JPWO2023210295A1 - - Google Patents
Info
- Publication number
- JPWO2023210295A1 JPWO2023210295A1 JP2024517943A JP2024517943A JPWO2023210295A1 JP WO2023210295 A1 JPWO2023210295 A1 JP WO2023210295A1 JP 2024517943 A JP2024517943 A JP 2024517943A JP 2024517943 A JP2024517943 A JP 2024517943A JP WO2023210295 A1 JPWO2023210295 A1 JP WO2023210295A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
- G01R1/203—Resistors used for electric measuring, e.g. decade resistors standards, resistors for comparators, series resistors, shunts
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/30—Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
- G01R31/396—Acquisition or processing of data for testing or for monitoring individual cells or groups of cells within a battery
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
- G01R35/007—Standards or reference devices, e.g. voltage or resistance standards, "golden references"
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Measurement Of Current Or Voltage (AREA)
- Arrangements For Transmission Of Measured Signals (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2022074512 | 2022-04-28 | ||
| PCT/JP2023/014266 WO2023210295A1 (ja) | 2022-04-28 | 2023-04-06 | 測定システム |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2023210295A1 true JPWO2023210295A1 (https=) | 2023-11-02 |
| JPWO2023210295A5 JPWO2023210295A5 (https=) | 2025-01-16 |
Family
ID=88518775
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024517943A Pending JPWO2023210295A1 (https=) | 2022-04-28 | 2023-04-06 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20250052847A1 (https=) |
| EP (1) | EP4517339A4 (https=) |
| JP (1) | JPWO2023210295A1 (https=) |
| CN (1) | CN119072634A (https=) |
| WO (1) | WO2023210295A1 (https=) |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5915865A (ja) * | 1982-07-16 | 1984-01-26 | Mitsubishi Electric Corp | 電圧検知器 |
| JP5659967B2 (ja) * | 2011-06-24 | 2015-01-28 | ソニー株式会社 | 監視装置 |
| JP5712841B2 (ja) | 2011-07-25 | 2015-05-07 | 株式会社デンソー | 電圧検出装置 |
| CN103311976A (zh) * | 2012-03-14 | 2013-09-18 | 张兴发 | 电池管理装置、方法及系统 |
| JP2015050870A (ja) * | 2013-09-03 | 2015-03-16 | 株式会社マキタ | バッテリパック |
| JP5860942B2 (ja) * | 2014-10-03 | 2016-02-16 | マイクロ モーション インコーポレイテッド | アナログからデジタルへの変換ステージおよび２つ以上のアナログ信号をデジタル化するための位相同期方法 |
| JP6373154B2 (ja) * | 2014-10-09 | 2018-08-15 | 株式会社日立超エル・エス・アイ・システムズ | 半導体装置 |
| JP7049115B2 (ja) * | 2015-09-17 | 2022-04-06 | ヌヴォトンテクノロジージャパン株式会社 | 異常検出装置、及び電池システム |
| JP6630151B2 (ja) * | 2015-12-28 | 2020-01-15 | ラピスセミコンダクタ株式会社 | 半導体装置、電池監視システム、及び半導体装置の診断方法 |
| JP6496687B2 (ja) * | 2016-07-21 | 2019-04-03 | 矢崎総業株式会社 | 電池監視システム |
| US10386243B2 (en) * | 2016-11-28 | 2019-08-20 | Nxp Usa, Inc. | Temperature sensor circuitry and method therefor |
| US20200028219A1 (en) * | 2018-07-19 | 2020-01-23 | Navitas Solutions, Inc. | Fault-tolerant electronic battery sensing |
| JP2020123795A (ja) * | 2019-01-30 | 2020-08-13 | ソニーセミコンダクタソリューションズ株式会社 | 固体撮像装置および電子機器 |
| JP2022001987A (ja) * | 2020-06-19 | 2022-01-06 | 株式会社日立製作所 | 保安装置、及び故障検知方法 |
-
2023
- 2023-04-06 JP JP2024517943A patent/JPWO2023210295A1/ja active Pending
- 2023-04-06 EP EP23796041.4A patent/EP4517339A4/en active Pending
- 2023-04-06 WO PCT/JP2023/014266 patent/WO2023210295A1/ja not_active Ceased
- 2023-04-06 CN CN202380036140.1A patent/CN119072634A/zh active Pending
-
2024
- 2024-10-24 US US18/926,008 patent/US20250052847A1/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| EP4517339A4 (en) | 2025-09-17 |
| EP4517339A1 (en) | 2025-03-05 |
| WO2023210295A1 (ja) | 2023-11-02 |
| CN119072634A (zh) | 2024-12-03 |
| US20250052847A1 (en) | 2025-02-13 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20241024 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20260312 |