CN117954304A - 质量分析装置 - Google Patents

质量分析装置 Download PDF

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Publication number
CN117954304A
CN117954304A CN202311395318.XA CN202311395318A CN117954304A CN 117954304 A CN117954304 A CN 117954304A CN 202311395318 A CN202311395318 A CN 202311395318A CN 117954304 A CN117954304 A CN 117954304A
Authority
CN
China
Prior art keywords
gas
analysis
flow path
ions
cell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202311395318.XA
Other languages
English (en)
Chinese (zh)
Inventor
松下知义
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Publication of CN117954304A publication Critical patent/CN117954304A/zh
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0495—Vacuum locks; Valves
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/626—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using heat to ionise a gas
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/24—Vacuum systems, e.g. maintaining desired pressures

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
CN202311395318.XA 2022-10-28 2023-10-25 质量分析装置 Pending CN117954304A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2022172967A JP2024064401A (ja) 2022-10-28 2022-10-28 質量分析装置
JP2022-172967 2022-10-28

Publications (1)

Publication Number Publication Date
CN117954304A true CN117954304A (zh) 2024-04-30

Family

ID=88511043

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202311395318.XA Pending CN117954304A (zh) 2022-10-28 2023-10-25 质量分析装置

Country Status (4)

Country Link
US (1) US20240145225A1 (https=)
EP (1) EP4362060A1 (https=)
JP (1) JP2024064401A (https=)
CN (1) CN117954304A (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20240363324A1 (en) * 2021-07-30 2024-10-31 Shimadzu Corporation Mass spectrometer

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6607597B2 (en) * 2001-01-30 2003-08-19 Msp Corporation Method and apparatus for deposition of particles on surfaces
WO2011104611A1 (en) * 2010-02-26 2011-09-01 Dh Technologies Development Pte. Ltd. Gas delivery system for mass spectrometer reaction and collision cells
CN104882352B (zh) * 2015-05-18 2017-04-05 中国计量科学研究院 气相分子‑离子反应的质谱装置及分析方法
CN109716484B (zh) 2016-09-21 2021-02-09 株式会社岛津制作所 质谱分析装置
JP7095579B2 (ja) 2018-12-05 2022-07-05 株式会社島津製作所 質量分析装置
US10600626B1 (en) * 2018-12-14 2020-03-24 Thermos Finnigan Llc Mass calibration device for a mass spectrometer

Also Published As

Publication number Publication date
EP4362060A1 (en) 2024-05-01
US20240145225A1 (en) 2024-05-02
JP2024064401A (ja) 2024-05-14

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