CN120898109A - 测定装置 - Google Patents

测定装置

Info

Publication number
CN120898109A
CN120898109A CN202480018515.6A CN202480018515A CN120898109A CN 120898109 A CN120898109 A CN 120898109A CN 202480018515 A CN202480018515 A CN 202480018515A CN 120898109 A CN120898109 A CN 120898109A
Authority
CN
China
Prior art keywords
temperature
measurement
stylus
unit
time
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202480018515.6A
Other languages
English (en)
Chinese (zh)
Inventor
前田邦博
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Seimitsu Co Ltd
Original Assignee
Tokyo Seimitsu Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Seimitsu Co Ltd filed Critical Tokyo Seimitsu Co Ltd
Publication of CN120898109A publication Critical patent/CN120898109A/zh
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/28—Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/045—Correction of measurements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0011—Arrangements for eliminating or compensation of measuring errors due to temperature or weight
    • G01B5/0014—Arrangements for eliminating or compensation of measuring errors due to temperature or weight due to temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/20—Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
    • G01B2210/60—Unique sensor identification

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
CN202480018515.6A 2023-03-13 2024-03-08 测定装置 Pending CN120898109A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2023-039048 2023-03-13
JP2023039048A JP2024129692A (ja) 2023-03-13 2023-03-13 測定装置
PCT/JP2024/008970 WO2024190643A1 (ja) 2023-03-13 2024-03-08 測定装置

Publications (1)

Publication Number Publication Date
CN120898109A true CN120898109A (zh) 2025-11-04

Family

ID=92755703

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202480018515.6A Pending CN120898109A (zh) 2023-03-13 2024-03-08 测定装置

Country Status (4)

Country Link
JP (1) JP2024129692A (https=)
CN (1) CN120898109A (https=)
DE (1) DE112024001199T5 (https=)
WO (1) WO2024190643A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN120651078B (zh) * 2025-07-24 2025-11-18 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） 一种光面环规自动校准装置和方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60214212A (ja) * 1984-04-10 1985-10-26 Mitsutoyo Mfg Co Ltd 測定装置
DE8813875U1 (de) * 1988-11-05 1988-12-22 Fa. Carl Zeiss, 7920 Heidenheim Taster für Koordinatenmeßgeräte
CN115461593B (zh) * 2020-04-30 2023-08-29 株式会社东京精密 测量装置

Also Published As

Publication number Publication date
DE112024001199T5 (de) 2026-01-15
JP2024129692A (ja) 2024-09-27
WO2024190643A1 (ja) 2024-09-19

Similar Documents

Publication Publication Date Title
JP6324588B2 (ja) 輪郭形状表面粗さ測定装置および輪郭形状表面粗さ測定方法
US11859969B2 (en) Measurement device
JP5816475B2 (ja) 産業機械
JP5810243B1 (ja) 形状測定機
JP2011503628A (ja) 座標測定機を校正するための方法
US20030069708A1 (en) Method for calibrating probe and computer-readable medium
CN120898109A (zh) 测定装置
Byman et al. High accuracy step gauge interferometer
JP4931867B2 (ja) 可変端度器
CN112444229B (zh) 形状测量装置、基准器及检测仪的校准方法
JP2015055517A (ja) 産業機械及びシフト量算出方法
JP2025160845A (ja) レーザ測定校正方法
JP2006145560A (ja) 倣いプローブの校正プログラムおよび校正方法
JP2024129694A (ja) 測定装置
WO2024190644A1 (ja) 測定装置
JP2024129693A (ja) 測定装置
WO2026004716A1 (ja) 校正方法及び校正装置
JP2012181021A (ja) 接触式プローブおよび形状測定装置
JP2026006943A (ja) 測定装置、測定方法及び測定制御プログラム
JP2003114116A (ja) 倣いプローブの校正装置および校正方法および誤差補正方法
JP2026006945A (ja) 測定装置、測定方法及び測定制御プログラム
JP2026023130A (ja) 座標測定機の評価システム、評価方法及び補正方法
JP2021173719A (ja) 測定装置
Hermann Design of calibration system for tactile displacement probes

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination