CN119072634A - 测定系统 - Google Patents

测定系统 Download PDF

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Publication number
CN119072634A
CN119072634A CN202380036140.1A CN202380036140A CN119072634A CN 119072634 A CN119072634 A CN 119072634A CN 202380036140 A CN202380036140 A CN 202380036140A CN 119072634 A CN119072634 A CN 119072634A
Authority
CN
China
Prior art keywords
measurement
path
circuit
reference signal
measurement path
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202380036140.1A
Other languages
English (en)
Chinese (zh)
Inventor
森良介
石井卓也
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nuvoton Technology Corp Japan
Original Assignee
Nuvoton Technology Corp Japan
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nuvoton Technology Corp Japan filed Critical Nuvoton Technology Corp Japan
Publication of CN119072634A publication Critical patent/CN119072634A/zh
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G01R1/203Resistors used for electric measuring, e.g. decade resistors standards, resistors for comparators, series resistors, shunts
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/30Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • G01R31/396Acquisition or processing of data for testing or for monitoring individual cells or groups of cells within a battery
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G01R35/007Standards or reference devices, e.g. voltage or resistance standards, "golden references"

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
CN202380036140.1A 2022-04-28 2023-04-06 测定系统 Pending CN119072634A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2022074512 2022-04-28
JP2022-074512 2022-04-28
PCT/JP2023/014266 WO2023210295A1 (ja) 2022-04-28 2023-04-06 測定システム

Publications (1)

Publication Number Publication Date
CN119072634A true CN119072634A (zh) 2024-12-03

Family

ID=88518775

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202380036140.1A Pending CN119072634A (zh) 2022-04-28 2023-04-06 测定系统

Country Status (5)

Country Link
US (1) US20250052847A1 (https=)
EP (1) EP4517339A4 (https=)
JP (1) JPWO2023210295A1 (https=)
CN (1) CN119072634A (https=)
WO (1) WO2023210295A1 (https=)

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5915865A (ja) * 1982-07-16 1984-01-26 Mitsubishi Electric Corp 電圧検知器
JP5659967B2 (ja) * 2011-06-24 2015-01-28 ソニー株式会社 監視装置
JP5712841B2 (ja) 2011-07-25 2015-05-07 株式会社デンソー 電圧検出装置
CN103311976A (zh) * 2012-03-14 2013-09-18 张兴发 电池管理装置、方法及系统
JP2015050870A (ja) * 2013-09-03 2015-03-16 株式会社マキタ バッテリパック
JP5860942B2 (ja) * 2014-10-03 2016-02-16 マイクロ モーション インコーポレイテッド アナログからデジタルへの変換ステージおよび2つ以上のアナログ信号をデジタル化するための位相同期方法
JP6373154B2 (ja) * 2014-10-09 2018-08-15 株式会社日立超エル・エス・アイ・システムズ 半導体装置
JP7049115B2 (ja) * 2015-09-17 2022-04-06 ヌヴォトンテクノロジージャパン株式会社 異常検出装置、及び電池システム
JP6630151B2 (ja) * 2015-12-28 2020-01-15 ラピスセミコンダクタ株式会社 半導体装置、電池監視システム、及び半導体装置の診断方法
JP6496687B2 (ja) * 2016-07-21 2019-04-03 矢崎総業株式会社 電池監視システム
US10386243B2 (en) * 2016-11-28 2019-08-20 Nxp Usa, Inc. Temperature sensor circuitry and method therefor
US20200028219A1 (en) * 2018-07-19 2020-01-23 Navitas Solutions, Inc. Fault-tolerant electronic battery sensing
JP2020123795A (ja) * 2019-01-30 2020-08-13 ソニーセミコンダクタソリューションズ株式会社 固体撮像装置および電子機器
JP2022001987A (ja) * 2020-06-19 2022-01-06 株式会社日立製作所 保安装置、及び故障検知方法

Also Published As

Publication number Publication date
EP4517339A4 (en) 2025-09-17
EP4517339A1 (en) 2025-03-05
WO2023210295A1 (ja) 2023-11-02
JPWO2023210295A1 (https=) 2023-11-02
US20250052847A1 (en) 2025-02-13

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