CN120403416A - 应变计 - Google Patents

应变计

Info

Publication number
CN120403416A
CN120403416A CN202510602609.4A CN202510602609A CN120403416A CN 120403416 A CN120403416 A CN 120403416A CN 202510602609 A CN202510602609 A CN 202510602609A CN 120403416 A CN120403416 A CN 120403416A
Authority
CN
China
Prior art keywords
metal layer
resistor
wiring
strain gauge
strain
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202510602609.4A
Other languages
English (en)
Chinese (zh)
Inventor
小野彩
小笠洋介
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MinebeaMitsumi Inc
Original Assignee
MinebeaMitsumi Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MinebeaMitsumi Inc filed Critical MinebeaMitsumi Inc
Publication of CN120403416A publication Critical patent/CN120403416A/zh
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/16—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge
    • G01B7/18—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge using change in resistance
    • G01B7/20—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge using change in resistance formed by printed-circuit technique
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/16—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge
    • G01B7/18—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge using change in resistance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2287—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges constructional details of the strain gauges

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
CN202510602609.4A 2022-05-02 2023-04-27 应变计 Pending CN120403416A (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2022-076117 2022-05-02
JP2022076117A JP7779799B2 (ja) 2022-05-02 2022-05-02 ひずみゲージ
CN202380037897.2A CN119137441B (zh) 2022-05-02 2023-04-27 应变计
PCT/JP2023/016698 WO2023214537A1 (ja) 2022-05-02 2023-04-27 ひずみゲージ

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
CN202380037897.2A Division CN119137441B (zh) 2022-05-02 2023-04-27 应变计

Publications (1)

Publication Number Publication Date
CN120403416A true CN120403416A (zh) 2025-08-01

Family

ID=88646471

Family Applications (2)

Application Number Title Priority Date Filing Date
CN202510602609.4A Pending CN120403416A (zh) 2022-05-02 2023-04-27 应变计
CN202380037897.2A Active CN119137441B (zh) 2022-05-02 2023-04-27 应变计

Family Applications After (1)

Application Number Title Priority Date Filing Date
CN202380037897.2A Active CN119137441B (zh) 2022-05-02 2023-04-27 应变计

Country Status (5)

Country Link
US (2) US12359990B2 (enExample)
EP (1) EP4521057A4 (enExample)
JP (2) JP7779799B2 (enExample)
CN (2) CN120403416A (enExample)
WO (1) WO2023214537A1 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7737790B2 (ja) * 2020-10-16 2025-09-11 ミネベアミツミ株式会社 ひずみゲージ

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04274703A (ja) * 1991-02-28 1992-09-30 Kyowa Electron Instr Co Ltd 金属箔ひずみゲージの電極形成方法
CN103604363B (zh) * 2013-11-30 2017-08-29 中航电测仪器股份有限公司 一种塑性变形测试用应变计及其制造和标定方法
JP6162670B2 (ja) 2014-10-03 2017-07-12 株式会社東京測器研究所 ひずみゲージ用合金及びひずみゲージ
JP2019132790A (ja) * 2018-02-02 2019-08-08 ミネベアミツミ株式会社 ひずみゲージ
CN110736421A (zh) * 2019-11-21 2020-01-31 中国船舶重工集团公司第七0四研究所 用于弹性体应变测量的薄膜应变计及制备方法
JP7469933B2 (ja) 2020-03-30 2024-04-17 ミネベアミツミ株式会社 ひずみゲージ
JP7737790B2 (ja) 2020-10-16 2025-09-11 ミネベアミツミ株式会社 ひずみゲージ
JP2022076117A (ja) 2020-11-09 2022-05-19 国立大学法人大阪大学 前立腺がんを検査する方法
JP7189240B2 (ja) * 2021-01-18 2022-12-13 ミネベアミツミ株式会社 ひずみゲージ
CN214843003U (zh) * 2021-07-13 2021-11-23 张继华 温度补偿型半导体应变计
CN114045467B (zh) * 2021-11-09 2023-12-01 北京石墨烯技术研究院有限公司 柔性应变传感器的制备方法以及柔性应变传感器

Also Published As

Publication number Publication date
US20250314539A1 (en) 2025-10-09
WO2023214537A1 (ja) 2023-11-09
EP4521057A4 (en) 2026-04-29
JP2023165275A (ja) 2023-11-15
US12359990B2 (en) 2025-07-15
JP2026026108A (ja) 2026-02-16
CN119137441B (zh) 2025-05-30
JP7779799B2 (ja) 2025-12-03
EP4521057A1 (en) 2025-03-12
CN119137441A (zh) 2024-12-13
US20250172444A1 (en) 2025-05-29

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