CN119072634A - 测定系统 - Google Patents
测定系统 Download PDFInfo
- Publication number
- CN119072634A CN119072634A CN202380036140.1A CN202380036140A CN119072634A CN 119072634 A CN119072634 A CN 119072634A CN 202380036140 A CN202380036140 A CN 202380036140A CN 119072634 A CN119072634 A CN 119072634A
- Authority
- CN
- China
- Prior art keywords
- measurement
- path
- circuit
- reference signal
- measurement path
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
- G01R1/203—Resistors used for electric measuring, e.g. decade resistors standards, resistors for comparators, series resistors, shunts
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/30—Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
- G01R31/396—Acquisition or processing of data for testing or for monitoring individual cells or groups of cells within a battery
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
- G01R35/007—Standards or reference devices, e.g. voltage or resistance standards, "golden references"
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Measurement Of Current Or Voltage (AREA)
- Arrangements For Transmission Of Measured Signals (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2022074512 | 2022-04-28 | ||
| JP2022-074512 | 2022-04-28 | ||
| PCT/JP2023/014266 WO2023210295A1 (ja) | 2022-04-28 | 2023-04-06 | 測定システム |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN119072634A true CN119072634A (zh) | 2024-12-03 |
Family
ID=88518775
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202380036140.1A Pending CN119072634A (zh) | 2022-04-28 | 2023-04-06 | 测定系统 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20250052847A1 (https=) |
| EP (1) | EP4517339A4 (https=) |
| JP (1) | JPWO2023210295A1 (https=) |
| CN (1) | CN119072634A (https=) |
| WO (1) | WO2023210295A1 (https=) |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5915865A (ja) * | 1982-07-16 | 1984-01-26 | Mitsubishi Electric Corp | 電圧検知器 |
| JP5659967B2 (ja) * | 2011-06-24 | 2015-01-28 | ソニー株式会社 | 監視装置 |
| JP5712841B2 (ja) | 2011-07-25 | 2015-05-07 | 株式会社デンソー | 電圧検出装置 |
| CN103311976A (zh) * | 2012-03-14 | 2013-09-18 | 张兴发 | 电池管理装置、方法及系统 |
| JP2015050870A (ja) * | 2013-09-03 | 2015-03-16 | 株式会社マキタ | バッテリパック |
| JP5860942B2 (ja) * | 2014-10-03 | 2016-02-16 | マイクロ モーション インコーポレイテッド | アナログからデジタルへの変換ステージおよび2つ以上のアナログ信号をデジタル化するための位相同期方法 |
| JP6373154B2 (ja) * | 2014-10-09 | 2018-08-15 | 株式会社日立超エル・エス・アイ・システムズ | 半導体装置 |
| JP7049115B2 (ja) * | 2015-09-17 | 2022-04-06 | ヌヴォトンテクノロジージャパン株式会社 | 異常検出装置、及び電池システム |
| JP6630151B2 (ja) * | 2015-12-28 | 2020-01-15 | ラピスセミコンダクタ株式会社 | 半導体装置、電池監視システム、及び半導体装置の診断方法 |
| JP6496687B2 (ja) * | 2016-07-21 | 2019-04-03 | 矢崎総業株式会社 | 電池監視システム |
| US10386243B2 (en) * | 2016-11-28 | 2019-08-20 | Nxp Usa, Inc. | Temperature sensor circuitry and method therefor |
| US20200028219A1 (en) * | 2018-07-19 | 2020-01-23 | Navitas Solutions, Inc. | Fault-tolerant electronic battery sensing |
| JP2020123795A (ja) * | 2019-01-30 | 2020-08-13 | ソニーセミコンダクタソリューションズ株式会社 | 固体撮像装置および電子機器 |
| JP2022001987A (ja) * | 2020-06-19 | 2022-01-06 | 株式会社日立製作所 | 保安装置、及び故障検知方法 |
-
2023
- 2023-04-06 JP JP2024517943A patent/JPWO2023210295A1/ja active Pending
- 2023-04-06 EP EP23796041.4A patent/EP4517339A4/en active Pending
- 2023-04-06 WO PCT/JP2023/014266 patent/WO2023210295A1/ja not_active Ceased
- 2023-04-06 CN CN202380036140.1A patent/CN119072634A/zh active Pending
-
2024
- 2024-10-24 US US18/926,008 patent/US20250052847A1/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| EP4517339A4 (en) | 2025-09-17 |
| EP4517339A1 (en) | 2025-03-05 |
| WO2023210295A1 (ja) | 2023-11-02 |
| JPWO2023210295A1 (https=) | 2023-11-02 |
| US20250052847A1 (en) | 2025-02-13 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US20200028219A1 (en) | Fault-tolerant electronic battery sensing | |
| US20210109161A1 (en) | Redundant voltage measurements for battery management systems | |
| US10514410B2 (en) | Sensor self-diagnostics using multiple signal paths | |
| US10330736B2 (en) | Semiconductor device, battery monitoring system, and diagnostic method for semiconductor device | |
| EP4099040B1 (en) | Voltage level detector performing state detection | |
| KR20170119636A (ko) | 다중 신호 경로들을 사용하는 센서 자체 진단 | |
| US7719255B2 (en) | Safe input circuit with one-channel peripheral connection for the input of a bus participant | |
| US11422201B1 (en) | Devices and methods for voltage supply monitoring | |
| CN112216882B (zh) | 操作电池管理系统的方法、对应的设备和车辆 | |
| JP6088642B2 (ja) | 複数のアナログ信号検出チャネルを有するアナログ信号入力回路 | |
| US9846191B2 (en) | Systems and methods for internal and external error detection in sensor output interfaces | |
| US9958507B2 (en) | Channel verification of multiple channels on one chip | |
| US11079409B2 (en) | Assembly with at least two redundant analog input units for a measurement current | |
| CN119072634A (zh) | 测定系统 | |
| US9651630B2 (en) | Circuitry and method for monitoring a power supply of an electronic device | |
| US11156672B2 (en) | Semiconductor device | |
| US11243264B2 (en) | Abnormal power supply voltage detection device and method for detecting abnormal power supply voltage | |
| JP2023075212A (ja) | 基準電圧回路および半導体装置 | |
| JP2010249689A (ja) | 配線故障検査装置及び方法 | |
| EP3130894B1 (en) | Abnormality detection device for sensor and sensor device | |
| EP4528292A1 (en) | Input signal detection circuit, electronic device, and system | |
| US11526389B2 (en) | Fault check without software intervention | |
| JP2017016960A (ja) | バッテリ監視システム | |
| US20190079819A1 (en) | Clock signal inspection device, plant monitoring controller, and method for diagnosing clock signal inspection device | |
| JPS62261975A (ja) | 論理集積回路 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |