CN1320605C - Method and device for plasma doping - Google Patents
Method and device for plasma doping Download PDFInfo
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- CN1320605C CN1320605C CNB031597513A CN03159751A CN1320605C CN 1320605 C CN1320605 C CN 1320605C CN B031597513 A CNB031597513 A CN B031597513A CN 03159751 A CN03159751 A CN 03159751A CN 1320605 C CN1320605 C CN 1320605C
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Abstract
A method for impurity implantation, in which a substrate is positioned on a table provided within a chamber in which a vacuum will be introduced and also an implantation impurity is supplied. A first high frequency electric power is applied to a plasma generating element to thereby generate a plasma so that the impurity in the chamber is implanted in the substrate. Also, a second high frequency electric power is applied to the table. Detected are a condition of the plasma in the chamber and a voltage or current in the table. A controller controls at least one of the first and second high frequency electric power sources according to the detected condition of the plasma and/or the detected voltage or current, thereby controlling an implantation concentration of the impurity to be implanted.
Description
Technical field
The present invention relates to be used for by utilizing plasma doping or plasma injection technique that a kind of foreign ion is doped to for example method and apparatus of the matrix of semiconductor chip.
Background technology
U.S. Patent No. 4912065 discloses a kind of plasma doping method, and by this method, Ionized impurity is injected among the substrate by the energy that reduces.Japan Patent No.2718926 also discloses a kind of method that is used to control implanted dopant concentration, wherein in discharge high-frequency current is detected so that controlled.
Yet, this control method has a shortcoming, be exactly the variation of high frequency power, thereby the control high-frequency current causes foreign ion density in undesirable electron density, the plasma and the variation that acts on on-chip ion energy, and then cause the uncontrollable property of concentration.
Summary of the invention
Therefore, one object of the present invention is to propose a kind of method and apparatus of the concentration of controlled doping easily.
According to a kind of method and apparatus that is used for ion doping of the present invention, substrate is positioned on the workbench, and workbench is installed in and will is pumped into vacuum and will be transfused in the cavity of impurity.First high frequency electric source is carried on the plasma generating element, thereby in cavity, produces plasma, so that the impurity in the cavity is injected in the substrate.Workbench also has been coupled with second high frequency electric source.The state of cavity ionic medium body and the voltage in the workbench or electric current are detected.Controller is according to one in detected plasmoid and detected voltage or the electric current, in first and second high frequency electric sources at least one controlled, thus the implantation concentration of the control implanted dopant of wanting.
In another aspect of this invention, voltage or the electric current that is connected to by electric capacity on the electrode on the workbench detected.Then, controller is according to one in detected plasmoid and detected voltage or the electric current, in first and second high frequency electric sources at least one controlled, thus the implantation concentration of the control implanted dopant of wanting.
Description of drawings
Fig. 1 is a schematic profile according to the doper of first kind of embodiment of the present invention.
Fig. 2 shows the curve chart that concerns between emissive porwer and the boron concentration.
Fig. 3 shows the curve chart that concerns between high frequency voltage and the boron concentration.
Fig. 4 is a schematic vertical cross section that shows according to the doper of second kind of embodiment of the present invention.
Fig. 5 is the circuit diagram of match circuit, and it shows the structure of workbench simultaneously.
Fig. 6 is the circuit diagram that shows the change form of match circuit.
Fig. 7 is the schematic cross sectional view of the change form of doper.
Embodiment
Hereinafter with reference to accompanying drawing, the various embodiment that are used for plasma doping of the present invention and device are described.
With reference to Fig. 1, it has shown a kind of according to plasma doping apparatus of the present invention, is totally represented by drawing reference numeral 10.Doper 10 has cylindrical chamber 12, and it limits cavity 14.Container 12 has the sidewall 18 of qualification container 12 and the first 16 of diapire 20, and the second portion 22 that limits the roof 24 of container 12.The first 16 of container 12 is made by electric conducting material, for example aluminium and stainless steel, and electrical grounding is on the ground.The second portion 22 of container 12, promptly roof 24 is made by dielectric substance, and silex glass for example is in the sensed cavity 14 of its high-frequency electric field.Be limited with opening 26 in the diapire 20, opening 26 and such vacuum pump 28 fluid connections of for example turbomolecular pump.In cavity 14 and the place of adjacent openings 26, the valve member 30 that is supported by the lifting device (not shown) is installed, make the extent of opening of opening 26 and the vacuum in the cavity 12 be controlled in particular value, for example a 0.04Pa by the lifting of valve member 30.
