CN1224300A - 具有双复位系统的金属氧化物半导体型放大图象传感器 - Google Patents
具有双复位系统的金属氧化物半导体型放大图象传感器 Download PDFInfo
- Publication number
- CN1224300A CN1224300A CN98124484A CN98124484A CN1224300A CN 1224300 A CN1224300 A CN 1224300A CN 98124484 A CN98124484 A CN 98124484A CN 98124484 A CN98124484 A CN 98124484A CN 1224300 A CN1224300 A CN 1224300A
- Authority
- CN
- China
- Prior art keywords
- reset
- floating
- diffusion
- photodiode
- electronics
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005540 biological transmission Effects 0.000 claims description 14
- 238000009792 diffusion process Methods 0.000 claims description 12
- 238000009825 accumulation Methods 0.000 claims description 8
- 230000000717 retained effect Effects 0.000 claims description 7
- 230000000994 depressogenic effect Effects 0.000 claims description 2
- 238000000926 separation method Methods 0.000 claims description 2
- 238000005070 sampling Methods 0.000 abstract description 5
- 230000003287 optical effect Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000003321 amplification Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 230000000881 depressing effect Effects 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Abstract
Description
Claims (11)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1545/1998 | 1998-01-20 | ||
KR1545/98 | 1998-01-20 | ||
KR1019980001545A KR100266657B1 (ko) | 1998-01-20 | 1998-01-20 | 이중 리셋 구조를 갖는 모스형 증폭 촬상소자 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1224300A true CN1224300A (zh) | 1999-07-28 |
CN1203664C CN1203664C (zh) | 2005-05-25 |
Family
ID=19531811
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB98124484XA Expired - Fee Related CN1203664C (zh) | 1998-01-20 | 1998-11-11 | 具有双复位系统的金属氧化物半导体型放大图象传感器 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JPH11261896A (zh) |
KR (1) | KR100266657B1 (zh) |
CN (1) | CN1203664C (zh) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2005122555A1 (fr) * | 2004-06-09 | 2005-12-22 | Via Technologies, Inc. | Fonctionnement d'un bloc capteur d'images et un dispositif capteur d'images equipe d'un tel bloc |
CN105027287A (zh) * | 2013-02-28 | 2015-11-04 | E2V半导体公司 | 具有抗模糊栅极的图像传感器 |
CN102801419B (zh) * | 2004-02-23 | 2016-12-21 | 索尼株式会社 | 模拟数字转换方法和装置、半导体器件及电子装置 |
CN111246134A (zh) * | 2020-01-16 | 2020-06-05 | 锐芯微电子股份有限公司 | 图像传感器的抗弥散方法及图像传感器 |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7129979B1 (en) * | 2000-04-28 | 2006-10-31 | Eastman Kodak Company | Image sensor pixel for global electronic shuttering |
US6720592B1 (en) * | 2001-06-29 | 2004-04-13 | National Semiconductor Corp. | Apparatus for high sensitivity, low lag, high voltage swing in a pixel cell with an electronic shutter |
KR20040047901A (ko) * | 2001-10-09 | 2004-06-05 | 포톤포쿠스 아게 | 광전 센서 |
JP4117540B2 (ja) * | 2002-10-17 | 2008-07-16 | ソニー株式会社 | 固体撮像素子の制御方法 |
KR101028137B1 (ko) * | 2003-04-30 | 2011-04-08 | 크로스텍 캐피탈, 엘엘씨 | 씨모스 이미지 센서의 단위화소 |
JP3829833B2 (ja) | 2003-09-09 | 2006-10-04 | セイコーエプソン株式会社 | 固体撮像装置及びその駆動方法 |
JP4870528B2 (ja) | 2006-11-17 | 2012-02-08 | オリンパス株式会社 | 固体撮像装置 |
KR100788381B1 (ko) * | 2006-12-22 | 2008-01-02 | 동부일렉트로닉스 주식회사 | 씨모스 이미지 센서 및 그 제조 방법 |
JP5101972B2 (ja) | 2007-10-02 | 2012-12-19 | オリンパス株式会社 | 固体撮像装置 |
US8928787B2 (en) * | 2009-12-22 | 2015-01-06 | Samsung Electronics Co., Ltd. | Photographing apparatus and photographing method |
JP5528093B2 (ja) * | 2009-12-22 | 2014-06-25 | 三星電子株式会社 | 撮像装置および撮像方法 |
JP5485680B2 (ja) * | 2009-12-22 | 2014-05-07 | 三星電子株式会社 | 撮像装置および撮像方法 |
JP5718069B2 (ja) | 2011-01-18 | 2015-05-13 | オリンパス株式会社 | 固体撮像装置および撮像装置 |
-
1998
- 1998-01-20 KR KR1019980001545A patent/KR100266657B1/ko not_active IP Right Cessation
- 1998-11-11 CN CNB98124484XA patent/CN1203664C/zh not_active Expired - Fee Related
-
1999
- 1999-01-20 JP JP11011445A patent/JPH11261896A/ja active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102801419B (zh) * | 2004-02-23 | 2016-12-21 | 索尼株式会社 | 模拟数字转换方法和装置、半导体器件及电子装置 |
WO2005122555A1 (fr) * | 2004-06-09 | 2005-12-22 | Via Technologies, Inc. | Fonctionnement d'un bloc capteur d'images et un dispositif capteur d'images equipe d'un tel bloc |
CN105027287A (zh) * | 2013-02-28 | 2015-11-04 | E2V半导体公司 | 具有抗模糊栅极的图像传感器 |
US10062725B2 (en) | 2013-02-28 | 2018-08-28 | Teledyne E2V Semiconductors Sas | Image sensor with anti-blooming gate |
CN111246134A (zh) * | 2020-01-16 | 2020-06-05 | 锐芯微电子股份有限公司 | 图像传感器的抗弥散方法及图像传感器 |
Also Published As
Publication number | Publication date |
---|---|
KR100266657B1 (ko) | 2000-10-02 |
JPH11261896A (ja) | 1999-09-24 |
KR19990065971A (ko) | 1999-08-16 |
CN1203664C (zh) | 2005-05-25 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN1203664C (zh) | 具有双复位系统的金属氧化物半导体型放大图象传感器 | |
US9445020B2 (en) | Solid-state imaging element having image signal overflow path | |
US9456158B2 (en) | Physical information acquisition method, a physical information acquisition apparatus, and a semiconductor device | |
US6603513B1 (en) | Using a single control line to provide select and reset signals to image sensors in two rows of a digital imaging device | |
EP0942593B1 (en) | Solid state image pickup apparatus | |
US4962412A (en) | Photoelectric conversion apparatus without isolation regions | |
US6445022B1 (en) | Increasing pixel conversion gain in CMOS image sensors | |
KR100695705B1 (ko) | 증폭형 고체 촬상 장치 및 그 구동 방법 | |
US8766157B2 (en) | High dynamic range CMOS pixel and method of operating same | |
KR100920166B1 (ko) | 증폭형 고체 촬상장치 | |
US7573016B2 (en) | Amplification type solid-state imaging device | |
KR101031982B1 (ko) | 고상 촬상 디바이스 및 그 구동 방법 | |
US20040036784A1 (en) | High dynamic range pixel with gain and true shutter capability | |
EP1149487B1 (en) | Solid-state image pickup device, method of driving the same and camera system | |
US7924331B2 (en) | Solid-state imaging device and driving method thereof that prevents image quality defect caused by coupling occuring when signal charge is read out from photodiode | |
EP1469520A2 (en) | Scanning switch transistor for solid-state imaging device | |
US7973844B2 (en) | Solid state image pickup device | |
KR100412995B1 (ko) | 병렬아날로그 버스 및 열구동부를 갖는 이미지센서 | |
JP2002077732A (ja) | 固体撮像装置 | |
WO1999043153A9 (en) | A single control line for providing select and reset signals to two rows of an image sensor | |
JPH05152552A (ja) | 固体撮像装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C06 | Publication | ||
PB01 | Publication | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: MAGNACHIP CO., LTD. Free format text: FORMER OWNER: HYNIX SEMICONDUCTOR INC. Effective date: 20070518 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20070518 Address after: North Chungcheong Province Patentee after: Magnachip Semiconductor Ltd. Address before: North Chungcheong Province Patentee before: Hairyoksa Semiconductor Co., Ltd. |
|
ASS | Succession or assignment of patent right |
Owner name: KONO SCIENCE CO., LTD. Free format text: FORMER OWNER: MAGNACHIP CO., LTD. Effective date: 20090807 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20090807 Address after: Delaware Patentee after: Magnachip Semiconductor Ltd. Address before: North Chungcheong Province Patentee before: Magnachip Semiconductor Ltd. |
|
C17 | Cessation of patent right | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20050525 Termination date: 20131111 |