CN117807347A - 处理装置、处理系统、处理方法以及记录介质 - Google Patents

处理装置、处理系统、处理方法以及记录介质 Download PDF

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Publication number
CN117807347A
CN117807347A CN202311275932.2A CN202311275932A CN117807347A CN 117807347 A CN117807347 A CN 117807347A CN 202311275932 A CN202311275932 A CN 202311275932A CN 117807347 A CN117807347 A CN 117807347A
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structural
structural factor
short
factor
distance
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Chinese (zh)
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吉元政嗣
表和彦
伊藤和辉
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Rigaku Corp
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Rigaku Corp
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    • G—PHYSICS
    • G16—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR SPECIFIC APPLICATION FIELDS
    • G16C—COMPUTATIONAL CHEMISTRY; CHEMOINFORMATICS; COMPUTATIONAL MATERIALS SCIENCE
    • G16C60/00—Computational materials science, i.e. ICT specially adapted for investigating the physical or chemical properties of materials or phenomena associated with their design, synthesis, processing, characterisation or utilisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20016—Goniometers
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10—Complex mathematical operations

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  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Computing Systems (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Data Mining & Analysis (AREA)
  • Mathematical Physics (AREA)
  • Mathematical Analysis (AREA)
  • General Engineering & Computer Science (AREA)
  • Software Systems (AREA)
  • Databases & Information Systems (AREA)
  • Pure & Applied Mathematics (AREA)
  • Mathematical Optimization (AREA)
  • Computational Mathematics (AREA)
  • Algebra (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN202311275932.2A 2022-09-30 2023-09-28 处理装置、处理系统、处理方法以及记录介质 Pending CN117807347A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2022-157711 2022-09-30
JP2022157711A JP7737148B2 (ja) 2022-09-30 2022-09-30 処理装置、システム、方法およびプログラム

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CN117807347A true CN117807347A (zh) 2024-04-02

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CN202311275932.2A Pending CN117807347A (zh) 2022-09-30 2023-09-28 处理装置、处理系统、处理方法以及记录介质

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US (1) US20240120036A1 (enExample)
JP (1) JP7737148B2 (enExample)
CN (1) CN117807347A (enExample)
DE (1) DE102023125564A1 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12368503B2 (en) 2023-12-27 2025-07-22 Quantum Generative Materials Llc Intent-based satellite transmit management based on preexisting historical location and machine learning

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014044079A (ja) * 2012-08-24 2014-03-13 Sumitomo Bakelite Co Ltd 透明複合シートの評価方法、透明複合シート製品、及び透明複合シート
JP2015025746A (ja) * 2013-07-26 2015-02-05 住友ベークライト株式会社 材料の三次元構造の評価方法、材料製品、及び透明複合シート製品
JP2020094945A (ja) * 2018-12-14 2020-06-18 国立研究開発法人物質・材料研究機構 Ｘ線全散乱による結晶構造解析方法
JP2022157711A (ja) 2021-03-31 2022-10-14 株式会社アドヴィックス 車両用制動制御装置

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DE102023125564A1 (de) 2024-04-04
US20240120036A1 (en) 2024-04-11
JP2024051504A (ja) 2024-04-11
JP7737148B2 (ja) 2025-09-10

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