CN119654452A - SiC基板及SiC复合基板 - Google Patents

SiC基板及SiC复合基板 Download PDF

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Publication number
CN119654452A
CN119654452A CN202280095382.3A CN202280095382A CN119654452A CN 119654452 A CN119654452 A CN 119654452A CN 202280095382 A CN202280095382 A CN 202280095382A CN 119654452 A CN119654452 A CN 119654452A
Authority
CN
China
Prior art keywords
sic
substrate
biaxially oriented
layer
bpd
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202280095382.3A
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English (en)
Chinese (zh)
Inventor
浦田勇辉
松岛洁
吉川润
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NGK Insulators Ltd
Original Assignee
NGK Insulators Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NGK Insulators Ltd filed Critical NGK Insulators Ltd
Publication of CN119654452A publication Critical patent/CN119654452A/zh
Pending legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/80Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
    • H10D62/83Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge
    • H10D62/832Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge being Group IV materials comprising two or more elements, e.g. SiGe
    • H10D62/8325Silicon carbide
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B1/00Single-crystal growth directly from the solid state
    • C30B1/02Single-crystal growth directly from the solid state by thermal treatment, e.g. strain annealing
    • C30B1/023Single-crystal growth directly from the solid state by thermal treatment, e.g. strain annealing from solids with amorphous structure
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/10Inorganic compounds or compositions
    • C30B29/36Carbides

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Inorganic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Thermal Sciences (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
CN202280095382.3A 2022-08-22 2022-08-22 SiC基板及SiC复合基板 Pending CN119654452A (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2022/031636 WO2024042591A1 (ja) 2022-08-22 2022-08-22 SiC基板及びSiC複合基板

Publications (1)

Publication Number Publication Date
CN119654452A true CN119654452A (zh) 2025-03-18

Family

ID=90012690

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202280095382.3A Pending CN119654452A (zh) 2022-08-22 2022-08-22 SiC基板及SiC复合基板

Country Status (5)

Country Link
US (1) US20250126865A1 (https=)
EP (1) EP4579006A1 (https=)
JP (1) JP7686016B2 (https=)
CN (1) CN119654452A (https=)
WO (1) WO2024042591A1 (https=)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014162649A (ja) 2013-02-21 2014-09-08 Mitsubishi Electric Corp SiC基板、SiC基板の製造方法、SiCエピタキシャル基板
JP6968408B2 (ja) 2017-07-20 2021-11-17 国立大学法人東海国立大学機構 炭化ケイ素単結晶の製造方法
JP7422479B2 (ja) * 2017-12-22 2024-01-26 株式会社レゾナック SiCインゴット及びSiCインゴットの製造方法
WO2020195196A1 (ja) * 2019-03-27 2020-10-01 日本碍子株式会社 SiC複合基板及び半導体デバイス用複合基板
WO2020255343A1 (ja) * 2019-06-20 2020-12-24 三菱電機株式会社 炭化ケイ素単結晶、半導体素子
WO2022168372A1 (ja) 2021-02-05 2022-08-11 日本碍子株式会社 希土類含有SiC基板及びそれを用いたSiC複合基板

Also Published As

Publication number Publication date
JPWO2024042591A1 (https=) 2024-02-29
WO2024042591A1 (ja) 2024-02-29
JP7686016B2 (ja) 2025-05-30
EP4579006A1 (en) 2025-07-02
US20250126865A1 (en) 2025-04-17

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