CN117355754A - 插座 - Google Patents

插座 Download PDF

Info

Publication number
CN117355754A
CN117355754A CN202280037582.3A CN202280037582A CN117355754A CN 117355754 A CN117355754 A CN 117355754A CN 202280037582 A CN202280037582 A CN 202280037582A CN 117355754 A CN117355754 A CN 117355754A
Authority
CN
China
Prior art keywords
hole
plunger
tapered portion
inclination angle
horizontal direction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202280037582.3A
Other languages
English (en)
Chinese (zh)
Inventor
细川大辅
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokowo Co Ltd
Original Assignee
Yokowo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokowo Co Ltd filed Critical Yokowo Co Ltd
Publication of CN117355754A publication Critical patent/CN117355754A/zh
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433Sockets for IC's or transistors
    • G01R1/0441Details
    • G01R1/0466Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716Elastic
    • G01R1/06722Spring-loaded
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733Geometry aspects
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02Contact members
    • H01R13/22Contacts for co-operating by abutting
    • H01R13/24Contacts for co-operating by abutting resilient; resiliently-mounted
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02Contact members
    • H01R13/22Contacts for co-operating by abutting
    • H01R13/24Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2421Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R33/00Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
    • H01R33/74Devices having four or more poles, e.g. holders for compact fluorescent lamps
    • H01R33/76Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00Connectors or connections adapted for particular applications
    • H01R2201/20Connectors or connections adapted for particular applications for testing or measuring purposes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Connecting Device With Holders (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
CN202280037582.3A 2021-06-24 2022-06-08 插座 Pending CN117355754A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021104560A JP7734517B2 (ja) 2021-06-24 2021-06-24 ソケット
JP2021-104560 2021-06-24
PCT/JP2022/023122 WO2022270311A1 (ja) 2021-06-24 2022-06-08 ソケット

Publications (1)

Publication Number Publication Date
CN117355754A true CN117355754A (zh) 2024-01-05

Family

ID=84544282

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202280037582.3A Pending CN117355754A (zh) 2021-06-24 2022-06-08 插座

Country Status (6)

Country Link
US (1) US20240295584A1 (https=)
EP (1) EP4361646A1 (https=)
JP (1) JP7734517B2 (https=)
CN (1) CN117355754A (https=)
PH (1) PH12023553267A1 (https=)
WO (1) WO2022270311A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023119897A1 (ja) * 2021-12-21 2023-06-29 株式会社ヨコオ プローブヘッド

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5399982A (en) * 1989-11-13 1995-03-21 Mania Gmbh & Co. Printed circuit board testing device with foil adapter
JP3414593B2 (ja) * 1996-06-28 2003-06-09 日本発条株式会社 導電性接触子
US5952843A (en) * 1998-03-24 1999-09-14 Vinh; Nguyen T. Variable contact pressure probe
JP2006300581A (ja) * 2005-04-18 2006-11-02 Yokowo Co Ltd プローブの組付け構造
JP4757531B2 (ja) 2005-04-28 2011-08-24 日本発條株式会社 導電性接触子ホルダおよび導電性接触子ユニット
JP2010237133A (ja) * 2009-03-31 2010-10-21 Yokowo Co Ltd 検査ソケットおよびその製法
JP5361518B2 (ja) * 2009-04-27 2013-12-04 株式会社ヨコオ コンタクトプローブ及びソケット
JP5858781B2 (ja) 2011-12-29 2016-02-10 株式会社エンプラス プローブピン及び電気部品用ソケット
JP6475479B2 (ja) * 2014-11-27 2019-02-27 株式会社ヨコオ 検査ユニット
JP2018194411A (ja) * 2017-05-17 2018-12-06 株式会社ヨコオ コンタクトプローブ及び検査用治具
JP7063609B2 (ja) 2017-12-26 2022-05-09 株式会社エンプラス プローブピン及びソケット
JP2020165803A (ja) 2019-03-29 2020-10-08 山一電機株式会社 コンタクトプローブ及びこれを備えた検査用ソケット
TWM588248U (zh) * 2019-07-01 2019-12-21 技鼎股份有限公司 探針頭及其導電探針
JP7335507B2 (ja) * 2019-12-10 2023-08-30 山一電機株式会社 検査用ソケット
JP2021104560A (ja) 2019-12-26 2021-07-26 株式会社安永 ワイヤ放電加工装置及びこのワイヤ放電加工装置に用いられるシート
JP7602112B2 (ja) * 2020-11-17 2024-12-18 山一電機株式会社 検査用ソケット
WO2023119897A1 (ja) * 2021-12-21 2023-06-29 株式会社ヨコオ プローブヘッド

Also Published As

Publication number Publication date
JP2023003466A (ja) 2023-01-17
WO2022270311A1 (ja) 2022-12-29
TW202305383A (zh) 2023-02-01
JP7734517B2 (ja) 2025-09-05
PH12023553267A1 (en) 2024-04-22
US20240295584A1 (en) 2024-09-05
EP4361646A1 (en) 2024-05-01

Similar Documents

Publication Publication Date Title
US10024908B2 (en) Probe and contact inspection device
US7081766B2 (en) Probe card for examining semiconductor devices on semiconductor wafers
WO2015194384A1 (ja) プローブピン、および、これを用いた電子デバイス
US9347971B2 (en) Probing device
TW202115410A (zh) 探針卡
US7791364B2 (en) Electronic device probe card with improved probe grouping
US11821915B2 (en) Socket for inspection
US20180335447A1 (en) Contact probe and inspection jig
JP2013088173A (ja) 摩耗検知システムおよび摩耗検知装置
JP2012149927A (ja) コンタクトプローブ及びソケット
CN117355754A (zh) 插座
US6674297B1 (en) Micro compliant interconnect apparatus for integrated circuit devices
JP2008532011A (ja) ウェハ試験装置のプローブ
US7189080B2 (en) Land grid array connector contact
US20220413010A1 (en) Contactor with angled depressible probes in shifted bores
JP2001255340A (ja) コンタクトプローブ及び該コンタクトプローブを設けたicパッケージ検査用ソケット
US20240353444A1 (en) Probe and inspection socket
CN109839522B (zh) 探针卡装置及其信号转接模块
US20250060393A1 (en) Probe head
US11394148B2 (en) Contact probe and inspection socket provided with contact probe
TWI921549B (zh) 插座
TW202033967A (zh) 檢查用輔助具支持具、支持具及檢查用輔助具
US20200153140A1 (en) IC Socket
JP2007127488A (ja) プローブカード
JP2009162682A (ja) プローブカード

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination