JP7737148B2 - 処理装置、システム、方法およびプログラム - Google Patents

処理装置、システム、方法およびプログラム

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Publication number
JP7737148B2
JP7737148B2 JP2022157711A JP2022157711A JP7737148B2 JP 7737148 B2 JP7737148 B2 JP 7737148B2 JP 2022157711 A JP2022157711 A JP 2022157711A JP 2022157711 A JP2022157711 A JP 2022157711A JP 7737148 B2 JP7737148 B2 JP 7737148B2
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JP
Japan
Prior art keywords
structure factor
range
structural model
short
long
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JP2022157711A
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English (en)
Japanese (ja)
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JP2024051504A (ja
JP2024051504A5 (enExample
Inventor
政嗣 吉元
和彦 表
和輝 伊藤
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Rigaku Corp
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Rigaku Corp
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Publication date
Application filed by Rigaku Corp filed Critical Rigaku Corp
Priority to JP2022157711A priority Critical patent/JP7737148B2/ja
Priority to DE102023125564.9A priority patent/DE102023125564A1/de
Priority to CN202311275932.2A priority patent/CN117807347A/zh
Priority to US18/373,967 priority patent/US20240120036A1/en
Publication of JP2024051504A publication Critical patent/JP2024051504A/ja
Publication of JP2024051504A5 publication Critical patent/JP2024051504A5/ja
Application granted granted Critical
Publication of JP7737148B2 publication Critical patent/JP7737148B2/ja
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G16—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR SPECIFIC APPLICATION FIELDS
    • G16C—COMPUTATIONAL CHEMISTRY; CHEMOINFORMATICS; COMPUTATIONAL MATERIALS SCIENCE
    • G16C60/00—Computational materials science, i.e. ICT specially adapted for investigating the physical or chemical properties of materials or phenomena associated with their design, synthesis, processing, characterisation or utilisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20016—Goniometers
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10—Complex mathematical operations

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Computing Systems (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Data Mining & Analysis (AREA)
  • Mathematical Physics (AREA)
  • Mathematical Analysis (AREA)
  • General Engineering & Computer Science (AREA)
  • Software Systems (AREA)
  • Databases & Information Systems (AREA)
  • Pure & Applied Mathematics (AREA)
  • Mathematical Optimization (AREA)
  • Computational Mathematics (AREA)
  • Algebra (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2022157711A 2022-09-30 2022-09-30 処理装置、システム、方法およびプログラム Active JP7737148B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2022157711A JP7737148B2 (ja) 2022-09-30 2022-09-30 処理装置、システム、方法およびプログラム
DE102023125564.9A DE102023125564A1 (de) 2022-09-30 2023-09-21 Verarbeitungsvorrichtung, system, verfahren und programm
CN202311275932.2A CN117807347A (zh) 2022-09-30 2023-09-28 处理装置、处理系统、处理方法以及记录介质
US18/373,967 US20240120036A1 (en) 2022-09-30 2023-09-28 Processing apparatus, system, method, and program for calculating a structural factor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2022157711A JP7737148B2 (ja) 2022-09-30 2022-09-30 処理装置、システム、方法およびプログラム

Publications (3)

Publication Number Publication Date
JP2024051504A JP2024051504A (ja) 2024-04-11
JP2024051504A5 JP2024051504A5 (enExample) 2024-12-19
JP7737148B2 true JP7737148B2 (ja) 2025-09-10

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JP2022157711A Active JP7737148B2 (ja) 2022-09-30 2022-09-30 処理装置、システム、方法およびプログラム

Country Status (4)

Country Link
US (1) US20240120036A1 (enExample)
JP (1) JP7737148B2 (enExample)
CN (1) CN117807347A (enExample)
DE (1) DE102023125564A1 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12368503B2 (en) 2023-12-27 2025-07-22 Quantum Generative Materials Llc Intent-based satellite transmit management based on preexisting historical location and machine learning

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014044079A (ja) 2012-08-24 2014-03-13 Sumitomo Bakelite Co Ltd 透明複合シートの評価方法、透明複合シート製品、及び透明複合シート
JP2015025746A (ja) 2013-07-26 2015-02-05 住友ベークライト株式会社 材料の三次元構造の評価方法、材料製品、及び透明複合シート製品
JP2020094945A (ja) 2018-12-14 2020-06-18 国立研究開発法人物質・材料研究機構 Ｘ線全散乱による結晶構造解析方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2022157711A (ja) 2021-03-31 2022-10-14 株式会社アドヴィックス 車両用制動制御装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014044079A (ja) 2012-08-24 2014-03-13 Sumitomo Bakelite Co Ltd 透明複合シートの評価方法、透明複合シート製品、及び透明複合シート
JP2015025746A (ja) 2013-07-26 2015-02-05 住友ベークライト株式会社 材料の三次元構造の評価方法、材料製品、及び透明複合シート製品
JP2020094945A (ja) 2018-12-14 2020-06-18 国立研究開発法人物質・材料研究機構 Ｘ線全散乱による結晶構造解析方法

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
DE ARAUJO, Gabriel L. B. et al.，Local Structure of Ion Pair Interaction in Lapatinib Amorphous Dispersions characterized by Synchrotron X-Ray diffraction and Pair Distribution Function Analysis，Scientific Reports，2017年04月11日，Vol. 7, No. 46367(2017)，p. 1-10，<https://doi.org/10.1038/srep46367>，ISSN 2045-2322
HIROI, Satoshi et al.，Structural Characterization of the Delithiated Noncrystalline Phase in a Li-Rich Li2VO2F Cathode Material，Chemistry of Materials，2021年06月16日，Vol. 2021, No. 33，p. 5943-5950，<https://doi.org/10.1021/acs.chemmater.1c01466>，ISSN 0897-4756
KEEN, D A et al.，Reverse Monte Carlo modelling of crystalline disorder，Journal of Physics: Condensed Matter，2005年01月21日，Vol. 17, No. 5(2005)，p. S15-S22，<https://doi.org/10.1088/0953-8984/17/5/002>，ISSN 1361-648X
TUCKER, Matthew G. et al.，Application of the reverse Monte Carlo method to crystalline materials，Journal of Applied Crystallography，2004年08月02日，Vol. 34, Issue 5，p. 630-638，<https://doi.org/10.1107/S002188980100930X>，ISSN 0021-8898

Also Published As

Publication number Publication date
DE102023125564A1 (de) 2024-04-04
US20240120036A1 (en) 2024-04-11
JP2024051504A (ja) 2024-04-11
CN117807347A (zh) 2024-04-02

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