JP2024064401A - 質量分析装置 - Google Patents

質量分析装置 Download PDF

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Publication number
JP2024064401A
JP2024064401A JP2022172967A JP2022172967A JP2024064401A JP 2024064401 A JP2024064401 A JP 2024064401A JP 2022172967 A JP2022172967 A JP 2022172967A JP 2022172967 A JP2022172967 A JP 2022172967A JP 2024064401 A JP2024064401 A JP 2024064401A
Authority
JP
Japan
Prior art keywords
gas
analysis
flow path
ions
cell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022172967A
Other languages
English (en)
Japanese (ja)
Other versions
JP2024064401A5 (https=
Inventor
知義 松下
Tomoyoshi Matsushita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP2022172967A priority Critical patent/JP2024064401A/ja
Priority to US18/382,955 priority patent/US20240145225A1/en
Priority to EP23205520.2A priority patent/EP4362060A1/en
Priority to CN202311395318.XA priority patent/CN117954304A/zh
Publication of JP2024064401A publication Critical patent/JP2024064401A/ja
Publication of JP2024064401A5 publication Critical patent/JP2024064401A5/ja
Pending legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0495—Vacuum locks; Valves
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/626—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using heat to ionise a gas
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/24—Vacuum systems, e.g. maintaining desired pressures

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2022172967A 2022-10-28 2022-10-28 質量分析装置 Pending JP2024064401A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2022172967A JP2024064401A (ja) 2022-10-28 2022-10-28 質量分析装置
US18/382,955 US20240145225A1 (en) 2022-10-28 2023-10-23 Mass spectrometer
EP23205520.2A EP4362060A1 (en) 2022-10-28 2023-10-24 Mass spectrometer
CN202311395318.XA CN117954304A (zh) 2022-10-28 2023-10-25 质量分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2022172967A JP2024064401A (ja) 2022-10-28 2022-10-28 質量分析装置

Publications (2)

Publication Number Publication Date
JP2024064401A true JP2024064401A (ja) 2024-05-14
JP2024064401A5 JP2024064401A5 (https=) 2025-08-08

Family

ID=88511043

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022172967A Pending JP2024064401A (ja) 2022-10-28 2022-10-28 質量分析装置

Country Status (4)

Country Link
US (1) US20240145225A1 (https=)
EP (1) EP4362060A1 (https=)
JP (1) JP2024064401A (https=)
CN (1) CN117954304A (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20240363324A1 (en) * 2021-07-30 2024-10-31 Shimadzu Corporation Mass spectrometer

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6607597B2 (en) * 2001-01-30 2003-08-19 Msp Corporation Method and apparatus for deposition of particles on surfaces
WO2011104611A1 (en) * 2010-02-26 2011-09-01 Dh Technologies Development Pte. Ltd. Gas delivery system for mass spectrometer reaction and collision cells
CN104882352B (zh) * 2015-05-18 2017-04-05 中国计量科学研究院 气相分子‑离子反应的质谱装置及分析方法
CN109716484B (zh) 2016-09-21 2021-02-09 株式会社岛津制作所 质谱分析装置
JP7095579B2 (ja) 2018-12-05 2022-07-05 株式会社島津製作所 質量分析装置
US10600626B1 (en) * 2018-12-14 2020-03-24 Thermos Finnigan Llc Mass calibration device for a mass spectrometer

Also Published As

Publication number Publication date
EP4362060A1 (en) 2024-05-01
US20240145225A1 (en) 2024-05-02
CN117954304A (zh) 2024-04-30

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