier Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/785—Field effect transistors with field effect produced by an insulated gate having a channel with a horizontal current flow in a vertical sidewall of a semiconductor body, e.g. FinFET, MuGFET
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/08—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind
- H01L27/085—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only
- H01L27/088—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate
- H01L27/092—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate complementary MIS field-effect transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/08—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind
- H01L27/085—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only
- H01L27/088—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate
- H01L27/092—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate complementary MIS field-effect transistors
- H01L27/0924—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate complementary MIS field-effect transistors including transistors with a horizontal current flow in a vertical sidewall of a semiconductor body, e.g. FinFET, MuGFET
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Ceramic Engineering (AREA)
- Electronic Switches (AREA)
Abstract
Description
Claims (33)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/905,874 US7177619B2 (en) | 2005-01-25 | 2005-01-25 | Dual gate FinFET radio frequency switch and mixer |
US10/905,874 | 2005-01-25 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1828939A true CN1828939A (zh) | 2006-09-06 |
CN100495729C CN100495729C (zh) | 2009-06-03 |
Family
ID=36696167
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB200610006159XA Active CN100495729C (zh) | 2005-01-25 | 2006-01-25 | 射频开关和将双栅晶体管修改成射频开关的方法 |
Country Status (3)
Country | Link |
---|---|
US (1) | US7177619B2 (zh) |
CN (1) | CN100495729C (zh) |
TW (1) | TW200642002A (zh) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101183685B (zh) * | 2006-11-15 | 2010-06-23 | 国际商业机器公司 | 可调谐电容器及其方法 |
CN104022152A (zh) * | 2014-06-04 | 2014-09-03 | 重庆大学 | 带有压应变薄膜应变源的双栅p沟道MOSFET及制备方法 |
CN104022153A (zh) * | 2014-06-04 | 2014-09-03 | 重庆大学 | 带有张应变薄膜应变源的双栅场效应晶体管及其制备方法 |
CN106911326A (zh) * | 2015-12-18 | 2017-06-30 | 上海新微技术研发中心有限公司 | 一种可减少偏压控制信号的射频开关 |
CN117491835A (zh) * | 2023-12-29 | 2024-02-02 | 苏州元脑智能科技有限公司 | 测量方法、装置、系统、晶体管、集成电路、介质及设备 |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102005039365B4 (de) * | 2005-08-19 | 2022-02-10 | Infineon Technologies Ag | Gate-gesteuertes Fin-Widerstandselement, welches als pinch - resistor arbeitet, zur Verwendung als ESD-Schutzelement in einem elektrischen Schaltkreis und Einrichtung zum Schutz vor elektrostatischen Entladungen in einem elektrischen Schaltkreis |
US8471344B2 (en) * | 2009-09-21 | 2013-06-25 | International Business Machines Corporation | Integrated circuit device with series-connected fin-type field effect transistors and integrated voltage equalization and method of forming the device |
US8232627B2 (en) * | 2009-09-21 | 2012-07-31 | International Business Machines Corporation | Integrated circuit device with series-connected field effect transistors and integrated voltage equalization and method of forming the device |
US8125007B2 (en) * | 2009-11-20 | 2012-02-28 | International Business Machines Corporation | Integrated circuit including FinFET RF switch angled relative to planar MOSFET and related design structure |
US9135987B2 (en) * | 2013-07-01 | 2015-09-15 | Internatinal Business Machines Corporation | FinFET-based boosting supply voltage circuit and method |
SG11201608960RA (en) * | 2014-06-27 | 2016-11-29 | Intel Corp | Non-linear fin-based devices |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2656437A1 (de) | 1976-12-14 | 1978-06-15 | Blaupunkt Werke Gmbh | Hf-empfaengermischstufe |
US4162451A (en) * | 1977-07-05 | 1979-07-24 | Texas Instruments Incorporated | MESFET-device surface-wave-device channel selector |
US4408347A (en) * | 1977-07-29 | 1983-10-04 | Texas Instruments Incorporated | High-frequency channel selector having fixed bandpass filters in the RF section |
DD142115A1 (de) | 1979-02-08 | 1980-06-04 | Rainer Ludwig | Elektronischer schalter |
DE3242547A1 (de) | 1982-11-18 | 1984-05-24 | Robert Bosch Gmbh, 7000 Stuttgart | Mischschaltung |
JPS62104074A (ja) | 1985-10-30 | 1987-05-14 | Fuji Photo Film Co Ltd | 固体撮像素子 |
US5150083A (en) * | 1988-10-07 | 1992-09-22 | Siemens Aktiengesellschaft | Digitally controlled monolithic switch matrix using selectable dual gate FET power dividers and combiners |
US5696470A (en) * | 1995-06-07 | 1997-12-09 | Comsat Corporation | Solid-state electronic switching module |
US5777530A (en) * | 1996-01-31 | 1998-07-07 | Matsushita Electric Industrial Co., Ltd. | Switch attenuator |
US5990580A (en) * | 1998-03-05 | 1999-11-23 | The Whitaker Corporation | Single pole double throw switch |
US20030119473A1 (en) * | 1998-11-09 | 2003-06-26 | Smith Stephen H. | Adjustable balanced modulator |
US6346744B1 (en) * | 1999-09-14 | 2002-02-12 | Sarnoff Corporation | Integrated RF M×N switch matrix |
US6496082B1 (en) * | 2001-09-25 | 2002-12-17 | Tyco Electronics Corporation | Matched broadband switch matrix with active diode isolation |
JP2004104394A (ja) * | 2002-09-09 | 2004-04-02 | Matsushita Electric Ind Co Ltd | 高周波スイッチ |
US6900711B2 (en) * | 2002-09-30 | 2005-05-31 | Agilent Technologies, Inc. | Switching system |
JP3902111B2 (ja) * | 2002-10-21 | 2007-04-04 | 新日本無線株式会社 | スイッチ半導体集積回路 |
FR2850206B1 (fr) * | 2003-01-17 | 2005-05-20 | Cit Alcatel | Dispositif de commutation une voie vers deux sans point de panne unique |
-
2005
- 2005-01-25 US US10/905,874 patent/US7177619B2/en not_active Expired - Fee Related
-
2006
- 2006-01-20 TW TW095102256A patent/TW200642002A/zh unknown
- 2006-01-25 CN CNB200610006159XA patent/CN100495729C/zh active Active
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101183685B (zh) * | 2006-11-15 | 2010-06-23 | 国际商业机器公司 | 可调谐电容器及其方法 |
CN104022152A (zh) * | 2014-06-04 | 2014-09-03 | 重庆大学 | 带有压应变薄膜应变源的双栅p沟道MOSFET及制备方法 |
CN104022153A (zh) * | 2014-06-04 | 2014-09-03 | 重庆大学 | 带有张应变薄膜应变源的双栅场效应晶体管及其制备方法 |
CN104022153B (zh) * | 2014-06-04 | 2016-10-12 | 重庆大学 | 带有张应变薄膜应变源的双栅场效应晶体管及其制备方法 |
CN104022152B (zh) * | 2014-06-04 | 2017-03-01 | 重庆大学 | 带有压应变薄膜应变源的双栅p沟道MOSFET及制备方法 |
CN106911326A (zh) * | 2015-12-18 | 2017-06-30 | 上海新微技术研发中心有限公司 | 一种可减少偏压控制信号的射频开关 |
CN117491835A (zh) * | 2023-12-29 | 2024-02-02 | 苏州元脑智能科技有限公司 | 测量方法、装置、系统、晶体管、集成电路、介质及设备 |
CN117491835B (zh) * | 2023-12-29 | 2024-03-15 | 苏州元脑智能科技有限公司 | 测量方法、装置、系统、晶体管、集成电路、介质及设备 |
Also Published As
Publication number | Publication date |
---|---|
US7177619B2 (en) | 2007-02-13 |
US20060164180A1 (en) | 2006-07-27 |
TW200642002A (en) | 2006-12-01 |
CN100495729C (zh) | 2009-06-03 |
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Effective date of registration: 20171219 Address after: Grand Cayman, Cayman Islands Patentee after: GLOBALFOUNDRIES INC. Address before: American New York Patentee before: Core USA second LLC Effective date of registration: 20171219 Address after: American New York Patentee after: Core USA second LLC Address before: New York grams of Armand Patentee before: International Business Machines Corp. |