The workbench of being made by for example aluminium and the such electric conducting material of stainless steel 32 is installed in the cavity 14.Workbench 32 is bearing in the central authorities of cavity by many insulating supports 34, with top dielectric wall 24 at a distance of certain distance, thereby limit a space 36 that is used to form the specified vol of plasma.Workbench 32 also has a top plan that is used to support such as the substrate 38 of silicon chip, will inject predetermined ion in the substrate.
Plasma gas supply source 40, promptly impurity source, is made and contains argon (Ar) and diborane (B in cavity 14 by fluid connection
2H
6) specific gas can be transported to the cavity 14 from impurity source.For example, the content of argon and diborane gas can be controlled in 10sscm (standard cubic centimeter/per minute) and 5sscm respectively.
Produce plasma 42 in the space 36 in order to form at plasma, inductively coupled plasma (ICP) particularly, above the dielectric walls 24 and be positioned at outside the cavity 14, plasma generating element or helical coil 44 to be installed with the coaxial mode of cylindrical chamber 12.As shown in the figure, the centre end 46 of coil 44 is positioned in the position that is higher than relative circumferential ends 48, makes coil 44 form a conical structure.The centre end 46 of coil 44 is connected on first high frequency electric source 50 that can apply High frequency power.First high frequency electric source 50 is the power supplys that can control voltage between 300kHz and 3GHz or by pulse-width regulated by FREQUENCY CONTROL, to change the density of the plasma that is produced in the cavity.In this embodiment, during beginning, for example the frequency of 13.56MHz is added on the coil 44.On the other hand, the circumferential end part 48 of coil 44 is grounding on the ground.
In order to make workbench 32 and substrate 38 have negative polarity with respect to plasma 42, second high frequency electric source 52 is electrically connected on the workbench 32 by a match circuit 54 and a voltage detector 56 (second monitor).Second high frequency electric source 52 that is used to change the ionization energy can be the conventional power source that is same or different from first high frequency electric source.For example, the power supply that can between 300kHz and 3GHz or by pulse-width regulated, control by FREQUENCY CONTROL of employing to voltage.In this embodiment, when for example beginning, be coupled with the 600kHz frequency on the workbench 32.The injection device 10 of present embodiment also adopts radiospectroscopy (optical emission spectroscopy) to come to produce in the test chamber 14 situation of plasma, controls the dosage that ion injects then.For this reason, the photo-detector 58 (first monitor) that can survey and measure the amount of the light that the plasma resonance from cavity 14 goes out has been installed.Monitor 56 and 58 is connected on the controller 60, and it is connected on first and second power supplys 50 and 52 successively, is used for controlling respectively the high frequency electric source that is added on coil 44 and the workbench 32.
In the operating process of the ion implantation apparatus 10 that so constitutes, substrate 38 is positioned on the workbench 32, makes substrate 38 contact fully with the opposite face of workbench 32.With this understanding, Ar and B
2H
6Mist, be input to the cavity 14 from plasma gas source of supply 40.In addition, cavity 14 is evacuated by pump 28, by moving up and/or down of valve member 30, thus the opening degree of adjusting opening 26, and then make vacuum degree controlled.In the case, in case high frequency electric source 50 is opened and induces high-frequency electric field in cavity 14, the top of the substrate 38 in the space 36 will produce plasma 42.Simultaneously, produce sheath voltage (sheath voltage) between plasma 42 and the substrate 38, make boron be injected into the end face of substrate 38 and form a ultra-thin boron implanted layer.
Utilize injection device to do test, with the relation between the boron concentration of determining emissive porwer and injection when on workbench and substrate, adding 1000V voltage, and when be added in the voltage that is added in when alternating current on the coil makes the emissive porwer of plasma be controlled in 0.5 (a.u.) on second high frequency electric source and the relation between the boron concentration by control.Showed its result among Fig. 2 and Fig. 3 respectively, its concentration that shows boron increases along with emissive porwer and institute's making alive.This means that each emissive porwer and voltage all represents a kind of situation of plasma, and all have direct relation with ion concentration.This so mean the output that measures by photodetector 58 by control corresponding to first high frequency electric source 50 of the light radiation of plasma 42, and/or by controlling the output of second high frequency electric source 52, promptly be added on the workbench 32 and by the measured voltage of voltage detector 56, boron concentration just is under control.Therefore, according to injection device 10 of the present invention, controller 60 is programmed to any one or whole two in first and second high frequency electric sources 50 and 52 are controlled, thereby produces the surperficial needed ion dose that will be injected into substrate 38.Specifically, in this process, first power supply is subjected to FEEDBACK CONTROL so that the plasma vapour phase is stable, and second source also is controlled so that obtain constant voltage or power.
With reference to Fig. 4, will the another kind of injection device according to second kind of embodiment of the present invention be described, it is indicated by drawing reference numeral 10A generally.In this embodiment, adopted a kind of single probe method to come the state of the plasma of generation in the test chamber 14, the dosage that ion is injected is controlled then.For this reason, the independent probe 62 by the rod-shaped electrode that tungsten is made has been inserted in the cavity 14, and adjacent with plasma formation space 36.Probe 62 also is electrically connected with a device 64 that is used to detect current strength, described device 64 and then be connected on the controller 60.Current strength is corresponding to the emissive porwer of plasma, this means by device 64 detected current strength to be used to controller 60, the state of the plasma that is produced with control and and then the control substrate in injected the concentration of boron.
In addition, around workbench 68 the annular monitoring electrode of being made by electric conducting material 66 is installed, described annular electrode 66 is also connecting match circuit 70.Fig. 5 has shown the structure of the workbench 68 of the details of match circuit 70 and this embodiment.As shown in the figure, workbench 68 has by insulating material being used to of making and supports the upper flat plate part 72 of injecting substrate 38, and by the lower flat plate part 74 that is used to support the upper flat plate part of conductor material supporting.Upper flat plate part 72 comprises a pair of chuck electrode that is embedded in wherein at least, first electrode 76 and second electrode 78.First and second electrodes 76 and 78 are connected on the DC power supply 80, apply specific direct voltage like this between chuck electrode 76 and 78, thereby are formed for substrate 38 is fixed on electrostatic force on the workbench 68.
By adopting said structure, high-frequency electrical energy, is transported on the annular monitoring electrode 66 by electric capacity 86, coil 88, electric capacity 90 and lead-out terminal 100 from power supply 52.In this case, the voltage of annular monitoring electrode 66 is identical with voltage on the lead-out terminal 100, obtains the proportional voltage of direct voltage with monitoring electrode 66 as a result on the supervisory circuit 94.When obtaining also with first kind of embodiment in the corresponding voltage of workbench voltage then controlled device 60 adopt, inject the concentration of boron with control.
Still in this match circuit 70, electric capacity 90 is separated monitoring electrode 66 from the lower plate portions 74 of workbench 68, and this has prevented to produce big negative voltage on lower plate portions 74, and described big negative voltage can cause the insulating properties variation of upper flat plate 72.Low pass filter 92 can the elimination high-frequency electrical energy.
Among the embodiment in front, annular monitoring electrode is floated in circuit by electric, does not have electric current to flow as a result in the circuit.In contrast, for the electric current that in circuit, produce to flow and and then utilize detected electric current to obtain voltage, can make modification as shown in Figure 6.Specifically, in this revised, the supervisory circuit 102 in the match circuit 54 had the first circuit part (not shown) that is used to detect the electric current that flows through and is used to calculate second circuit part (not shown) with the corresponding voltage of detected electric current.In addition, be installed in the resistance that the resistance that is used to detect electric current in first circuit has reduction usually, it can produce overheated and can cause supervisory circuit to be made mistakes.In order to prevent this point, resistance 104 preferably is connected on the annular monitoring electrode 66 with the form of polyphone, to reduce to flow into the electric current in the supervisory circuit.As shown in Figure 6, can also between electric capacity 90 and supervisory circuit 102, connect an interpole coil 106, flow in the supervisory circuit 102 to prevent high-frequency current.
Adopt the injection device shown in Fig. 6 to test.In this test, substrate is positioned on the workbench.Include Ar and B
2H
6The injection mist be transported to cavity.The content of argon and diborane is controlled in 10sccm (standard cubic centimeter/per minute) and 5sccm respectively.Pressure in the cavity is maintained at 0.04Pa.In the case, helical coil and workbench (lower plate portions) are applied in respectively from power supply 50 and 52 high-frequency electrical energys.The result confirms that boron is injected in the surface of substrate.
In addition, in this test, the high-frequency electrical energy that is added on helical coil and the workbench (lower plate portions) is changed.Simultaneously, to the electric current that flows in the supervisory circuit, and be injected into the concentration of substrate top surface and detect at a distance of the boron of the substrate inside of 1.0nm.
The result shows, if it is constant that the direct current in the annular electrode keeps, the concentration of boron just roughly increases pro rata along with the intensity of ionic current, on the other hand, if it is constant that the intensity of ionic current keeps, boron concentration just roughly increases pro rata along with the direct current in the annular electrode.This means that keeping ionic current intensity constant, and control simultaneously is added in another high frequency electric source on the workbench and keeps current constant in the monitoring electrode, just can accurately control the concentration of boron by the high frequency electric source of control in the helical coil.
Though various embodiment are illustrated, injection device of the present invention can be made amendment and/or improves by variety of way.For example, as shown in Figure 7, can adopt a hemispherical dome 108 to replace plate shaped roof among Fig. 1 and Fig. 4.In this embodiment, coil can be configured to a kind of form of non-helical shape.Can also install one is used to produce and passes the magnetic coil 110 of roof towards the magnetic field of substrate, it can produce helicon wave plasma (helicon waveplasma) or the neutral ring of magnetic plasma (magnetic neutral loop plasma), and each all has the intensity higher than inductively coupled plasma.Change kind of a mode, also can be in conjunction with adopting antenna for radiating microwave and magnetic coil.In this embodiment, produced a kind of Ecr plasma in the cavity, it has the intensity higher than inductively coupled plasma.In these change forms,, in cavity, can produce D.C. magnetic field or be lower than the low frequency magnetic field of 1kHz by the electric current that flows in the control magnetic coil.
Although what be used as substrate is the semiconductor flat board of being made by silicon, it also can be made by any material.
In addition, what be used as implanted dopant and be alloy is boron, also can substitute to inject or extra other dopant that comprises arsenic, phosphorus, aluminium and antimony that injects.
In addition, although adopt argon Ar, also can adopt other gas, for example the gas that constitutes by nitrogen and helium as diluent gas.
Also have, although impurity is to be B with gas form
2H
6Be introduced into, impurity also can be compounded in the inside or the surface of a certain specific matrix (impurity source), enters into cavity by for example sputter then.
In addition, although be used for monitoring the radiant light spectrometry of cavity ionic medium body state and single probe method formerly embodiment obtained description, also other alternative method be can adopt, laser induced fluorescence method, infrared laser absorption spectrometry, vacuum ultraviolet absorption spectrometry, laser scattering method, double probe method, three probe methods and four-electrode spectrum method comprised.
Although among the embodiment formerly the voltage that is added on the workbench is monitored, also can replace the electric current that monitoring flow is crossed.
In addition, although what monitor among the embodiment formerly is voltage and current in the monitoring electrode, also can replace monitoring high-frequency current wherein.
List of parts:
10: ion implantation apparatus
12: container
14: cavity
16: the first of container
18: sidewall
20: diapire
22: the second portion of container
24: roof
26: opening
28: vacuum pump
30: valve member
32: workbench
34: support
36: the space
38: substrate
40: the plasma gas source of supply
42: plasma
44: helical coil
46: the end, center of coil
48: the circumferential ends of coil
50: the first high frequency electric sources
52: the second high frequency electric sources
54: match circuit
56: voltage detector (second watch-dog)
58: photodetector (first watch-dog)
60: controller
62: probe (single probe)
64: the current strength supervising device
66: annular monitoring electrode
68: workbench
70: match circuit
72: upper board part
74: lower plate portions
76: the first electrodes
78: the second electrodes
80: DC power supply
82: terminal
84,86: electric capacity
88: coil
90: electric capacity
92: low pass filter
94: supervisory circuit
96: terminal
98: lead-out terminal
100: lead-out terminal
102: supervisory circuit
104: resistance
106: coil
Claims (12)
1. one kind is used for the device that plasma injects, and it comprises:
Its inside is limited with the vacuum tank of vacuum cavity;
Be installed in the workbench that is used to support the substrate that will be injected into impurity in the cavity;
Be installed in the outer plasma generating element of cavity;
With first high-frequency electrical energy being loaded on the described element in cavity, to produce first power supply of plasma;
Be used for second high-frequency electrical energy is loaded into second source on the described workbench;
Be used to detect first detector of plasmoid;
Be used for the voltage of testing platform or second detector of electric current; With
Controller, it is used for according to by the state of the detected plasma of first detector with by detected voltage of second detector or electric current one, come in first and second high frequency electric sources at least one controlled, thus the implantation concentration of the control implanted dopant of wanting.
2. one kind is used for the device that plasma injects, and it comprises:
Its inside is limited with the vacuum tank of vacuum cavity;
Be installed in the workbench that is used to support the substrate that will be injected into impurity in the cavity;
Be installed in the outer plasma generating element of cavity;
With first high-frequency electrical energy being loaded on the described element in cavity, to produce first power supply of plasma;
Be used for second high-frequency electrical energy is loaded into second source on the described workbench;
Be used to detect first detector of plasmoid;
Be used for the voltage of testing platform or second detector of electric current; With
Controller, it is used for according to by the state of the detected plasma of first detector with by two conditions of detected voltage of second detector or electric current, come in first and second high frequency electric sources at least one controlled, thus the implantation concentration of the control implanted dopant of wanting.
3. device as claimed in claim 1 or 2 is characterized in that first detector adopts a kind of method of selecting from following method to described status detection: radiant light spectrometry, single probe method, double probe method, three probe methods, laser induced fluorescence method, infrared laser absorption spectrometry, vacuum ultraviolet absorption spectrometry, laser scattering method and four-electrode spectrum method.
4. one kind is used for the device that plasma injects, and it comprises:
Its inside is limited with the vacuum tank of vacuum cavity;
Be installed in the workbench that is used to support the substrate that will be injected into impurity in the cavity;
Be installed in the outer plasma generating element of cavity;
Be used for first high-frequency electrical energy is loaded into described element to form first power supply of plasma at described cavity;
Be used for second high-frequency electrical energy is loaded into second source on the workbench;
With workbench in abutting connection with installing and being connected to electrode on the workbench by electric capacity;
Be used to detect first detector of plasmoid;
Second detector that is used for detecting electrode voltage or electric current;
Controller, it is used for according to by the detected plasmoid of first detector with by detected voltage of second detector or electric current one, come in first and second high frequency electric sources at least one controlled, thus the implantation concentration of the control implanted dopant of wanting.
5. one kind is used for the device that plasma injects, and it comprises:
Its inside is limited with the vacuum tank of vacuum cavity;
Be installed in the workbench that is used to support the substrate that will be injected into impurity in the cavity;
Be installed in the outer plasma generating element of cavity;
Be used for first high-frequency electrical energy is loaded into described element to form first power supply of plasma at described cavity;
Be used for second high-frequency electrical energy is loaded into second source on the workbench;
With workbench in abutting connection with installing and being connected to electrode on the workbench by electric capacity;
Be used to detect first detector of plasmoid;
Second detector that is used for detecting electrode voltage or electric current;
Controller, it is used for according to by the detected plasmoid of first detector with by two conditions of detected voltage of second detector or electric current, come in first and second high frequency electric sources at least one controlled, thus the implantation concentration of the control implanted dopant of wanting.
6. as claim 4 or 5 described devices, it is characterized in that first detector adopts a kind of method of selecting from following method to described status detection: radiant light spectrometry, single probe method, double probe method, three probe methods, laser induced fluorescence method, infrared laser absorption spectrometry, vacuum ultraviolet absorption spectrometry, laser scattering method and four-electrode spectrum method.
7. method that is used for impurity is injected into substrate comprises step:
Substrate is positioned on the workbench that is installed in the cavity;
In cavity, produce vacuum;
Impurity is input in the cavity;
First high-frequency electrical energy is loaded on the plasma generating element, thereby produces plasma, so that the impurity in the cavity is injected in the substrate;
Second high-frequency electrical energy is added on the workbench;
Plasmoid in the test chamber;
Voltage in the testing platform or electric current; With
According to one in the state of detected plasma and detected voltage or the electric current, in first and second high frequency electric sources at least one controlled, thereby control to be injected into the implantation concentration of the impurity in the substrate.
8. method that is used for impurity is injected into substrate comprises step:
Substrate is positioned on the workbench that is installed in the cavity;
In cavity, produce vacuum;
Impurity is input in the cavity;
First high-frequency electrical energy is loaded on the plasma generating element, thereby produces plasma, so that the impurity in the cavity is injected in the substrate;
Second high-frequency electrical energy is added on the workbench;
Plasmoid in the test chamber;
Voltage in the testing platform or electric current; With
According to two conditions of state and the detected voltage or the electric current of detected plasma, in first and second high frequency electric sources at least one controlled, thereby control to be injected into the implantation concentration of the impurity in the substrate.
9. as claim 7 or 8 described methods, it is characterized in that the supply frequency of each all is controlled in the scope of 300kHz to 3GHz in first and second power supplys.
10. method that is used for impurity is injected into substrate comprises step:
Substrate is positioned on the workbench in the cavity;
In cavity, produce vacuum;
Implanted dopant is transported in the cavity;
First high-frequency electrical energy is loaded on the element, to produce plasma, so that the impurity in the cavity is injected in the substrate;
Second high-frequency electrical energy is added on the workbench;
The state of the plasma in the test chamber;
Detection is connected to voltage or electric current on the electrode on the workbench through electric capacity; With
According to one in detected plasmoid and detected voltage or the electric current, in first and second high frequency electric sources at least one controlled, so that the implantation concentration of implanted dopant is wanted in control.
11. a method that is used for impurity is injected into substrate comprises step:
Substrate is positioned on the workbench in the cavity;
In cavity, produce vacuum;
Implanted dopant is transported in the cavity;
First high-frequency electrical energy is loaded on the element, to produce plasma, so that the impurity in the cavity is injected in the substrate;
Second high-frequency electrical energy is added on the workbench;
The state of the plasma in the test chamber;
Detection is connected to voltage or electric current on the electrode on the workbench through electric capacity; With
According to two conditions of detected plasmoid and detected voltage or electric current, in first and second high frequency electric sources at least one controlled, so that the implantation concentration of implanted dopant is wanted in control.
12., it is characterized in that the frequency of the electric energy of each output from first and second power supplys all is controlled in the scope of 300kHz to 3GHz as claim 10 or 11 described methods.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/611,867 | 2003-07-03 | ||
| US10/611,867 US20040036038A1 (en) | 2002-07-11 | 2003-07-03 | Method and apparatus for plasma doping |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1577746A CN1577746A (en) | 2005-02-09 |
| CN1320605C true CN1320605C (en) | 2007-06-06 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB031597513A Expired - Fee Related CN1320605C (en) | 2003-07-03 | 2003-09-24 | Method and device for plasma doping |
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| Country | Link |
|---|---|
| CN (1) | CN1320605C (en) |
| TW (1) | TWI312645B (en) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101177867B1 (en) * | 2005-05-12 | 2012-08-28 | 파나소닉 주식회사 | Plasma doping method and plasma doping apparatus |
| CN102290341B (en) * | 2007-09-27 | 2013-07-10 | 汉辰科技股份有限公司 | Ion implantation method |
| CN102324383B (en) * | 2007-09-27 | 2013-10-16 | 汉辰科技股份有限公司 | Ion implantation method and method for adjusting ion beam scanning rate |
| CN102124543B (en) * | 2008-08-15 | 2013-03-13 | 株式会社爱发科 | Plasma doping method and semiconductor device manufacturing method |
| CN103715073B (en) * | 2013-12-23 | 2016-03-09 | 京东方科技集团股份有限公司 | Improve the method for ion implantation |
| KR102306695B1 (en) | 2014-03-14 | 2021-09-28 | 어플라이드 머티어리얼스, 인코포레이티드 | Smart chamber and smart chamber components |
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| JP2718926B2 (en) * | 1987-05-29 | 1998-02-25 | 松下電器産業株式会社 | Plasma doping method |
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| WO2001011659A1 (en) * | 1999-08-06 | 2001-02-15 | Axcelis Technologies, Inc. | System and method for providing implant dose uniformity across the surface of a substrate |
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| WO2002023586A2 (en) * | 2000-09-13 | 2002-03-21 | Infineon Technologies North America Corp. | Apparatus for etching noble metals using ion implantation and method of use |
| CN1361889A (en) * | 1999-07-20 | 2002-07-31 | 东京电子株式会社 | Electron density measurement and plasma process control system using a microwave oscillator locked to an open resonator containing the plasma |
-
2003
- 2003-09-15 TW TW092125348A patent/TWI312645B/en not_active IP Right Cessation
- 2003-09-24 CN CNB031597513A patent/CN1320605C/en not_active Expired - Fee Related
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2718926B2 (en) * | 1987-05-29 | 1998-02-25 | 松下電器産業株式会社 | Plasma doping method |
| US5393986A (en) * | 1991-09-09 | 1995-02-28 | Sharp Kabushiki Kaisha | Ion implantation apparatus |
| US5572038A (en) * | 1993-05-07 | 1996-11-05 | Varian Associates, Inc. | Charge monitor for high potential pulse current dose measurement apparatus and method |
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| WO2002023586A2 (en) * | 2000-09-13 | 2002-03-21 | Infineon Technologies North America Corp. | Apparatus for etching noble metals using ion implantation and method of use |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI312645B (en) | 2009-07-21 |
| CN1577746A (en) | 2005-02-09 |
| TW200503590A (en) | 2005-01-16 |
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