CN1331418A - 液晶显示器的检测用信号分配装置 - Google Patents

液晶显示器的检测用信号分配装置 Download PDF

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Publication number
CN1331418A
CN1331418A CN00136435A CN00136435A CN1331418A CN 1331418 A CN1331418 A CN 1331418A CN 00136435 A CN00136435 A CN 00136435A CN 00136435 A CN00136435 A CN 00136435A CN 1331418 A CN1331418 A CN 1331418A
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CN
China
Prior art keywords
signal
detection
lcd
splicing ear
distributor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN00136435A
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English (en)
Chinese (zh)
Inventor
久保隆
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DAIWA SCIENCE CO Ltd
Original Assignee
DAIWA SCIENCE CO Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by DAIWA SCIENCE CO Ltd filed Critical DAIWA SCIENCE CO Ltd
Publication of CN1331418A publication Critical patent/CN1331418A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10—Measuring as part of the manufacturing process
    • H01L22/14—Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means

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  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Signal Processing (AREA)
  • Health & Medical Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Power Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Liquid Crystal (AREA)
  • Liquid Crystal Display Device Control (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
CN00136435A 2000-07-04 2000-12-25 液晶显示器的检测用信号分配装置 Pending CN1331418A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP202713/2000 2000-07-04
JP2000202713A JP2002022788A (ja) 2000-07-04 2000-07-04 液晶表示器の検査用信号分配装置

Publications (1)

Publication Number Publication Date
CN1331418A true CN1331418A (zh) 2002-01-16

Family

ID=18700204

Family Applications (1)

Application Number Title Priority Date Filing Date
CN00136435A Pending CN1331418A (zh) 2000-07-04 2000-12-25 液晶显示器的检测用信号分配装置

Country Status (3)

Country Link
JP (1) JP2002022788A (ko)
KR (1) KR20020005360A (ko)
CN (1) CN1331418A (ko)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102681226A (zh) * 2010-01-04 2012-09-19 京东方科技集团股份有限公司 阵列基板检测信号分配装置和检测设备
CN105284018A (zh) * 2013-05-29 2016-01-27 艾查元器件有限责任公司 信号分配器

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100443084B1 (ko) 2001-09-21 2004-08-04 삼성전자주식회사 구리 금속막의 연마 방법, 연마장치 및 구리 금속 배선형성 방법
KR100877648B1 (ko) 2007-04-23 2009-01-08 엘에스엠트론 주식회사 전기적 특성 측정 장치
KR101022908B1 (ko) * 2008-10-02 2011-03-16 삼성전기주식회사 무선 장비 테스트 장치

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05297025A (ja) * 1992-04-16 1993-11-12 Mitsubishi Heavy Ind Ltd 電子機器トラブルシュート用計測装置
JPH06165225A (ja) * 1992-11-18 1994-06-10 Toshiba Corp 映像表示システム
JP3297896B2 (ja) * 1994-09-30 2002-07-02 タキロン株式会社 ドットマトリクス型ｌｅｄ表示装置のデータ分配器
JP3699811B2 (ja) * 1996-09-24 2005-09-28 東芝電子エンジニアリング株式会社 液晶表示装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102681226A (zh) * 2010-01-04 2012-09-19 京东方科技集团股份有限公司 阵列基板检测信号分配装置和检测设备
CN102681226B (zh) * 2010-01-04 2015-01-21 京东方科技集团股份有限公司 阵列基板检测信号分配装置和检测设备
CN105284018A (zh) * 2013-05-29 2016-01-27 艾查元器件有限责任公司 信号分配器
CN105284018B (zh) * 2013-05-29 2018-02-13 艾查元器件有限责任公司 信号分配器

Also Published As

Publication number Publication date
KR20020005360A (ko) 2002-01-17
JP2002022788A (ja) 2002-01-23

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C02 Deemed withdrawal of patent application after publication (patent law 2001)
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